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Servo Test
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Dual Servo Electrical Test Fixture
TA-334001
The TA-334001 is a Dual Servo Electrical Test Fixture made to be an equivalent substitute for the Honeywell test fixture T-334001. The test fixture front panel duplicates all the proper switch numbers and descriptions so the technician can follow by the book testing. The panel overlay text is reverse screened (backside) to insure that text quality will not degrade over time. All the appropriate test jacks are provided on the panel for servo pin and bracket breakouts. This fixture provides for the switching of motor direction, clutch, tach selection, synchro selection, limit switching and polarity relays. Panel meters are provided on the test fixture so that the technician can monitor the servomotor voltage as well as clutch voltage and current.
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Servopulser Control Unit
4830 Controller
The 4830 has been developed as a controller for servo control type test devices to have the ultimate in advanced performance and operator ease. A single controller unit allows a variety of tests from testing of static properties through to testing of endurance and dynamic characteristics, and has all functions and performance required of a controller for testing machines for actual objects and structures in addition to materials.
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Power Cord Bending Tester
SW-6
SW-6 Power cord bending tester is fully designed according to the IEC standard, and can also be costumer-sized depends on the samples’ type and the costumer’s requirement. Specifications: • Power supply：AC220V 50/60HZ 12KVA • Control mode: PLC with touch screen and Servo motor. • Test Speed: 10~60times/min (Adjustable) • Test Degree: 0~540° (Adjustable) • Counter: 0~999999 (Can be pre-set) • Weight: 5N,10N,20N. 2Sets. (6Position type will have 6 Sets) • Position: 2/6 • Load Current: 0~20A (Adjustable) • Angle plate: Can check the test situation • Sample fixture: Can be costumer-sized. • Can do power line bending test (The User need prepare sample and power supply ), Can record the number of the sample’s work with load.
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Computer Servo Control Testing Machine for Rock Stiffness
YAW-G300
Jinan Testing Equipment IE Corporation
The Computer Servo Control Testing Machine for Rock Stiffness is used for static fatigue compression test for conncrete & rock material under different parameter. The test includes compression, shearing test, three-point bending testing & fatigue test. Meanwhile, the Computer Servo Control Testing Machine can also realize the automatic control, measuring, data processing; curve analyzing, result displaying and test report printing in the process of various tests. The stiffness testing system can do full process test under stress and strain.
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Hydraulic Universal Testing Machines
UH-X/FX Series
Environmentally and operator friendly state-of-the-art universal testing machine The operability and visibility of the computer-controlled hydraulic servo type universal testing machine (UH-X) and the high-performance universal testing machine (UH-FX), equipped with front opening type hydraulic grips, have been greatly improved by the adoption of a large color touch panel. Equipped with a semi autotuning function that automatically adjusts the control parameters, stress control and strain control (ISO 6892 compliant) can be easily carried out without the need for a preliminary test. The UH-Xh and UH-FXh models feature a new hybrid hydraulic oil source that reduces the required quantity of hydraulic oil, thereby achieving a major reduction in electrical power (about 50 %).
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Servopulser Fatigue And Endurance Testing Machine
EHF-E Series
This is the standard electrohydraulic servo fatigue testing machine, offering outstanding stable performance. It is capable of carrying out tests ranging from static tests to fatigue tests.
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Dynamic and Satatic Electro-Hydraulic Servo Testing Machine
PLS Series
Jinan Testing Equipment IE Corporation
PLS series dynamic and static testing machine is produced according to the dynamic servo test technology. Our design of the electro--hydraulic servo testing system is unitized, standardized and modularized, which enhance the stability and reliability of the system. The electro-hydraulic servo testing system is mainly used to test the dynamic and static mechanical performance of material parts. Equipped with corresponding accessories, the servo-hydraulic testing system can do tensile, compression, low and high cycles, crack growth tests and other mechanical tests for various kinds of materials. The Dynamic and Static Testing Machine is widely used in the fields of aviation and aerospace, ship-building and military industries.
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2-500kg Computer Servo Tensile Test Instrument
JY－106B
Shenzhen Chuangxin Instruments Co., Ltd.
The Computer Servo Tensile Testing Machine is widely to test the tensile, tear, peel and bend of all kinds of
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NI Automated Test Software Suite
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Test Workflow Pro
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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3U OpenVPX SOSA™-aligned PWM Servo Motor Drive
68PW1
The 68PW1 is a 3U OpenVPX SOSA™-aligned (basis, Snapshot 2) single-axis PWM servo motor drive that can be configured with closed loop feedback measurement options including Hall, Resolver/Synchro or Encoder. The PWM drive provides programmable PWM output drive (up to 65 V @ 10 A continuous) from a single +28 VDC input source. Ideally suited for rugged Mil-Aero applications, the 68PW1 delivers off-the-shelf solutions that accelerate deployment of SWaP-optimized systems in air, land and sea applications.
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Test Instruments
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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NI Vehicle Radar Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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EV Power Components End of Line Test Platform
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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Semiconductor Testers
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Audio and Acoustic Functional Test Solution
With the growing popularity of Internet of Things devices worldwide, many electrical products are adopting voice commands as their user interface. This means that acoustic and audio test challenges are likely to impact more products than ever before. Test teams must meet extended test coverage requirements to ensure product quality while maintaining throughput and operational efficiency. For a solution to meet these sorts of demands, it must:
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VLSI Test System
3380
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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SoC Test Systems
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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NI's Electrical Functional Test Solution
PXI instrumentation ensures complete and accurate test coverage with a modular architecture mounted in ultra-reliable PXI chassis.TestStand and LabVIEW software provide rapid development of complex test steps and sequences. PXI systems conserve floorspace because of their small, light form factor. Order them preassembled and installed using NI ATE Core Configurations.SystemLink™ software deploys updates and democratizes data insights to optimize operational efficiency.
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PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Flight Control System Test Platform
The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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NTS Platform
Manufacturers all over the world are leveraging our NTS platform for products with rotating or otherwise moving parts, or produce sounds. Typical applications include mass production of air conditioning units, pumps or small electric motors, where errors in assembly can cause malfunctions or significantly shorten service life. This test platform is customized to your specification and application. Feasibility studies are available to ensure your solution is exactly what you are looking for.
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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In-Circuit Test (ICT) Fixtures
At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
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EV-DO Analysis Using NI PXI RF Test Instruments
NI-RFmx EV-DO
Highly optimized RF measurement experiencePerform physical layer analysis on EV-DO cellular signals including MODACC, ACPR, CHP, OBW, and SEMSimple access to advanced measurement parallelism
