X-ray
Electromagnetic Spectrum whose radiation wavelength is 1 nm - 1pm and frequency (Hz) ranges between 10 to the 17th and 10 to the 20th power.
See Also: X-ray Systems
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Non Destructive Analysis
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The submicron resolution of a submicron focus X-ray tube and digital image detection offers in 2D and Oblique View with High Magnification imaging mode high resolution X-ray images. A 3D image of the sample can be reconstructed from multiple image recordings during a 360° rotation of the sample. Virtual any cross section can be viewed at an offline workstation. This mode is a strong tool for multi-material components.
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X-Ray Inspection System
MX1
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Manncorp’s new MX1 is a high-performance x-ray inspection system designed for real time imaging of multilayer PCBs and dense metal BGAs, μBGAs, and chip scale packages. Its high voltage (80kV), computer-controlled x-ray tube and 35 μm focal spot provide the power necessary for detection of a variety of defects including bridging, voids, and missing balls. The MX1’s standard camera features continuous zoom magnification from 4X to 50X and variable angle viewing up to 45°, and an upgrade to the x-ray tube can boost magnification to 225X.
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Inline 3D-CT Automated X-ray Inspection Systems (3D-AXI)
3Xi Series
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Saki's 3D-AXI (X-Ray) series adds significant inspection capability. The system utilizes Planar Computed Tomography (PCT) providing high precision CT imaging at high speed.
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Real-Time X-Ray Imaging and Variable Pressure Scanning Electron Microscope
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Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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Digital Radiography Software
SHERLOCK NDT
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Sherlock NDT is the perfect link between Teledyne ICM best in class portable X-ray generator, the CPSERIES, and our high-resolution digital radiography detectors, the Go-Scan SERIES. Developed by and with NDT DR specialists, this intuitive and user-friendly touchscreen software produces high-quality images, allows real-time (video) acquisition, and comes with many different enhancement features.
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High-power Benchtop Sequential WDXRF Spectrometer
Supermini200
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Elemental analysis of solids, liquids, powders, alloys and thin films. The new Supermini200 has improved software capabilities as well as a better footprint. As the world''s only high-power benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer for elemental analysis of oxygen (O) through uranium (U) of almost any material, the Rigaku Supermini200 uniquely delivers low cost-of-ownership (COO) with high resolution and lower limits-of-detection (LLD)..
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Microscopy Software/Hardware
ZEISS Atlas 5
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Atlas 5 is your powerful hardware and software package that extends the capacity of your ZEISS scanning electron microscopes (SEM) and ZEISS focused ion beam SEMs (FIB-SEM). Use its efficient navigation and correlation of images from any source, e.g. light- and X-ray microscopes. Take full advantage of high throughput and automated large area imaging. Unique workflows help you to gain a deeper understanding of your sample.
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Industrial Computed Tomography
TomoScope® S
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In both design and construction, the measuring machine meets the legal requirements for a fully protective device according to x-ray device regulations. Additional safety features have been included over and above the legal requirements.
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Real-time X-ray Inspection System
JewelBox 70T™
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The JewelBox-70T delivers superior image quality with excellent resolution and sensitivity for laboratory and failure analysis applications. The system’s 10-micron MicroTech™ x-ray source provides magnification from 7X to 2000X, with resolution of 100 line pairs/mm.
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Product
Control Unit for SITEx & SITExs
SITEX SCU286
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The SCU286 has a system for direct measurement of the high voltage delivered by the X-Ray generator to guarantee the accuracy of the radiological parameters. Based on this data the control system maintains the stability of mA and kilovolts to within ± 0.5% in any selection range.SITEX & XS units offer a totally constant quality of exposures, as they are virtually exempt from fluctuations in the power supply.
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Failure Analysis
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A partial list of our state of the art test equipment, applicable to these testing disciplines, will include the following: Two Scanning Electron Microscopes with EDS (SEM/EDS) Three Differential Scanning Calorimeters (DSC) Three Thermogravimetric Analyzers (TGA) Three Thermo Mechanical Analyzers (TMA) One Dynamic Mechanical Analyzer (DMA) Two Real-Time Fluoroscopic X-ray Systems, including a Microfocus System One Fourier Transform Infrared Microscope (FTIR) (capable of identifying a single particle of an unknown material) Two Ion Chromatographs (IC) (capable of identifying ionic impurities in ppm)
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elemental analyzer
SPECTRO XEPOS
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SPECTRO Analytical Instruments GmbH
An elemental analyzer designed for demanding applications – the SPECTRO XEPOS energy dispersive X-ray fluorescence (ED-XRF) spectrometer redefines XRF analysis with exceptional new levels of performance
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Micro-XRF spectrometer
Atlas™
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The Atlas™ Micro-XRF spectrometer (µXRF) from IXRF Systems introduces a new world of x-ray mapping and automation. The Atlas™ boasts the largest chamber volume and SDD detection area (150mm2) well as the smallest spot size (10µ) available on the market. Additionally, the Atlas™ is complimented by the most comprehensive software suite including multi-point analysis, unattended automation, in-depth feature/image analysis, unprecedented mapping and reporting features, and much more.
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Gasoline and Diesel Analyzer
NAX-100S
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Napco Precision Instruments Co
NAX-100S is the X-ray fluorescence spectrometer which is collaborative researched Sense and the University of Michigan in USA,TsingHua University in china and other spectrum experts, It is based on American high-end technology,has a design patent about the unique vacuum system ,special optics path system,designed for the detection of gasoline and diesel,has excellent stability about the ultra low content of elements analysis for petroleum chemical industry products.
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Small-Angle X-Ray Scattering (SAXS) Products
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Small-Angle X-Ray Scattering (SAXS) Products from Rigaku
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Flat Panel Detectors
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Are a class of solid-state x-ray digital radiography devices similar in principle to the image sensors used in digital photography and video.
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High-Speed Video Camera
Hyper Vision HPV-X2
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Medical science and engineering have made dramatic progress thanks to visualization technology. Examples include the invention of microscopes capable of enlarged observations of phenomena occurring in the microscopic domain, invisible to the human eye, X-ray inspection systems, which enable the observation of images utilizing light at imperceptible wavelengths, and infrared cameras. Our eyes are incapable of capturing phenomena occurring at times shorter than 50 to 100 ms. As a result, high-speed video cameras have become necessary in order to record phenomena occurring at intervals that cannot be seen with the human eye, and then replay them at a slower rate so that they can be visualized. As the standard tool for visualizing ultra high-speed domains, the Hyper Vision high-speed video camera contributes to our understanding of ultra high-speed phenomena in a variety of fields.
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Windows-Based Software Suite for Rigaku's X-Ray Diffractometers
SmartLab Studio II
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SmartLab Studio II is a new Windows®-based software suite developed for the flagship Rigaku SmartLab X-ray diffractometer that integrates user privileges, measurements, analyses, data visualization and reporting. Newly available for the MiniFlex, the modular (plugin) architecture of this software delivers state-of-the-art interoperability between the functional components. Just one click switches from measurement to analysis. Watch real-time scans from one experiment while simultaneously analyzing other data on the same desktop by selecting an appropriate layout. The software provides various analysis tools such as automatic phase identification, quantitative analysis, crystallite-size analysis, lattice constants refinement, Rietveld analysis, ab initio structure determination, etc.
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Electron Multipliers
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Electron multipliers are mainly used as positive/negative ion detectors. They are also useful for detecting and measuring vacuum UV rays and soft X-rays. Hamamatsu electron multipliers have a high gain (multiplication factor) yet low dark current, allowingoperation in photon counting mode to detect and measure extremely small incoming particles and their energy. This means our Hamamatsu electron multipliers are ideal for electron spectroscopy and vacuum UV spectroscopy such as ESCA (electron spectroscopy for chemical analysis) and Auger electron spectroscopy as well as mass spectroscopy and field-ion microscopy.
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Fat Analysis
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Unlike standard x-ray systems which use a single x-ray energy spectrum to scan products, DEXA technology uses two energy spectrums to discriminate between high and low energy x-rays. A patented software algorithm uses the differential x-ray energy absorbance of these two energies by the meat to determine the fat content.
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Material Discrimination X-ray Technology
MDX
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Eagle’s Material Discrimination X-ray (MDX) technology enhances traditional x-ray inspection, providing food processors with unprecedented contaminant detection capabilities.
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Linear Detector Arrays (LDAs)
X-Scan H
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This digital end-to-end solution is built on a proven concept enabling easy integration, and accelerated development time of X-ray systems. X-Scan H series has high radiation hardness extending lifetime of detectors significantly, and reducing total costs. The series is available in several standard lengths easily scalable to various configurations.
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X-ray Inspection System
X-eye SF160 Series
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High-performance Micro-focus Open Tube with 160kV is installed and fine defects of 1㎛ are detectable. High-resolution X-ray image can be gained with world best magnification by installing high-price Open Tube as standard.Dual CT function can be purchased adtionally, and exact location & size of defects can be detected and analyzed with this function.
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Analysis System
Neptune (EDS-WDS)
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By integrating Energy Dispersive Spectroscopy (EDS) and Wavelength Dispersive Spectrometry (WDS) analytical techniques on a single platform, Neptune provides the power and flexibility of EDS with the resolution, precision, and detection limits of WDS. Together the two techniques extend X-ray microanalysis capabilities and provide solutions to the most challenging analysis problems. Each technique can be used independently or the data can be integrated to provide results which were previously unachievable.
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Scanning XPS Microprobe
PHI Quantera II
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The core technology of the PHI Quantera II is PHI’s patented, monochromatic, micro-focused, scanning x-ray source which provides excellent large area and superior micro-area spectroscopy performance. Spectroscopy, depth profiling, and imaging can all be performed over the full range of x-ray beam sizes including the minimum x-ray beam size of less than 7.5 µm. In addition to superior XPS performance characteristics the PHI Quantera II provides two in situ sample parking stations which enables the automated analysis of all three sample platens in a single user defined analysis queue.
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WDXRF Spectrometers
Zetium
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X-ray fluorescence spectrometry (XRF) is capable of elemental analysis of a wide range of materials, including solids, liquids and loose powders. Designed to meet the most demanding process control and R&D applications, the Zetium XRF spectrometer leads the market in high-quality design and innovative features for sub-ppm to percentage analysis of Be to Am.
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Energy Dispersive X-ray Fluorescence Spectrometer
EDX-LE
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EDX-LE is an X-ray fluorescence spectrometer designed specifically for screening elements regulated by RoHS/ELV directives. The model uses a detector (Si-PIN semiconductor detector) that does not require liquid nitrogen, thereby achieving lower operation cost and easier maintenance. Automated analysis functions improve operability without sacrificing its high level of inspection reliability. The time required from start of measurement to judgment is as short as one minute for some samples, which is very helpful in screening inspections for elements regulated by the RoHS directive.
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Spectrometers
VUV and XUV Spectrometers
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Innovative and affordable spectrometers for VUV/XUV/Hard X-Ray spectroscopy applications in science and industry
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Product
Gratings for Synchrotron, FEL and EUV Light Sources
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HORIBA Scientific holographic lamellar gratings exhibit ultra-low grooves roughness and unique efficiency uniformity making them ideal for Synchrotron, Free Electron Laser (FEL), EUV or Soft X-ray light sources.
