Test Cards
See Also: Cards, Extender Cards, Probe Cards, POST Cards
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Product
PCIe X16 Intel Arc A380E Embedded GPU Card
EAI-3101
Graphics Card
PCIe x16 Intel Arc A380E Embedded GPU Card with 4x DP 1.4a. Intel Arc A380E with 2000 MHz Base Clock, GDDR6 6GB 96 bit Memory, up to 5.018 TFLOPS. 4x DP1.4a up to 8K UHD resolution. 0-60°C working temperature support w/ auto smart fan.
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Product
Memory Test System
T5230
Test System
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
48-Ch Digital I/O And 3-Ch Counter PCIE Card
PCIE-1751
Counter/Timer Card
48 TTL digital I/O linesEmulates mode 0 of 8255 PPI (every port with nibble)Supports both dry and wet contactInterrupt handling capabilityTimer/Counter interrupt capabilityBuffered circuits for higher driving capacity than the 8255Keeps the I/O port setting and DO state after system resetBoardID switchPattern match interrupt function for DIChange of state interrupt function for DIProgrammable digital filter function for DI
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Product
Precision Multi-Channel DC Source PXI Card
GX1838 Series
PXI Card
The GX1838 is a multi-channel programmable DC Source providing multiple discrete outputs for avionics automotive, industrial testing and other ATE applications.
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Product
EBIRST 200-pin LFH To 96-pin SCSI Adapter Cable
93-002-226
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Test Fixture, Axial And Radial
16047A
Test Fixture
The 16047A is designed for impedance evaluation of axial/radial lead type devices of up to 13MHz. The 16047A employs Kelvin contacts which realize a wide impedance measurement range. The contact tip can be changed according to the device shape.
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Product
Digital/Pattern/PE Card
PE16S
Interface Card
The PE16S represents a new level of performance and capabilities for PXI-based digital instrumentation. Based on the proven architecture of the PE16, the PE16S offers high performance pin electronics and an enhanced timing generator in a compact, 3U PXI form factor. Each card can function as a stand-alone digital subsystem or if required, multiple cards can be interconnected, supporting up to 256 bi-directional pins (16 boards). The PE16S offers 16 programmable level input or output channels with 2 PMU . The PE16S also supports deep pattern memory by offering 32 M of on-board vector memory with per channel dynamic direction control running test rates up to 66 MHz.
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Product
Memory Test System
T5851/T5851ES
Test System
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Product
Network Interface Card
NIC10GFT
Interface Card
The NIC10GFT is a dual port 10GBase-T XMC module that brings 10GbE expandability to new and existing embedded systems with available XMC slots.
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Product
Test Port Adapter Set, 2.4 Mm To 2.4 Mm
85130G
Test Port Adapter
The Keysight 85130G test port adapter protects the test set port from connecting directly with the device under test. It has a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a NMD-2.4 mm (f) to NMD-2.4 mm (m) adapter and a NMD-2.4 mm (f) to PSC-2.4 mm (f) adapter. The frequency range for these adapters is dc to 50 GHz with a return loss of 23 dB or better.
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Product
Network Interface Card
NIC10G
Interface Card
Featuring the Intel 82599ES dual 10GbE controller, the NIC10G supports flow control, integrated IPsec security engines, optimized queues, IPv6 offloading, advanced filtering capabilities, and Tx/Rx IP, TCP and UDP checksum offloading capability. Also has integrated a PCI Express Gen 2 interface supporting up to 8 lanes.
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Product
Coaxial Plug-in Switch Card
1260-152/172
Switch Card
The Astronics 1260-152/172 is a high- frequency coaxial switch card for use in either the Adapt-a-Switch® 1260-100, VXI carrier, or the 1256, GPIB/RS-232 Switching Mainframe.
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Product
High Density, 64-Channel Switch Card - 64 Channel, SPDT, High Isolation, Low Crosstalk Switch Module
1260-16A
Switch Card
The Astronics 1260-16A is a 64-channel, SPDT, high isolation; low crosstalk switch module designed for switching and routing sources such as AC and DC power supplies in automated test systems. The 1260-16A switches currents up to 6A, AC or DC, and voltages up to 110VDC or 250VAC.
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Product
FPGA PXI Card with 80 Channel mLVDS Buffer Module
GX3610
FPGA PXI Card
The GX3610 is a 3U PXI FPGA card with 80, mLVDS channels. The GX3610 is comprised of the GX3500 PXI FPGA card and the GX3510 expansion card providing 80 mLVDS buffered channels.
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Product
LitePoint RF Test System
J750
Test System
The option of adding LitePoint instrumentation to the J750 system delivers a cost-effective, complete production test solution covering global wireless connectivity standards.
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Product
SoC Test Systems
Test System
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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Product
8-Ch Relay And 8-Ch Isolated Digital Input PCIE Card
PCIE-1760
Digital Input PCIe Card
8 opto-isolated digital input channels with counter/timer function8 relay actuator output channels2 opto-isolated PWM outputsProgrammable digital filter function for DIJumper selectable dry contact/wet contact input signalsUp event counters for DILED indicators to show activated relaysPattern match interrupt function for DIChange of state interrupt function for DIBoardID switch
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Product
VLSI Test System
3380P
Test System
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
USB Graphics Adapter, Internal Mount, DB-15 connector
DB-UVGA16
Graphics Card
- Mounts in DB9 cutout on chassis or in PCI slot- Uses internal USB pin header- Display resolutions up to: 1600 x 1200 (4:3), 1680 x 1050 (16:10)- Supports multiple display modes: Primary, Extended, Mirr
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Product
PCI Express Graphics Card With NVIDIA RTX 4500 Ada
NVIDIA RTX 4500 Ada
Graphics Card
- NVIDIA Ada Lovelace Architecture- Full height, full length design- PCIe Gen4x16 interface- 24GB GDDR6 Memory, 192-bit Bandwidth- 7680 CUDA Cores, 39.6 TFLOPS SP Peak
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Product
Network Interface Card
XMC477RC
Interface Card
The XMC477RC is a quad switched mezzanine card (XMC) compatible module providing a 4-channel Gigabit Ethernet Small Form Factor pluggable (SFP) interface.
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Product
ARINC PC/104-Plus Interface Card
PC104P-A429
Interface Card
Alta Data Technologies’ PC104P-A429 interface module offer a variety of ARINC-419/429/575/573/717 channel configurations with software selectable RX/Tx channels, baud rates, bit encoding and word configurations (Start/Sync/Stop length, Parity, bits/word, MSB/LSB). Encode or decode almost any ARINC-429 physical layer signal.
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Product
Memory Test System
T5511
Test System
Offering Multi-functionality and Industry's Top Test Speed of 8Gbps.
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Product
32-Ch TTL And 32-Ch Isolated Digital I/O PCIE Card
PCIE-1730
Isolated Digital I/O Card
32-ch isolated DI/O (16-ch digital input, 16-ch digital output)32-ch TTL DI/O (16-ch digital input,16-ch digital output)High output driving capacityInterrupt handling capability2 x 20-pin connectors for isolated DI/O channels and 2 for TTL DI/O channelsD-type connector for isolated input and output channelsHigh-voltage isolation on output channels (2,500 VDC)
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Product
Ethernet Network Interface Cards
Interface Card
Our Ethernet cards, which support copper and fiber, are designed to relieve your bandwidth bottlenecks in compactPCI and VMEbus applications.
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Product
250 KS/s, 16-Bit, 8-Ch Simultaneous Sampling, Multifunction PCI Card
PCI-1706U
PCI Card
8 differential analog inputs8 A/D converters simultaneously sampling16-bit A/D converter, with up to 250kHz sampling rate for each channelProgrammable gainMultiple A/D triggering modesOnboard FIFO memory up to 8K SampleProgrammable pacer/counterBoardID™ switchUniversal PCI Bus (supports 3.3V or 5V PCI bus signals)
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Product
14-Bit, 12-Ch Analog Output Universal PCI Card With 32-Ch Digital I/O
PCI-1727U
Analog Output Card
12 independent analog output channelsFuse on each channelUniversal PCI for 5 V and 3.3 V supportBoardID™ switchSynchronized output function
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Product
NI Real-Time Test Cell Reference System
778820-35
test
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Product
In-Circuit Test System Calibrations
Test System
Regular calibration is essential to ensure accuracy and reliability in testing. Forwessun offers precise calibration services tailored to your test systems, verifying that all components meet industry standards. Our calibration services maintain peak accuracy and compliance, so you can be confident in your system’s performance for any testing application. Choose from one-off calibrations or scheduled service contracts to meet your needs.- HP3070 - Agilent- Keysight - GenRad- Teradyne
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Product
Automated Test Equipment
test
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
