Test Cards
See Also: Cards, Extender Cards, Probe Cards, POST Cards
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Product
Pyroelectric and Thermal Testing
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The optional Chamber Task measures the Pulse Polarization response and Small Signal Capacitance of a Pyroelectric material that is being heated and/or cooled within a thermal chamber, on a hot chuck or in a furnace. From these measurements the Spontaneous Polarization Pr(q) and the Dielectric Constant er(q) are computed. These are then combined to determine the Electrical Displacement D(q) as a function of the temperature q.
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Test Chambers
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The focus of the Feutron climate simulation overall concept is on the simplest operation of the overall functions of the test systems and the highest reliability with maximum efficiency. This is why our systems are supplied as plug-in compact devices.
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HV Test System up to 20000 Volt
Test System
Insulated test booth with large space for test items. 2 banana sockets for AC connection and 4 banana sockets for the DC connection of the DUTs. IC’s are tested in a long-term test. These are checked in an oil bath so that there are no air gaps to reduce the insulation. Maximum voltage 20 kV. Therefore, insulation tests must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Product
Universal Test System
LS6601A
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LS6601A Universal Test System is based on LXI bus, primarily used for functional electronic product or system verification, test parameters. Because the system design is based on LXI bus structure, so its addition to general characteristics of versatility, scalability, but the architecture of the system more flexible, the test system is not limited to one or more cabinets, but may be needed test network and multiple LS6601A and can be easily grouped into one or more of the ground test system, depending on the test mechanism, form a powerful set of test, control, simulation, simulation, data management as one; distributed in different places .
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Exchangeable Test Fixture
MA 2109/D/H/S-5
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 8,50 kg
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Testing Tool Development
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We can create a custom software testing tool for your needs.As developers who love testing, we invest in R&D, combining our product testing and software development expertise to deliver customized testing solutions for you, utilizing open source stacks combined with Artificial Intelligence for added power.
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Product
Boundary-Scan Test and In-System
PCIe-1149.1
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The Corelis PCIe-1149.1 is a high-performance boundary-scan controller for multi-TAP (Test Access Port) and concurrent JTAG test and in-system programming. When combined with a ScanTAP™ intelligent pod, the PCIe-1149.1 offers up to 80 MHz clock rates on 4 or 8 TAPs with features such as external write strobe, direct programming, and analog voltage measurement.
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Test Fixturing Solutions
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Amfax and MAC Panel have teamed up to provide a unique WIRE-FREE Test fixture technology. We have created an alternative solution to traditional wired ITAs called PECture(TM). The name is a combination of PEC (Printed Electronic Circuit) and fixture.
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Semiconductor Test Platform
PAx
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PAx semiconductor test system delivers uncompromised RF performance in a low-cost system for testing RF power amplifiers and front-end modules for next-generation wireless standards.
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Product
4 Ports 25GbE SFP28 Network Mezzanine Card
NMC-2503
Network Mezzanine Card
1 x Intel® E810-CAM1, 4 port SFP28 connector, 1 x PCIe x8, Gen4, CE, FCC, and RoHS compliant.
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Product
CAM/TRAC Test Kits
Series 43
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The GR Series 43 CAM/TRAC®1 kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 43 provides interface compatibility by using a 12 position, GR2270 style I/O block interface. This interface accepts the industry standard I/O, power, and coax blocks.
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Product
DWV/IR Test Systems
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When used in conjunction with ART's own parametric relay test systems such as the RT290, the RT900 offers high speed AC and DC Hipot (dielectric withstand voltage) and Leakage testing of relays or other multi-pin passive devices.
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Armature Test Systems
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Automation Technology's ATS-3800 is at the top of the class when it comes to Armature Test Systems. The ATS-3800 is packed with standard features and like all of ATI's 3800 Series Test Systems; it is backed by ATI's industry leading two-year limited warranty. The ATS-3800 offers the most comprehensive testing of armatures available.
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UDP Test Suite
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Design engineers, quality assurance engineers and testers use the IWL UDP Test Suite to find and fix bugs in their UDP implementation. The tests help ensure that the UDP implementation is sufficiently robust so that it is not vulnerable to the wide range of attacks in today's Internet. The tests make use of the Maxwell Pro network emulation environment, so that each test sequence can intelligently impair all aspects of the UDP protocol.
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Test Programming
TestAssistant II
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From a front-end graphical user interface to a back-end relational database, TestAssistant II organizes and maintains everything necessary for testing. Tester interfaces, wires, connectors, adapter cables, and other complex sub-assemblies are graphically represented.
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Versatile Test Stand
VTS-2100
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Applied Scientific Instrumentation
*Base is a Breadboard on 25 mm centers tapped for M6 screws with threaded holes for risers for TE/TI-2000, TE-300, IX-71/81, DMI, and MS-2000 stages.*Base feet provide vibration isolation.*Z riser is adjustable on pillar blocks.*Z motion from LS-50, LS-100, or LS-150 linear stage.*Z illumination can use LED, LED and a Condenser (from below), or fiber illumination (from above).*Observation is with a Modular Infinity Microscope.
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IT Battery Test System
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Shenzhen Sinexcel RE Equipment CO., Ltd
IT battery test system support for multiple charging mode (such as CC, CV, CP, pulse, etc.) and discharge mode, to ensure that the battery performance and safety in the practical application. IT battery test system is designed to be modular, easy to maintain, and with anti-reverse connection, data loss and other protection functions
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Product
PCI card with 3 IP sites
PCI3IP
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The PCI compatible PCI3IP design adds 3 Industrypack compatible slots to your PCI host. The PCI3IP acts as an adapter, converter, carrier, or bridge between the PCI bus and your IndustryPack hardware. The PCI3IP is a half size PCI card with 3 IP sites; compatible with the smallest chassis and the tallest processors that prevent full size solutions.
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Test Probe
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INGUN, which has earned tremendous trust and achievements from customers all over the world in terms of quality and durability , has a network of distributors in about 50 countries around the world, and has a product lineup of more than 20,000 types.
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Product
PCI Reed Relay Card, 32xSPDT
50-110B-021
Reed Relay
The 50-110B-021 is a 32xSPDT PCI general purpose switching card and is part of our 50-110B/50-115B range of reed relay switching cards which are available in both Changeover (SPDT) and Normally Open (SPST & DPST) configurations. Connections are made via a front panel 200 pin female LFH connector.
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Semiconductor Testing
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Teradyne’s semiconductor test portfolio is transforming the way you test chipsets for automotive, industrial, communications, consumer, smartphones, and computer and electronic game applications. Semiconductor devices span a broad range of functionality, from very simple low-cost devices such as appliance microcontrollers, operational amplifiers or voltage regulators to complex digital signal processors and microprocessors as well as memory devices.
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Test System
Series 303
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The 303-Relay Test System tests the integrity of electromechanical relays and switches. The system can perform an array of tests and control output binning in a fraction of the time of any other tester on the market. Ease of use and overall system flexibility make the 303 ideal for applications in development, incoming inspection, and production line testing.
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Test Chambers
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Drug test chamber, ozone test chamber, plant grown chamber, salt spray test chamber, sand test chamber, temperature and humidity test chamber, UV test chamber, xenon test chamber
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VLF Insulation Testing
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Weshine Electric Manufacturing Co., Ltd
1. The current, voltage and waveform data are directly obtained from the high voltage side, so the data is accurate.2. It has over-voltage protection function. When the output exceeds the set voltage limit, the instrument will stop for protection, and the action time is less than 20ms.3. It has over-current protection function: it is designed as high-voltage and low-voltage dual protection, and the high-voltage side can carry out accurate shutdown protection according to the set value; when the current on the low-voltage side exceeds the rated current, it will carry out shutdown protection, and the action time is less than 20ms.
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SQL Test
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If you want to do test-driven development for databases, SQL Test is the place to start. It lets you write database unit tests in T-SQL and run them in SQL Server Management Studio. It's simple to set up, you don't need extra tools, and you don't need to learn new technologies.
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Test System
ETS788
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The 55/110 MHz ETS788 system boasts the same small footprint and cool quiet CMOS architecture as our ETS780 but with the new high-performance precision components of our Griffin series. This powerful member of the HiLevel family takes advantage of all of the tried and true features that have served users so successfully to date. Learn why the ETS788 is the perfect cost-effective solution for higher performance in Design Verification, Production and Failure Analysis.
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Test & Monitoring Recorders
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Curtiss-Wright Defense Solutions
From miniature avionics bus recorders to high-speed, high-capacity units with customizable interfaces, we use our decades of experience designing and manufacturing flight test and monitoring recorders to deliver solutions that meet the newest standards.
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Cantilever type Probe Card / C type
CE Series
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Japan Electronic Materials Corp.
*Standard Cantilever Probe Card*Low Contact force*Stable Contact*High accuracy of alignment*Suitable for variety of Devices
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Clock and Trigger Distribution Card
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The clock and trigger distribution card is a simple and passive component that allows to synchronize several systems externally. No programming is necessary. A clock can be fed in from an external device or as an option an internal clock oscillator can be equipped by the factory. This clock is then also used to synchronize an external trigger signal into the clock domain. Both, clock and synchronized trigger, are then fed into a maximum of 17 different systems. Each system can be a single card or a synchronized set of cards that run with an internal star-hub.
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Product
Test Socket Lids
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For handler setup or hand test, a manual lid is often required as part of the test hardware set. We have refined our standard offerings so that with each socket you can receive a lid designed specifically for your application from one of five standard lid form factors
