System Under Test
tries inter, extra and intra interoperability. Also known as: SUT
See Also: EUT, Unit Under Test, UUT
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GSM RF Interference Test System
Guangzhou Jumho Electric Co., Ltd.
Cell phones and other wireless devices radiate powerful electromagnetic fields that can cause interference and noise in microphone signals. The interference and noise is called RF interference, which is an unwanted “signal” that occurs at the same time and frequency as a data signal. The RF interference disrupts the flow of data and degrades quality-of-service. Jumho Electric provides a cost-effective RF interference test system for GSM interference level measurement of wireless microphone.
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Jetting System
IntelliJet®
The IntelliJet® Jetting System with patented ReadiSet® Jet Cartridge delivers cutting-edge reliability and micro dot dispensing for manufacturing advanced semiconductor and mobile electronics packages
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EV Power Components End of Line Test Platform
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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Advanced Test Systems
ATS
The commercial version of the RTS-503, this one is not built with the rugged qualifications of the RTS-503. The case is plastic and fuses are used. Otherwise, the internal components and software capabilities are very similar.
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Surge Voltage and Surge Current Testing Systems
HIGHVOLT Prüftechnik Dresden GmbH
Pulse Voltage Test Systems are used for surge testing on transformers, cables, gas insulated switchgear (GIS), arresters, and other high voltage equipment.
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In Vivo Systems
To achieve low minimum detectable activities with count times as fast as one minute.
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Development System
FE-5131
Emulates AT89C5131/AT89C5131A Derivatives with 6/12 Clocks/Cycle31K Code MemorySoftware TraceReal-Time EmulationFrequency up to 40MHzMS-Windows Debugger for C and AssemblerKeil Vision2 Debugger CompatiblePLCC, SOIC, QFP and 32-QFN Emulation HeadersSerially Linked to PC at 115Kbaud
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High Voltage Test & Measurement System
Hard-wearing and technically-sound High Voltage Test & Measurement System is developed to provide accurate results. These systems are widely used in power, electrical, engineering and other industries. They are designed using heavy-duty spare-parts to add strength with life to the systems. They are ideal to provide accurate results without any flaw to ensure to provide the best performance. These systems are perfect combination of easy usage, durability and high accuracy in results.
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Flying Probe PCB Test and Repair System
GRS500
Designed to help troubleshoot complex boards when fixture based tools are not a viable solution, the GRS500 is designed to help you compare the characteristics of good and faulty PCBs, using nodal impedance test, and a "Videosection" technique which presents you with high resolution images of a good board for use in live video comparison with the board under test,
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Embedded System Test Automation Software
ECU-TEST
ECU-TEST is the software for automation tests used in the validation of embedded systems within the automotive industry. It can be used when designing, implementing, and evaluating different tests. It will generate intuitive test reports.
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Characterization System
System 7700
Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
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AIM System Solutions
AIM can provide a wide range of customized solutions:*Special-to Type Test Equipment (STTE)*High Level Bus Analysers (HLBA)*Data Acquisition Recording & Simulation Systems*Aircraft Ground Equipment (AGE)*MIL-STD-1760 Weapon Test Sets*Fibre optic MIL-STD-1553 Stub/ARINC429 Link Extension System (FoMIS/FoL)
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Commercial Test Systems
IR Target Projectors, IR/Visible Target Projections, Wide FOV Target Projectors, Focal Plane Array Tester, Fused IR/Visible Projectors, High Volume Tester, IR/Visible Ranging Projectors, Dual Blackbody Wide FOV, Future Test Requirements.
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200KHz AUTOMATIC TRANSFORMER TEST SYSTEM
VE2729XAU
Its a Microprocessor Based 200KHz Automatic Transformer Tester with inbuilt 20 Pin Channel Scanner for Automatic Switching and Testing Coils & Transformers (Ferrite) with Max. 20 PINS. Test Parameters : -> Inductance (L)-> Leakage Inductance (Lk)-> Capacitance (C)-> DC Resistance (Rdc)-> AC Resistance (Rac)-> Turns Ratio with Winding Polaity-> Quality Factor (Q)-> Impedance (Z)
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Compact EMS/EMI Test Platform
CEMS100
Setting up an EMS/EMI test system is a very complex process requiring significant investment. The steps involved include custom planning, design, installation and configuration of various components and standalone instruments as well as the RF shielded anechoic chamber. Rohde & Schwarz offers the standardized R&S®CEMS100 test platform that is the company's first flexible, reliable and cost-effective off-the-shelf solution for radiated EMS measurements in line with IEC/EN 61000-4-3.
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Inline Test Systems
A perfect basis for an automatic integrated Test System for medium to high manufacturing volumes. Important technical and economic advantages due to their modular structure and expansion capability are evident.
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Combined Environmental Reliability Test System
VTC SERIES
HALT/HASS testing challenges the design, components, sub-assemblies and final assemblies of today's manufactured products. Stresses are applied through a number of conditions to set operational limits and ultimately precipitate failure in the HALT/HASS test environment. Rapid thermal change rate is one of the classic conditions that facilitate product stress.VTC Series chambers are equipped with an LN2 cooling system, with modulating valve and directed air flow to the product, provides the rapid thermal change rates required to achieve maximum product stress. Additionally, these rates are accomplished with smaller space requirements, lower audible noise, no water requirement, and lower maintenance costs than a typical refrigeration system.
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Weapon Control System Test Set
MS 1102
- Provides serviceability checks on armament system- Portable instrument- Check the Bomb release sequence, practice bomb release sequence, rocket release sequence, fuzing, and jettison of aircraft stores- Helps to identify faults of conventional armament- Microprocessor based design
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Test Fixture
N1295A
The Keysight N1295A Device/Component Test Fixture provides a low-cost solution to quickly and easily test packaged devices and components. For more advanced packaged testing needs, the Keysight 16442B Test Fixture provides more capabilities.
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SIP-90-5 Test System Interface Probe
SIP-90-5
Overall Length (mil): 1,000Overall Length (mm): 25.40Rec. Mounting Hole Size (mil): 55Rec. Mounting Hole Size (mm): 1.40Recommended Drill Size: #54 or 1.40 mm
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Complete Systems
Universal Testing Device
The universal testing device is intended for a diverse range of measurement and automation tasks in laboratories and in test engineering. Thermocouples, RTDs and other sensors can be directly connected. Electrical AC/DC values can also be acquired with the universal testing device.
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Vision System
Axiomtek's vision system series is designed to focus on vision inspection, guidance, measurement and identification applications. The products have already gone through a complete set of compatibility experiments to eliminate potential integration problems, significantly helping users reduce development and staffing costs as well as accelerate system deployment in factory automation environment.
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Parallel Test Systems
Our parallel test systems for research and development are highly flexible in use and easily adaptable to different tasks as well as changing piezoelectric materials and designs.
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Medical System
Sentinel II
Chroma Systems Solutions, Inc.
The Sentinel II system provides fully automatic Electrical safety testing to IEC/EN/UL/CSA 60601-1. Sentinel II saves time by scanning patient connections for leakage current without powering down the medical device.
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System Instruments
bsw TestSystems & Consulting AG
Many tasks in the area of semiconductor characterization as well as in the testing of electronic assemblies are routine tasks. Test series of new building elements or samples from production are routinely measured in a large number of electrical parameters. For this, you do not need a measuring device with a complex graphical user interface. A simple interface for remote control with a PC is sufficient. The evaluation and visualization of the results is also carried out on the PC. With the Keysight E5270B and its "little brother" the E5260A two powerful modular SMU units are available for the purpose of the integration into automatic test systems.
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Testing
Underwriters Laboratories Inc.
Our independent, rigorous testing process helps ensure that your products align with applicable requirements and expectations. We deliver innovative, customized options that aim to streamline testing processes, reduce costs and help speed products to market around the world. And our global team’s knowledge helps you stay ahead of the curve on evolving requirements, materials and technologies.
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In-Circuit Test (ICT) Fixtures
At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
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IEC60529 IP3/4 Oscillation Tube Rain Test System
CX-IPX3/4
Shenzhen Chuangxin Instruments Co., Ltd.
IEC60529 IPX3/4 Oscillation Tube Rain Test System is designed according to IEC60529 standard.The IEC60529 IPX3/4 Oscillation Tube Rain Test System is mainly used to simulate the product under the condition of the rain climate to test the productc' physical properties, the product can be electronical products, lamps, lanterns, electrical cabinets, electrical components, automobiles, motorcycles and their accessories.
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Wafer Level Multi-Die Test System
ITC55WLMD
The ITC55WLMD series of test systems has been developed by ITC to be stand-alone UIL test systems configured specifically to test on wafer. The systems include an ITC55series UIL tester and inductor box, a current limiter module and a system controller
