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LifeTest Software
In combination with the extended range of PEC test equipment, LifeTest supports the many specific functionalities required in battery testing labs. Drive cycle simulations (FUDS, DST…), thermal performance tests, high speed pulse tests (HPPT), life cycle tests, accelerated ageing tests and internal resistance measurement tests can be easily configured, scheduled, executed and reported from a single platform.
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Material Testing
*Abrasion Testing*Adhesion Testing*Brittleness Temp.*Bursting Strength*Coating Testing*Coefficient of Friction*Compression Testing*Compression Set*Dart Drop Testing*Density Determination*Fatigue Testing*Fiberboard Testing*Flammability Testing*Flexural Testing*Foam Testing*Hardness Testing*Heat Deflection*Hydrostatic Testing*Impact Testing*Life Cycle Testing*Melt Index Testing*Plastic Testing*Ply Separation*Resin Content*Rubber Testing*Shear Strength Testing*Stress Crack Testing*Tear Testing*Temperature Testing*Tensile/Elongation*UV Exposure*Water Absorption*Wood Testing
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Automotive & Industrial Cycle Testing System
CV
The CV is Bitrode's economical cycle life test equipment for the network based line of battery laboratory equipment. Designed to work with VisuaLCN Lab Client software, the CV provides standard or fully customized charge, discharge and rest cycles for automotive and industrial batteries. The Model CV is also useful for reserve capacity and charge acceptance testing with recharge.
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Fatigue Rated Low Profile Cells
Fatigue rated load cells are specifically designed for component durability and fatigue test machines where highly cyclical loading is present. These rugged load cells are extremely resistant to extraneous bending and side loading forces. They are used for material testing, component life cycle testing and structural testing. All fatigue rated load cells are guaranteed against fatigue failure for 100 million fully reversed cycles.
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Test Executive & Development Studio
ATEasy
ATEasy is a test executive and a rapid application development framework for functional test, ATE, data acquisition, process control, and instrumentation systems. ATEasy provides all the necessary tools to develop, deploy and maintain software components - including instrument drivers, test programs, and user interfaces, as well as a complete and customizable test executive. It is designed to support and simplify ATE system applications with long product life cycles. With ATEasy, test applications are faster to generate and easier to maintain.
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Life Cycle & Fatigue Testers
Switches can use all these operations. Membrane switches, keyboards and keypads will all require a push with a known force. On/Off switches will combine a push and a pull or possibly push on, push off. A rocker switch and toggle switches will require a push in two different places. Rotary switches (and volume controls, potentiometers) need to be rotated clockwise and counter clockwise The standard life cycle and fatigue tester the B886 Simon System has been designed for life cycle and fatigue testing of switches, membrane switches, keyboards and keypads. It contains all the components needed to life and fatigue test a products that need to be pushed. We can also supply different actuators for a push, pull, rocker, toggle, volume control or rotary switch.
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Electric Vehicle Battery Cell Tester
MCV
The MCV is a low-current life cycle test system for development of primary and rechargeable batteries in various chemistries. Operating from a common microprocessor, multiple circuits in the MCV module can run individual test programs. Additionally, the MCV is designed and built for ease of maintenance and service. The modular construction means that most subassemblies, large or small, remove easily for service outside the cabinet and fast replacement.
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Accelerated Product Life Cycle
Delserro Engineering Solutions
Under normal conditions it may take years to gather failure data on the life cycle of new products. Through accelerated life testing the overall time to failure can be reduced to weeks by increasing the frequency of the field loads and by removing insignificant stress components. In addition, life cycle testing on a product can be reduced or accelerated dramatically by increasing the stress levels to higher than normal. Putting a product through Accelerated Life Testing can reduce test time from weeks to days while still achieving satisfactory results saving both time and money.
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Milliampere-Level Test System
Shenzhen Sinexcel RE Equipment CO., Ltd
mA class battery test system, mainly used for battery material research, high-precision test, pulse charge and discharge test, DCIR test, cycle Life test. It provides powerful testing equipment for research institutions, universities and experimental centers of battery production enterprises
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Full-Featured Life Cycle Test System
LCV
Configurations for testing to industry standards: IEC, SAE, BCILife Cycle Testing: Perform charge/discharge cycling of batteries or modules to obtain charge and discharge capacity, energy and DC internal resistanceAutomotive Battery TestingStarting, Lighting and Ignition (SLI) TestingTraction Battery Testing
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Lifecycle Test System
Model 933
The Model 933A Life Cycle Test System is a low cost, generic test platform used to perform cycling of keypads, keyboards, membranes, switches, or any product requiring fatigue testing.
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DC Power Supply
62000H Series
The 62000H Series includes 14 different models ranging from 5KW to 15KW, with current range up to 375A and voltage range up to 1000V. The 62000H can easily parallel up to ten units capable of 150KW with current sharing for bulk power applications, for example, battery bank simulation of 450V/150A/67.5KW for electric vehicle and military use. There are 100 user programmable input status on the front panel for automated test application and life cycle ON/OFF test. In addition, the 62000H has a 16 bit digital control with bright vacuum fluorescent display readout. The 62000H series DC power supplies are very easy to operate either from the front panel keypad or from the remote controller via USB / RS232 / RS485 / APG (Standard) and GPIB & Ethernet (optional). Its compact size with 3U only can be stacked on a bench in a standard rack without any difficulty.
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Test Workflow Standard
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Semiconductors Testing
Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Cable Free ATE
CABLEFREEATE
Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
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Automated Aerospace and Defense Test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Explosive Test Site Range Instrumentation
Firesets, CDU’s EDU’s, Delay generators, firing panels, and custom instruments. Fiber-optic and computer-control options.
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Test System Optimized for High Volume Production Testing of Integrated Circuits
ETS-364 / ETS-600
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture. The test system offers separate floating resources for each site, improving site isolation and measurement accuracy coupled with digital instrumentation enabling the most efficient, high-volume testing available. The system supports up to 240 analog pin channels, and offers 133 MVPS digital vector rate with up to 128 digital pin channels. Eagle's scalability includes the ability to double the capacity of an ETS-364, providing more than 480 analog pin channels and up to 256 digital I/O pin channels with the ETS-600.
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Dielectric Test Fixture
16451B
The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
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Semiconductor Test Software
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Off-Line Testing Platform
6TL22
The 6TL22 Platform is a perfect base for the conception of a real modular Automatic Test Equipment for low to mid manufacturing volumes.A system designed around the 6TL22 is simple, easy to maintain, and cost-effective. The rack is prepared for the direct integration of the three platform-based receivers from Virginia Panel, the S6, G12 and G12X.The core of the system can be either an Industrial PC or a NI-PXI. A UPS will protect the valuable instrumentation as well as control all the steps for an automatic power-up and down of the test system.
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In-Circuit Test System Rentals
Forwessun offers flexible test system rental options to meet short-term or seasonal testing demands. Our rental systems are rigorously tested for reliability and performance, giving you access to high-quality equipment without the need for a full purchase commitment. Customised rental agreements allow you to return the equipment when it’s no longer required, providing an ideal solution for scaling up production or filling in during periods of high demand.
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Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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NI's Wireless Connectivity Functional Test Solution
The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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FPD Tester Model
27014
Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
