X-ray
Electromagnetic Spectrum whose radiation wavelength is 1 nm - 1pm and frequency (Hz) ranges between 10 to the 17th and 10 to the 20th power.
See Also: X-ray Systems
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Automated X-ray Inspection (AXI)
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Automated X-ray inspection (AXI) is a testing approach based on the same principles as automated optical inspection (AOI). Instead of cameras, X-rays are used to automatically inspect features.
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Sindie Online
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Sindie Online is an industrial-grade process analyzer delivering continuous sulfur detection to monitor fuel streams and help to prevent tank contamination. It has many advantages over competing technologies: Powered by MWDXRF, Sindie Online has an exceptional signal-to-noise ratio using monochromatic excitation of the X-ray source characteristic line – a technique that is faster, safer and cleaner than UVF.
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Excitation Sources
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SPECS Surface Nano Analysis GmbH
o our customers in research and industry we offer a variety of sources for deposition, excitation and charge neutralization as well as analyzers and monochromators. Most of our sources originate from product lines which we have taken over from Leybold AG, Cologne, and from VSI GmbH. The X-ray monochromator Focus 500 and the UV monochromator TMM 302 are original developments by SPECS.
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Refurbished And Demo X-ray Inspection Systems
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Our 2024 collection of refurbished and demo X-ray inspection systems offers high-quality performance at an affordable price. These precision X-ray inspection systems provide exceptional value without compromising on quality.
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Flat Panel Detectors
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Are a class of solid-state x-ray digital radiography devices similar in principle to the image sensors used in digital photography and video.
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Research & Industry
XPERT 20
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A small focal spot x-ray source provides increased visibility and sharpness of detail. With an X-ray source of up to 25kV and 1.0mA, the XPERT 20 provides images with the highest resolution to locate the smallest detail. Designed for use in the most limited spaces with complete shielding and other radiation safety features, the XPERT 20 is fully compliant with U.S. Federal and State requirements for radiation safety and operates with only a standard AC power source.
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X-ray Fluorescence Spectrometer
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X-ray fluorescence spectrometer that provides quick, easy elemental analysis using touch screen operation. It is equipped with functions for conventional qualitative and quantitative analysis (FP method, calibration curve method), as well as screening for RoHS elements. With a variety of both hardware and software options available, it is customizable to cover a wide range of analysis needs.
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Industrial Computed Tomography
TomoScope® XL
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Micro focus X-ray source up to 225 kV (option: 300 kV micro focus tube) Grater range of x-ray detectors Grater range of x-ray detectors
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Crystallographic Imaging Software
GrainMapper3D™
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The GrainMapper3D software provides non-destructive 3D crystallographic imaging through LabDCT™ on the ZEISS Xradia 520 Versa X-ray Microscope made for laboratory use.
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X-ray Diffraction (XRD) Instruments
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X-ray diffraction (XRD) is one of the most important non-destructive tools to analyze all kinds of matter—ranging from fluids, to powders and crystals. From research to production and engineering, XRD is an indispensable method for materials characterization and quality control. Rigaku has developed a range of diffractometers, in co-operation with academic and industrial users, which provide the most technically advanced, versatile and cost-effective diffraction solutions available today.
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Beam Panoramic Power Supply Battery Crawler 40 to 160 kV
CP160CR
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Designed to fit into 6” pipelines and higher, the CP160CR constant potential X-Ray generator for crawlers is – in its category – the most powerful panoramic X-Ray tube head in the world for crawlers. The generator is making the cutting edge constant potential technology of the CPSERIES even more compact into a 9.9 kg – 120 mm diameter X-Ray tube head. The crawler unit is capable of penetrating up to 28 mm of steel in 10 minutes, which corresponds to just a 25 second exposure time for 6” standard pipeline welds.
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Direct-Reading Dosimeters
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The Direct-Reading Dosimeters are rugged, precision instruments. They are designed to measure and directly read, at any time accumulated dose of gamma and x-ray radiation exposure. The Direct-Reading Dosimeter is designed to satisfy military specifications for the IM-Series RADIAC METER and ANSI N13.5 and N322 requirements. The sturdy metal clip attaches the dosimeter to a pocket or any object to monitor total radiation exposure. They are hermetically-sealed and immersion proof.
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Electron Probe Microanalyzer
EPMA-8050G
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This instrument is equipped with a cutting-edge FE electron optical system, which provides unprecedented spatial resolution under all beam current conditions, from SEM observation conditions up to 1 μA order. Integration with high performance X-ray spectrometers that Shimadzu has fostered through the company's traditions achieves the ultimate advance in analysis performance.
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Radiographic Inspection Test
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The radiographic inspection is a non-destructive x-ray method for detecting internal physical defects in small component parts which are not otherwise visible. Radiographic techniques are intended to reveal such flaws as improper positioning of elements, voids in encapsulating or potting compounds, inhomogeneities in materials, presence of foreign materials, broken elements, etc.
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Photonic Detectors
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Excelitas offers photonic detection solutions covering a very broad spectrum, from Gamma, X-Ray, UV, Visible and into the near Infrared...making it a simple choice to find the right detector for your unique detection application. Product ranges include Silicon and InGaAS PINs and APDs, hybrid receivers and photon counting modules. In addition to our wide offering of off-the-shelf devices, we also specialize in customized solutions for your specific needs.
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Control Unit for SITEx & SITExs
SITEX SCU286
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The SCU286 has a system for direct measurement of the high voltage delivered by the X-Ray generator to guarantee the accuracy of the radiological parameters. Based on this data the control system maintains the stability of mA and kilovolts to within ± 0.5% in any selection range.SITEX & XS units offer a totally constant quality of exposures, as they are virtually exempt from fluctuations in the power supply.
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Neutronic Detection
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Neutron imaging is a non-destructive method used to see inside objects that may be inpenetrable by X-ray or other techniques.Neutrons offer the benefit of being able to see through heavy metals such as lead but can also be used to examine delicate processes.Photonis Neutron detector is designed to provide either still images or video using both cold and thermal neutron imaging techniquesfor non-destructive testing and neutron tomography.
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Portable XRF Analyzer
X-5000
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The Olympus X-5000™ is engineered to provide safe and superior in-the-field energy dispersive X-ray fluorescence (EDXRF) analysis. Functioning as a portable laboratory, this high-powered instrument is equipped with a secure closed-beam sample chamber and flexible analytical software that features a wide range of factory default and user-defined calibrations. The X-5000 offers the performance and safety of traditional benchtop EDXRF, merged with the cost-effective benefits and ruggedness of proven, portable XRF technology.
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X-ray Fluorescence Sulfur-in-Oil Analyzer
SLFA-60
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HORIBA introduces the new standard of transportable sulfur-in-oil analyzers, the SLFA-60. This instrument introduces new software and hardware features to meet the growing changes in the petroleum industry. The instrument has expanded storage of calibration curves and data can be exported using USB output. The measurement range has increased to 0-9.9999 wt% to cover high sulfur crudes and shale oil markets.
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X-Ray Cameras
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A range of scientific camera solutions optimized for high energy / X-Ray detection.
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Metrology Solutions for Semiconductors
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Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition.
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Portable X-RAY Fluorescence Measuring System
FISCHERSCOPE® X-RAY XAN® 500
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Mobile and universal handheld device for precise coating thickness measurement and material analysis - even with difficult material combinations.
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Inspection System
X-eye 7000B
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Appropriate for the inspection of medium•large size components and detection of surface structure and defects (inside voids and cracks etc).Due to high-energy, high-power Micro-focus X-ray Open Tube, maintenance cost's significantly reduced and long-term use possible with only replacing consumables.Customization is available with selecting main parts by customers depends on their needs for size and material.
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Permacoat Beryllium-Based Windows
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MICROMATTER Permacoat™ x-ray detector windows are beryllium based. The outer surface of the window has enhanced corrosion resistance due to a proprietary inert coating, which does not notably affect the transparency of the window.
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Handheld ED-XRF Spectrometers
SPECTRO xSORT
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SPECTRO Analytical Instruments GmbH
The SPECTRO xSORT family of handheld ED-XRF spectrometers supplies elemental testing and spectrochemical analysis of myriad materials in widely varying conditions. These energy dispersive X-ray fluorescence devices are recognized for ruggedness and reliability on the job. They offer metals or nonmetals identification in seconds, with innovative technologies and designs that provide repeatable, laboratory-quality results. Simple, user-friendly displays and efficient ergonomics make these instruments extremely easy to use. At a range of affordable prices, SPECTRO xSORT spectrometers are leaders in their class for a broad spectrum of applications. - See more at: http://www.spectro.com/products/xrf-spectrometer/xsort-xrf-gun-handheld-analyzer#sthash.18piI4Px.dpuf
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Diffractometers & Scattering Systems
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Bruker develops and manufactures analytical solutions for X-ray diffraction and scattering. Our innovative instruments and software support research, development and quality control in academia, governmental institutions and industry.
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Linear Array Detector Cards
X-Card 0.2 to 2.5mm
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A product family of high performance linear X-ray detector cards with preamplifier ASICs. The preamplifier ASIC converts the charge output from the photodiode array into voltage with serial output for easy integration with readout electronics. Can be arranged end-to-end to form large linear detector arrays.
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Optical Design and Simulation Services
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The key area of expertise and the basis for all developments at the Fraunhofer IOF is optical and mechanical design as well as the simulation and analysis of optical and opto-mechanical systems inclusive of thermal and thermo-optical effects. Extensive design and modeling tools enable the simulation and optimization of systems for the THz to X-ray range - from micro-optics to astronomical telescopes.
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X-Ray Seamless Pixel Array Detector
XSPA-400 ER
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In general, X-ray diffraction measurements using a Cu X-ray source are known to have difficulty detecting trace crystalline phases because of increased background when measuring samples containing transition metals. The high energy resolution of the XSPA-400 ER supresses the fluorescent X-rays originating from the sample, thereby reducing background, enabling highly sensitive measurements of samples containing transition metals, such as iron and steel compounds and battery materials.Therefore, it achieves higher sensitivity measurements than conventional detectors.
