X-ray
Electromagnetic Spectrum whose radiation wavelength is 1 nm - 1pm and frequency (Hz) ranges between 10 to the 17th and 10 to the 20th power.
See Also: X-ray Systems
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Product
Quantitative Analysis Software
Electron Probe X-Ray Analyzer (EPXA)
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The software runs on standard PC’s and operating systems (Windows XP and later). Complete ZAF analysis is possible, with or without standards, using an internal database of fundamental parameters (FP) such as absorption coefficients, fluorescence yields, transition probabilities, etc. There is also an integrated spectrum display.
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X-Scan U
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X-Scan U series based on the novel digital platform improves image quality, increases maximum scanning speed and saves the overall system cost of industrial in-line and off-line nondestructive testing (NDT) of tires. X-Scan U series is an enhanced product family of U-shaped X-ray line cameras developed and optimized specially for high-speed digital tire inspection utilizing panoramic X-ray sources.
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Product
Linear Detector Arrays (LDAs)
X-Scan H
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This digital end-to-end solution is built on a proven concept enabling easy integration, and accelerated development time of X-ray systems. X-Scan H series has high radiation hardness extending lifetime of detectors significantly, and reducing total costs. The series is available in several standard lengths easily scalable to various configurations.
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Product
Data Acquisition Control Boards
X-GCU
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X-GCUs are a data acquisition and control boards of Detection Technology’s digital X-ray detector platforms. X-GCU together with the digital X-Cards provide complete and easily scalable detector subsystems shortening time-to-market and delivering total cost savings for all types of X-ray imaging systems.
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Product
High Voltage Film Capacitor
STHVP/STHVE
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High Voltage Pulse Current for medium frequency applicationHigh Voltage DC / AC Voltage applicationCapacitor can be discharged at rated voltage directly without any protective component and with ambient Temperature up to +105CHigh Voltage Decoupling and SnubberingVoltage MultiplierInduction heatingAct as discharge capacitor to trigger laser, X-Ray and Tesla CoilFor high voltage capacitor bank or arrayHigh Voltage Power Supplies
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Product
Beam Panoramic Power Supply Battery Crawler 40 to 160 kV
CP160CR
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Designed to fit into 6” pipelines and higher, the CP160CR constant potential X-Ray generator for crawlers is – in its category – the most powerful panoramic X-Ray tube head in the world for crawlers. The generator is making the cutting edge constant potential technology of the CPSERIES even more compact into a 9.9 kg – 120 mm diameter X-Ray tube head. The crawler unit is capable of penetrating up to 28 mm of steel in 10 minutes, which corresponds to just a 25 second exposure time for 6” standard pipeline welds.
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Product
X-ray Inspection Of PCB Boards And More
The RTX Series
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Glenbrook’s RTX Series of modular, real-time systems include models designed to meet a variety of production requirements including circuit board components. Numerous options make it easy to customize any RTX model to your specific application. All hardware and software elements are fully compatible to ensure the continued value of your equipment.
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Product
Crystallographic Imaging Software
GrainMapper3D™
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The GrainMapper3D software provides non-destructive 3D crystallographic imaging through LabDCT™ on the ZEISS Xradia 520 Versa X-ray Microscope made for laboratory use.
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Product
WDXRF Wafer Analyzer
2830 ZT
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The 2830 ZT wavelength dispersive X-ray fluorescence (WDXRF) wafer analyzer offers the ultimate capability for measuring film thickness and composition. Designed specifically for the semiconductor and data storage industry, the 2830 ZT Wafer Analyzer enables the determination of layer composition, thickness, dopant levels and surface uniformity for a wide range of wafers up to 300 mm.
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Product
Beam Geometry & Alignment Testing
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Perform quality control testing of your Digital Radiography (DR), Computed Radiography (CR) and Fluoroscopy X-ray systems with ease. Comply with local, state, federal, and governing bodies for digital and traditional analog radiographic imaging technologies.
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Industrial Computed Tomography
TomoScope® S
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In both design and construction, the measuring machine meets the legal requirements for a fully protective device according to x-ray device regulations. Additional safety features have been included over and above the legal requirements.
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Product
Research XRD Diffractometers
X'Pert³
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The successful X'Pert platform is continued by the Malvern Panalytical’s X'Pert³ range of X-ray diffraction systems. With new on-board control electronics, compliance with the latest and most stringent X-ray and motion safety norms, advances in eco-friendliness and reliability the X'Pert³ platform is ready for the future.
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Product
XRD Diffractometers
Empyrean Range
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With the Empyrean, Malvern Panalytical has set the new standard in developing the ultimate X-ray platform for the analysis of powders, thin films, nanomaterials and solid objects.
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Product
X-ray Fluorescence Sulfur-in-Oil Analyzer
SLFA-20
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The SLFA-20 are designed specifically to meet the recent demanding needs of measuring the new low sulfur fuels, diesel and RFG.Using the X-ray fluorescence technique, fast and accurate measurements can be carried out in compliance with the ASTM D4294 method, either in the lab or in the field.
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Product
HPGe Detectors & Spectrometers
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Baltic Scientific Instruments, Ltd
Baltic Scientific Instruments produces gamma- and X-ray spectrometers based on HPGe coaxial or planar detectors with liquid nitrogen and electric machine cooling. The spectrometers are used for radionuclide analysis and for monitoring of activity in the nuclear industry and related environment monitoring. HPGe detectors have additional applications in scientific research and technology development as well as in various spheres of industry including security and border control.
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Product
Benchtop X-ray Diffractometer
Aeris
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Meet Aeris – our brand-new benchtop X-ray diffractometer. Aeris will impress you with data quality and speed of data acquisition so far only seen on full-power systems. The instrument is accessible for everyone with its built-in touch screen and intuitive software. Being a Malvern Panalytical product guarantees delivery of the best benchtop data and full automatability for industrial applications. Aeris is designed for low cost of ownership and is available in 4 editions tailored to the needs of specific markets: the Cement, Minerals, Metals and Research editions.
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XRF Lead Paint Spectrum Analyzer
LPA-1
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The LPA-1 is a state-of-the-art Lead Paint Analyzer using X-Ray Florescence (XRF) and K-Shell technologies, providing readings in as little as 2-4 seconds. It is widely considered the fastest, most reliable lead inspection system today. Non-destructive testing for lead on painted surfaces. Fast, efficient and easy to use testing device. Completes readings in 2-4 seconds.
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Product
Portable XRF Spectrometers
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XRF (X-ray fluorescence) is an innovative, non-destructive technology for material analysis. It`s unique and almost universal, given you get a high-quality XRF gun (handheld XRF). An X-ray gun sees sample contents by using an X-ray source to measure the secondary ways (fluorescent) the sample emits. Such an analysis is clear and fast.
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Product
X-Scan T
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The X-Scan T series is a product family of TDI (Time Delay Integration) technology-based X-ray line cameras that are optimized for demanding industrial environments.
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X-ray sources / X-ray optics
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X-ray sources are the heart of every X-ray analytical instrument. In combination with advanced X-ray optics, they generate the required X-ray radiation for structure analysis in various fields of material and life sciences. X-ray sources must offer perfect thermal constancy for excellent position stability of the X-ray beam as well as high intensity, even at low power levels. The design has to guarantee easy integration into advanced X-ray equipment paired with straightforward operation to keep uptimes high and to guarantee maximum radiation safety for operators and equipment.
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Industrial Computed Tomography
TomoScope® XL NC
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Coordinate measuring machine with x-ray tomography for the most stringent requirement with a small cone beam angle
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Product
Making Invisible Visible
Quadra 3
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Quadra™ 3 is your partner for high quality X-ray inspection for production line quality control. Detect a wide range of manufacturing defects including BGA, QFN and IGBT attachment, PTH filling, interfacial voiding, component cracking and counterfeit device screening. High quality, high magnification inspection for product applications.
