X-ray
Electromagnetic Spectrum whose radiation wavelength is 1 nm - 1pm and frequency (Hz) ranges between 10 to the 17th and 10 to the 20th power.
See Also: X-ray Systems
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Tube-Above Wavelength Dispersive X-ray Fluorescence Spectrometer
ZSX Primus IV
As a tube-above sequential wavelength dispersive X-ray fluorescence spectrometer, the new Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards. ZSX Guidance supports you in all aspects of measurement and data analysis. Can accurate analysis only be performed by experts ? No — that is in the past. ZSX Guidance software, with the built-in XRF expertise and know-how of skilled experts, takes care of sophisticated settings. Operators simply input basic information about samples, analysis components and standard composition. Measured lines with the least overlap, optimum backgrounds and correction parameters (including line overlaps) are automatically set with aid of qualitative spectra.
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High Resolution Inline AXI Platform
AXI XS Series
The XS-platform series is a small-footprint high-resolution automated X-ray inspection system concept designed for sophisticated high-speed inspection of semiconductor samples, wire bonds and PCB-assembly boards for single/multipanels or samples in trays. The inspectable applications range from component level inspection to mid-sized SMT boards.
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X-Ray Beam Monitors
When standard products just aren’t good enough—or the measurement technology does not yet exist—Sydor Technologies develops technology to enable these complex imaging measurements. Just as we’ve developed next-generation streak cameras and x-ray detectors to meet novel, emerging requirements in national laboratories, we’re doing the same with x-ray beam monitors.
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Constant Potential Generator Small Focal Spot 10 to 200 kV
CP200DS
The small focal spot (1 mm) of the CP200DS generator minimizes un-sharpness and gives clearer images, which makes it ideal for digital radiography (DR) when close X-ray shots are possible.Our CP200DS is a light and powerful generator (200 kV) with a metal-ceramic tube which turns it to be the best power-to-weight ratio in the world.Its 100% duty cycle combined to its built-in multiple X-Ray outputs carousel make the CP200DS one of the most versatile generators on the market that will adapt to a very wide variety of NDT applications.The CP200DS, like the rest of the CPSeries product range, operates with the plug-and-play POWERBOX control unit.
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Detachable X-Ray Detector
RadEye HR
The Remote RadEye HR x-ray detector is a slim, lightweight, rugged solution for high-resolution radiation imaging. The detector is suitable for industrial inspection applications where images are taken in tight or difficult-to-reach spaces.
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Microprocessors
CAES specializes in digital hardware design for commercial and aerospace applications. Our processing solutions are ideal for spacecraft on-board computers, payload processing, nuclear power plant controllers, critical transportation systems, high-altitude avionics, medical electronics and X-ray cargo scanning.
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Beam Directional Power Supply Mains
SiteX CP225D
The CP225D is currently the most powerful constant potential X-Ray generator in ICM's portfolio. Supplemental to its outstanding penetration capacity (up to 47 mm for steel in just 10 minutes), it includes a built-in multiple X-Ray output carrousel that features a Beryllium window for the inspection of lighter alloys such as aluminum and carbon fiber. The CP225D is one of the most versatile generators on the market and will adapt to an extremely wide variety of applications. In fields as diverse as the construction or petrochemical industries, its power and small focal spot, light weight, compactness and high penetration capacity will be much appreciated.
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Low cost EDXRF Elemental Analyzer
NEX QC+ QuantEZ
Applied Rigaku Technologies, Inc
As a premium low-cost benchtop EDXRF elemental analyzer, the Rigaku NEX QC+ QuantEZ delivers wide elemental coverage with easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids, and slurries. The 50 kV X-ray tube and Peltier cooled silicon drift detector (SDD) deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability, along with multiple automated X-ray tube filters, provides a wide range of XRF applications’ versatility and low limits-of-detection (LOD).
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Electron Multiplication (EM) Standard Image Sensors
EM (Electron Multiplication) is a technology that uses on-chip gain in the charge domain to effectively eliminate read noise from an image sensor. This enables advanced ultra-low light applications that require extreme sensitivity at fast frame rates. Examples include life science applications such as single molecule detection, super resolution microscopy and spinning disk confocal microscopy along with physical science applications such as nanotechnology imaging, Bose Einstein condensates and soft X-ray spectroscopy, and astronomy applications such as adaptive optics and lucky imaging. The inclusion of an additional conventional output allows further flexibility for applications such as true 24 hour surveillance.
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Counterfeit Analysis / Screening Services
DPACI perform counterfeit part analysis on all types of electrical, electronic, and electromechanical (EEE) components. Our suspect counterfeit analysis task groups include source identification, manufacturer validation, external visual inspection, mechanical inspection, electrical test, X-Ray, in-depth internal visual and materials analysis. With one of the largest databases of test reports for EEE components, we can offer similar historical data for correlation with images, test data, certifications and reports.
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High Performance XRF Measuring Instrument
FISCHERSCOPE® X-RAY XAN® 250
Universal high performance X-ray fluorescence (XRF) measuring instrument for fast and non-destructive material analysis and coating thickness measurement. Measurements according to DIN EN ISO 3497 and ASTM B 568.
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Handheld XRF Analysers
X-MET8000 range
Hitachi High-Technologies Corp.
The X-MET8000 range of handheld X-ray fluorescence (HHXRF) analysers delivers the performance needed for rapid alloy grade identification and accurate chemistry of a wide variety of materials (solid and powder metals, polymers, wood, solutions, soil, ores, minerals etc). The X-MET is practical, rugged and easy to use to deliver results you can trust.
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X-ray Fluorescence Sulfur-in-Oil Analyzer
SLFA-60
HORIBA introduces the new standard of transportable sulfur-in-oil analyzers, the SLFA-60. This instrument introduces new software and hardware features to meet the growing changes in the petroleum industry. The instrument has expanded storage of calibration curves and data can be exported using USB output. The measurement range has increased to 0-9.9999 wt% to cover high sulfur crudes and shale oil markets.
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Imaging X-Ray Photoelectron Spectrometer
AXIS Supra+
X-ray photoelectron spectroscopy (XPS) is unique in providing quantitative elemental and chemical state information from the uppermost 10 nm of a materials surface. The AXIS Supra+ (also known as Kratos Ultra 2+ in Japan) is a market leading X-ray photoelectron spectrometer combining state-of-the-art spectroscopic and imaging capabilities with the highest level of automation currently available. Unrivalled large area spectroscopic performance allows photoelectron spectra to be acquired from all types of materials including metals, semi-conductors and insulators. Fast, high spatial resolution XPS imaging reveals the lateral distribution of surface chemistry and aids further characterisation with selected small area analysis.
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High-speed In-Line 3D CT Inspection System
X-eye 6300
Automatically inspects the defects of products in customer's line with high-speed 3D CT tomography.Able to inspect every defects of Double-sided PCBA & BGA mounted components precisely by solving overlapped X-ray image issue.Inspection speed of 3 sec/1FOV from loading to automatic Good/NG judgement.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDL®
Your entry into automated measuring. Robust XRF measuring device for quality control of electroplated bulk parts and for bath analysis.
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X-Ray Systems
X-ray and radioactive devices developed by AET, are widely utilized for medical, industrial and research use. The Compact Pulse X-ray Source can accelerate electron beams in a high-gradient electric field, to produce X-rays. Dose Calibrators are utilized for radioactive examinations and treatments in the medical industry.
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Digital mammography system
AMULET
The new format FPD has a proprietary panel structure with a double layer of amorphous selenium that has high X-ray absorption properties, and was developed by combining Fujifilm''s "Device Development Technology" and "Vacuum Deposition Technology." The first layer efficiently converts X-rays into electrical signals, while the second layer employs the unique "Direct Optical Switching Technology," that captures higher resolution and lower noise image electrical signals rather than using electrical switches such as conventional TFTs. By achieving both "50µm fine pixel size (higher resolution) and low noise," the AMULET system can show microcalcifications and tumors in greater detail, both significant indicators for early diagnosis of breast cancer.
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XRF Lead Paint Spectrum Analyzer
LPA-1
The LPA-1 is a state-of-the-art Lead Paint Analyzer using X-Ray Florescence (XRF) and K-Shell technologies, providing readings in as little as 2-4 seconds. It is widely considered the fastest, most reliable lead inspection system today. Non-destructive testing for lead on painted surfaces. Fast, efficient and easy to use testing device. Completes readings in 2-4 seconds.
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XRF Analyzers
Vanta iX
The Olympus Vanta™ iX in-line X-ray fluorescence (XRF) analyzer gives you confidence in your products by automating material analysis and alloy identification on the manufacturing line.
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Quantitative Analysis Software
Electron Probe X-Ray Analyzer (EPXA)
The software runs on standard PC’s and operating systems (Windows XP and later). Complete ZAF analysis is possible, with or without standards, using an internal database of fundamental parameters (FP) such as absorption coefficients, fluorescence yields, transition probabilities, etc. There is also an integrated spectrum display.
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Analysis System
Neptune (EDS-WDS)
By integrating Energy Dispersive Spectroscopy (EDS) and Wavelength Dispersive Spectrometry (WDS) analytical techniques on a single platform, Neptune provides the power and flexibility of EDS with the resolution, precision, and detection limits of WDS. Together the two techniques extend X-ray microanalysis capabilities and provide solutions to the most challenging analysis problems. Each technique can be used independently or the data can be integrated to provide results which were previously unachievable.
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XRD Diffractometers
Empyrean Range
With the Empyrean, Malvern Panalytical has set the new standard in developing the ultimate X-ray platform for the analysis of powders, thin films, nanomaterials and solid objects.
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Compact Photon Counting X-Ray Detector
HyPix-3000
Rigaku’s HyPix-3000 is a next-generation two-dimensional semiconductor detector designed specifically to meet the needs of the home lab diffractionist. One of the HyPix-3000’s unique features is its large active area of approximately 3000 mm² with a small pixel size of 100 μm², resulting in a detector with high spatial resolution. In addition, the HyPix-3000 is a single photon counting X-ray detector with a high count rate of greater than 10⁶ cps/pixel, a fast readout speed and essentially no noise.
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XRF
M Series
The M Series is the ultimate in high performance for the smallest x-ray spot sizes. The poly-capillary optics in the M Series is more advanced than the O Series, focusing the x-ray beam down to 15μm FWHM. To measure features on that scale, a 150x magnification camera is included. The field of view becomes more limited with higher magnification, so a second camera takes a macro-image of the part to be measured. The dual-camera system allows operators to see the entire part, click the image to zoom in with the high-mag camera, and pinpoint the feature to be measured.
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Portable XRF Spectrometers
Handheld / portable X-ray fluorescent (XRF) analyzers have the capability to non-destructively quantify or qualify nearly any element from Magnesium to Uranium, depending on the instrument configuration.
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Total Sulfur Process Analyzer
NEX XT
Applied Rigaku Technologies, Inc
Featuring third-generation X-ray transmission technology, the NEX XT represents the next evolution of process gauge for sulfur measurement (0.02% to 6% S) of crude, bunker fuel, fuel oils, and other highly viscous hydrocarbons, including residuums.The Rigaku NEX XT system is faster, more sensitive and far more compact than competitive systems, and provides continuous, reliable detection of sulfur at pressures up to 1480 psig. Rigaku NEX XT can operate as a stand-alone analyzer or provide real-time closed-loop control when tied into a blending or plant-wide automation system. Among its other key features are a simplified user interface, reduced standards requirement, automatic density compensation, password protection, and standard platform for communicating sulfur and density to a plant-wide DCS. Due to its unique design and robust construction, sample conditioning and recovery systems are typically not required.
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Energy Dispersive X-ray Spectroscopy
EDS
Materials Evaluation and Engineering
EDS is an elemental chemical microanalysis technique performed in conjunction with each of the SEMs at MEE. Features or phases as small as about 1 micron can be analyzed.
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Specimen Radiography System
XPERT 40
Whether in the biopsy suite or the pathology lab, nothing beats the XPERT 40 Specimen Radiography System in terms of versatility and speed. A 50kV, 1.0 mA X-ray penetrates the densest cores and surgical specimens, identifying the finest details in seconds.
