Thermal Test
Designed to produce a temperature change in a device. The magnitude and rate of this change should induce a sufficient thermal stress fatigue to identify sources of potential failure without causing catastrophic failure of all components. (sigmasystems.com)
See Also: Thermal, Thermal Shock
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Product
Thermal Shock Test Chamber (3 Zone)
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Guangdong Test EQ Equipment co., Ltd.
- Divided into a high-temperature zone, low-temperature zone, and test zone. The test product is placed in the test zone, and the temperature from the high-temperature zone or low-temperature zone is applied to the test zone for thermal shock. The test product remains static during the test.- Equiped with a touch-screen control interface for easy operation.- Temperature is transferred to the test zone using a wind route switching method to perform thermal shock testing.- The maximum duration of high-temperature or low-temperature shock can reach 999 hours, and the maximum cycle period can reach 9999 cycles.- The system can operate in automatic cycle mode or manually select specific shocks. It can be set to perform two-zone or three-zone shocks, as well as cold-to-hot or hot-to-cold transitions.- The cooling system utilizes a dual refrigeration system, providing fast cooling. Water cooling is employed as the cooling method.- Testing can be performed at room temperature.
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Thermal Shock Testing
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DATASYST Engineering & Testing Services, Inc.
Thermal shot testing is a accomplished through the use of two-zone temperature chambers where the unit under test is shuttled between chambers.
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Test Equipment For IEC 62133
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designed for the battery thermal abuse test for IEC62133-8.2.2. The fire-proof dual-chamber has dimension 10" x 10" x 8", which can be heated up to 180°C via an independent temperature controller with +/- 1°C accuracy.
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Product
Thermal imagers
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Thermal imagers sensitive in MWIR and LWIR spectral bands are one of crucial surveillance technologies for defense/security sector. These imagers have also found mass applications outside defense sector. Testing thermal imagers is needed for both manufacturers, maintenance workshops and final users for a set of different and important reasons. Hi-tech test equipment can help significantly in manufacturing, maintenance, training, purchase optimization, and optimal use of these expensive imagers.
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Product
Thermal Abuse Test Chamber
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Guangdong Bell Experiment Equipment Co.,Ltd
DGBell's Thermal abuse test chamber is suitable for standard IEC 62133-2017, UL 1642 and GB 31241-2014.
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Product
Temperature Humidity Environmental Test Chamber
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Guangdong Bell Experiment Equipment Co.,Ltd
DGBell’s Temperature and Humidity Test Chamber is able to simulate a wide range of temperature and humidity environment condition for testing various products and components. It is widely used for basic thermal cycling test and accelerated stress test. We provide 6 standard models, test cabinet from 80L to 1000L, customized size is also available.
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Product
Thermal Shock Test Chamber
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Guangdong Bell Experiment Equipment Co.,Ltd
DGBELL’s Thermal Shock Chamber provide the sudden temperature changes between extreme cold and extreme hot from -65℃ to 150℃ (customized available), specially for environmental stress screen test of the industries that rely on thermal testing, such as component, board electronic assemblies, defense, material stress, consumer products etc.
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Standard And Custom Targets
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Santa Barbara Infrared manufactures a wide range of targets for visible, and infrared/FLIR electro-optical testing. These targets complement our complete line of Visible and IR test products. Our targets are designed to function with one of SBIR’s target wheels. Utilizing a variety of manufacturing techniques, including conventional machining, photochemical etching, electro-deposition, electrical discharge machining (EDM) and laser cutting. SBIR targets are manufactured to exacting mechanical tolerances. SBIR manufactures all of the targets specified by MIL-STD-1859 and the Tri-Service Guide for thermal imager testing.
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Product
Climatic Test Chamber
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Before anything reaches out for market distribution, you would need to determine its exact quality and performance to that follows to the point with readings. Thermal and environment testing are some of the most positive aspects to get your materials tested for their underlying performance capacity and reliability in quality.
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Product
Environmental Test Chamber
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High and Low Temperature Test Chambers, ESS Environment Stress Screening, 2 Zone Thermal Shock Test Chamber, 3 Zone Thermal Shock Chambers, Walk-In Chambers, Burn-in Room and Aging Test Chambers, Altitude Chambers, Industrial Drying Oven, Salt Spray Test Chambers, Temperature Humidity Vibration Comprehensive Test Chamber, Test Machine Series, Custom Made Environmental Test Equipment, Double-Layer High and Low Temperature Chamber, Explosion Proof Temperature Chamber For Power Battery, etc.
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Semiconductor
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With ultra-multi pin count and fine pitch, our general-purpose IC socket lineup corresponds to every need. For semiconductor burn-in sockets for thermal acceleration tests, and test sockets for semiconductor electrical testing, we continue to hold a high market share all over the world.
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Product
Temperature Forcing System
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Wewon Environmental Chambers Co, Ltd.
Wewon Technology specializes in the research, development, production and sales of laboratory testing equipment system services. Through more than ten years of accumulation in the field of equipment, the business of wewon Tech is mainly divided into three fields, namely optical communication, automobile and new energy industry.Specialized equipment from Wewon Environmental Chambers Co., Ltd. includes thermal stream instrument, environmental chambers, walk in chamber, salt fog test chamber, vibration testing machine, xenon lamp aging tester, ultraviolet weather testing equipment, tensile testing machine and various IP protection level test equipment. The system characteristic of Wewon Tech thermal stream temperature test system as below technical parameters mentioned.https://www.wewontech.com/temperature-forcing-system/
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Product
Thermal Shock Test Chamber (2 Zone)
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Guangdong Test EQ Equipment co., Ltd.
- Thermal Shock Chamber: -70℃~150℃, ≤5min recovery, meets MIL-STD-810. Ideal for PCB/IC reliability testing.- ESS Environmental Chamber: Humidity 20%~98% RH, supports GB/T 2423 standards. 40% energy saving vs. competitors.- Liquid-to-Liquid Shock Tester: LN₂ cooling to -196℃, 15s transition time. For aerospace materials validation.- Thermal Cycling Equipment: 25℃/min ramp rate, 1000L capacity. JESD22-A104 compliant.- Benchtop Thermal Chamber: -65℃~150℃, 65dB low noise. Lab-use with USB data export.
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Product
Thermal Testing And Analysis
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Response Dynamics Vibration Engineering, Inc.
We have consulted on thermal issues ranging from conduction issues in TECs, thermal radiation modeling, and countless air cooled system issues relating to system performance, vibration, and acoustics noise. We use a wide array of thermocouple instrumentation, thermal imaging, flow measurements, as well as finite element analysis and analytic modeling to measure, design, and debug thermal and related issues. We often work on customer products in our Response Dynamics lab where we characterize the system, engineer solution options, and prototype solutions. We then work with the customer to work the winning solution into their quality control and manufacturing process.
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Product
Imperial Test Executive
ITE
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The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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Product
BSD (Test Diagnostics)
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BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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NI Real-Time Test Cell Reference System
780590-35
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VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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NI Automated Test Software Suite
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The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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NI HIL and Real-Time Test Software Suite
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Suites combine LabVIEW Professional Development System with NI's most popular application softwareIncludes LabVIEW Professional, VeriStand, and the LabVIEW Real-Time and LabVIEW FPGA modulesEach new suite includes a one-year NI Training and Certification membershipSoftware is shipped on USB 3.0 media with NI device drivers included to speed up your installationConfigure real-time test applications quickly and easily; add custom functionality
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Product
Scienlab Combined Battery Test Solution
SL1133A
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Solution for testing battery cells with an output power up to ±3 kW and a voltage range up to 6 V.
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Product
EFT Module for Teststand
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The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
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Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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Product
Semiconductors Testing
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Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Design for Testability (DFT Test)
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Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Application Software for Electronic Test & Instrumentation
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Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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Product
Cable Free ATE
CABLEFREEATE
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Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
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Product
CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
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NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Product
Automated Aerospace and Defense Test
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Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
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Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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Product
Test System
UltraFLEX
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The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.
