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- Pickering Interfaces Inc.
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Surface Mount Reed Relays from Pickering Electronics
Pickering Electronics Surface Mount Reed Relays contain the highest quality instrumentation grade reed switches making them suitable for the most demanding applications and are suitable for infra-red or vapor phase reflow soldering.
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Surface Analysis
Bruker Nano Surfaces provides industry-leading surface analysis instruments for the research and production environment. Our broad range of 2D and 3D surface profiler solutions supply the specific information needed to answer R&D, QA/QC, and surface measurement questions with speed, accuracy, and ease. Bruker’s AFMs are enabling scientists around the world to make discoveries and advance their understanding of materials and biological systems. Our tribometers and mechanical testers deliver practical data used to help improve development of materials and tribological systems.
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Profilometer
NANOVEA Optical Profiler is a 3D, non-contact profilometer designed with Chromatic Confocal technology, which uses wavelengths of light to accurately determine physical height. The Optical Profilers NANOVEA offers include compact, stand-alone and portable profilometer models. High-speed sensors are available to scan large surface at high accuracy.
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3D Profilers
AEP Technology offers different kinds of 3D profilers. Rugged platform, advanced electronic equipment, clean test space, low carbon emission, low machine noise, high-end lens, etc., make our surface profiler unique in the imaging world. In addition to providing stand-alone contact 3D profilers and optical 3D profilers, we also provide the world's only cross-platform, dual-mode 3D profiler that is compatible with both tactile and optical profilometers.
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Surface Analysis
Bruker Nano Surfaces provides industry-leading surface analysis instruments for the research and production environment. Our broad range of 2D and 3D surface profiler solutions supply the specific information needed to answer R&D, QA/QC, and surface measurement questions with speed, accuracy, and ease. Bruker’s AFMs are enabling scientists around the world to make discoveries and advance their understanding of materials and biological systems. Our tribometers and mechanical testers deliver practical data used to help improve development of materials and tribological systems.
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Optical Profilometers
Profilm3D® and Zeta™ optical profilometers provide fast, easy, non-contact solutions for 3D surface topography measurements. Our portfolio of optical profilers supports a variety of measurement techniques, including white light interferometry, True Color imaging and ZDot™ confocal grid structured illumination. KLA Instruments can help guide you to the right optical profiler solution for your unique needs.
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Stylus Profilometry
Dektak®
Bruker's Dektak stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. Dektak surface profilers have been widely accepted as a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.
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Robotic Vehicle Gap / Flush Measurement System
Automation
LaserGauge® Automation is a robotic system for measuring vehicle gap/flush on a moving assembly line. It is cost-effective, fast, flexible, and delivers LaserGauge® accurate measurements. Utilizing the Cross-Vector scanning and Blue Laser Technology, the system provides more assembled-panel surface information than any other robotic laser profiler.
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Multi-Surface Profiler
Tropel® FlatMaster® MSP
The Tropel® FlatMaster® MSP (Multi-Surface Profiler) is a frequency stepping interferometer that provides fast and accurate metrology for semiconductor wafers up to 300mm in diameter. In seconds up to 3 million data points are collected with sub-micron accuracy enabling total thickness and flatness characterization over the entire surface.
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Non-contact Optical Surface Profiler
VS-OSP
The VersaSCAN OSP integrates the Base with a high-accuracy, high-speed laser displacement sensor. The OSP technique uses diffuse reflection mechanism to measure topography of a sample. OSP can be used to measure topography, as a very sensitive leveling mechanism, or charting topography to be implemented with other scanning probe techniques for constant-distance mode operation.
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3D Optical Profilers
ZYGO's 3D Optical Profiler instruments enable precise, quantitative, ISO-compliant, non-contact surface measurement and characterization of micro- and nano-scale surface features, capturing up to two million data points in just seconds. Applications range from topography and waviness to roughness and microstructure characterization on samples as that vary from ultra-smooth sub-angstrom optical surfaces, to extremely rough and diffuse 3D printed surfaces.
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3D Optical Surface Profiler
NewView™ 9000
The NewView™ 9000 3D optical surface profiler provides powerful versatility in non-contact optical surface profiling. With the system, it is easy and fast to measure a wide range of surface types, including smooth, rough, flat, sloped, and stepped. All measurements are nondestructive, fast, and require no sample preparation.
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Surface Profiler Measurement System
SP series
SP series, high accuracy 3D surface profiler measurement system with white light interferometry.
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High Resolution Thickness & Surface Profiler for as-sawn Wafers
MX 70x
The MX 70x series measure Thickness, Warp, Waviness, Roughness and are usable for nanotopography.
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Surface Profilers
Taylor Hobson offers a world leading range surface form, surface finish and metrology solutions for 3D contour,ideal for the most demanding applications.
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MiniCTD Profiler
The miniCTD has been developed to provide a cost-effective tool for the collection of CTD Profiles, without compromising the quality of the data.
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Water Current Profiler
ADP
The SonTek/YSI ADP (Acoustic Doppler Profiler) is a high-performance, 3-axis (3D) water current profiler that is accurate, reliable, and easy to use.
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Humidity And Temperature PROfilers
RPG's profiling radiometers are mainly used to derive vertical profiles of atmospheric temperature and humidity (RPG-HATPRO). The infrared radiometer extension allows to cloud base height and ice cloud detection.The radiometer series covers high-resolution temperature profiling of the boundary layer and low-humidity applications. All models of the series provide accurate total amounts of atmospheric water vapor and cloud liquid cloud. RPG radiometers are stand-alone systems for automated weather-station use under nearly all environmental conditions. A variety of retrieval algorithms (custom designed and global standard algorithms) can be selected.
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Wave Profiler
The Wave Profiler allows the user to measure non-directional wave parameters continuously for long periods of time with high temporal and spatial resolution in deeper water from the safety of an underwater mooring. The instrument is particularly useful for clients who need to measure long-period waves (such as rogue waves or infra-gravity waves), waves in wash and in wakes, and non-linear waves.
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Thermal Profiler
SPS Smart Profiler
The SPS Smart Profiler stands out as the best and “smartest” temperature profiling data collection system available. The hardware is the best in temperature tolerance design using an LCP (Liquid Crystal Polymer) enclosure for better protection and faster cool down between profiles. The design of the SPS thermal shields allows for easy and secure opening and closing, durability that meets the most stringent of drop tests, and temperature tolerance capabilities that exceed all previous KIC profiler and shield models.
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Thermal Profiler
KIC K2
The latest-generation mobile-friendly profiling technologyThe KIC K2 Thermal Profiler features a compact and robust design that allows it to fit through the tight, heated chambers of lead-free reflow ovens. A plug-and-play hardware and graphical user interface makes profiling both quick and easy. The profile data measured by the K2 can now be viewed on either a PC or on a mobile device using the Profile Viewer App.
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Multibeam Profiler Sonar
MB1350-N
At 1.35 MHz, the MB1350 delivers 3D profile data at levels more akin to a laser line scanner than today' low frequency bathymentry systems. Mountable on Boats, ROVs, UUVs, and Tripods, BlueView's MB1350 is the right tool to take your operation into the next generation of 3D bottom and structure mapping.
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Surface Analysis
A UHV surface analysis system for thin film depth profilingMeasures the surface composition of the first few nanometers and/or micrometers depth of solid samples.
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Surface Roughness
Surface Roughness: these consist of a stylus attached to an arm which moves over the surface to record and measure the roughness over a specified distance, recording peak-to-valley average.
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UV-NIR Beam Profiler
CinCam
CINOGY Technologies CinCam is optimized to provide excellent sensitivity from the UV to NIR spectral range involving CCD/CMOS/InGaAs technologies. Thanks to its high resolution and its small pixel size, the CinCam ensures the highest accuracy in laser beam analysis of cw and pulsed laser systems. The plug and play design facilitates easy and flexible adaption to standard optical components.
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Surface Profile
Surface profile: The degree of profile on the surface affects a coating’s overall performance and determines aspects such as adhesion, coverage and overall volume of coatings used. If the profile is too large the amount of coating required increases, otherwise there is a danger that the peaks remain uncoated - allowing rust spots to occur. If the profile is too small there may be an insufficient key for adequate adhesion.
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Battery Emulator And Profiler
E36731A
The Keysight E36731A battery emulator and profiler is an integrated electronic load and power supply developed to use with Keysight PathWave BenchVue battery emulation software. An emulated battery gives you a known good reference for testing at any charge level. Quickly assess the effect of design or software changes on battery life by emulating any battery charge state. Leverage emulation and precise current drain analysis to achieve longer battery life or to reduce the size of your device.
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Surface Analysis
Innova-IRIS
This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.
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Surface Resistivity Meter
395
The ACL 395 handheld meter features sophisticated circuitry that allows for the same advantages as megohmmeters, but at an economical price. Utilizing color-coded zones, the LED scale is easy to read and evaluate. Half decades indicate where the measurement value falls within the decade giving a closer indication to actual value. Unlike other pocket-sized meters, the ACL 395 features rubber rails which provide the best possible contact.
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Surface Profile Gauge
123
The Elcometer 123 Surface Profile Gauge is an easy to use analogue gauge which measures the peak-to-valley height of a blast cleaned surface in a similar way to the Elcometer 224 Digital Surface Profile Gauge.
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Surface Resistance Meter
Wolfgang Warmbier GmbH & Co. KG
Starterkit for testing conductive an dissipative surfaces and electrostatic fields/surface potentials
