Particle
fundamental objects of quanta.
See Also: Nanoparticle, Airborne Particle, Particle Accelerator, Particle Counters, Particle Detection, Wave
-
product
Laser Diffraction Particle Size Analyzer
SALD-2300
The new standard in the SALD series. While maintaining continuity and compatibility with respect to the data of the SALD2000/2100/2200, which were popular, widely distributed models, this instrument is equipped with many new functions useful for evaluating changes (dispersion, aggregation, dissolution) in particle size distribution relative to the concentration or time. It supports a particle concentration range from 0.1 ppm to 20% and can perform a series of measurements of 200 data points at 1 second minimum intervals.
-
product
Magnetic Plugs
Magnetic Drain Plugs were pioneered by Lisle Corporation in the 1930's. Lisle MAGNETIC PLUGS are similar to standard pipe or straight thread drain plugs with one important difference – a permanent magnet is fastened to the plug body. This magnet attracts and holds abrasive, ferrous metal particles preventing their circulation through the lubrication or hydraulic system.
-
product
Dynamic Particle Image Analysis System
iSpect DIA-10
Shimadzu's iSpect DIA-10 Dynamic Image Analyzer combines particle size and image analysis technology to offer complete particle characterization. It can perform particle imaging, size analysis, and foreign object detection, and obtain size distributions and number concentration, in as little as two minutes.
-
product
PXIe-5763, 16-Bit, 500 MS/s, 4-Channel PXI FlexRIO Digitizer
785165-01
The PXIe-5763 is a PXI FlexRIO Digitizer that simultaneously samples four channels at 500 MS/s with 16 bits of resolution and features 225 MHz of analog input bandwidth. With over 73 dB of SNR, the PXIe-5763 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PXIe-5763 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
-
product
PCIe-5764, 16-Bit, 1 GS/s, 4-Channel PCI FlexRIO Digitizer Device
785957-01
The PCIe-5764 is a PCI FlexRIO Digitizer Device that simultaneously samples four channels at 1 GS/s with 16 bits of resolution and features 400 MHz of analog input bandwidth. With up to 70 dB of SNR, the PCIe-5764 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PCIe-5764 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
-
product
PXIe-5764, 16-Bit, 1 GS/s, 4-Channel PXI FlexRIO Digitizer
785166-01
The PXIe-5764 is a PXI FlexRIO Digitizer that simultaneously samples four channels at 1 GS/s with 16 bits of resolution and features 400 MHz of analog input bandwidth. With up to 70 dB of SNR, the PXIe-5764 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PXIe-5764 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
-
product
Sample Pretreatment For Optical Emission Spectrometry
Samples are taken from molten metal, thin sheet, semi-complete or complete products. When sampling molten metal with a ladle, small quantities of molten metal are poured into a casting mold. Unnecessary parts of the sample are removed using a grinder or a cutter. As particles from a grinder may contaminate the surface of the sample, a lathe or milling machine is used (not a grinder) to cut soft samples such as white metal. If trace elements are not being investigated, a grinder or belt sander can be used. However, to minimize contamination, the grinding wheel or belt should be changed for each sample. Samples excised from semi-complete or complete products must be at least 12 mm in diameter. Small rod-shaped samples can be analyzed using special equipment.
-
product
TEM Sampler
Naneos Particle Solutions gmbh
The naneos partector TEM sampler is the perfect marriage between simplicity and power: You can use it as a simple survey instrument to quickly identify nanoparticle sources in workplaces. You can also use it to sample particles directly to a standard transmission electron microscope (TEM) grid.
-
product
Laser Diffraction Systems
Since the release of the 7991 in 1974, the first commercially available particle size analyzer, Microtrac has been at the forefront of Laser Diffraction technology. By continuously improving the instrument technology, Microtrac offers customers a robust portfolio of Laser Diffraction instruments that’s ideal for particle sizing and characterization.
-
product
Raman Spectroscopy Analysis Laboratory
Rocky Mountain Laboratories, Inc.
Raman is used to analyze organic and inorganic materials. Bulk and small particle materials can be analyzed. Raman microscopy allows for the identification of particle as small as 1 µm.
-
product
PCIe Gen3 Full HD, High Speed, Compact Camera for
CB019MG-LX-X8G3
Full HD, High speed, compact, fast camera for: Vehicle Impact, Airbag Deployment and Safety Restraints Testing, Digital Image Correlation (DIC), Projectile, Explosives, Ballistics, Combustion and Missile Launch Tracking, Fluid and Flow Visualization, Sports Broadcasting, Commercial Film, Television and Studio Production, Fluidics and Particle Image Velocimetry (PIV), Flat panel inspection (FPD), printed circuit board (PCB) examination and more.
-
product
EDEM for Academia
Whether you want to deploy Discrete Element Method in your research or want to expand your curriculum with a DEM-related subject, EDEM software can add another dimension to your research and help expand horizons for your students. * Combine DEM simulation with experimental investigation to understand processes involving particles, * Develop new equipment and methods for bulk solids handling and processing, * Investigate fundamental characteristics of particle systems
-
product
Dynamic Image Analysis (DIA)
CAMSIZER
Dynamic Image Analysis (DIA) is a modern high-performance method for the characterization of particle size and particle shape of powders, granules and suspensions. Retsch Technology's optical analyzers CAMSIZER P4 and CAMSIZER X2 are based on this technology, covering a measuring range from 0.8 m to 30 mm.
-
product
flow Coefficient
For the determination of the flow coefficient of fine aggregates up to 4 mm particle size.
-
product
Particle Size Analyzers
Particle analyzers are used to determine the size and distribution of particles making up a material. Particle size analyzers are used in numerous fields for research and development, manufacturing and for quality control and product testing.
-
product
PCIe-5774, 12-Bit, 6.4 GS/s, DC-Coupled, 2-Channel PCI FlexRIO Digitizer Device
785648-01
The PCIe-5774 is a PCI FlexRIO Digitizer Device that provides up to 3.2 GHz of DC-coupled analog bandwidth and 12 bits of resolution. You can operate the PCIe-5774 in a dual-channel mode at 3.2 GS/s or in a single-channel interleaved mode at 6.4 GS/s. The voltage ranges are software-selectable and include 200 mV peak-to-peak and 1 V peak-to-peak, with a selectable DC offset. The PCIe-5774 is ideal for time-domain measurements in areas such as scientific instrumentation, medical imaging, and particle physics. The FlexRIO driver includes support for finite acquisition, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA.
-
product
PXIe-5764, 16-Bit, 1 GS/s, 4-Channel PXI FlexRIO Digitizer
785169-01
The PXIe-5764 is a PXI FlexRIO Digitizer that simultaneously samples four channels at 1 GS/s with 16 bits of resolution and features 400 MHz of analog input bandwidth. With up to 70 dB of SNR, the PXIe-5764 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PXIe-5764 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
-
product
NPIRI Fineness of Grind Gauge
2070
The Elcometer 2070 NPIRI Fineness of Grind Gauge is used to determine particle size and the fineness of grind of particles in printing inks according to the National Printing Inks Research Institute (NPIRI) scale.
-
product
Aggregation Analysis System For Biopharmaceuticals
Aggregates Sizer
The "Aggregates Sizer" aggregation analysis system enables the quantitative evaluation of particle amounts in the SVP range as a concentration (unit: μg/mL). Aggregations of biopharmaceuticals can be categorized into 3 ranges: IVP (In-visible Particle), SVP (Sub-visible Particle), and VP (Visible Particle), according to their particle size. Until now, no particle size analyzer could cover the SVP range with a single measurement. Therefore, multiple methods had to be used. Aggregates Sizer completely covers the SVP range.
-
product
Energy Dispersive X-Ray Spectroscopy (EDS)
Rocky Mountain Laboratories, Inc.
Energy Dispersive Spectroscopy (EDS Analysis) is used in conjunction with the Scanning Electron Microscope (SEM) providing chemical analysis in areas as small as 1 µm in diameter. EDS detects all elements except for H, He, Li, and Be. EDS can be performed exactly on any features or particles seen in the SEM images and can “MAP” elements on a surface. Unknown materials can be identified and quantitative analysis can be performed.
-
product
Turbidity And Standard Meters
Accurately measure the cloudiness of a fluid caused by suspended particles with turbidity meters and standards from HF scientific. Our turbidity meters and standards instruments include features that simplify installation, maintenance, and data access.We offer reliable turbidity meters including an online turbidity meter, handheld turbidity meter, and benchtop turbidity meter.
-
product
Conveyor Scale
KW-LU
This advanced belt conveyor-type constant feeder weighs various raw materials in particle or powder form, and products on the belt conveyor.
-
product
Silicon Charged Particle Radiation Detectors
ORTEC introduced the first silicon surface barrier detectors for charged particle spectroscopy in the early 1960’s. Since then, ORTEC has expanded the product line with more than ten different options to choose from.
-
product
PCIe-5763, 16-Bit, 500 MS/s, 4-Channel PCI FlexRIO Digitizer Device
786168-01
The PCIe-5763 is a PCI FlexRIO Digitizer Device that simultaneously samples four channels at 500 MS/s with 16 bits of resolution and features 225 MHz of analog input bandwidth. With over 73 dB of SNR, the PCIe-5763 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PCIe-5763 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
-
product
Magnetic Particle Inspection(MPI)
Magnetic particle inspection is an inspection method used to identify defects on the surface of ferromagnetic materials by running a magnetic current through it.
-
product
Remote Particle Sensors
3718-A And 3719-A
Kanomax Remote Particle Sensors with analog output are designed to fit into your existing monitoring system, or they can be used as a stand-alone unit to monitor a critical area when connected to an alarm or controller. With two models available, these 2-channel remote particle sensors are capable of Modbus communication via RS485 interface. 0.1 cfm and 1.0 cfm flow rate models are available, along with flexible 4-20mA analog output with the 1.0 cfm unit (only).
-
product
Advanced Aerosol Neutralizer
3088
Aerosol neutralization is an important component of aerosol science and engineering. Neutralizing aerosol particles can reduce electrostatic losses of particles within tubing or to other surfaces. Neutralization is also critical to gathering reliable particle size data when using a sizing instrument based on electrical mobility.
-
product
Ferrous Wear Metal Measurement In Lubricants
FerroCheck 2000 Series
The FerroCheck 2000 Series of portable ferrous analyzers offer accuracy and convenience for total ferrous measurement of in-service lubricating oil and grease. Fast and easy to use samples are analyzed in less than 30 seconds. Small sample volumes of just 1.5 ml of oil or 0.75 ml of grease are needed to measure ferrous content in part per million (ppm) by weight. The FerroCheck measures the total ferrous content of both small particles from normal machine wear and large abnormal wear particles.
-
product
PCIe Gen3 High Speed, Compact Camera for Testing
CB013CG-LX-X8G3
High speed, compact, fast camera for: Vehicle Impact, Airbag Deployment and Safety Restraints Testing, Digital Image Correlation (DIC), Projectile, Explosives, Ballistics, Combustion and Missile Launch Tracking, Fluid and Flow Visualization, Sports Broadcasting, Commercial Film, Television and Studio Production, Fluidics and Particle Image Velocimetry (PIV), Flat panel inspection (FPD), printed circuit board (PCB) examination and more.
-
product
NIM-Modules
The "dual channel" TDC'''' - Model 7072T - converts time directly to a digital output. They offer improved performance and linearity specifications compared to separate TAC and ADC modules. There is also the Wilkinson-type ADC, Model 7070 which is suitable for high resolution HPGe detectors. Our Constant-Fraction discriminators are still state-of-the-art even after a more than 20 Year history. The Differential CFD - Model 7029A - still offers the highest counting rate (>50 MHz) of any such devices. Our Pulse-Shape Discriminator - Model 2160A - can be used to separate neutron and gamma particles, alphas and protons, electrons and alphas etc depending on the detector used.
