Picture Analysis
The extraction and analysis of data from images.
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Product
Display and Analysis Software
IADS
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Curtiss-Wright Defense Solutions
IADS telemetry client software is the integrated display and analysis portion of the IADS data display, processing, delivery and archive software suite. IADS client facilitates real-time mission analysis and raises situational awareness, safety monitoring, and test point clearance capabilities to a new level.
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Product
Failure Analysis And Magnetic Imaging Services
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Micro Magnetics offers failure analysis services on a contractual basis. We maintain two current density metrology systems at our headquarters in Fall River and can produce maps of current flow in a wide variety of ICs and packages, usually with initial results delivered within 48 hours. Our engineers will work closely with you to understand and interpret the results in order to determine the root cause of the failure.
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Product
Sulfur Analysis System
Model 6400TSG
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Teledyne Analytical Instruments
The 6400TSG series utilizes our field-proven ultraviolet (UV) fluorescence technology to continuously monitor the total sulfur content found in process gas and liquid feeds. UV-Fluorescence is a non-consuming method of detection, eliminating the hassles associated with replacing tape cartridges, and enables detection as low as 10 ppb, depending on application, with stable, reproducible results.
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Product
*Structural Analysis
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Guangzhou Amittari Instruments Co.Ltd
With proven accuracy every time, Altair offers industry-leading engineering analysis and optimization tools from simulation-driven design concepts to detailed virtual product validation and simplified modeling workflows to advanced high-fidelity model building. Whether big or small, our customers trust their decision making to Altair, the pioneer of simulation-driven design.
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Product
DFT Testability Analysis Software
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Landrex Technologies Co., Ltd.
DFT Testability Analysis Software
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Product
Raman Spectroscopy Analysis Laboratory
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Rocky Mountain Laboratories, Inc.
Raman is used to analyze organic and inorganic materials. Bulk and small particle materials can be analyzed. Raman microscopy allows for the identification of particle as small as 1 µm.
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Product
Spectrum Analysis Up To 125 GHz
S93093B
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The S93093B has all of the capability of the S93090xA spectrum analyzer application with an upper frequency of 125 GHz
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Product
Chemical Analysis
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Chemical analysis involves determining the elemental constituents of a material. This information can then be used to determine if the material matches a required specification. At Keighley Laboratories analysis of a wide range of products covering many material types is undertaken although these are mainly metal or metal related products.
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Product
Sound Analysis Software NoiseImage
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Our sound analysis software NoiseImage is a general-purpose platform software providing all tools required for the whole measurement and analysis process. You can use the core package on its own or expand its functionality with any combination of add-on modules for different acoustic measurement types or analysis methods. The add-on modules connect seamlessly via one integrated software environment. You can combine as many expansion modules as you need.
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Product
Audio Spectral Analysis Freeware
PSELab
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Power Spectrum Estimation Laboratory
"PSE Lab" is a freeware Windows application useful to estimate power spectrum and time frequency distribution of signals. To estimate power spectrum, the application uses following methods: periodogram; using the simplex algorithm to estimation of complex exponential model optimal parameters; using the quasi-Newton algorithm to estimation of complex exponential model optimal parameters; least squares Prony method; modified least squares Prony method; Burg method; modified covariance method; MUSIC..
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Product
Signal Analysis
STA/LTA Detector
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The STA/LTA Detector program is a representation of a detector of various events in triaxial or single-component time signals. The software is based on one of the STA/LTA detector types.
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Product
XRF analysis
X-Supreme8000
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XRF analysis (X-ray fluorescence) with the highly flexible and powerful energy-dispersive X-ray fluorescence (EDXRF) spectrometer X-Supreme8000 for quality assurance and process control requirements across a diverse range of industries.
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Product
Digital Image Correlation System for Complete 3D Warpage, Thermal Expansion, and Strain Analysis of Materials and Components in the Heating and Cooling Phase
Q-400 TCT
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The Q-400 TCT system is designed for complete three-dimensional and highly sensitive warpage, thermal expansion measurement and strain analysis of materials and components in the heating and cooling phase. Areas from 50 mm x 70 mm down to 2 mm x 3 mm can be investigated. Measurements can be done from room temperature up to 300°C and down to -40°C. The system is specially suited for thermal expansion measurement of electronic components and is frequently used in the development and testing of complex anisotropic materials, components, and structures in electronic applications.
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Product
Finite Element Analysis (FEA) Solution
Femap
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Siemens Digital Industries Software
Femap is an advanced engineering simulation software program that creates finite element analysis models of complex engineering products and systems, and displays solution results. Femap can virtually model components, assemblies or systems and determine the behavioral response for a given operating environment.
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Product
Scanning Electron Microscopy (SEM Analysis)
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Rocky Mountain Laboratories, Inc.
Scanning Electron Microscopy (SEM Analysis) can produce images of almost any sample at magnifications of 15-300,000X. The SEM has tremendous depth of field allowing for imaging that cannot be accomplished using optical microscopy. Conductive and nonconductive samples can be imaged. When operated in the backscatter (BSE) detection mode, differences in material composition can be observed. Elemental analysis can be performed on any feature observed with an integrated Energy Dispersive Spectroscopy (EDS) detector.
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Product
LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Product
Current Signature Analysis
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The Iris Power MDSP3 uses the Current Signature Analysis technology which relies on the concept that faults in the induction motor rotor or driven components result in changes to the rotor magnetic field pattern. Unique magnetic rotating fields are produced due to the faults which induce detectable stator current components indicative of the fault.
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Product
Multifunction Data Collection and Analysis System
2002
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The Model 2002 DME System is a state of the art, multifunction data collection and analysis system. It is suitable for application in an electrical utility substation or plant environment to produce Sequence of Event (SER), Digital Fault Recorder (DFR), Dynamic Disturbance Recorder (DDR), and Continuous Recorder data in conformance with PRC-002-1 and PRC-018-1. All data recorded by the DME system is stored in IEEE C37.111 format and named in conformance with IEEE C37.232. The system also has a software option to enable the Phasor Measurement Unit (PMU) feature to provide streaming data in conformance with IEEE C37.118.
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Product
Spectrum Analysis For P50xxB Up To 14 GHz
S970903B
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Add spectrum analysis to your P50xxB Streamline series vector network analyzer
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Product
IC EMC Analysis
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We carry out standard measurements according to BISS/IEC and analysis of the interference immunity and interference emissions of ICs during development.With the targeted EMC analysis, we uncover weak points in the ICs so that the IC developer can use them to develop improvements for the product
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Product
Failure Analysis Services
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Innovative Circuits Engineering, inc
Innovative circuits engineerin's failure analysis group performs root cause analysis on a wide variety of integrated circuit devices.
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Product
Counterfeit Analysis / Screening Services
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DPACI perform counterfeit part analysis on all types of electrical, electronic, and electromechanical (EEE) components. Our suspect counterfeit analysis task groups include source identification, manufacturer validation, external visual inspection, mechanical inspection, electrical test, X-Ray, in-depth internal visual and materials analysis. With one of the largest databases of test reports for EEE components, we can offer similar historical data for correlation with images, test data, certifications and reports.
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Product
Materials Analysis
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Materials Analysis provides products that enable customers to determine structure, composition, quantity and quality of particles and materials, during their research and product development processes, when assessing materials before production, or during the manufacturing process. Our products help customers to improve accuracy and speed of materials analysis in the laboratory. We see a growing demand for the application of our solutions in quality and process control. Our key customers in this segment are leaders in the metals, minerals and mining, pharmaceutical and academic research industries. The operating companies in this segment are Malvern Instruments, PANalytical and Particle Measuring Systems. Malvern Instruments and PANalytical merged on 1 January 2017.
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Product
Analysis Software
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The Waveform Processing Software AS-70 reads data from WAVE files and offers a wide range of functions, including graph display, level processing, frequency analysis(FFT analysis and octave band analysis), file output, and playback.
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Product
E-Band Signal Analysis Reference Solution
Reference Module
The E-band signal analysis reference solution provides an effective measurement solution for today’s wideband signals as well as emerging communications standards. With the M1971E waveguide harmonic mixer, which provides a 55 to 90 GHz input; Keysight oscilloscopes, which provide excellent signal integrity; and the powerful 89600 VSA software, you have a high-quality wideband measurement solution. A simple user interface also provides integrated mixer setup, correction and LO optimization, allowing for accurate measurements.
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Product
Data Collection and Analysis System
3002
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The Model 3002 SER System is a state of the art data collection and analysis system. It is suitable for application in an electrical utility substation or plant environment to produce Sequence of Event (SER) data in conformance with PRC-002-1 and PRC-018-1.
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Product
Image Analysis & Stage Micrometers
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The APPLIED IMAGE series of Image Analysis and Stage micrometers are ideally suited for calibrating optical, imaging, video, and reticle-based measurement systems. Designed for ease of use and manufactured for durability, the SM Series has both English and Metric scales in one or two axis configurations. Both types of micrometers come with NIST traceable calibration standards and are available on multiples substrates to perfectly fit your needs. The experience APPLIED IMAGE has in manufacturing precision imaged optical components makes us the trusted source for standards for magnification system microscopy and vision applications. Should you need to alter feature patterns, size, or substrate, fill out our Custom Optical Components and Standards form to start the conversation.
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Product
Enterprise Class Network Analysis
Capsa
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Capsa network analyzer makes it easy to rapidly detect, isolate and resolve network problems. It captures all data transmitted over the network and provides a wide range of analysis statistics in an intuitive and graphic way. With Capsa's network traffic monitor feature, we can quickly identify network bottleneck and detect network abnormities.
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Product
Software for Configuration, Logging and Analysis
LMG-CONTROL
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ZES ZIMMER Electronic Systems GmbH
Real-time display of configuration and measuring valuesTransfer of up to 3000 measuring values per secondTimestamps with a resolution of 1 millisecondVersatile analysis of sampling valuesExport of measuring values to other applications
