X-ray
Electromagnetic Spectrum whose radiation wavelength is 1 nm - 1pm and frequency (Hz) ranges between 10 to the 17th and 10 to the 20th power.
See Also: X-ray Systems
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Handheld ED-XRF Spectrometers
SPECTRO xSORT
SPECTRO Analytical Instruments GmbH
The SPECTRO xSORT family of handheld ED-XRF spectrometers supplies elemental testing and spectrochemical analysis of myriad materials in widely varying conditions. These energy dispersive X-ray fluorescence devices are recognized for ruggedness and reliability on the job. They offer metals or nonmetals identification in seconds, with innovative technologies and designs that provide repeatable, laboratory-quality results. Simple, user-friendly displays and efficient ergonomics make these instruments extremely easy to use. At a range of affordable prices, SPECTRO xSORT spectrometers are leaders in their class for a broad spectrum of applications. - See more at: http://www.spectro.com/products/xrf-spectrometer/xsort-xrf-gun-handheld-analyzer#sthash.18piI4Px.dpuf
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Silicon Drift Detector
Octane Elite (SDD) Series
The game changing advancements in the Octane Elite Silicon Drift Detector (SDD) Series take detector technology to the next level. This line of detectors incorporates a new silicon nitride (Si3N4) window, which offers remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis. The Octane Elite Series also uses the widely praised CUBE technology, which yields high speed X-ray data processing within a smaller and fully vacuum encapsulated detector device.
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Beam Geometry & Alignment Testing
Perform quality control testing of your Digital Radiography (DR), Computed Radiography (CR) and Fluoroscopy X-ray systems with ease. Comply with local, state, federal, and governing bodies for digital and traditional analog radiographic imaging technologies.
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X Ray Flaw Detector
A non-destructive testing (NDT) device used to inspect materials for internal flaws or defects such as cracks, voids, inclusions, and weld discontinuities.
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Electron Sources
SPECS Surface Nano Analysis GmbH
To our customers in research and industry we offer a variety of sources for deposition, excitation and charge neutralization as well as analyzers and monochromators. Most of our sources originate from product lines which we have taken over from Leybold AG, Cologne, and from VSI GmbH. The X-ray monochromator Focus 500 and the UV monochromator TMM 302 are original developments by SPECS.Compliance with industry standards, a good price-performance ratio, stability, and longevity are the guidelines for our product development. We focus on standardized easy handling, user-friendliness, standardized software interfaces and safety.
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Bulkflow X-Ray Inspection System
Designed to be integrated into line with optional reject stations, the Bulkflow X-ray System is perfect for loose and free flowing products. Offering a good detection levels on a wide range of contaminants including all metal, bone, glass and dense plastics.
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Spectrometers
VUV and XUV Spectrometers
Innovative and affordable spectrometers for VUV/XUV/Hard X-Ray spectroscopy applications in science and industry
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Direct-Reading Dosimeters
The Direct-Reading Dosimeters are rugged, precision instruments. They are designed to measure and directly read, at any time accumulated dose of gamma and x-ray radiation exposure. The Direct-Reading Dosimeter is designed to satisfy military specifications for the IM-Series RADIAC METER and ANSI N13.5 and N322 requirements. The sturdy metal clip attaches the dosimeter to a pocket or any object to monitor total radiation exposure. They are hermetically-sealed and immersion proof.
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X-Ray Components
Photonis designed the Micro Pore Optics detector to be used in X-Ray imaging applications. Its perfectly square, flat channels are optimized to allow X-Ray and UV photons to be focused or collimated due to the total external reflection at a grazing angle (<2°). Micro Pore Optics are installed on a number of international space missions.
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XRF
L Series
The L Series is the most versatile instrument that Bowman offers. It combines all of the features of the P Series with a larger sample chamber and greater X-Y stage travel. For samples larger than ~12 inches (300 mm) in any direction, the L Series is a must-have. The large sample stage and travel allows for both large parts, or large sample fixtures holding multiple parts, to be measured. The chamber is fully enclosed and boasts a capacity to hold samples up to 22″ (550mm) x 24″ (600mm) x 13″ (330mm) (LxWxH). The X-Y stage travel distance is 10″x10″ (254mm x 254mm). The standard configuration includes a 4-position multiple collimator assembly, and a variable focus camera allowing for measurement in recessed areas. As with other models, the collimator sizes and focal distances are customizable for different customer applications. The programmable X-Y stage is included, but can be removed to allow for the maximum sample height capacity (10″ (254mm) z-height with stage, 13″ (300mm) without). The solid-state PIN detector is included along with our long-life micro-focus x-ray tube. The high performance SDD detector is an optional upgrade.
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Beam Directional Power Supply Battery 40 to 120 kV
CP120B
This ultra-light, compact and battery operated constant potential portable X-Ray generator is the perfect tool for specific NDT applications that require repetitive short exposures. Its versatility also makes it the ideal piece of equipment for security applications. In fact, in combination with the FLATSCAN15, the FLATSCAN30 and other digital X-Ray detectors, the CP120B will – thanks to its small focal spot and constant potential X-Ray output – enhance image quality and definitely contribute to a reduced exposure time.
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(X-ray and XUV) Streak Cameras
AXIS-PX
We build streak camera systems that can achieve time resolution on the femtosecond time scale while conserving and ultra-fine spatial resolution on a very long slit length.
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XRF Spectrometers
Epsilon Range
The Epsilon range of X-ray fluorescence XRF analyzers are an ideal analytical solution. They are capable of simple element identification and quantification up to more sophisticated analysis. They are easy to operate, compact and X-ray safe instruments without the need for additional chemicals or operating gasses. Considerable savings in time and cost are two of the many benefits XRF can bring compared to alternative analytical techniques.
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Aviation Security
Aviation is highly regulated, from ICAO Annex 17 to National Security Programs. Due to its high profile and the subsequent multitude of threats, regulation safeguards travel security. Our expertise will support your business, by supplying market leading X-Ray and Metal detection products along with maintenance, that meet the regulator requirements and best fit your business.
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Radiation Testers
The Ranger is a small, handheld, digital survey meter which offers excellent sensitivity to low levels of alpha, beta, gamma, and x-rays. It has built in efficiencies for common isotopes to calculate activity in Bq and DPM. It has a backlit display and a count light and abeeper that sounds with each count detected. Other features include selectable alert levels, an adjustable timer, and an optional wipe test plate. Internal memory and the free Observer USB Software allow you to download your data, set computer alarms, and calibrate your instrument! The Bluetooth and Observer BLE enables saving, sharing,and automation of surveys and RadResponder compatibility
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TXRF Spectrometers
Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.
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Si Detectors & Spectrometers
Baltic Scientific Instruments, Ltd
X-ray spectrometers based on Si detectors with liquid nitrogen cooling, Peltier and electric machine cooling. The spectrometers are applied in the various systems for element analysis: X-ray fluorescent; electron probe; with alpha and beta excitation etc, as well as for the precision diffractometry in the devices of structural and phase analysis.
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Scanning XPS Microprobe
PHI VersaProbe III
The PHI VersaProbe III is a highly versatile, multi-technique instrument with PHI’s patented, monochromatic, micro-focused, scanning X-ray source. The instrument offers a true SEM-like ease of operation with superior micro area spectroscopy and excellent large area capabilities. The fully integrated multi-technique platform of the PHI VersaProbe III offers an array of optional excitation sources, sputter ion sources, and sample treatment and transfer capabilities. These features are essential in studying today’s advanced materials and in supporting your material characterization and problem-solving needs.
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Scientific Solutions
Our backside illuminated (BSI) and backthinned Charge Coupled Devices (CCDs) and front and back illuminated CMOS image sensors (CIS) are seen as the gold standard for scientific and quantum imaging in applications in spectroscopy, microscopy, in vivo, x-ray and astronomy. We understand that every imaging application is unique and requires our engineers and scientists to work closely with our customers providing highly tailored imaging solutions.
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In Situ Diagnostics
For researchers working on ultra thin films and novel interfaces, Neocera offers insitu, real-time process control and diagnostic tools such as high-pressure RHEED, Low Angle X-ray Spectroscopy (LAXS) and Ion Energy Spectroscopy (IES). RHEED provides exceptional growth control via RHEED intensity oscillations and the Structural data via diffraction. LAXS is a complimentary to RHEED and provides real-time Compositional information. IES provides energetics of the laser generated plasma plume which is directly responsible for obtaining high quality films and interfaces.
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MultiBeam System
FIB
An easy-to-use, out-lens type scanning electron microscope (SEM) equipped with a Schottky electron gun, as well as a new FIB column capable of large current processing (maximum ion current 90nA) installed into one chamber. JIB-4610F enables high-resolution SEM observation after high-speed cross-section milling with FIB, and high-speed analysis with a variety of analytical instruments, such as energy dispersive X-ray spectroscopy (EDS) that takes advantage of the Schottky electron gun delivering a large probe current (200nA), electron back scatter diffraction (EBSD) to perform crystallographic characterization, and cathodoluminescence (CLD). In addition, the 3D analysis function Cut & See is included in the standard configuration, allowing cross-section milling to be executed automatically at fixed intervals, while acquiring SEM images for each cross section.
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Xineos Scanning
Teledyne DALSA's leadership in CMOS innovation lets our Xineos scanning products deliver three times more sensitivity and five times more signal-to-noise performance than other standard technologies at equal X-ray dose conditions. CMOS image detectors offer numerous advantages including the ability to record smaller image details with higher resolutions – allowing for the diagnostics of medical anomalies at earlier stages, and significantly increasing the probability of early intervention, patient recovery, and reduced treatment costs.
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Micro XRF
W Series
The W Series Micro XRF uses poly-capillary optics to focus the X-ray beam to 7.5 µm FWHM, the world’s smallest beam size for coating thickness analysis using XRF technology. A 150X magnification camera is used to measure features on that scale; it is accompanied by a secondary, low-magnification camera for live-viewing samples and birds-eye macro-view imaging. Bowman’s dual-camera system lets operators see the entire part, click the image to zoom with the high-mag camera, and pinpoint the feature to be programmed and measured.
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Radiation Monitor
The Radiation Monitor is the survey meter in measuring the beta, gamma and x-ray radiation. It is useful in monitoring the environment/home safety, nuclear, medical, mining and metal industries. It is also ideal for the border control, customs and cargo inspections.
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Small-Angle X-Ray Scattering (SAXS) Products
Small-Angle X-Ray Scattering (SAXS) Products from Rigaku
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Platform
AXM XM8000 Wafer
The complete solution for operator free, automated X-ray wafer metrology. XM8000 is specifically designed for inline use in clean room environments.
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Thyratrons and Accessories
Cargo scanning is a broad term which encompasses intelligent logistics, sniffer dogs and X-ray inspection. X-ray inspection systems offer rapid, non-invasive checking of manifests, detection of contraband, and when combined with other techniques, can be used to identify the presence of nuclear material. X-ray energies up to 10 MeV are required to penetrate fully loaded shipping containers and vehicles. These X-rays are generated through the acceleration of electrons along a linear accelerator into a target using megawatt energy microwave pulses produced by the RF sub-system.The skills for the design, manufacture and integration of specialised components for low-cost systems reside mainly in commercial companies. There is an emerging trend for linac system companies to demand higher performance from their integrated RF sub-systems.Currently, we intend not only to drive the innovation and development in this area, but also to offer integrated RF sub-systems to meet new requirements such as, portability, material discrimination and higher throughput.
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Universal Offline AXI Systems
AXI XT-6 Series
The XT-series provides the advanced inspection capability of Nordson TEST & INSPECTION's inline system in a smaller footprint manual load/island of automation system. The platforms are designed for flexibility and ease of use for a wide variety of products requiring 2D and 2.5D automated X-ray inspection. The XT-6/XT-6A platform is a highly flexible automated X-ray inspection system with minimum footprint and a parallel-kinematic Hexaglide manipulation unit for extreme-angle off-axis image acquisition with high resolution. It is suitable for high-quality X-ray analysis of electronic assemblies and material analysis of parts that require flexible part manipulation with multiple inspection angles. For batch modes and volume inspection the XT-6 can be equipped with a single-sided conveyor setup and magazine load/unload station (XT-6A).
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Process XRR, XRF, and XRD metrology FAB tool
MFM310
Thickness, density, roughness & composition of films on blanket and patterned wafers. The Rigaku MFM310 performs high-precision measurements not possible by optical or ultrasonic techniques. This sophisticated X-ray metrology tool makes it practical to perform high-throughput measurements on product and blanket wafers ranging from ultrathin single-layer films to multilayer stacks.
