Thermal Test
Designed to produce a temperature change in a device. The magnitude and rate of this change should induce a sufficient thermal stress fatigue to identify sources of potential failure without causing catastrophic failure of all components. (sigmasystems.com)
See Also: Thermal, Thermal Shock
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Thermal Test Vehicles
TTV
Thermal Engineering Associates, Inc.
Using the TTC-1002 Thermal Test Chip as a basis, TEA offers TTVs in flip-chip, bare die, BGA packages for a variety of thermal simulation, reliability, qualification, heat sink characterization, and TIM characterization activities. Selective unused balls are sequentially connected together for daisy-chain applications.
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Thermal Test Boards
Thermal Engineering Associates, Inc.
TEA offers a series of thermal test boards for package characterization and design comparison that conform to to the JEDEC JESD51 standards. The board family, referred to as the TTB-1000 series, consists of two different standard sizes designed to cover a wide range of package sizes. These boards, also referred to as test coupons, provide a well defined mounting environment, will withstand temperatures to 125 oC, and have lead lands terminated in eyelets to allow for hand-wired connection to the board edge contacts. The board mates with a dual 18-pin, 3.962 mm (0.156") pitch edge-card connector.
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Thermal Test Chip
Thermal Engineering Associates, Inc.
Thermal Test Chips (TTC) are used in many different Applications: Package Thermal Characterization, Heat Source Simulator, Temperature Reference Platform, Transient Analysis, System Thermal Management Design, Thermal Interface Material (TIM) Measurement & Characterization, Heat Sink Measurement & Characterization.
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2 Zone Thermal Shock Test Chamber
2-Zone Thermal Shock Testing Equipment with programmable electronics.
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SPD AC & DC Thermal Stability Test Equipment
Shanghai Guantu Technology Co., Ltd.
1. Computer control measurement, PLC control;2. Equipped with sudden voltage capability, suitable for thermal stability tripping test under high current conditions;3. Increase the high-power resistance box;4. The interface is friendly and beautiful, and can reflect the running status of the system in real time; .5. Automatically draw voltage, current and temperature curves;6. The system performs multi-point temperature detection in real time;7. Timing sampling and recording function, which is convenient for users to view temperature values at different times and compare data;8.2 times Uc leakage current test function to check the tripping reliability of the product;9. Built-in test box;10. RS232 communication interface, can realize remote control.
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IEC60884 Fig38 Thermal Compression Test Device For Plug Testing
IEC60884 fig38
Shenzhen Chuangxin Instruments Co., Ltd.
IEC60884 fig38 thermal compression test device for plug testingUsed to evaluate the pressure resistance of electrical accessories and wall mounted mounting boxes under heatStandard: GB2099.1-2008 Articles 24.19 and 25.4 and Figure 38, IEC60884-1 Figure 38, etc.
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Thermal Shock Test Chamber
observe the product characteristics and failure occurrences caused by different materials and their thermal expansion coefficients, thermal shock testing is subjected to the product. In thermal shock testing alternating high and low temperatures are fed in the chamber. WEIBER designs and manufactures customised THERMAL SHOCK CHAMBERS with separately controlled temperature zones (2 zone and 3 zone), liquid to liquid (2 zone) depending on configuration of the chamber chosen.
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Thermal Shock Test Chamber (3 Zone)
Guangdong Test EQ Equipment co., Ltd.
- Divided into a high-temperature zone, low-temperature zone, and test zone. The test product is placed in the test zone, and the temperature from the high-temperature zone or low-temperature zone is applied to the test zone for thermal shock. The test product remains static during the test.- Equiped with a touch-screen control interface for easy operation.- Temperature is transferred to the test zone using a wind route switching method to perform thermal shock testing.- The maximum duration of high-temperature or low-temperature shock can reach 999 hours, and the maximum cycle period can reach 9999 cycles.- The system can operate in automatic cycle mode or manually select specific shocks. It can be set to perform two-zone or three-zone shocks, as well as cold-to-hot or hot-to-cold transitions.- The cooling system utilizes a dual refrigeration system, providing fast cooling. Water cooling is employed as the cooling method.- Testing can be performed at room temperature.
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Thermal Shock Test Chamber (Three Zone)
Guangdong Bell Experiment Equipment Co.,Ltd
DGBell’s Thermal Shock Test Chamber (3 Zone) consist of the Test Zone, Heat Storage Zone and Cold Storage Zone. The specimen stay in test zone, hot and cold air will be blew from the storage zones to achieve rapid temperature change for thermal shock.
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Thermal Shock Test Chambers
How well does your product stand up to the shock of extreme thermal temperature changes? Tenney Environmental's thermal shock test chambers take products from 200°C to -65°C in just seconds.
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Temperature Chambers For Thermal Tests
Before anything reaches out for market distribution, you would need to determine its exact quality and performance to that follows to the point with readings. Thermal and environment testing are some of the most positive aspects to get your materials tested for their underlying performance capacity and reliability in quality.
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Device Thermal Test Systems
Thermal Engineering Associates, Inc.
Thermal test system combines the test and measurement capability of dedicated instruments with the ease of operation and data collecting capability offered by graphical-user-interface-driven software operating on an integrated computer.Diodes (PN, Schottky, LED, varactor, PIN), Stacked Diodes (Hi-V Rectifiers & LEDs), Laser Diodes, Transistors (Bipolar, MOSFET, IGBT) & Diodes, Integrated Circuits (Application & Thermal Test Die).
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Thermal Testing
At E-Labs, Inc., we support thermal cycling and thermal bakeout vacuum testing requirements. During thermal cycling, the unit experiences repeated heating and cooling as it would when exposed to the harsh environment of space. During thermal bakeout, flight equipment is subjected to an outgassing reduction process so as to decrease the chance of molecular contamination of the spacecraft instrumentation.
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Temperature Humidity Environmental Test Chamber
Guangdong Bell Experiment Equipment Co.,Ltd
DGBell’s Temperature and Humidity Test Chamber is able to simulate a wide range of temperature and humidity environment condition for testing various products and components. It is widely used for basic thermal cycling test and accelerated stress test. We provide 6 standard models, test cabinet from 80L to 1000L, customized size is also available.
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MCB Thermal Verification Test Bench
The test system is a special version of the thermal test test system in the sense that the test jig is primarily designed to hold and connect multi pole MCBs for thermal verification so that each pole can be verified to trip within the IEC time band after the MCB has been riveted. This test ensures the trip verification of MCB so as to trip all the 4 poles at once when overload is detected in one single pole. In short, this is a verification-only bench.
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Relay Test Equipment
Vanguard Instruments Company, Inc.
The VIC Model PCI-600 is a programmable, high-current source that is designed specifically for utility-substation applications. This alternating current(ac) test device is used primarily for injection testing of protective relays. This same device can also be used for testing thermal, magnetic and solid-state motor-protection relays and molded-case circuit breakers. The PCI-600 is versatile and can also be used in many other applications that require a high-current source.
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Environmental Testing
Environmental testing capabilities include: High and Low Temperature Testing including Thermal Shock. Humidity Testing to 100% Relative Humidity at High and Low Temperatures. Altitude Testing to 100,000 Feet. Combined Vibration, Temperature and Altitude Testing. Mass Spectrometer for Leak Testing. Vibration Testing to 50 G's and 3000 Hz including Resonance Scan, Cycling, and Endurance. Free Fall Half Sine Wave Mechanical Shock Testing to 100 G's
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Semiconductor
With ultra-multi pin count and fine pitch, our general-purpose IC socket lineup corresponds to every need. For semiconductor burn-in sockets for thermal acceleration tests, and test sockets for semiconductor electrical testing, we continue to hold a high market share all over the world.
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Thermal Vacuum Data Acquisition and Control Software
TVAC 7000
Equipment used in space applications needs to go through stringent environmental tests in order to prove that it can survive the extreme conditions experienced during launch and while in space. Some of the key environmental tests include vibration, thermal vacuum, and electromagnetic compatibility. Thermal vacuum test is crucial to confirm the equipment is able to operate under the space vacuum condition.
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LifeTest Software
In combination with the extended range of PEC test equipment, LifeTest supports the many specific functionalities required in battery testing labs. Drive cycle simulations (FUDS, DST…), thermal performance tests, high speed pulse tests (HPPT), life cycle tests, accelerated ageing tests and internal resistance measurement tests can be easily configured, scheduled, executed and reported from a single platform.
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Temperature shock test chambers test
TSS series
The operating principle of Schocktestprfschrank based of two superposed test rooms (top hot chamber, cold chamber below), between which a car with the test specimens is moved up and down by the large thermal shock test equipment may be subjected
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IR FPA sensors
IR FPA sensors are the most important modules of thermal imagers. Design of sensor electronics (camera core) is a crucial part of designing of new thermal imager. Knowledge of precise parameters of IR FPA sensor is needed by both professionals involved in both IR FPA technology/thermal imagers technology because parameters of IR FPA sensors determine performance limits of thermal imagers. Therefore test equipment that enable measurement of IR FPA sensors is a vital tool for development of both IR FPA technology/thermal imagers technology. It is commonly known that data sheets provided by manufacturers of IR FPA sensors (both cooled or non-cooled) provide too little details for electronics designers. Sometimes the provided data is not accurate enough and better sensor performance can be achieved using modified control signals. Therefore design teams loose sometimes years to develop electronic camera core optimized for a specific IR FPA sensor. When the type of the IR FPA sensor is changed the whole process is to be repeated. In this situation an universal, flexible camera core that would accept IR FPA sensors from different manufacturers and to carry out semi-automatic determination of optimal signal controls for a specific IR FPA sensor would be highly desirable.
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Semiconductor Package Wind Tunnel
WT-100
Thermal Engineering Associates, Inc.
The WT-100 Forced Convection (Moving Air) Wind Tunnel is designed in accordance with the EIA/JEDEC JESD51-6 standard for thermal characterization of semiconductor packages and devices. The vertical design minimizes laboratory floor space requiements. Air is drawn in at the bottom and exhausts at the top. The test section is large enough to accommodate the largest JEDEC and SEMI thermal test boards. Air velocity can be adjusted over the range of 0.5 to 5 m/s; air velocity is monitored with an included hot-wire anemometer connected to a digital display. A Type-T thermocouple is mounted in the test section for monitoring the moving air temperature.
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Climatic Test Chamber
Before anything reaches out for market distribution, you would need to determine its exact quality and performance to that follows to the point with readings. Thermal and environment testing are some of the most positive aspects to get your materials tested for their underlying performance capacity and reliability in quality.
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Mechatronics
MERA performs design, construction, supply, installation and certification of stands for various testing types:● static loading● dynamic and life-cycle● transporting testing (vibration table)● thermal testing● centrifuges● modeling of take-off, landing modes, etc.
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Thermal Shroud
BC8-55/150C
When combined with a thermal conditioner such as the Bemco PCL3L-III or PCL3M-III, this shroud converts a 24 inch inside diameter by 30 inch high vacuum only vertical bell jar into a 19 inch inside diameter by 20 inch high thermal vacuum testing system. With a convenient clam shell door, test objects are easily loaded by simply raising the bell jar above the top of the door opening.
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Guarded Heat Flow Meter
The Guarded Heat Flow Meter (GHFM-02) follows ASTM E1530-19 for testing thermal resistance and thermal conductivity of solids, such as metals, polymers and composites. The easy to operate GHFM-02 follows the trusted steady-state approach, with the addition of a guard to limit the effects of lateral heat loss. This design, allows testing of a wide range of materials with low to medium thermal conductivity.
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Thermal Shock Chambers
We provide a large selection of thermal shock chambers to accommodate various types of product testing. Thermal Shock Chambers perform tailored environmental stress screening of component and board electronic assemblies. Our unique chamber design transfers product between two extreme temperature-controlled chambers, passing equal volumes of high velocity conditioned air over the product and resulting in rapid product temperature changes. The induced thermal stresses can reveal hidden manufacturing defects in electronic sub-assemblies and other components by the expansion and contraction of critical parts.
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Hybrid Single Site Test Handler
3110
Chroma Hybrid Single Site Test Handler 3110 is a full range ATC (Active Thermal Control) test handler capable of handling device bodies up to 120x120mm with 450kg force load.
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Thermal Abuse Test Chamber
Guangdong Bell Experiment Equipment Co.,Ltd
DGBELL Thermal abuse test chamber protect for short circuit caused by incorrect operation of the operator and battery electrode, battery positive and negative connection, etc





























