Wafer Level Reliability
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Product
Sound Level Test System
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In a world where precision and performance rule, measuring and controlling sound levels can be crucial to the success of your product or project. The team at Integrated Test & Measurement (ITM) have developed a customized solution that not only measures and collects sound-level data, but will help your team identify the specific components causing all that noise.
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Product
Wafer Edge Profile Measurement
WATOM
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WATOM can carry out fully automatic, non-contact measurements of the edge profiles and diameter in accordance with SEMICON standards. A special feature is the system's ability to make measurements of the mark cut into the edge of the wafer to indicate the crystal orientation. Because of its high measurement accuracy of less than 1.5 µm, leading wafer manufacturers across the world use WATOM for shop-floor geometrical quality control.
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Product
Enabling Low Power, High Reliability, And High Performance Design
Lattice Nexus Platform
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The Lattice Nexus FPGA platform combines Lattice’s long-standing low power FPGA expertise with leading 28nm FD-SOI semiconductor manufacturing technology. With this platform, Lattice enables the rapid development of multiple device families that deliver low power, high performance, high reliability and small form factor.
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Product
Wafer Thickness Measuring System
WT-425
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Contact type can measure any materials within 0.2 µm (2 σ at 20℃ ±1℃). The wafer floats positions while measurement points change and it does not damage even thin wafers. Best for the process control of compound wafers and oxide wafers. (SiC, GaN, LT, Sapphire and Bonded Wafers)
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Product
Full Wafer Test System
FOX-1P
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Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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Product
Signal Level Meters
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The SignalScout (SS40) provides fast and accurate measurement of signal strength when tuning an antenna for a local TV channel.
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Product
Digital Level Sensors (DLS) with High-Level Shut-In
Model 2100
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The Model 2100 DLS with High Level Shut-In delivers consistently accurate measurements of different types of fluids in both hazardous and non-hazardous environments. Multiple fluid densities and temperatures do not affect measurement. The DLS with High Level Shut-In effectively measures the level and temperature of a variety of liquids, including Crude oil, Diesel, Kerosene, Condensate, Gasoline, Water, and Others.
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Product
Low Freq. Pneumatic Levelling Mounts
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ACE has a range of low frequency pneumatic levelling mounts under the designations PLM and PAL: they keep high performance and precision machines isolated from vibrations, impacts and force peaks.
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Product
Wafer Flatness Measurement System
FLA-200
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*Measures Thickness, TTV, Bow, Warp and site and global Flatness (ASTM compliance)*Measures all materials including Si, GaAs, Ge, InP, SiC*Full 500 micron thickness measurement range without re-*calibration2-D /3-D Mapping software
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Product
Wafer Chucks
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American Probe & Technologies, Inc.
High Performance Chuck for your needs Introducing the American Probe & Technologies’ HC-6000 series of thermal chucks,
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Product
Wafer ESD Tester lineup
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Hanwa Electronic Ind. Co.,Ltd.
◆Correspond to 300mm Wafer. This tester can measure LED or the large sizes Wafer, such as a system LSI. And Zap of HBM/MM can be performed. The Automatic destructive judging by V/I measurement can also be performed after Zap.◆Waveform guarantee in Zap needles. HED-W5100D carries out the calibration before shipment in the place of Zap needles. Therefore, Correlation of the Result of a Package Device becomes clear easily.◆Correspondence to Standards This Tester corresponds to the Standard of JEITA, ESDA, and JEDEC. A Zap unit adopts the plug-in system and also has the waveform of Customer's requests.◆Connection with TLP This Tester is the best for TLP Testing with deep relation of ESD. The protection circuit of a device with an ESD problem is investigated.
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Product
Board Level CrossLine Generator
BL-CL5400A-11
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Precision CrossLine or Crosshair Generators from MicroImage Video Systems are designed for relative size measuring, positioning and size referencing. The CL5400C series is especially helpful in industrial, metallurgical or forensic applications where comparisons in relative position or size are important.
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Product
Wafer Auto Line Integration
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The line is used for semiconductor wafer grinding. It carries out material matching and distribution, automatic loading and unloading, auto focusing and positioning and many other functions. The grinding precision is 2μm(3-sigma). It is also capable of collecting and analyzing real-time production data and interfacing with MES system.
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Product
Class 1 Sound Level Calibrator
HD2020
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The HD2020 sound level calibrator is a portable, battery operated sound source, suitable for sound level meters (portable and laboratory) and acoustic stations.
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Product
Wafer Level Multi-Die Test System
ITC55WLMD
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The ITC55WLMD series of test systems has been developed by ITC to be stand-alone UIL test systems configured specifically to test on wafer. The systems include an ITC55series UIL tester and inductor box, a current limiter module and a system controller
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Product
Mini Liquid Level Sensor
28090
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The Mini Liquid Level Sensor is made to be inserted vertically into wet environments to detect liquid level from 0 to 1.88” (48 mm) or as an alarm. This sensor has a single analog output which may be directly connected to the Propeller Activity Board 4-channel A/D converter or easily interfaced with the MCP3002 A/D with a FLiP Multicore Microcontroller.
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Product
Customized Semiconductor Wafer Inspection, Sorting & Metrology Equipment | Systems
Customized Solutions
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Unique Needs? Need better wafer inspection throughput, accuracy, versatility? Need a wafer defect inspection expert who’s not a sales person? We’ve been providing complete semiconductor wafer inspection, sorter, and microscopes solutions to semiconductor wafer manufacturers since 1994.
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Product
Class 1 Integrating Sound Level Meter
Castle Sonus GA116I
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The Castle SONUS GA116I is a feature packed instrument that is fully compliant with IEC 61672-1:2002 Class 1, and IEC61252: 1993. This meter gives simultaneous Leq (rms. average) personal exposure (LEpd) and peak measurement for assessments to the Control of Noise at Work Regulations 2005. It has a high-specification, Class 1 measurement microphone and is cased in tough, crack resistant ABS plastic.
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Product
ATSC 3.0 Handheld Signal Level Meter
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Professional ATSC 3.0/1.0 hardware demodulator built in.Full motion video and audio decoding of received channels.Digital RF measurements including average power/level, pre/post BER, MER, spectral analysis and constellation.
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Product
Loop and Line Powered Level Switch
Safety IntelliPoint
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The Safety IntelliPoint level switch provides a capacitance probe level switch with either a current output or relay contacts and “On-Board” self-diagnostics to ensure reliability. This SIL Intellipoint conforms to SIL 2 specifications providing the ultimate in level switch integrity and level sensing elements for a wide variety of temperatures, pressures, and materials.
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Product
Three-Parameter Water Quality Analyzer (three-parameter water level gauge)
HR8833
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HighReach Measuring & Controlling System Co.,Ltd
The HR8833 integrated pressure water level gauge is a three-parameter (water level, water temperature, conductivity) measurement product. It can be used with digital atmospheric pressure meter. It can be externally powered and self-powered by internal battery. It can be The product includes a water level sensor, a temperature sensor and a conductivity sensor, a built-in large-capacity non-volatile memory and a high-capacity long-life lithium battery, For three-parameter hydrological parameter measurement of surface water, groundwater and marine environment.
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Product
Ultrasonic Level Measurement
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Ultrasonic technology is a perfect choice for level applications that require low cost, non-contact measurement of liquids and slurries for level, distance, volume and open channel flow. These products have excellent accuracy and will handle measurements up to 30’.
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Product
Exposure Level Tester
ELT-400
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*Wide frequency range (1 Hz - 400 kHz)*Standard-compliant measurement*Acceptance measurements compliant with CE standard IEC/EN 62233 and Generic Standard IEC 62311*Limit value traces conforming to ICNIRP 1998, 2010 and EMF Directive 2013/35/EU*Real time measurement with RMS and peak detectors*External FFT signal analysis for determining the frequency components via three channel analog output (one channel for each spatial axis) e.g. with the aid of a digital oscilloscope.
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Product
Package Level Test
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Applicable for burn-in, reliability andlife testingACC and APC control modesIndividual channel driving and measurementDriving current 500mA per channel
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Product
Ultra Low Level DC Voltage Amplifiers
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The EM A10 is a low level amplifier module for sensitive measurements, data collection and systems, where signals below 1 nanovolt may be measured. It is ideal for the input unit for precision voltage measuring systems, requiring voltage sensitivity for measuring low noise and low impedance sources. The noise level of the A10 is equivalent to a perfect resistor of about 20 ohms. When used with a digital voltmeter, steady one nanovolt digits may be displayed, with a response time constant of less than a second. The input voltage stability of the A10 is very high, with the drift around a nanovolt per degree C. The input connectors are made from pure copper. The input impedance is very high, and is time dependent, determined by the loop gain.
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Product
Wafer Prober
Prexa MS
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The latest fully automated 300mm wafer prober for memory devices. Featuring high rigidity and exceptional thermal control, the system enables full-wafer contact testing.
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Product
Batch Wafer Transfer Tools
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Dou Yee Enterprises (S) Pte Ltd
Dou Yee Enterprises Batch Wafer Transfer Tools
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Product
Sound Level Meters
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Acoustic Data These definitions are intended simply as an aid to understanding and for this reason, some are not strictly scientifically accurate. For correct formal definitions, consult IEC standards 60651, 60804, 60942, 61252 and IEC 61672: 2003 part 1.
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Product
Vibrating Level Switch
TF 100 Series
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TF-100 Series is a vibrating level switch with TF-L relay output and TF-P transistor output or with TF-T current output.This level switch is designed for reliable indication of clean liquids and light slurries. It is available with Relay, Current, and PNP outputs that can be set to indicate alarm on either high level for spill prevention, or low level for run-dry protection.
