Surface Contamination
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Surface Contamination Monitor
IMI Inspector Alert™ V2
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The IMI Inspector Alert™ V2 measures alpha, beta, gamma and x-radiation using a 2-inch “pancake” GM detector with high sensitivity to common beta and alpha sources. The easy-to-read digital display shows readings in your choice of µSv/hr, mR/hr, CPM, or CPS. The Total/Timer feature allows timed readings from one minute to 40 hours for precise measurement of low level contamination. An audible alert sounds when the radiation reaches a user-adjustable level.
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Surface Contamination Monitors
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Small-sized devices for measuring the ambient dose equivalent rate and the ambient dose equivalent of X-ray and gamma radiation, as well as measuring the flux density of beta particles (AT6130).
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Spatial Heterodyne Surface Chemical Agent Detector
SHSCAD
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Wide area, high areal coverage rate surface contaminant detection via LWIR reflectance spectroscopy employing eye safe broadband quantum cascade lasers (QCLs) and a high-speed spatial heterodyne spectrometer (SHS) in a handheld sensor package (~ 10,000 cm3, 10 lb).
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Total Reflection X-ray Fluorescence (TXRF) Services
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A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.
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Surface Quality Monitors
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PET manufactures and markets non-destructive, non-contact surface contamination and thin film detection models and automated systems (surface quality monitoring system) capable of detecting thin layer contamination, thin films and coating down to the Angstrom level. These systems represent a major breakthrough by providing, for the first time, a quantitative measure of surface cleanliness. As surface cleanliness verification instruments, in a part cleaning environment, these products are capable of validating the cleaning quality of all the part cleaning equipment available in the market. Any of SQM model series is capable of verifying metal contamination; monitoring absence/presence of organic and/or inorganic on virtually on surfaces of all metals. They are, price/performance, the most sufficient product available for testing surface of metals for surface cleanliness. These systems operate in an ambient environment, require no sample preparation or deposit of any agents on the surface. In any parts cleaning environment where the quality and efficiency of part cleaning equipment for removal of surface contamination is highly desired, these systems provide a scientific solution by quantitatively measuring the surface cleanliness. The SQM series has the sensitivity and operational simplicity required to provide fast and cost effective surface evaluation for all metals.
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Surface Contamination Kit
138/2
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The Elcometer 138/2 Surface Contamination Kit provides the user with a means for testing invisible surface contaminants including:pHchloride ionsironsalts
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Chemical Testing
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Accolade Engineering Solutions
To ensure product environmental compliance or to gain better understanding of your materials or processes, chemical testing is often required. AES has state of the art the equipment for chemical analysis. For elemental analysis XRF, SEM/EDS or ICP can be used. For molecular analysis GCMS, HPLC and FTIR may be used. FTIR may also be used for surface analysis of contamination and our microFTIR system is suitable for the smallest samples.
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Omicron Fiber Optic Connector
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Teledyne Impulse-PDM’s Omicron 5030/5070 optical connectors utilize proven small form factor ferrule technology and are available for multi-mode or single-mode operation.The connectors are offered, as standard, in stainless steel to BSEN10088-3 Grade 1.4404 (316L), which is electro-polished to remove surface contamination, thus improving resistance to corrosion. Connector bodies can also be manufactured in other materials, either to address specific anti-corrosion requirements, or to increase depth rating. Engaging nuts are normally manufactured in naval brass to UNS C46400.
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Geiger Counter
ONYX®
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ONYX features a modern, streamlined look and the use of advanced technologies, making it a one-of-a-kind Geiger Counter. It weighs only 7 oz. (200g.) and measures a mere 5.1 X 2.6 X 0.9 in. (72 X 37 X 13 mm.) making it easy to transport. Despite its compact size ONYX is capable of detecting alpha, beta and gamma radiation with the same sensitivity as the IMI Inspector Alert™, and like the IMI Inspector Alert™ V2, ONYX is optimized for surface contamination measurements through use of its 2 in. pancake Geiger Mueller tube.
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Optical 12,000 Meter Connector
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Teledyne Impulse-PDM’s 5135/5175 optical connectors utilize proven standard ferrule technology and are available for multi-mode or single-mode operation.The connectors are manufactured in Titanium Ti 6Al-4V, which is electro-polished to remove surface contamination, thus improving resistance to corrosion. The engaging nuts are also manufactured in the same grade of Titanium and the threads are coated with a Nickel/PTFE composite coating to prevent galling. The connectors have been qualifi ed to 12,000 meter operating depth.
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Spectrometers
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Search and detection of gamma radiation sources with automatic identification of the radionuclide composition; Measurement of the dose rate of gamma radiation; Detection of neutron radiation and measurement of the neutron count rate (AT6102); Measurement of the dose rate of neutron radiation (external detection unit BDKN-03); Measurement of the flux density of alpha and beta particles from contaminated surfaces (external detection units BDPA-01 / BDPB-01)
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Elcometer Bresle Patches
135B
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Elcometer 135B Original Bresle Patches are used to determine surface chloride contamination and are self-adhesive rubber film patches with a sealed compartment for sampling soluble impurities from steel surfaces with a suitable solvent.
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Microbial Contamination Monitors
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Is an active sampling method that is superior to the usage of settle plates, that additionally creates validated and actionable data.
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Fluid Contamination Test
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Fluid contamination testing determines the abilities of materials to withstand the contaminating fluids, to which they are exposed in service.
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Salt Contamination Meter
130
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Key features of the Elcometer 130 Salt Contamination Meter include: Fast reading rate allows multiple conductivity tests to be completed efficiently Pressure plate ensures a constant and uniform pressure to paper Automatic detection of paper size and automatic adjustment of reading value USB and Bluetooth® data output to ElcoMaster® software Dust and water resistant rugged design equivalent to IP64 Automatic temperature compensation ensures accurate results Non-oxidising gold plated contacts ensures lifetime accuracy Stores up to 150,000 readings in 2,500 alpha numeric batches Fully portable hand-held, ergonomic design ideal for use in the field
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EDX-FTIR Contaminant Finder/Material Inspector
EDXIR-Analysis Contaminant Finder/Material Inspector
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EDXIR-Analysis software is specially designed to perform qualitative analysis using data acquired by an energy dispersive X-ray (EDX) fluorescence spectrometer and a Fourier transform infrared spectrophotometer (FTIR). This software is used to perform an integrated analysis of data from FTIR, which is excellent at the identification and qualification of organic compounds, and from EDX, which is excellent at the elementary analysis of metals, inorganic compounds and other content. It then pursues identification results and the degree of matching. it can also be used to perform EDX or FTIR data analysis on its own. The library used for data analysis (containing 485 data as standard) is original to Shimadzu, and was created through cooperation with water supply agencies and food manufacturers. Additional data can be registered to the library, as can image files and document files in PDF format. It is also effective for the linked storage of various types of data as electronic files.
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PuroMaxx Contamination Control
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Brooks offers the industry’s most advanced suite of FOUP carrier/reticle pod cleaners and photomask/reticle stockers. Using state-of-the-art humidity control along with in-situ metrology, our products address all critical airborne molecular contamination, productivity, and process stability challenges at sub20-nm nodes.
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Contamination Monitors
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Control of X-ray and gamma radiation personal dose equivalent.The dosimeter together with the PC reader and the software forms an efficient automatic system for staff radiation exposure control.
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Surface Analysis
InSight-450 3DAFM
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Based on the production-proven InSight® 3DAFM platform for 300mm, the InSight-450 3DAFM is ideally suited for a broad range of roughness, depth and CD applications.
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Surface Cleanliness
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Surface cleanliness: Soluble salts & ion specific contamination (sulphates, chlorides, nitrates etc.) which are often invisible to the eye, together with amine blush (for amine cured epoxy coatings) can result in premature coating failure, resulting in high re-coating and maintenance costs. Elcometer has a range of test equipment for assessing surface cleanliness prior to applying a coating.
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Surface Profilers
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Taylor Hobson offers a world leading range surface form, surface finish and metrology solutions for 3D contour,ideal for the most demanding applications.
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Automated Monitoring of Airborne Molecular Contamination
AMC-Monitor T-1000
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The all-in-one analyzer for FOUP, fab and clean-room environment AMC monitoring in the semiconductor industry. The AMC-Monitor is a modular and flexible platform for airborne molecular contaminations (AMC) monitoring in semiconductor applications such as: FOUP analysis with a focus on VOC and condensables incl. full integration with Pfeiffer Vacuum APA 302 pod analyzer. Clean-room monitoring in fabrication plants.
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Ionic Contamination (Cleanliness) Tester
Zero-Ion
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Current IPC standards now require ROSE testing for process monitoring. The Zero Ion ionic contamination tester fully complies with current IPC standards.
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Contamination & Clearance
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Provides the ultimate user-friendly operation, with thorough and reliable detection of external contamination on personnel working in nuclear environments.
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Surface Carbon Analyzer
SurfaceC‑800
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Determination of surface carbon is a special requirement for quality control in the metal producing and metal working industry. ELTRA’s SurfaceC-800 analyzer is designed for the precise determination of surface carbon in numerous kinds of solid samples from trace level up to 1000 µg/cm2. The SurfaceC-800 is equipped with a resistance furnace with quartz tube for sample oxidation and can provide temperatures up to 1000 °C. The temperature of the SurfaceC-800 can be set up in steps of 1 °C. As common carrier gas in the SurfaceC-800 oxygen is used.
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Surface Roughness
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Surface Roughness: these consist of a stylus attached to an arm which moves over the surface to record and measure the roughness over a specified distance, recording peak-to-valley average.
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Surface Analysis
Dimension AFP
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The Dimension AFP is the world's only fab-based metrology tool specifically designed for both CMP profiling and etch depth metrology for current and advanced technology nodes. The system combines the superb resolution of an AFM with the long-scan capability of an atomic force profiler tomonitor etch depth and dishing and erosion on submicron features with unsurpassed repeatability.
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SURFACE PROFILE GAGES
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Steel is often abrasive blast cleaned or otherwise roughened prior to painting. The peak-to-valley height of the resultant surface profile is an important factor in the performance of applied protective coatings. Low profile may reduce coating bond strength (adhesion). Too high and the peaks may receive insufficient coverage and possibly rust prematurely. The costly application of more coating may be required if the profile is too high. For these reasons, surface profile should be measured prior to coating application to ensure that it meets contract specifications.
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Surface Measurement Instrument
SMI
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Redefining speed and accuracy in non-contact metrology, the Optikos SMI is a high-speed surface topography instrument that characterizes spherical, toric, and aspheric surfaces. The SMI measures surface shape deviations of precision surfaces using wavefront analysis technology. Configured to measure such items as: micro-optics, ball lenses, and contact lens molds, the instrument allows users to easily measure aspheric and toric parts without the need for reference surfaces.
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Surface Roughness Meters
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This instrument is compatible with four standards of site to measure surface roughness of various machinery-processed parts, calculate corresponding and clearly display all measurement parameters.When measuring the roughness of a surface, the sensor is placed on the surface and then uniformly slides along the surface by driving the mechanism by the sharp built-in probe. This roughness causes displacement of the probe which results in change of inductive amount of induction coils so as to generate analogue signal, which is in proportion to the surface roughness at output end of phase-sensitive rectifier.
