Scattering
a propagating wave or moving particle's linear trajectory, interrupted by non-uniformity in the medium they move through.
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Dynamic Light Scattering (DLS)
NANOTRAC
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Dynamic Light Scattering (DLS) is an established and precise measurement technique for the characterization of particle sizes in suspensions and emulsions. Microtrac is a pioneer of particle analysis technology and has been developing optical systems based on Dynamic Light Scattering for over 30 years.
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SERS (Surface Enhanced Raman Scattering) Substrate & SERS Reader – Mini Chemistry Analytic Pack
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The porous carbon SERS substrate provides not only high signal enhancement due to its strong broadband charge-transfer resonance for large chemical enhancement (as opposed to electromagnetic enhancement in traditional metal-based SERS substrates), but also extraordinarily high reproducibility or substrate-to-substrate, spot-to-spot, sample-to-sample, and time-to-time consistency in SERS spectrum (which is not possible with traditional metal-based SERS) due to the absence of "electromagnetic hot spots" by making the entire surface of the substrate "chemically hot", high durability due to no oxidization, and high compatibility to biomolecules due to its fluorescence quenching capability.
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Multi-angle Polarized Light Scattering Measurements
LISST-VSF
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The LISST-VSF covers the angular range from 0.094 to 150°. Of this, the range 0.094 to 14.9° is covered with Sequoia’s 32-ring detector optics as in the LISST-200X. From 15 to 150° scattering from the length of a laser is viewed by a rotating eyeball. These data produce P12 and a noisy estimate of P22 (no P22 estimate at 45 and 135°).
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Multi-Angle Light Scattering Detector
PN3621
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Since the 1990s Postnova has been a leading innovator and developer of special advanced online Light Scattering solutions for coupling with chromatographic separation systems. The first model was the PD2000 - Static Light Scattering detector for coupling with Asymmetric Flow FFF. Later on the models PN3020 SLS and PN3070 MALS have been launched. Based on these over two decades of practical experience, Postnova has collected a unique competence in the area of Laser Light Scattering and has developed the unique PN3621 MALS - Multi-Angle Light Scattering detector series. The model PN3621 MALS is a completely new type of high performance MALS detector system with a unique range of specifications.
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Small-Angle X-Ray Scattering (SAXS) Products
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Small-Angle X-Ray Scattering (SAXS) Products from Rigaku
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Diffractometers & Scattering Systems
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Bruker develops and manufactures analytical solutions for X-ray diffraction and scattering. Our innovative instruments and software support research, development and quality control in academia, governmental institutions and industry.
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Deep Submersible Particle Size Analyzer
LISST-Deep
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The LISST-DEEP instrument obtains in-situ measurements of particle size distribution, optical transmission, and the optical volume scattering function (VSF). Using a red 670nm diode laser and a custom silicon detector, small-angle scattering from suspended particles is sensed at 32 specific log-spaced angle ranges. This measurement is post-processed to obtain sediment size distribution, volume concentration, optical transmission, and VSF. The electronics and optical configuration in the LISST-DEEP are very similar to Sequoia’s workhorse, the LISST- 100X. However, because of the extreme difficulty associated with keepingalignment under high pressure, the LISSTDEEP hardware design is radically different from the LISST-100X. This allows the LISST-DEEP to be deployed down to 3000 m and obtain reliable measurements of the in situ particle size distribution and volume concentration in waters with optical transmission up to 98.5%.
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Isolators
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Optical isolators transmit light in only one direction. These devices are especially beneficial in preventing back-reflection and scattered light from reaching sensitive components such as lasers.
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Product
3D Electromagnetic Simulation Software
XFdtd®
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A full-featured simulation solver, XFdtd outpaces other methods in efficiency as the number of unknowns increases. XF includes full-wave, static, bio-thermal, optimization, and circuit solvers to tackle a wide variety of applications, including antenna design and placement, biomedical and SAR, EMI/EMC, microwave devices, radar and scattering, automotive radar, and more. It also works with Remcom's ray-tracing products to provide thorough simulation capability at the low-, middle-, and high-end of the electromagnetic spectrum.
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Sample Analysis Services
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Postnova Analytics offers a variety of unique sample analysis services for the characterization of biopolymers, proteins, liposomes and nanoparticles. Our European Application Laboratory Center EAC and our American Application Laboratory Center AAC represent the worldwide biggest and most advanced labs offering sample analysis services based on Field-Flow Fractionation and Light Scattering.
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Benchtop Small Angle X-ray Scattering (SAXS) Instrument
NANOPIX mini
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Non-destructive measurement of particle size and size distribution.Rigaku NANOPIX mini is the world’s first benchtop small angle X-ray scattering (SAXS) system that is engineered to deliver automatic nanoparticle size distribution analysis for both quality control (QC) and research and development (R&D) applications. Nanoparticle size, size distribution, and particle shape are the key pieces of information obtained from SAXS. Samples may range from solutions, suspensions or slurries to solid plastics, rubbers or polymers.
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Light-resistant Integrating Sphere
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The integrating sphere is used for total luminous flux measurement. It uniforms the light by spatially integrating the collected light of light source. The integrating sphere has highly reflective diffusing plates formed on the spheres internal surfaces. These plates repeatedly scatter light rays from the light source with in the sphere to all other points to deliver uniform brightness distribution so measuring a portion of that light gives the total luminous flux. These years, the usage of integrating sphere for total luminous flux evaluation of light source is increasing. The large size integrating sphere over 1.5M is required for measuring a high brightness light source and a long light source such as fluorescent light.
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Gloss & Reflectance
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Visual appearance can determine a person’s perception of a product. Colour and Gloss are two key parameters that are used to define a product’s overall quality. Perception is subjective, but Elcometer’s range of gloss meters, DOI meters and colour assessment equipment can quantify appearance measurement. The ability of a surface to reflect light without scattering is known as gloss. Using a gloss meter, gloss is measured by directing a constant intensity light beam at a fixed angle to the test surface and then by monitoring the amount of reflected light at the same angle. Different surfaces require different reflective angles.
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Laboratory And Analysis Systems
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High performance UV-VIS-IR spectrophotometer with superb optical performance for the determination of spectral absorption coefficient and spectral effective scattering coefficients
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Modular SEC system
SC2000
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The new Postnova SC2000 Modular SEC system offers unrivalled flexibility in Advanced SEC/GPC analysis. It is the first truly modular multi-detector SEC system available allowing flexible access to a wide range of applications. The system incorporates state-of-the-art detection technologies including light scattering (MALS > multi-angle light scattering) for absolute molecular weight and Viscosity detection for structural and conformational data. Many other detector and accessory options and combinations are available to build a system uniquely tailored to your application requirements, with the benefit of modularity to allow easy future expansion. In addition, the SC2000 can be further expanded to include FFF modules to widen the application range and allow both SEC and FFF separations to be carried out on the same sample within one instrument platform.
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EMORAL LiDARESA Mobile Raman
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The EMORAL LIDAR observations at the PolWET site in Rzecin, Poland, on 10 June 2019. The scattering ratio (top), quasi-particle depolarization ratio (middle), and backscatter colour ratio (bottom) derived at 532 nm with 30 m spatial and 30 s temporal resolutions
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Particle & Molecular Size/Charge Analyzers
Zetasizer Range
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Instruments in the Zetasizer range are used to measure particle and molecular size from less than a nanometer to several microns using dynamic light scattering; zeta potential and electrophoretic mobility using electrophoretic light scattering; and molecular weight using static light scattering. The Zetasizer system is available in a range of variants, including the new Zetasizer Pro and Ultra. These two new systems offer unprecedented ease-of-use and flexibility, along with empowering user guidance and novel measurement techniques such as MADLS® and Particle Concentration.
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Present Weather Sensors
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Bristol Industrial & Research Associates Ltd
Biral forward scatter Present Weather Sensors measure visibility and report precipitation type and intensity. These compact sensors can identify a wide range of precipitation types including drizzle, rain, snow, hail, freezing rain and other forms of frozen precipitation. Precipitation type is reported using a combination of WMO Table 4680 and METAR codes. The range of precipitation types identified varies with sensor model.
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Physical Contact Connectors
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Amphenol Fiber Systems International
Physical Contact (PC) connections are characterized by the physical mating of two optical fibers. Precision ceramic ferrules are typically utilized for PC connections. A PC connection is accomplished by terminating the optical fiber into a precision ceramic ferrule. Epoxy is used to affix the fiber into the ferrule. The tip of the ceramic ferrule is polished in a precise manner to ensure that light enters and exits at a known trajectory with little scattering or optical loss. Polishing the terminated ceramic ferrule is a critical process in Physical Contact fiber optic connectors.
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Product
Vector Network Analyzer
SNA5000A
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The SIGLENT SNA5000A series of Vector Network Analyzers have a frequency range of 9 kHz to 8.5 GHz, with 2 and 4 port models available. Designed to give you instant insight into scattering, differential, and time-domain measurements. They are effective instrumentation for determining the Q-factor, bandwidth, and insertion loss filters and feature impedance conversion, movement of measurement plane, limit testing, ripple test, fixture simulation, and adapter removal/insertion adjustments. There are five sweep types: Linear-Frequency, Log-Frequency, Power-Sweep, CW-Time, and Segment-Sweep mode. The SNA5000A series VNAs also support scattering-parameter correction of SOLT, SOLR, TRL, Response, and Enhanced Response for increased flexibility in R&D and manufacturing applications.
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Vector Network Analyzer
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SIGLENT Vector Network Analyzers have a frequency range of 9 kHz to 8.5 GHz, with 2/4-port models that can quickly deliver reliable scattering, differential, and time-domain parameter measurements.
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Product
kSA SpectR
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The kSA SpectR is a complete metrology solution for measurement of absolute spectral reflectance, growth rate and end point detection. Custom spectral features such as reflectance minima, maxima, inflection points, or baseline scatter level, over a user defined wavelength range of interest, are easily measured.
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Static Multiple Light Scattering (SMLS)
TURBISCAN
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Static Multiple Light Scattering (SMLS) is an optical method that allows for the direct characterization of native concentrated liquid dispersions. Microtrac’s TURBISCAN range uses this technology to provide accurate and rapid results. TURBISCAN was the first patented technology to provide tools that allow accelerated aging tests on unstressed products, thus becoming a reference for direct stability characterization technology.
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Product
Measuring Stations
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In cooperation with important customers in the automotive industry, medical engineering, mechanical engineering, and the semiconductor industry, OptoSurf has developed measuring devices that enable scattered light to be used for production purposes as well as in R&D and universities.
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NDT Wedges
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Rexolite or perspex wedges incorporate a pyramidal scattering surface with an impedance matched acoustic absorber to minimise internal reflections within the wedge.
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OEM Solutions
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Headwall-manufactured gratings, spectrographs, and spectrometers maximize the quality of UV-VIS-NIR analysis. Each grating is an original piece, unmarred by replication processes. These master-quality gratings feature superior spectral and spatial resolution and extremely low scatter, meeting the demands of your high-performance instrument. We have more than 40 years of experience producing gratings and spectral engines for ourselves and for our OEM customers.
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Raman Spectroscopy
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Raman is a spectroscopic technique that uses laser light to interact with molecular excitations and determine what a substance or element is composed of. It relies upon the inelastic scattering of photons which produces a weak signal, making the collection of information challenging particularly when the substance to be measured is at distance or can only be given short exposure times. Our Raman spectrometers are particularly effective at making Raman measurements due to their configuration which delivers a higher throughput/etendue than standard instruments.
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Product
Evaporative Light Scattering Detector for HPLC
ELSD-LT III
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The evaporative light scattering detector (ELSD) is a general-purpose universal detector that can even detect components with no UV absorption, such as carbohydrates, lipids, surfactants, and synthetic polymers. With exceptional sensitivity, a wide dynamic range through Analytical Intelligence features, and easy operability using LabSolutions™ software, the ELSD-LT III contributes to more effective analysis in a wide variety of fields.
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Saybolt Color Analyzer
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optek’s Saybolt color analyzer is a dual wavelength light absorption sensor. Operationally, the sensor passes a white light beam through the stream to be monitored, where light absorbance is measured at two distinct wavelengths. The measuring wavelength is set to focus on or near the peak absorbance point of the “yellowness” curve, while the secondary wavelength is chosen to compensate for any influence due to light scattering (window fouling, particulate, immiscible fluids, gas bubbles, etc.). Together, the sensor yields a repeatable and reliable true color number without any sample conditioning.
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Product
Network OTDR
NFO series
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The NFO OTDR unit injects the laser pulse into the fiber under test and picks up scattered and reflected optical signals by an avalanche photodiode (APD). The unit accepts remote commands from Internet to control all related timing and data acquisition processes. Maximal three wavelengths are available at the NFO with options on 1310, 1490, 1550, and 1625 nm. NFO also has options on dynamic ranges so users can select the most cost effective units for their demands. Radiantech provides an easy use API (Application Program Interface) for NFO so users can design and build their own AP for NFO. Standard NFO API package is for Windows XP or higher. Please contact Radiantech’s sales person to inquire API for another OS.





























