-
Product
Pulse Characterization Sensors
-
Pulse Characterization Sensors provide the ability to see and measure the temporal characteristics of pulsed and CW laser beams. Ophir Fast Photodiode Detectors are designed to convert optical signals into electrical signals which are then measured with third-party instrumentation such as oscilloscopes and spectrum analyzers. Accessories are available to connect to IS6 integrating spheres or fiber optic cables. Attenuating filter accessories are also available to increase their dynamic range. Different models offer silicon, UV enhanced silicon and InGaAs PIN photodiodes, covering a combined spectral range of 193 nm to 1700 nm. Rise times range from 25 picoseconds to 3 nanoseconds. The fast rise times are achieved by an internal reverse bias voltage circuit. Power is supplied by internal batteries and/or an external power supply depending on the model. Detectors should be connected to a 50Ω impedance in order to maintain their nominal rise times. They can be connected to higher impedance loads, but this will result in a significant increase in the rise time. If higher output voltage is required, it is recommended to connect the detector to a trans-impedance amplifier with an Input impedance of 50Ω
-
Product
Device Characterization
-
Probe systems for device characterization must be particularly flexible because many different measurements often must be performed; DC, IV/CV, Capacitance, HF, 1/f, temperature and more. The modular architecture of the PS4L product line is ideal for these broad requirements.
-
Product
Laser Diode Characterization Systems
-
Artifex Engineering GmbH & Co. KG
The LIV100 and LIV120 employ digitally programmable analogue end stages for flexible and accurate current control. A wide range of current end stages are available with maximum currents of 250mA for low power and telecom lasers or up to 1200A for high power laser bars. Custom units are available with even more current!
-
Product
Arbitrary Load-Control Device Characterization
S94522B
-
The S94522B Arbitrary Load Control Device Characterization application. Ideal for bare transistor compact modeling. Generate Keysight’s DynaFET compact model or use large signal waveform data to generate models.
-
Product
Characterization Of VCSEL Arrays Including Polarization Analysis
-
Konica Minolta Sensing Americas, Inc
Laser diodes are becoming indispensable in a multitude of everyday and industrial applications, thereby expediting new applications and technologies. These include: facial and gesture recognition in consumer electronics, LiDAR (light detection and ranging) in the car and material processing with high-performance diode lasers.
-
Product
Characterization System
System 7700
-
Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
-
Product
Nonlinear Component Characterization 10 MHz - 50 GHz (Export Control)
S94511B
-
The S94511B Nonlinear Component Characterization provides strong insight into the nonlinear behavior of your device under test (DUT).
-
Product
Process & Material Characterization System
TriboLab CMP
-
Bruker’s TriboLab CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost-effective bench characterization of waferpolishing processes. Small R&D-scale specialty system for CMP. Reproduces full-scale wafer polishing process conditions without downtime on production equipment. Provides unmatched measurement repeatability and detail. Allows testing on small coupons for substantial cost savings over whole-wafer testing.
-
Product
Materials Characterization
-
The techniques within Material Characterization have some sample challenges. Our highly talented staff of Engineers have overcome these with unique solutions. From moving highly viscous samples to mixing and sampling in a small well plate.
-
Product
Laser Diode Characterization System
58620
-
The Chroma 58620 Laser Diode Characterization Station is a state-of-the-art full turnkey system specially designed for laser diode testing. Features range from macro inspection of the facet or aperture active area to a full suite of electro-optical parametic tests.
-
Product
Device Characterization Software with Test Automation
14565B
-
The Keysight 14565B device characterization software is designed for easy evaluation of portable battery powered device (like 3G handsets, PDA, WLAN, and Bluetooth enable devices) current profiles to ensure long operating life of devices.
-
Product
Fan Characterization Module
FCM-100
-
Advanced Thermal Solutions, Inc.
The FCM-100 Fan Characterization Module is a specialized unit designed to test and characterize fans of various sizes and performance outputs. Using the FCM-100 Module in conjunction with pressure measurement equipment (such as the PTM-1000) and velocity measurement equipment (such as the eATVS); it is possible to develop fan curves (P vs. Flow rate) that can be used to verify fan manufacturer data or to characterize fans of unknown performance.
-
Product
Embedded DisplayPort Electrical Performance and Characterization Toolset Software
D9040EDPV
-
Characterization testing of eDP designs now supporting AUX channel automation.
-
Product
Surface Analysis and Materials Characterization Services
-
The Materials Characterization division of Evans Analytical Group is the leading global provider of surface analysis and materials characterization services. Our international network delivers world-class analytical services directly to you. EAG''s expertise in surface analysis, composition and contamination measurement, trace elemental analysis and microscopy can help you and your company meet your goals, no matter what high technology industry you work in.
-
Product
Amplifier Characterization With Wideband Modulated Signal
N5245BV
-
The N5245BV provides the N5245B 50 GHz PNA-X network analyzer, application software and accessories for amplifier measurements with modulated signal such as EVM, NPR and ACPR in addition to gain, gain compression, IMD and other measurements.
-
Product
Active Device Characterization Solution Up To 43.5 GHz For 5G
N5244BM
-
The N5244BM provides the N5244B 43.5 GHz PNA-X network analyzer, application software and accessories for active device characterization up to 43.5 GHz for 5G applications.
-
Product
Nonlinear Component Characterization 10 MHz - 110 GHz
S94510B
-
Measure and display the calibrated, vector corrected waveform of the incident, reflected, and transmitted waves of the DUT
-
Product
Image Sensor Characterization Systems
-
Image Sensor QE and Spectral Responsivity Characterization
-
Product
Solar Cell I-V Characterization System
VS6825
-
Industrial Vision Technology Pte Ltd.
The VS-6825A I-V test system is tailored for high-efficiency Solar cell production lines. It is able to eliminate the impact of HJT/IBC/TOPCON’s high capacitance characteristics on measurement results.
-
Product
Material Characterization Services
-
Accolade Engineering Solutions
As the direction of materials science continues towards studying the basis of properties on smaller and smaller scales, different techniques are used to quantify material characteristics and tendencies. Measuring mechanical properties of materials on smaller scales, like thin films, cannot be done using conventional hardness testing.
-
Product
Beam Characterization
-
Thorlabs offers a wide range of products that can be used for beam characterization. Properties such as intensity, degree of collimation, power, wavefront shape, and spectral properties can be measured.
-
Product
120 GBd High-performance BERT
M8050A
-
The Keysight M8050A high-performance bit error ratio tester (BERT) enables accurate characterization of receivers used in next-generation data center networks and server interfaces. With uncompromised signal integrity, support for NRZ, PAM4, PAM6, and PAM8 signals, and data rates up to 120 GBd, the flexible architecture of the M8050A supports 1.6T pathfinding as well as other leading-edge technologies.
-
Product
Scatterometer with Thin Film Measurement Capabilities
OptiPrime-X Series
-
The n&k OptiPrime-X series are automated metrology systems used to fully characterize and monitor Thin Film and OCD applications for both current and next generation IC processes.
-
Product
High Impedance Active Probes
18C & 19C
-
High impedance probes, PICOPROBE® MODEL 18C and MODEL 19C, combine the most advanced MOS and bipolar technologies with special, low capacitance packaging techniques to achieve truly remarkable electronic measurement capabilities. While being manufactured each instrument is individually optimized for the best possible performance. The extremely low input capacitance, high input impedance, and almost negligible input leakage current permits the direct probing of even the most sensitive MOS dynamic nodes. At the same time, the full dc capability of this Picoprobe coupled with the high speed capability permits the full characterization of circuits.
-
Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
-
Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
-
Product
Light/Laser Flash Analyzers
-
Light or laser flash is a measurement technique used to determine the thermal diffusivity, thermal conductivity, and specific heat capacity of materials. Light flash measurements are essential for characterizing the heat transfer and storage properties of a variety of materials, whether the sample of interest is expected to insulate, conduct, or simply withstand temperature changes.
-
Product
TDR Cable Analyzer
CT100B
-
The CT100B is special for two reasons: (1) It is the industry''s only high-resolution portable TDR providing step TDR impedance waveforms with resolution sufficient to show connector detail (~1 cm), and (2) it is the industry''s first portable TDR capable of making frequency domain S-parameter measurements including return loss (S11) and cable loss / insertion loss (S21). "High resolution TDR is extremely useful for detecting and localizing cable faults and characterizing cable and connector performance, but historically, portable TDRs have been unable to display OSL-calibrated S-parameter measurements," said Brandt Mohr, MOHR chief technologist. "The CT100B includes that capability, making it a very versatile instrument. If you can only carry one cable tester out into the field with you, it should be the CT100B."
-
Product
Continuous Time Interval Analyzer - PXI
GT668PXI-40
-
A true breakthrough in high-speed Time Measurement and test technology, GuideTech’s GT668PXI-40 leverages the power of its CTIA continuous time-stamping technology, eliminating the need for supplemental triggers, pattern markers or clock recovery circuits.GuideTech’s CTIAs enables serial interfaces pattern verification and full jitter analysis in milliseconds for fast, automated characterization and high-throughput production test on all ATE platforms, including low-cost and in-house testers.GT668PXI-40 cards can be expanded up to 36 Channels Single Ended Input in a single 3U PXI chassis.
-
Product
Multi-Fabric Switch
PEX431
-
Designed to enable the development of complex, scalable, high performance 3U VPX systems in today’s increasingly-connected military/aerospace world, the PEX431 is characterized by significant flexibility. The PEX431 Multi-Fabric Switch and XMC Carrier Card allow designers to build complex VPX systems with multiple single board computers and multiple I/O modules. PEX431 supports PCIe switching, GigE switching and the ability to host a XMC mezzanine.
-
Product
Surface Analysis
Innova-IRIS
-
This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.
