Impact Test
forceful strike to UUT determining strength and durability or detection of loose particles.
See Also: Drop Testers, Pendulum Impact, Impact Hammers, Crush, Hardness Testers, Rupture
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Particle Impact Noise Detection (PIND) Test
This test detects the presence of free moving particulate contaminants within sealed cavity devices. This test is specifically directed toward relays and other devices where internal mechanism noise makes rejection exclusively by threshold level impractical. This test method also may be used prior to final sealing in the manufacturing sequence as a means of eliminating loose particles from the interior of the device.
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In-Circuit Test Systems For Sale
Forwessun offers a comprehensive range of global services for a variety of Test Systems. We provide refurbished systems that have undergone rigorous testing, giving you reliable performance at a fraction of the cost of new equipment. Whether you’re looking for a long-term solution to enhance your testing capabilities or a temporary setup to meet increased production demands, we have flexible options to suit your needs. - HP3070- Agilent - Keysight- GenRad- Teradyne Our bespoke rental agreements make it easy to scale up without permanent investment—simply return the system when it’s no longer required. For ongoing support, we offer calibration, repair, and maintenance services through convenient service contracts. If you’re looking to retire any outdated or non-functional In-Circuit Test (ICT) systems, we’ll offer fair market prices, helping you maximise value on any surplus equipment.
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Test Fixture
16047E
Perform impedance evaluation of lead type devices of up to 120 MHz; includes a guard and a shorting plate
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Low-Temperature Impact Device
DWC-1
This low-temperature impact device is compliance with standard requirement of IEC60245, IEC60227, IEC60540, GB5013-2008, GB5023-2008 and GBT2951-2008. It’s used to test all kinds of PVC sheathed cable, wire, soft wire and no sheath of parallel soft PVC insulated impact resistance at low temperature. Specification: • Working temperature: -15℃±1℃ • Impact height: 10~200mm adjustable • Length of specimen: 5D~150D • Material: 304 stainless steel • Completion time once: 3~5s • Completion number of units for once: ≥2pcs • Weight: 100/200/300/400/500/600/750/1000/1250/1500g • Low temperature box to match additionally
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EV-DO Analysis Using NI PXI RF Test Instruments
NI-RFmx EV-DO
Highly optimized RF measurement experiencePerform physical layer analysis on EV-DO cellular signals including MODACC, ACPR, CHP, OBW, and SEMSimple access to advanced measurement parallelism
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Impact Series Power Discrete Semiconductor Tester
The Impact Series Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.
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NI Real-Time Test Cell Reference System
778820-35
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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SAS Protocol Test System
M124A
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Universal Spring Impact Hammer 0.14J To 1J Adjustable
Shenzhen Chuangxin Instruments Co., Ltd.
This spring impact hammer is mainly used to test household and similar electrical appliances shell, lever, handle, knobs, lights and other shell to withstand mechanical shocks. The impact tester made of stainless steel or alloy.
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Low Energy Plastic Impact
IT 503 & IT 504
The model IT503 plastics impact tester, together with the model IT504, continues to set the industry standard for versatility, ease of operation and display of information with high resolution. The primary difference between the IT503 and the IT504 is that the model IT504 is supplied without the interlocking safety shielding.
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SoC Test Systems
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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Laser Diode Burn-in Reliability Test System
58604
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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BMS Manufacturing Test System
The Battery Management System (BMS) Manufacturing Test System performs functional testing of product during end-of-line manufacturing. The system hardware includes all instrumentation to test a BMS, including multiple cell simulators, a mass interconnect for quick product transition and bed-of-nail fixtures to ensure less down time, higher throughput, and easy maintenance. The system application easily integrates into manufacturing processes, provides a method to test multiple product types, and optimizes tests to ensure only good product is released from manufacturing.
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Safety Compliance Test System
EN 60601
Test system for electrical safety compliance testing of medical products in accordance with EN 60601-1, 3rd edition.The system is equipped with three test fixtures which are connected in parallel order to reduce the number of setup tasks for different variants in the course of day-to-day manufacturing processes. Its purpose is to test medical products, e. g. patient monitors, which are employed at hospitals to monitor heartbeat and oxygen saturation.Based on the integrated electrical safety tester by Associated Research, in combination with an AC power source and a switching matrix, it is possible to fully automate tests like for instance AC/DC high-voltage tests, insulation resistance measurements, earth connection tests and leakage current measurements.The required occupational safety is provided by a high-voltage safety hood in accordance with EN 501191. The entire safety technology, as well as the control PC, is mounted in an aluminum-profile cart.
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Manhole Impact Tester
Manhole Impact Tester is used to test the impact performance of manhole base and manhole wall.
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Variable Impact Tester
1615
The Elcometer 1615 Variable Impact Tester is a simple to use gauge ideal for evaluating the resistance of a coating to impact (elongation, cracking or peeling).
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Standard Test Systems
WaveCore™ Products
Textron Systems’ WaveCore family offers a variety of standard test systems with a primary application of satellite payload lab testing. Our systems can be deployed affordably for both production and engineering applications, providing industry-leading levels of data correlation with high system mean time between failures and low mean time to repair.
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Medalist i1000D
U9401B
The Keysight Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards and a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless.
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IK01-IK06 Universal Spring Impact Hammer
CX-T06
Shenzhen Chuangxin Instruments Co., Ltd.
The IK01-IK06 Universal Spring Impact Hammer is designed according to IEC60068-2-75 and IEC62262 standard. The IK01-IK06 Universal Spring Impact Hammer is mainly used to test household and similar electrical appliances shell, level, handle, knobs etc shell.
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Test Sets For Diagnostic Testing
Test Sets For Diagnostic Testing are designed to test Oil Resistivity, Tan Delta, High Voltage Surge Comparison, etc. These test sets are automated instruments used to measure electrical features to insulate transformer oil, liquids and varied other insulating materials. They are ideal for revealing different localized problems and varied weak spots in the insulation. These modern testing sets are designed to provide high accuracy in results. In addition to this, they are easy to maintain testing sets available to ensure accurate readings.
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Functional Test
cUTS
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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Incline Impact Tester
Evaluates the ability of the packaging system to withstand sudden horizontal impacts or crushing forces.
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VXI Digital Test Instrument
T940 Series
The T940 Series for the VXIbus provides the basis for a complete state-of-the-art digital solution at the subsystem level. The T940 is the solution for both legacy digital replacement and new test stations to be built for digital test including aircraft/ avionics, weapons systems, spacecraft, semiconductors and medical devices.
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In-Circuit Testing and Test Engineering
Teradyne Z1820
2048 Pure Pin Test Nodes3 & 6-wire Analog MeasurementsVector Test for VLSI, PLCC’s & ASICSMultiscan II Vectorless TestingIEEE Functional Interface BoardLarge Custom Vector Library
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Continuous Testing
Continuous testing is the practice of embedding quality through every phase of the software delivery lifecycle - from planning to production. The goal is to ensure that testing continuously reduces risk and improves application quality.
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Game Testing
Testing mobile game means ensuring that it is running properly, it meets its all specific requirements and provides fantastic user experiences to gamers. This may sound difficult – especially when there are bazillion different device configurations where the game must run well. If you consider that significant portion of Google Play and App Store revenues are generated by mobile games, there is absolute need to automate as many mobile game components as possible.
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Off-Line Base Test Platform
6TL19
The 6TL19 is a bare half-rack with castors for creating Off-Line, modular, flexible, and reliable Base test platforms. The overall rack capacity is 11U (580mm depth).
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2.0J Impact Hammer
CX-T20
Shenzhen Chuangxin Instruments Co., Ltd.
Required by many Standards to test the mechanical integrity of product enclosures. After applying the impact with the hammer, the product is examined with accessibility probes to determine access to shock, energy, and injury hazards. Built in exact accordance to IEC, EN, UL, CSA and other international Standards.
