Wafer Probing
Bring the wafer in contact with the set of wafer probes.
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Standard 1.53 (43.00) - 4.00 (114.00) Bead Probe
BTP-72HF-4
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,700Overall Length (mm): 43.18
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High 2.90 (82.20) - 12.60 (357.00) Switch Probe
TSP100-F180-3
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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Light 0.60 (17.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-72I-2
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Wafer Thickness Measuring System
WT-425
Contact type can measure any materials within 0.2 µm (2 σ at 20℃ ±1℃). The wafer floats positions while measurement points change and it does not damage even thin wafers. Best for the process control of compound wafers and oxide wafers. (SiC, GaN, LT, Sapphire and Bonded Wafers)
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Light 0.48 (14.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-62H-2-S
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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High 2.84 (81.00) - 8.00 (227.00) High Performance Lead Free Probe
LFRE-25T79-8
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Standard 1.50 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-25L-4
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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High 2.84 (81.00) - 8.00 (227.00) Bead Probe
BTP-25HF-8
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Elevated 1.68 (4.00) - 7.00 (198.00) Bead Probe
BTP-1HL-7
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Sapphire/SIC Wafer Flatness and Surface Appearance System
FM200
Sapphire/SIC wafer flatness and surface appearance system provide a previous surface flatness testing solution, though non-contract lighting testing to record the whole information of the surface, rapid and fast measurement for various of surfaces, line and all kinds of surface information.
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Standard 1.00 (28.00) - 2.75 (78.00) Non Replaceable General Purpose Probe
E-S-W
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 65Full Travel (mm): 1.65Recommended Travel (mil): 43Recommended Travel (mm): 1.09Overall Length (mil): 495Overall Length (mm): 12.57Rec. Mounting Hole Size (mil): 67Rec. Mounting Hole Size (mm): 1.70Recommended Drill Size: #51Overall Length Remark: Overall length for E-S-V and E-S-W is .540 (13.72)
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Wafer Thickness Measurement System
MPT1000
Laser based Wafer Thickness and Roughness Measurement System designed by Chapman Instrument Inc., USA and OEM by Creden Mechatronic Sdn Bhd. A non-contact measurement system measures several parameters in a single system. (wafer & tape thickness, roughness, TTV, bump height, bow and warp measurements)
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Thermocouple Probes
Type T
No matter the application, ThermoWorks has a probe for you: penetration probes, immersion probes, air probes, surface probes, wire probes, even specialized probes like griddle probes, burger probes, pipe clamp probes, and probes for medical and lab use. Choose from standard tip, reduced tip, corkscrew tip, alligator clip, or needle probes; different handle types; and straight, coiled, stainless overbraid or even armored cables. Sensor types include type T or type K thermocouples, RTD sensors and our Pro-Series® line of thermistor probes.
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Probes
72 Series
American Probe & Technologies, Inc.
20 mil (0.020") shank sizesAvailable in straight and bent shapes to fit most industry standard analytical probe holders
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Differential Probe
DP-02VF
*150MHz High Frequency*MAX. Input Voltage:*±40V DC or 80V p-p or AC 28V rms*Bandwidth: DC-150MHz*Input Impedance 1MΩ // 7.5PF*X2, X20 Attenuator*To Ground MAX. Voltage: 40V*Output Impedance 50Ω
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ICT Probes
Merica Serirs- MP175
Minimum Center: 1.91mm (75mil)Current Rating: 3amps, continuousContact Resistance: 40milliohmsMounting Holes Size: 1.35Full Stroke: 6.40mmRated Stroke:4.30mmSpring Force: 203gf (7.2oz)/227gf(8oz)
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Touch-Trigger Probes
Touch-trigger probes measure discrete points, making them ideal for inspection of 3-dimensional geometric parts.Renishaw provides a comprehensive range of systems to meet the application needs and budget constraints of all users, from simple feature checks on manually operated CMMs, to complex part measurement on high-speed computer controlled machines.
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Wafer Prober Networking System
PN-300
The Wafer Prober Networking System PN-300 utilizes a database to facilitate data access from other systems and provides an environment that enables the user to edit data and handle processing. The system achieves wide-ranging compatibility by adopting standard hardware and operating system. In addition, it is equipped with an N-PAF (Network-based Prober Advanced Function) to provide robust support for wafer prober operation and maintenance.
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Profile Probes
Consist of several temperature sensing points inside one probe. Used to profile the temperature at various points along a single axis. Great for measuring the temperature distribution in tanks.
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Wafer Internal Inspection System
INSPECTRA® IR Series
An infrared internal defect inspection system has been added to the INSPECTRA® series.It is now possible to inspection with both infrared and visual light in one system.
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Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1T30-6
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Serrated, Multiple Point Waffle, Standard 0.61 (17.00) - 2.80 (79.00) General Purpose Probe
HPA-0H
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 635Overall Length (mm): 16.13
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Voltage Probes
In addition to EMI measurement with LISNs (Line Impedance Stabilisation Networks, Artificial Mains Networks), Probes are used for Terminal or Line voltage measurement.
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Premium 4.49 (127.00) - 12.00 (340.00) High Performance Lead Free Probe
LFRE-25T1-12
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Bias Ball Probe
POGO-1B-10-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Ultra High 4.18 (119.00) 11.70 (332.00) General Purpose Probe
EPA-3L5-2
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Temperature Probes
Is a device, typically, a thermocouple or RTD, that provides for temperature measurement through an electrical signal. A thermocouple (T/C) is made from two dissimilar metals that generate electrical voltage in direct proportion to changes in temperature.
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Multi-Purpose Probes
*For All your Functional Test Needs *Machine Building *end of line test
