X-ray
Electromagnetic Spectrum whose radiation wavelength is 1 nm - 1pm and frequency (Hz) ranges between 10 to the 17th and 10 to the 20th power.
See Also: X-ray Systems
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Industrial Computed Tomography
TomoScope® S
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In both design and construction, the measuring machine meets the legal requirements for a fully protective device according to x-ray device regulations. Additional safety features have been included over and above the legal requirements.
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Precious Metal Analyzer
MIDEX
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SPECTRO Analytical Instruments GmbH
Small spot energy dispersive X-ray fluorescence (ED-XRF) spectrometer optimized for precious metal testing. Analyzing precious metals alloys, SPECTRO MIDEX provides high precision and accuracy for a wide range of concentration levels — plus record-setting testing times (as low as 15 seconds). For small jewelry items or drill cuttings from remelted samples, it analyzes a small spot (typically 1.2 mm). For silver samples, which may be relatively inhomogeneous, averaged results from an optional larger spot size maintain high-accuracy results.
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Software
DIFFRAC.SUITE
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DIFFRAC.SUITE represents a new software platform offering a wide range of software modules for easy X-ray powder diffraction data acquisition and evaluation. Based on Microsoft's .NET technology, DIFFRAC.SUITE offers all the advantages of most modern software technology for maximum ease of use and networking.
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Multi-Sensor Core Logger
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The Geotek Multi-Sensor Core Logger (MSCL) systems enable a suite of geophysical measurements to be obtained rapidly, accurately and automatically on sediment or rock cores. The rugged nature of the equipment makes it suitable for use in either an onshore laboratory/repository environment or onboard survey and drilling vessels. All of Geotek’s core loggers accept core between 50 mm and 150 mm in diameter and up to 1.55 m in length. Geological cores and materials come in a variety of sizes therefore the MSCL and X-ray CT systems are designed for a full range of core material in a variety of liner compositions. To accommodate varying customers’ requirements (both operational and scientific), we provide a range of different core loggers and X-ray CT systems:
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X5 Spacesaver X-Ray Inspection
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Designed to be integrated into line with optional free standing reject, Available in 300mm and 500mm belt width models, the X5 SpaceSaver is perfect for packed products with a width of up to 250mm.
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Product
GO-SCAN
15 10 XR
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Featuring Teledyne DALSA’s high-resolution CMOS detector, and the lightest x-ray generator on the market, Teledyne ICM’s CPSERIES, the Go-Scan solution is without a doubt the all-around NDT solution when it comes to image quality, ease of use, handiness, and reliability.
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Universal Offline AXI Systems
AXI XT-6 Series
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The XT-series provides the advanced inspection capability of Nordson TEST & INSPECTION's inline system in a smaller footprint manual load/island of automation system. The platforms are designed for flexibility and ease of use for a wide variety of products requiring 2D and 2.5D automated X-ray inspection. The XT-6/XT-6A platform is a highly flexible automated X-ray inspection system with minimum footprint and a parallel-kinematic Hexaglide manipulation unit for extreme-angle off-axis image acquisition with high resolution. It is suitable for high-quality X-ray analysis of electronic assemblies and material analysis of parts that require flexible part manipulation with multiple inspection angles. For batch modes and volume inspection the XT-6 can be equipped with a single-sided conveyor setup and magazine load/unload station (XT-6A).
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Energy Dispersive X-ray Fluorescence Spectrometer
EDX-LE
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EDX-LE is an X-ray fluorescence spectrometer designed specifically for screening elements regulated by RoHS/ELV directives. The model uses a detector (Si-PIN semiconductor detector) that does not require liquid nitrogen, thereby achieving lower operation cost and easier maintenance. Automated analysis functions improve operability without sacrificing its high level of inspection reliability. The time required from start of measurement to judgment is as short as one minute for some samples, which is very helpful in screening inspections for elements regulated by the RoHS directive.
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Scanning XPS/HAXPES Microprobe
PHI Quantes
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The PHI Quantes is the only commercially available automated, high-throughput lab-based HAXPES spectrometer. It is a unique scanning X-ray photoelectron microprobe that combines a high energy (HAXPES) monochromatic X-ray source (Chromium Kα) with a conventional monochromatic soft X-ray source (Aluminum Kα). Both sources are high flux focused X-ray beams that can be scanned across the sample surface and can be used to define analysis points, areas, lines, and maps with 100% confidence.
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Scanning XPS Microprobe
PHI Quantera II
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The core technology of the PHI Quantera II is PHI’s patented, monochromatic, micro-focused, scanning x-ray source which provides excellent large area and superior micro-area spectroscopy performance. Spectroscopy, depth profiling, and imaging can all be performed over the full range of x-ray beam sizes including the minimum x-ray beam size of less than 7.5 µm. In addition to superior XPS performance characteristics the PHI Quantera II provides two in situ sample parking stations which enables the automated analysis of all three sample platens in a single user defined analysis queue.
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Analysers
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Hand-held tester for checking the molybdenum content of stainless steels. Portable semi-quantative analyser for stainless steels, nickel-base alloys and monel. The MolyTester is most convenient for quick, non-destructive determination of alloys both in-shop and outdoor. Molytester is apllicable even for narrow weld seas where the local resolution of X-ray analysers is not fine enough.
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Scientific Solutions
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Our backside illuminated (BSI) and backthinned Charge Coupled Devices (CCDs) and front and back illuminated CMOS image sensors (CIS) are seen as the gold standard for scientific and quantum imaging in applications in spectroscopy, microscopy, in vivo, x-ray and astronomy. We understand that every imaging application is unique and requires our engineers and scientists to work closely with our customers providing highly tailored imaging solutions.
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Simultaneous Wavelength Dispersive X-ray Fluorescence Spectrometer
Simultix 15
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Multi-channel simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system, the Simultix 15 high-throughput WDXRF spectrometer. Analyze beryllium (Be) through uranium (U) in almost any sample matrix. The most important metrics for automated process control are precision, accuracy and sample throughput. With up to 30 (and optionally 40) discrete and optimized elemental channels and 4 kW (or optionally 3 kW) of X-ray tube power, Simultix 15 delivers unparalleled analytical speed and sensitivity.
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X-ray and CT inspection System
UX20
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Due to the transformation to electric mobility, foundries are increasingly producing larger and more complex components. With its exceptional inspection envelope and the smart Geminy software, the UX20 facilitates fast and precise inspections of cast parts and helps increase overall production efficiency.
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Product
SAXS
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Anton Paar’s precise and reliable solutions for SAXS/WAXS/GISAXS/RheoSAXS studies provide excellent resolution and the best possible data quality for your daily research of nanostructured materials. The robust systems employ brilliant X-rays as well as scatterless beam collimation and are equipped with a wide range of sample stages to cover many different applications.
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Basic Digital Systems
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The Medical Imaging System can be configured simply by installing the FCR Reader, the CR Console, and the Imager to your existing X-ray equipment. The Imager uses the dry film for output and therefore does not require a dark room as in conventional systems thus saving space. Also, the scanned image can be digitally saved to media and not on films, thus not much storage space is required.
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Spectrometers-XRF
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For X-ray fluorescence spectrometers for elemental analysis or trace element analysis, SPECTRO is a world leader
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Marine Fuel Sulfur Analyzer
NEX QC MFA
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Applied Rigaku Technologies, Inc
Specifically designed for marine fuel applications, the new Rigaku NEX QC MFA features an intuitive "icon-driven" touch screen interface for easy operation and a built-in printer for convenience. The shuttered 50 kV X-ray tube and Peltier cooled semiconductor detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides an analysis of sulfur (S), nickel (N), vanadium (V), iron (Fe) and zinc (Zn) ... all with low limits-of-detection (LOD).
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Product
Real-time Chemical Imaging System
AZtecLive & Ultim Max
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AZtecLive is a revolutionary new approach to EDS analysis that enables a radical change in the way users perform sample investigation in the SEM. It combines a live electron image with live X-ray chemical imaging to give an intuitive new way of interacting with your samples. 100 mm2 and 170 mm2 sensor areas. Quantitative analysis at 400,000 cps. EDS mapping at >1,000,000 cps.
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Medical Imaging
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ams offers high-speed, low-noise and low-power sensing solutions that enable manufacturers of Computer Tomography (CT) equipment and digital X-Ray Flat Panel Detectors (FPD) to produce crystal clear images while exposing patients to low doses of radiation. We are taking our leading imaging sensing solutions and expertise forward to achieve an unprecedented level of image accuracy while enhancing convenience and safety for the user.
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XRF Analyzers
Vanta iX
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The Olympus Vanta™ iX in-line X-ray fluorescence (XRF) analyzer gives you confidence in your products by automating material analysis and alloy identification on the manufacturing line.
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Beam Geometry & Alignment Testing
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Perform quality control testing of your Digital Radiography (DR), Computed Radiography (CR) and Fluoroscopy X-ray systems with ease. Comply with local, state, federal, and governing bodies for digital and traditional analog radiographic imaging technologies.
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Failure Analysis
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A partial list of our state of the art test equipment, applicable to these testing disciplines, will include the following: Two Scanning Electron Microscopes with EDS (SEM/EDS) Three Differential Scanning Calorimeters (DSC) Three Thermogravimetric Analyzers (TGA) Three Thermo Mechanical Analyzers (TMA) One Dynamic Mechanical Analyzer (DMA) Two Real-Time Fluoroscopic X-ray Systems, including a Microfocus System One Fourier Transform Infrared Microscope (FTIR) (capable of identifying a single particle of an unknown material) Two Ion Chromatographs (IC) (capable of identifying ionic impurities in ppm)
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Gratings for Synchrotron, FEL and EUV Light Sources
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HORIBA Scientific holographic lamellar gratings exhibit ultra-low grooves roughness and unique efficiency uniformity making them ideal for Synchrotron, Free Electron Laser (FEL), EUV or Soft X-ray light sources.
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General Purpose Benchtop XRD System for Phase I.D. and Phase Quantification
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In a move to bring lab-quality performance to the manufacturing floor, Rigaku introduces the MiniFlex XpC, a manufacturing-optimized powder diffractometer for fast and accurate quality control measurements. It is extremely easy to operate using Rigaku’s new EasyX quality control software, which requires minimal clicks to run. A minimal interface means there will be no accidental error variance from operator to operator. The MiniFlex XpC can be configured with a conveyor belt or robot for automated sample processing and collaboration with other instruments. With an 800 W X-ray source and a short-diameter goniometer, the system has the performance of a lab unit, and thus can greatly improve throughput for quality control measurements.
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High-speed In-Line 3D CT Inspection System
X-eye 6300
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Automatically inspects the defects of products in customer's line with high-speed 3D CT tomography.Able to inspect every defects of Double-sided PCBA & BGA mounted components precisely by solving overlapped X-ray image issue.Inspection speed of 3 sec/1FOV from loading to automatic Good/NG judgement.
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Gratings for Space-Flight
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HORIBA Scientific (with its Jobin Yvon Grating Technology) has 50 years of experience in space-flight gratings. The first space flight ruled gratings were produced for the CNES mission D2A in early 70’s. Since that date, HORIBA Scientific has continuously produced some of the most technically-challenging gratings ranging from off-plane X-ray replica gratings to aspherical 5800gr/mm VLS gratings for the FUV and Transmission Grisms or very low groove density VNIR-SWIR ruled blazed gratings. HORIBA Scientific gratings (master and replica) have been space qualified and are TRL9.
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Product
Constant Potential Generator Power Supply Mains
CP225D
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Supplemental to its outstanding penetration capacity (up to 47 mm for steel in just 10 minutes), the CP225D includes a built-in multiple X-Ray output carrousel that features a Beryllium window for the inspection of lighter alloys such as aluminum and carbon fiber. The CP225D is one of the most versatile generators on the market and will adapt to an extremely wide variety of applications. In fields as diverse as the construction or petrochemical industries, its power and small focal spot, light weight, compactness and high penetration capacity will be much appreciated.
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Product
XRF
L Series
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The L Series is the most versatile instrument that Bowman offers. It combines all of the features of the P Series with a larger sample chamber and greater X-Y stage travel. For samples larger than ~12 inches (300 mm) in any direction, the L Series is a must-have. The large sample stage and travel allows for both large parts, or large sample fixtures holding multiple parts, to be measured. The chamber is fully enclosed and boasts a capacity to hold samples up to 22″ (550mm) x 24″ (600mm) x 13″ (330mm) (LxWxH). The X-Y stage travel distance is 10″x10″ (254mm x 254mm). The standard configuration includes a 4-position multiple collimator assembly, and a variable focus camera allowing for measurement in recessed areas. As with other models, the collimator sizes and focal distances are customizable for different customer applications. The programmable X-Y stage is included, but can be removed to allow for the maximum sample height capacity (10″ (254mm) z-height with stage, 13″ (300mm) without). The solid-state PIN detector is included along with our long-life micro-focus x-ray tube. The high performance SDD detector is an optional upgrade.
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X-ray Microscopy
Xradia Family
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✔ Characterize the properties and behaviors of your materials non-destructively.✔ Reveal details of microstructures in three dimensions (3D).✔ Develop and confirm models or visualize structural details.✔ Achieve high contrast and submicron resolution imaging even for relatively large samples.
