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Device Under Test
a specific purpose component or module check; ex. substantial component of a PCB.
See Also: DUT, Unit Under Test, EUT
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2-Module ICT System, I317x Series 6
E9902G
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Scanner Probe
RFS set
The RFS set consits of three passive near field probes designed for the use in a measurement scanner during the development of E-field and magnetic field. They are designed for frequency ranges of 30 MHz to 3 GHz. The probe heads of the RFS set allow for close measurements needed to correctly localize interference sources on an electronic assembly. They document the whole image of the device under test`s near field. The scanner probes have a sheath current attenuation and are electrically shielded. They are connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance. The measuring signal can be increased with PA 203 or PA 303 preamplifier. On request RFS, LFS and XFS scanner probes can be produced.
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PXIe-4141, 4-Channel, ±10 V, 100 mA, Precision PXI Source Measure Unit
781743-01
PXIe, 4-Channel, ±10 V, 100 mA, Precision PXI Source Measure Unit - The PXIe-4141 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4141 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4141 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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Automated Test Interface
ATI-100
Matrix Test Equipment Incorporated
Now, with our ?New? Model ATI-100 you can turn your existing Matrix Signal Generator and Switchable Filter Bank into a full-blown DTS (Distortion Test System). Plug and play is the word, just plug in your Multiple Frequency Signal Generator, Switchable Filter Bank, Spectrum Analyzer, Oscilloscope, Power Meter, Frequency Counter, etc. to allow the following automatic testing with a single insertion of DUT (device under test
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RFP DC Low Power
AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
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Digital I/O Adapter Module For FlexRIO
Digital I/O Adapter Modules for FlexRIO offer up to 54 channels of configurable digital I/O that can interface with single‐ended, differential, and serial signals at a variety of voltage levels. When combined with a large, user‐programmable FPGA, you can use these modules to solve a variety of challenges, from high‐speed communication with a device under test to emulating custom protocols in real time.
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PCIe 6.0 Protocol Test Backplane
P5563B
The Keysight P5563B PCIe 6.0 Protocol Test Backplane provides a convenient means for testing PCIe 6.0 add-in cards with a self-contained portable and powered passive backplane. The P5563B provides power required for all combination of exerciser and analyzer with device under test.
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Solderability Tester
LBT210
Microtronic Microelectronic Vertriebs GmbH
Microtronic's LBT-210 solderability tester has software that offers statistical information such as mean value, standard deviation, etc. A camera option offers video of the test cycle and storage in memory with the appropriate test measurements and data. Additionally, it has the feature to test under nitrogen. This function can be switched on in the software. An enclosure that is flooded with nitrogen lowers and rises with the device under test.
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Dynamic Digital I/O with Per Channel Programmable Logic Levels and PMU PXI Card
GX5295
The GX5295 offers outstanding digital test capabilities and channel density in a compact 3U PXI form factor. Offering both performance digital and analog test capabilities, the GX5295 provides a cost-effective, tester per pin architecture - making this card the ideal choice for high throughput, mixed-signal component test applications. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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NI-9239 , ±10 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
782402-01
±10 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The NI‑9239 performs differential analog input. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. In addition to safety, isolation eliminates measurement errors caused by ground loops because the front end of the module is floating. Designed for both speed and accuracy, the NI‑9239 is an effective general-purpose analog module because of its resolution, sample rate, and input range.
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1kV, 25 MHz High Voltage Differential Probe Without Tip Accessories and with Auto Zero Disconnect
HVD3102A-NOACC
The HVD3000A series of high voltage differential probes cover the fullest range of applications, from 120/240 V switch-mode power supplies through 600 V class and 5 kV electrical apparatus. The table below provides a list of recommended probe models based on specific device under test applications.
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Accessory EFT/Burst generators IEC 61000-4-4
The field sources and the burst transformer are used to harden the device under test. They are powered by an EFT/burst generator.
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Interoperability And Field Tests
Interoperability and field tests are carried out to determine the behavior of a device under test in a qualified test environment or in connection with specially selected, qualified products. Our interoperability and field tests are based on many years of experience with wireless technologies and our close cooperation with the leading manufacturers and network operators in the telecommunications industry.
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12-Ch 10A RCV Power Distribution Unit
AR438
AR438 module helps with interconnection, power supply and load switching, monophasic and triphasic, adding the current measurement capability up to 10A.Enable input helps for a safe relay disconnection. It is a quick electrical -hardware- disconnection of the relays and is designed to be an auxiliary safety element, so that loads cannot reach the device under test.
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Pressure Comparator (System D)
P Series
AMETEK Sensors, Test & Calibration
The P-Series (System D) comparators are hydraulic screw pumps designed for easy, controlled, high pressure generation. Each comparator includes a 4 connection manifold, which can be used for the reference indicator, the device under test, a fine adjust, an isolation valve, or a fluid reservoir. The adjustable reference pressure port lets you set your reference gauge at the best viewing angle. Three models are available for hydraulic oil, water, or both.
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RF Shielded Test Enclosure, Largest Rack Mountable Enclosure
JRE 1724
Originally designed for testing wide screen laptops, the rack-mountable JRE1724 is ideal for large wireless devices such as; Mesh Network AP's, Cellular/LTE/4G Base Stations, and other large RF devices. Featuring rugged welded aluminum construction, you can be assured of its tight RF shielding effectiveness. Long life door gasket material along with double edge engagement not only provides solid RF shielding, but smooth trouble free operation over its lifespan. Internal struts keep the lid open for easy internal access when connecting the device under test.
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Function Tester with Low Number of Channels
UTP 6010 RF
The UTP 6010 is one of our smallest test systems and therefore a cost-effective entry into our UTP tester series.The fast system is used to implement scalable functional test applications for a test item (single device under test) with multiple RF channels and mixed-signal test options. Depending on the adapter, the DUT can be tested at circuit board level (FKT) or when installed at the end of the line (EOL).Depending on the test item requirements, we configure the appropriate number of channels and integrate the necessary interfaces directly in the adapter or tester. The test speed, production volume and overall complexity of the UTP 6010 interfaces can be varied according to your requirements.
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Regenerative Power System, 1000 V, ±60 A, 20 KW, 400/480 VAC
RP7972A
The RP7972A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test.
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NI-9239 , ±10 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
780181-01
±10 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The NI‑9239 performs differential analog input. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. In addition to safety, isolation eliminates measurement errors caused by ground loops because the front end of the module is floating. Designed for both speed and accuracy, the NI‑9239 is an effective general-purpose analog module because of its resolution, sample rate, and input range.
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PXI-2547, 2.7 GHz, 50 Ω, 8x1 PXI RF Multiplexer Switch Module
778572-47
2.7 GHz, 50 Ω, 8x1 PXI RF Multiplexer Switch Module—The PXI‑2547 is an RF signal multiplexer switch module. The higher channel count of the PXI‑2547 makes it ideal for test systems that require the switching of a large number of RF signals, such as switching several devices under test to a single channel on the RF analyzer. The module also features excellent insertion loss, voltage standing wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use the onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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MEMS Device-Oriented Testers
Are your test requirements oriented to defined families of devices, with common characteristics? You do not need to purchase an expensive, general-purpose mixed signal tester: You can rely on SPEA DOT 100, a system designed to answer the test requirements of MEMS and other low-pin-count devices at an incredibly low cost.The DOT 100 is based on a revolutionary per-device architecture: each device under test has a dedicated CPU managing the entire test process, while each card hosts all the resources for the parallel test of 3 devices, in the size of a postcard.
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Power Profiler, DC Energy Analyzer, Power Supply, Digital Multimeter, Source Measure Unit, Power Debugger
Otii Arc Pro
Otii Arc Pro is an instrument that can precisely source voltage or current and simultaneously measure voltage and/or current. It computes power and energy and syncs with software output, enabling engineers and developers to easily see what drains the energy and optimize the battery life of their devices under test.
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Single Board Source/Meter/Switch
SMSU
SMSU Series SourceMeterSwitch Unit (SMSU), introduced by SW Link Ltd, is single-channel voltage/current sourcing, 4X6 switch matrix and measurement instruments. Each Series 100 SMSU instrument tightly integrates highly accurate stable DC power source and a true instrument-grade programmable gain amplifier and 18bits ADC on a 100x100mm PCBs. It can output up to 20V, sub-uA to 1A current to device under test (DUT)
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Large-size Hybrid Reverberation / Anechoic Chamber
F-Series
The F large-size hybrid Reverberation/Anechoic Chamber represents the most versatile OTA test system in the market today. With the same unique test features of their E Series RC counterparts, the F-Series can also test large form-factor devices under test (DUTs) like laptops, large TV sets, solar and trash compactors, drones, fridges or washing and vending machines, among others. With up to 16x16, 8DLCC and DUTs up to 2m and 500 kg including full-body phantoms in a turntable, the F Series also expands the frequency range down to cover 200 MHz up to 40 GHz frequency ranges and the test modes to include EMC, BS, small cell, eNodeB and Virtual Drive Testing over the air (VDT-OTA). In an again unheard-of feature, the F-Series is also reverse-convertible into an Anechoic chamber, allowing Far Field (FF) and Spherical Near Field (SNF) radiation patterns, efficiency and gain measurements and pre-5G testing of antennas and devices. Conversion from RC to AC or vice versa can be performed within half a day.
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PXI Single 36 Channel MUX, SMB Connectors
40-735-912-S4
The 40-735 data communications multiplexer is designed for switching the data lines of serial interfaces (RS232, USB). Careful attention to the design of the module ensures that the switching system minimizes its impact on the transmission distance of USB1.1 interfaces. The MUX is available in 36:1 or 18:1 formats and enables a single source of serial data to be switched to one of 36 or 18 devices under test. This allows the data source to load information to, or receive information from, the device under test. This 36:1 version can be software configured into two independent 18 way MUXs enabling two separate sources of serial data to be connected to separate banks of 18 devices. The module is ideal for performing bulk testing of any device that relies on a serial data communications port to load software or control the device operation. It can also be used for a variety of other applications where ever a 2-pole low power MUX is required.
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1kV, 120 MHz High Voltage Differential Probe Without Tip Accessories and with Auto Zero Disconnect
HVD3106A-NOACC
The HVD3000A series of high voltage differential probes cover the fullest range of applications, from 120/240 V switch-mode power supplies through 600 V class and 5 kV electrical apparatus. The table below provides a list of recommended probe models based on specific device under test applications.
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Optical signal transmission
Digital
The fibre optic cable are used to transmit digital signals from the device under test under EFT/burst interference.
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Bulk Current Monitoring Probe
MP-50
The Current Monitoring probes may be used whenever RF current measurements are required. Current measurements are made by placing a current carrying conductor within the “sensing” window of the probe and measuring the probe’s output voltage with an RF detector. Calibration of the probe permits the conversion of the voltages measured to current. Current measurements can be made over the frequency range shown in the transfer impedance curve furnished with each probe. There is virtually no loading of the circuit and the technique permits normal operation of the device under test during measurements. The MP-50 can be used for the procedure for clamp injection when the common- mode impedance requirements cannot be met given in chapter 7.4 of IEC/EN 61000-4-6 „Immunity to conducted disturbances, induced by radio frequency fields”. The MP-50 can also be used as current monitor for BCI testing as per ISO11452-4, RTCA/DO-160 section 20, MIL-STD-461 and various automotive standards.
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Pogo Pin
Probe pin is also known as pogo pin or spring probe. It is designed to test the connection between two circuit boards and devices or equipment under test.
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NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
