Embedded System
-
Product
EMI Test System
TS9975
Test System
The R&S®TS9975 is the base system for conducted and radiated EMI measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for large equipment under test. Combinations of different applications or incremental expansion are easily possible.
-
Product
cRIO-9041, 1.30 GHz Dual-Core CPU, 2 GB DRAM, 4 GB Storage, -40 °C to 70 °C, Kintex-7 70T FPGA, 4-Slot CompactRIO Controller
786369-01
Embedded Controller
1.30 GHz Dual-Core CPU, 2 GB DRAM, 4 GB Storage, -40 °C to 70 °C, Kintex-7 70T FPGA, 4-Slot CompactRIO Controller - The cRIO-9041 is a rugged, high-performance, customizable embedded controller that offers Intel Atom dual-core processing, NI-DAQmx support, and an SD card slot for data-logging, embedded monitoring, and control. It includes a Kintex-7 70T FPGA with LabVIEW FPGA Module support for advanced control and coprocessing. The controller provides precise, synchronized timing and deterministic communications using Time Sensitive Networking (TSN), which is ideal for highly distributed measurements. This controller offers several connectivity ports, including Gigabit Ethernet, USB 3.1, USB 2.0, RS232, and RS485 ports. You can use the USB 3.1 ports to add a local human machine interface and program, deploy, and debug software, which simplifies application development.
-
Product
Mezzanine System
5041
System
ECM P/N 5041 provides eight channels of RS485 / RS422 I/O with fixed 120 ohm termination for each channel. Speeds are up to 30M bits per second. All channels power up as inputs. Also transceiver inputs are always enabled for loop back diagnostic use when the outputs are enabled. Software can enable outputs on a channel by channel basis.
-
Product
In-Circuit Test
TestStation LH
Test System
The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family. TestStation LH features SafeTest protection technologies for accurate, reliable, and safe testing of the latest low-voltage technologies.
-
Product
Scienlab Battery Test System - Cell Level
SL1007A
Test System
The SL1007A Scienlab Battery Test System – Cell Level enables you to accurately and productively test battery cells for automotive and industrial applications. The bidirectional power supply charges and discharges your cells under test with very high efficiency.
-
Product
PXIe8862, 2.6 GHz 8-Core PXI Controller
788167-33
Embedded Controller
The PXIe8862 is an Intel Core i7 8Core embedded controller for PXI Express systems. You use the PXIe8862 for processor-intensive RF, modular instrumentation, and data acquisition applications. The PXIe8862 includes two 10/100/1000/2500BASET (Gigabit) Ethernet ports, two USB 3.0 ports, four USB 2.0 ports, as well as an integrated hard drive, serial port, two Thunderbolt 4 ports, and other peripheral I/O.
-
Product
cRIO-9045, 1.30 GHz Dual-Core CPU, 2 GB DRAM , 4 GB Storage, -20 °C to 55 °C, Kintex-7 70T FPGA, 8-Slot CompactRIO Controller
785623-01
Embedded Controller
1.30 GHz Dual-Core CPU, 2 GB DRAM , 4 GB Storage, -20 °C to 55 °C, Kintex-7 70T FPGA, 8-Slot CompactRIO Controller - The cRIO-9045 is a rugged, high-performance, customizable embedded controller that offers Intel Atom dual-core processing, NI-DAQmx support, and an SD card slot for data-logging, embedded monitoring, and control. It includes a Kintex-7 70T FPGA with LabVIEW FPGA Module support for advanced control and coprocessing.
-
Product
Modular Breakout System 3-Pin & 20-Pin Plugin Module
95-199-004
Modular Breakout System
The 95-199-004 Plugin Breakout Module is designed to be fitted to a PXI 40-199 Fault Insertion Switch as part of the Pickering MBoS. The Modular Breakout System is designed to Simplify HILS (Hardware In the Loop Simulation) Applications.
-
Product
cRIO-9035, 1.33 GHz Dual-Core CPU, 1 GB DRAM, 4 GB Storage, and Kintex-7 70T FPGA, 8-Slot CompactRIO Controller
784774-01
Embedded Controller
1.33 GHz Dual-Core CPU, 1 GB DRAM, 4 GB Storage, and Kintex-7 70T FPGA, 8-Slot CompactRIO Controller - The cRIO-9035 is a rugged, fanless, embedded controller that you can use for advanced control and monitoring applications. This software-designed controller features an FPGA, a real-time processor running the NI Linux Real-Time OS, and embedded user interface capability. You also can use the Mini DisplayPort to add a local human machine interface (HMI) for application development. Additionally, the cRIO-9035 features an SDHC slot and a variety of connectivity ports, including two tri-speed RJ-45 Gigabit Ethernet, two USB host, one USB device, and two RS-232 serial. The registered trademark Linux® is used pursuant to a sublicense from LMI, the exclusive licensee of Linus Torvalds, owner of the mark on a worldwide basis.
-
Product
Disk Drive Test System
Saturn
Test System
The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
-
Product
Scienlab Battery Test System — Cell Level
SL1002A
Test System
Test System with up to 36 Channels.The Keysight SL1002A provides sink and source with 0 to 6 V, 100 to 600 A, 0.6 to 3.6 kW and 36 channels for battery cells.
-
Product
Video Encoding and Machine Learning
-
Fraunhofer Institute for Telecommunications
With the proliferation of video in our everyday lives, the efficient coding, transport, processing and analysis of video signals is becoming more and more important. The Department of Video Coding and Machine Learning is concerned with image and video coding, transport of multimedia data, design of embedded systems for multimedia processing as well as analysis and machine understanding of images and videos.
-
Product
Bluetooth RF Test System
FRVS
Test System
FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
-
Product
Configurable Data-Logging System
NI CompactDAQ
Data Acquisition System
This NI CompactDAQ configurable data-logging system includes an NI CompactDAQ controller or chassis, C Series I/O modules, and Chameleon software. It is designed for structural test and monitoring applications with the NI CompactDAQ controller, which includes built-in processing and nonvolatile storage for running Chameleon software and logging data locally. Alternatively, you can choose a USB or Ethernet chassis for a lower cost system that requires an external PC. This system accepts a variety of C Series I/O modules, so you can mix and match microphones, accelerometers, and temperature and bridge-based sensors.
-
Product
Multi-Functional Optical Profiling system
7505-01
System
Chroma 7505-01 is the newest multi-function optical inspection system that equips with the capability of measuring 1D, 2D and 3D at the same time. Penetrating reflection measurement is used for 1D film thickness measurement to measure the non-destructive film thickness on transparent and translucent material.
-
Product
Mezzanine System Carrier
MMS8010 / MMS8011
System
The Abaco ECM 3U VPX carrier supports up to six Abaco Systems Electrical Conversion Modules (ECMs) in a VITA 46 VPX form factor. Each ECM site connects 32 single-ended 3.3 V signals to the FPGA. The specific ECM board installed on a site converts the FPGA signals to 16 I/O signals, for a total of 96 I/O signals across the six ECM sites.
-
Product
Radisys Management System
System
The Radisys Management System is a carrier-grade management solution built to scale as your network evolves while maintaining high-performance levels.
-
Product
Medalist i1000D Small Foot Print Inline and Offline In-Circuit Systems
U9405A
System
Unlike traditional bridge type board handlers that add a 3rd party equipment on your offline ICT systems, we provide a one-stop shopping experience when you are automating your in-circuit test.
-
Product
PXIe-8842 2.6 GHz 6-Core Processor PXI Controller
788816-0118
Embedded Controller
The PXIe8842 is an embedded controller for PXI systems that you can use for processor-intensive modular instrumentation and data acquisition applications. The PXIe8842 includes two 10/100/1000/2500BASET (Gigabit) Ethernet ports, one Thunderbolt 4 port, two USB 3.0 ports, four USB 2.0 ports, as well as an integrated hard drive, serial port, and other peripheral I/O. Thunderbolt is a trademark of Intel Corporation or its subsidiaries in the US and/or other countries.
-
Product
cRIO-9035, 1.33 GHz Dual-Core CPU, 1 GB DRAM, 4 GB Storage, and Kintex-7 70T FPGA, 8-Slot CompactRIO Controller
783848-01
Embedded Controller
1.33 GHz Dual-Core CPU, 1 GB DRAM, 4 GB Storage, and Kintex-7 70T FPGA, 8-Slot CompactRIO Controller - The cRIO-9035 is a rugged, fanless, embedded controller that you can use for advanced control and monitoring applications. This software-designed controller features an FPGA, a real-time processor running the NI Linux Real-Time OS, and embedded user interface capability. You also can use the Mini DisplayPort to add a local human machine interface (HMI) for application development. Additionally, the cRIO-9035 features an SDHC slot and a variety of connectivity ports, including two tri-speed RJ-45 Gigabit Ethernet, two USB host, one USB device, and two RS-232 serial. The registered trademark Linux® is used pursuant to a sublicense from LMI, the exclusive licensee of Linus Torvalds, owner of the mark on a worldwide basis.
-
Product
Memory Test System
T5230
Test System
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
-
Product
Modular Breakout System 8-Pin Power D-type Plugin Module for 40-192
95-192-001
Modular Breakout System
The 95-192-001 Plugin Breakout Module is designed to be fitted to a PXI 40-192 Fault Insertion Switch as part of the Pickering MBoS. The Modular Breakout System is designed to Simplify HILS (Hardware In the Loop Simulation) Applications.
-
Product
Mezzanine System
5174
System
The 5174 provides two major functions, serving as a precision Voltage Controlled oscillator board and a variable frequency source board. These features can be use together or independently. As a variable frequency source, the 5174 provides a high-resolution variable clock source that is based upon a reference clock supplied by the ECM carrier.
-
Product
VIP Cabin Management Systems
System
Where elegance meets powerful functions, add a new level of electronic sophistication to your cabin.
-
Product
Memory Test System
T5851/T5851ES
Test System
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
-
Product
Wafer Chip Inspection System
7940
System
Chroma 7940 wafer chip inspection system is an automated inspection system for postdiced wafer chip inspection.
-
Product
IPC Systems
System
Industrial Server-Grade System delivers a scalable high performance platform for a wide array of industrial applications.
-
Product
LitePoint RF Test System
J750
Test System
The option of adding LitePoint instrumentation to the J750 system delivers a cost-effective, complete production test solution covering global wireless connectivity standards.
-
Product
SoC Test Systems
Test System
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
-
Product
VLSI Test System
3380P
Test System
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
