Mapping
See Also: Wafer Mapping, Survey
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Azure Purview
Unified data governance to maximize the business value of data. Azure Purview is a unified data governance service that helps you manage and govern your on-premises, multicloud, and software-as-a-service (SaaS) data. Easily create a holistic, up-to-date map of your data landscape with automated data discovery, sensitive data classification, and end-to-end data lineage. Empower data consumers to find valuable, trustworthy data.
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Thermal Image Analysis Software
Thermalyze
Thermalyze software provides a stable platform from which to perform sophisticated temperature analysis and failure analysis testing. Tools such as Emissivity Tables allow you to perform true temperature mapping on the surface with varying emissivity. Lock-in thermography tests enable you to detect heating below 0.001°C.
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Smart Sensorgrid NG
Smart Sensorgrid belongs to the smart sensor family devised for on-line monitoring of diagnostic quantities in electrical assets. It provides traffic-light alerts to SCADA systems / asset and maintenance service. Smart Sensorgrid is a state-of-art PD analyzer, exploiting the TECHIMP T-F Map technology (patented). Such feature allows noise rejection and automatic alarm warning based on amplitude and repetition rate trend relevant to statistical parameters. The PD sensor, a HFCT, is integrated in the smart sensor body.
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High-Performance Surface Plasmon Resonance System
SPR-32
Features like ‘Frame Inject’ allows for turn-key sample processing protocols and customized workflows created together with pharmaceutical customers. The faster data analysis and highly intuitive user interface combine to deliver an industry-leading SPR throughput of 10,000 control-substracted binding measurements. Combining flexible 8-needle sample delivery with a 32-sensor detection array laid out in 8 detection flow cells, enables 4 sensors per flow cell, an important advantage for controlled, high-throughput SPR methods. The patented Hydrodynamic Isolation™ technology enables ‘Any Sample, Any Sensor, Any Time’, making it the preferred platform for screening, kinetics, thermodynamics and epitope mapping for pharmaceutical applications.
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Software For Data Analysis
Imc FAMOS
Data source managementVisualization of measurement data at your fingertipsFull range of analysis functionsReport generation with direct PDF outputQuickly analyze large data sets with 64 bitMulti-layer macro creationProject managementLink data with dynamic maps or video
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Failure Analysis And Magnetic Imaging Services
Micro Magnetics offers failure analysis services on a contractual basis. We maintain two current density metrology systems at our headquarters in Fall River and can produce maps of current flow in a wide variety of ICs and packages, usually with initial results delivered within 48 hours. Our engineers will work closely with you to understand and interpret the results in order to determine the root cause of the failure.
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Hydrogen Testing Solutions
The widespread introduction of hydrogen is a necessary and essential part of the path to a climate-neutral future. AVL is ideally equipped to support and help shape this transfer. In terms of content, we provide extraordinary expertise in the fields of engineering, simulation and testing and act as a reliable innovation and development partner. With our test solutions, we support you specifically with your challenges, from development, through industrialization, to further operation. Depending on the technological maturity of your product, the test solutions offer you full flexibility within the planned development tasks or a customized proportion of supporting and automated functions, if quality assurance in the production environment is involved. The guarantee of safe operation is obligatory and is of course also mapped.
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4X14 Gb/s QSFP/QSFP+ Evaluation Board
EV-QSFP-174
The EV‐QSFP‐174 QSFP/QSFP+ Host Test Board comes complete with Windows based software (Windows XP & above) to enable intuitive memory map programming and testing, controlled via a mini B USB port. It is designed to simulate an ideal environment for QSFP/QSFP+ transceiver module testing, characterization and manufacturing test. Its high speed properties make the host board as electrically transparent as possible, allowing for a more accurate assessment of the module’s performance.
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DataComm
SCHILLER AUTOMATION GmbH & Co. KG
With ever-growing performance, accuracy, and precision required by 112G/800G PAM4 solutions, Wilder has designed a robust HCB and MCB fixtures to support OSFP-XD, QSFP-DD, OSFP and SFP-DD compliance testing. In addition, CMIS_GUI Software provides: Displays of many of the settings and Controls in the Module including Lane States, Module Power States and Optical Power. Alarms and Warnings for Module Temp and Vcc and Optical Power Controls for Module Power, Margins, and read access to Descriptors and Data Path Configuration. Direct Read/Write access to the I2C and CMIS Memory Map as well Scripts that directly access the CMIS Memory Map Registers.
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Advanced 4-CH Encoder Card with High-speed Triggering Function
PCI-8124-C
PCI-8124-C is a 4-CH trigger board which is suitable for advanced line scan application which need high line rates. PCI-8124-C has internal FIFO to realize the high speed position compare and trigger pulse output. For this application, ADLINK proposes you can use PCI-8134 and PCI-8124-C together to gain the advantage of motion control and high speed trigger function. For position compare, PCI-8124-C provides two method: linear function or variable interval. PCI-8124-C also provides the variety of mapping function between comparator and trigger output. The comparator condition can be associated with latch signal, TTL input and EA/EB signal.
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Multibeam Echosounder - Shallow Water
SeaBat T20 MotionScan
The SeaBat T20 MotionScan is a tilted head 350° rotational configuration based on the renowned and compact SeaBat T20 high-resolution multibeam echo sounder. Installed on a dredge barge the SeaBat T20 MotionScan will, literally at the push of a button, map the work progress in seconds – saving contractors both time and money. As a part of the modular SeaBat T-series, the T20 MotionScan can also easily be reconfigured to more traditional survey tasks.
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MIL-STD-1760
M4K1553Px(S)-1760
The M4K1553Px(S)-1760 interface module for the multimode, multiprotocol, Excalibur 4000 family of carrier boards provide a complete solution for developing and testing MIL-STD-1760 interfaces and performing system simulation of the MIL-STD-1760 bus. The module handles all standard variations of the MIL-STD-1760 protocol.Each M4K1553Px-1760 multi function module contains 64K bytes of dual-port RAM for Data blocks, Control registers, and Look-up Tables. All Data blocks and Control registers are memory mapped, and may be accessed in real time. Each of the independent dual redundant M4K1553Px-1760 modules may be programmed to operate in one of three modes of operation: Remote Terminal, Bus Controller/Concurrent-RT, and Bus Monitor. In addition, modules 1 and 3 can be programmed to operate as Concurrent monitors, to modules 0 and 2 respectively.
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XYZ Bootstrap Directional Gyroscopes
4000H-series
Sigma Tek's Directional Gyro with heading synchro output provides a cost effective link to "bootstrap" other instruments requiring heading information for: display orientation to aircraft heading, heading stabilization functions, and other navigational calculations and/or solutions. Specific applications include: Argus Moving Map Display®, L-3 Avionics Stormscope®, and Insight Strike Finder®.
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RANGER-ULTRA
The RANGER-ULTRA is an airborne laser scanner with an impressive combination of weight, range, accuracy and pulse rate. It is equipped with a unique forward and rear looking FOV designed to minimize laser shadowing and provide geometry on complex vertical structures on a single pass. With its wide field of view of 100 degrees and an extremely fast pulse repetition rate of up to 1.8 MHz, the RANGER-ULTRA is perfectly suited for high point density corridor mapping applications such as power line, railway track and pipeline inspection.
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Chip Obsolescence Solutions
Solve component obsolescence problems with an Ironwood adapter and an alternate device. Adapters convert the pinout of an alternate device to maintain compatibility with an existing footprint – no need to redesign a new circuit board. Very often, these adapters (called Package Converters) are a simple 1:1 pin mapping from the new package to the old. Here are a few examples of package converters and how they can solve chip obsolescence issues.
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BlueViewer Software
Quickly view .xyz 3D point clouds filesTake accurate point-to-point measurementsSupports a variety of color maps including jet, gradient, and intensityOverlay multiple point clouds
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High Speed VNIR/SWIR Hyperspectral Imager
Compact VNIR/SWIR HSI sensor compatible with small rotary wing UAS operation with application to disturbed earth detection and vegetation/mineral mapping
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X-ray Fluorescence, XRF Analysis Services
Two XRF systems are available, a wavelength dispersive system (WDXRF) and an energy dispersive system (EDXRF). The difference is the manner in which the x-rays are detected. WDXRF instruments have very good energy resolution which leads to fewer spectral overlaps and improved background intensities. EDXRF instruments have higher signal throughput which can shorten analysis times. The higher signal throughput also makes EDXRF systems suitable for small spot or mapping analysis.
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Automated Calibration
ORION
ORION automates the process of characterization and calibration of engines. It facilitates the calibration process by taking control of both the ECU calibration system and the test cell control system to run experiments as part of an automated calibration process. With connectivity to IAV’s EasyDOE, Mathworks’ MBC Toolbox and other DOE tools, ORION provides an extremely powerful environment for mapping an engine and generating the Engine Management System calibration tables. The modular design means the product can be configured to a users’ specific requirements and work practices, rather than having to adhere to rigid methodologies dictated by prescriptive software.
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Network Performance Monitor
*Multi-vendor network monitoring*Network Insights for deeper visibility*Intelligent maps*NetPath and PerfStack for easy troubleshooting*Smarter scalability for large environments*Advanced alerting
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Testing for Si Solar Cells Using High Performance CCD
EL Imaging Tester
EL Testing for Si Solar Cells using High Performance CCD. The determination of luminescence (photo emissions) in solar cells is an important characterization tool. Typical solar cells often have defects which limit the efficiency or lifetime of a cell. Many of these defects are visualized with Luminescence Imaging. By using this technique, the manufacturing process can be optimized to produce better cells. Luminescence Imaging takes advantage of the radiative inter-band recombination of excited charge carriers in solar cells. The emitted photons can be captured with a sensitive CCD camera to obtain an image of the distribution of the radiative recombination in the cell. This distribution is determined by the local excitation level, allowing the detection of electrical losses, thus mapping the diffusion length of minority carriers as the emitted light is low intensity and in the near infra-red range, the CCD camera has a high sensitivity wavelength from 900 to 1100 nm with little thermal noise. This CCD camera provides excellent resolution of 1024 x 1024 pixels with a large 1μm pixel size, multi-megahertz readout speed, and robust USB 2.0 connectivity. The EL CCD Camera is the ultimate high-performance CCD camera for electroluminescence and photoluminescence imaging for Photovoltaic (PV) Cells and Modules. This camera combines low noise electronics and optimal sensitivity in NIR.
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Inspector
Inspector BLE
*Inspector BLE works with smart phones and computers across all the platforms.*Log and Map Data*Share Data with RadResponder, Safecast, the World, or create your own Private Network
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Wafer & Die Inspection
SemiProbe wafer inspection system (WIS) examines, locates and identifies defects created during wafer manufacturing, probing, bumping, dicing or general handling. This provides microelectronic device manufacturers with accurate, timely quality assurance and process information. The WIS has single sided and double sided wafer mapping capabilities and can improve efficiency, reduce manufacturing costs, increase yields and shorten time to market.
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Turnkey NDT Corrosion Inspection Services
Robot-enabled ultrasonic inspection that produces thickness grid maps to identify areas where corrosion and other damage mechanisms have caused wall-thinning.
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Text-Based Way to Connect & Disconnect Relays on ABex Modules
ABex Switching
The ABex Switching features a text-based way to connect and disconnect relays on ABex modules. Alias names for channels could be defined in a DUT specific topology file and then be used for text-based switching. These alias names are also shown in the Konrad System Manager allowing easy debugging of test sequences. The ABex Switching functionality could be either used out of NI Teststand with the provided test steps or via API from other programming languages.- Text-based switch routes- XML based topology for Alias mapping- Switch routes with support for Alias names- Seamless integration into Konrad System Manager
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Geospatial Information Solution
Geospatial information solution that uses radio frequency (RF) technology to help monitor global activity across air, land and sea and assist with emergencies. It will collect information on specific radio signals worldwide to provide high-precision radio frequency mapping and analytics that we can customize to our clients’ needs.
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Universal CMM Software Module
Verisurf CMM
Plug and play CMM communication for Hexagon Dea, Leitz, Mitutoyo, Wenzel, Pantec, Nikon, LK or Zeiss™️ machine controllers, as well as Renishaw, Tesa, Hexagon Leitz or Zeiss™️ head controllers.Optional support for scanning probes and error mapping compensation for geometric, volumetric, orientation, positioning and kinematic errors in the CMM structure that affects accuracy.
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Epi Thickness & Composition System
Element
The Element system is the tool of record for wafer suppliers for high speed impurity mapping and epi thickness measurement. It is the only tool on the market with the unique combination of transmission and reflection based technology. This system is the industry standard for dielectric monitoring.
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Bow and Global Film Stress Measurement
128 Series
Bow and Global Film Stress Measurement.Non-contact full wafer stress mapping for semiconductor and flat panel application.Dual Laser Switching Technology.
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HydroRANGER Series
The HydroRANGER is an evolution of mapping technology. This Airborne Topo-Bathymetric (ATB) system provides dual purpose topographic and bathymetric measurements for full scene mapping of shoreline systems. Utilizing a visible green spectrum laser with an elliptical scan pattern and measurement rates up to 200 kHz, the HydroRANGER provides a combination of high spatial resolution and spatial accuracy.
