Test Applications
See Also: Test Apps, Test Management Applications, Crowdsourced
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IEC60529 IPX3-IPX4 Rain Proof Test Machine
CX-IPX34A
Shenzhen Chuangxin Instruments Co., Ltd.
IEC60529 IPX3-IPX4 Rain Proof Test Machine Application The rain test system is strictly designed according to IEC60529. It’s applied to the Electrical equipment of the waterproof test of IPX3 and IPX4.
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Time Shift Test Java Applications w/in a WebLogic Managed Server
Time Machine Framework for WebLogic
The Time Machine Framework for WebLogic provides a great set of features enabling time shift testing scenarios for Java applications deployed to Oracle WebLogic. This Framework enables customers to use Time Machine functionality to time shift test Java applications within a WebLogic managed server without the need to create a separate instance of the application server for testing other time related activities. The Framework allows customers to configure and automatically create different virtual clocks on managed servers within the WebLogic domain as well as the granularity to establish virtual clock rules for specific applications deployed to the managed server.
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Electrical Receiver Conformance Test Application for IEEE 802.3bs/cd
M8091BSCB
IEEE 802.3bs receiver test application for 200GAUI-4 and 400GAUI-8, covering chip-to-module, chip-to-chip, backplane, and copper cable interconnects.
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Mobile Application Testing
Mobile Application testing involves the testing of applications in mobile devices. The applications are tested for functionality, performance, usability, etc.
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Structural Testing Application Examples Using EDM Modal
Illustrated below are some customer applications in varying industries who are using the hardware and software by Crystal Instruments to analyze and understand the structural properties of their test specimen(s). Analyzing the modal characteristics namely natural frequencies, damping and mode shapes of the test unit further helps in improving the design to enhance the mechanical behavior of the test unit.
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Power Meters & Power Sensors
Keysight’s power meters and power sensors measure the power of RF and microwave signals accurately with sensors of various types (CW, average, and peak and average), covering numerous frequencies and power ranges. We offer a wide selection of power meters and power sensors for nearly all application needs — wireless communications, radar pulse measurements, component test, and more. Applications include testing the output power of communication base-station transmitters, radar system equipment, wireless devices, and much more.
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Comprehensive Suite of Software Tools for Semiconductor Test Applications
ICEasy Test Suite
Marvin Test Solutions' ICEasy Test Suite is supplied with both the TS-900 and TS-960 semiconductor test platforms and provides a comprehensive set of software tools - facilitating the development and debugging of test programs for semiconductor devices. In addition the suite includes I-V curve and Shmoo plot tools for analyzing a device's DC and AC characteristics. The complete suite of tools interfaces seemlessly with Marvin Test Solutions' ATEasy®, a test executive and test development evironment which is supplied with each TS-900 / TS-960 system.
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Electrical Receiver Conformance Test Application for IEEE 802.3bs/ cd
M8091BSCA
IEEE 802.3bs receiver test application for 200GAUI-4 and 400GAUI-8, covering chip-to-module, chip-to-chip, backplane, and copper cable interconnects.
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1.6T Optical Receiver Test Application
N4917DJCA
Offers fully automated stress eye calibration and receiver testing for 800G and 1.6T modules with 100G and 200G / λ optical interfaces.
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Force Gauge
Shenzhen Graigar Technology Co.,Ltd.
A force gauge is a small measuring instrument used across all industries to measure the force during a push or pull test. Applications exist in research and development, laboratory, quality, production and field environment.
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Receiver Conformance Test Application for IEEE 802.3ck
M8091CKCA
Designed to assist and simplify the stress signal calibration used for testing the inputs of IEEE 802.3ck Draft 3.3 chip-to-chip (C2C) and chip-to-module (C2M) electrical interfaces using Keysight M8040A 64Gbaud Higher Performance BERT or an M8050A 120Gbd High-Performance BERT together with Keysight Digital Communication Analyzer (DCA) Oscilloscope or Infiniium UXR real-time Oscilloscope.
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20MHz Pulse / Function Generator
Model 2019A
- Versatile Waveform Generation for a Wide Range of Testing Application- Wide Range of Frequencies from 0.0002Hz (i.e. 5000s) to 20MHz (i.e. 50ns)- Choice of Eight Selectable Waveforms- All Outputs can Drive 50 ohms Terminations- Trigger and Gate Modes with Adjustable Start/Stop Control
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PCI High Voltage MUX
50-350-001
The 50-350-001 is a Short PCI Card designed as a high voltage multiplexer for use in a Submarine Cable Testing Application. It is designed to allow the dynamic connection of various test instruments to 1 of 16 test points. The multiplexer may be operated as a conventional multiplexer with break-before-make action when a new channel is selected.
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Supernova
SuperNova Test Application Framework is an innovative, fully integrated test environment that addresses world-class test deployment challenges by simplifying access to high-end test capabilities, reducing time spent on analysis and customizations, and quickly meeting the most different test deployment use cases.
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Flexible Test Connectors
Pin and socket sizes 22, 20, 16, 12 and 8 conform to MIL Spec dimensions. Whenever connector reliability is important, you’ll find NASA-approved FLEXCON test connectors. Applications include electronic, electrical and communications systems, computers, space vehicles, missiles, aircraft and other military equipment.
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Scalable Test Solution for Mixed-Technology Test Applications
Spectrum RF Systems
The Spectrum RF Systems are fully integrated, configurable test platforms combining several digital, analog, RF, and switching instruments to provide automated functional test solutions for a wide range of mixed-signal and microwave test applications including radars, Electronic Warfare, missile, and satellite communications.
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Test Workflow Standard
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Semiconductors Testing
Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Cable Free ATE
CABLEFREEATE
Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
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Automated Aerospace and Defense Test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Explosive Test Site Range Instrumentation
Firesets, CDU’s EDU’s, Delay generators, firing panels, and custom instruments. Fiber-optic and computer-control options.
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Test System Optimized for High Volume Production Testing of Integrated Circuits
ETS-364 / ETS-600
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture. The test system offers separate floating resources for each site, improving site isolation and measurement accuracy coupled with digital instrumentation enabling the most efficient, high-volume testing available. The system supports up to 240 analog pin channels, and offers 133 MVPS digital vector rate with up to 128 digital pin channels. Eagle's scalability includes the ability to double the capacity of an ETS-364, providing more than 480 analog pin channels and up to 256 digital I/O pin channels with the ETS-600.
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Dielectric Test Fixture
16451B
The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
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Semiconductor Test Software
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Off-Line Testing Platform
6TL22
The 6TL22 Platform is a perfect base for the conception of a real modular Automatic Test Equipment for low to mid manufacturing volumes.A system designed around the 6TL22 is simple, easy to maintain, and cost-effective. The rack is prepared for the direct integration of the three platform-based receivers from Virginia Panel, the S6, G12 and G12X.The core of the system can be either an Industrial PC or a NI-PXI. A UPS will protect the valuable instrumentation as well as control all the steps for an automatic power-up and down of the test system.
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In-Circuit Test System Rentals
Forwessun offers flexible test system rental options to meet short-term or seasonal testing demands. Our rental systems are rigorously tested for reliability and performance, giving you access to high-quality equipment without the need for a full purchase commitment. Customised rental agreements allow you to return the equipment when it’s no longer required, providing an ideal solution for scaling up production or filling in during periods of high demand.
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Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series





























