Product

Wafer Test Solutions

-

AEM Holdings Ltd

AEM Holdings Ltd

Wafer Test Solutions has established leadership positions in developing and deploying application-specific test solutions for MEMS devices, offering wafer and frame probing stations suitable for R&D, Wafer Sort, and Final Test. We offer state-of-the-art solutions to test environmental and motion sensors in wafer and other advanced packages.

Product

Semi-Automated Probe Stations

SPS 2600, SPS 2800, and SPS 12000 Series

-

MicroXact, Inc.

SPS 2600, SPS 2800, and SPS 12000 Series - MicroXact, Inc.

The SPS 2600, SPS 2800, and SPS 12000 Series systems are MicroXact’s semi-automated probe stations designed to be flexible and easy to use when performing high productivity device characterization, wafer level reliability testing and failure analysis. These semi-automatic probe station systems are designed to support manual and semi-automatic probing of up to 200mm wafers.

Product

Mini Probe Station

C-2

-

EverBeing Int'l Corp

C-2 - EverBeing Int'l Corp

The smallest probe station which still preserves the key functions and precision that are fundamental to all probing. This size is still capable of DC and RF measurements, making it the most versatile in its size.

Product

Complete Probe Station

BD Series

-

EverBeing Int'l Corp

BD Series - EverBeing Int'l Corp

Best for DC and RF probing, the platen lift is designed for smooth raise and contact of your probes simultaneously to your device. It is ideal for probing multiple spots on your device, or through multiple devices.

Product

Optoelectronics and Photonics

-

SemiProbe

SemiProbe

SemiProbe has developed probe stations for a wide variety of optoelectronic and photonic device applications, including light emitting diodes (LEDs), vertical cavity surface emitting lasers (VCSEL) and photo diodes. Testing and handling small, fragile, thin wafers with thousands of die on them poses unique challenges that require innovative solutions.

Product

Hot Chucks

-

Materials Development Corporation

Materials Development Corporation

Probe stations to suit all measurement requirementswhether production, engineering or research. See individual data sheets for more details.

Product

High Power Devices

-

SemiProbe

SemiProbe

SemiProbe configures our PS4L Adaptive Architecture into the Voltarus (TM) family of probe stations to fulfill the unique requirements of testing high power devices at wafer level prior to packaging. Voltarus probe stations are available in manual, semiautomatic, and fully automatic configurations that can test and characterize power devices up to 10 KV or 200 Amps (pulsed).

Product

Lab Assistant

-

SemiProbe

SemiProbe

The SemiProbe Lab Assistant family of probe stations is specifically designed to address the requirements of universities and research personnel. Lab Assistant probe stations provide simplicity, ease of operation, portability, affordability and modularity. Lab Assistant probe stations can be configured for DC or HF/Microwave testing configurations, including an array of sophisticated accessories that are usually only found on much larger, more expensive probing stations.

Product

Probe Station

EPS300

-

ECOPIA

EPS300 - ECOPIA

Reasonable price and compact design. - Sellectable chuck size : 4inch, 6inch, 8inch when ordering probe station. - Hot chuck can be installed. Temp range: RT ~ 300°C - Hot and cool chuck from 0 °C ~ 300 °C can be provided.

Product

Probe Card

T90™ Series

-

Celadon

T90™ Series - Celadon

The 90 mm tile was designed for mounting on a standard 4.5″ probe card holder for multi-site wafer level reliability testing. The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations.

Product

Recirculating Chillers

-

Lake Shore Cryotronics, Inc.

Lake Shore Cryotronics, Inc.

Recirculating chillers from Lake Shore offer high performance for improved cooling capacity for your Hall measurement system, VSM, probe station, or electromagnet application.

Product

Flying Probe Programming & Test Development

-

Testing House, Inc.

Testing House, Inc.

Testing House offers full Flying Probe Programming and Test Development using its very own Seica Pilot LX Flying Probe Test Stations.

Product

Technical Manual Probe Station

4060 150-200 mm

-

Micromanipulator Company

4060 150-200 mm - Micromanipulator Company

Micromanipulator's Tech Series Probe Station, Model 4060 is designed to provide a quality 6-inch (150mm) or 8-inch (200mm) probe station at a cost effective price

Product

Cryogenic Probe Station

FWPX

-

Lake Shore Cryotronics, Inc.

FWPX - Lake Shore Cryotronics, Inc.

Lake Shore’s FWPX probe station is designed for researchers who require large-size wafer probing. The FWPX accommodates wafers up to 102 mm (4 in) in diameter and can be modified to accept up to 152 mm (6 in) wafers. This general-purpose probe station is designed for researchers or engineers conducting material characterization tests over large samples. It is also an effective unit for measuring organic materials.

Product

Probe Systems

-

FormFactor, Inc.

FormFactor, Inc.

We offer a complete line of premium performance analytical probe stations for precise device test and measurement directly on wafer.

Product

Fully Manual Systems

SPS-1000, SPS-2000, and SPS-2200

-

MicroXact, Inc.

SPS-1000, SPS-2000, and SPS-2200 - MicroXact, Inc.

The SPS-1000, SPS-2000, and SPS-2200 systems are MicroXact’s premier manual probe stations designed to be flexible and easy to use. The high level of performance and affordability of these manual probe systems put them in a class of their own.

Product

Standard Probe Station Chucks & Accessories

-

ABET Technologies, Inc.

ABET Technologies, Inc.

In this test solutions section of our website we describe the expanding line of Abet PV IV probe stations for the growing variety of solar cell types and sizes being developed around the world. This page describes a line of vacuum chucks and accessories for top/bottom, top/top, and bottom/bottom solar cells from 3 x 3 mm to 300 x 300 mm. Probe stations for multiple device on a single substrate and multifunction probe stations are described further in the sections highlighted to the left of this page.

Product

Portable Wafer Probe Station

PS-5026B

-

High Power Pulse Instruments GmbH

PS-5026B - High Power Pulse Instruments GmbH

The PS-5026B is a rugged portable wafer probing solution which has been designed for high reliability, compact size and minimum cost.

Product

Cryogenic Probe Station

EMPX-HF

-

Lake Shore Cryotronics, Inc.

EMPX-HF - Lake Shore Cryotronics, Inc.

The Lake Shore EMPX-H2 probe station enhances standard probe station capabilities with the addition of a ±0.6 T horizontal field electromagnet. All standard C-V, I-V, microwave, and electro-optical probing, plus in-plane horizontal field electromagnetic measurements can be performed on this versatile station. Researchers can use it for testing magneto-transport parameters. The EMPX‑H2 is Lake Shore’s premier probe station for vector-dependent magneto-transport measurements.

Product

Stimulus Induced Fault Testing

SIFT

-

FA Instruments

SIFT - FA Instruments

SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.

Product

Probe Station

EPS1000

-

ECOPIA

EPS1000 - ECOPIA

Reasonable price and compact design. - Sellectable chuck size : 4inch, 6inch, 8inch when ordering probe station. - Hot chuck can be installed. Temp range: RT ~ 300°C - Hot and cool chuck from 0 °C ~ 300 °C can be provided. - Maximum pcs of manipulators can be installed on the base unit of probe

Product

Probe Station

EPS500

-

ECOPIA

EPS500 - ECOPIA

Reasonable price and compact design. - Sellectable chuck size : 4inch, 6inch, 8inch when ordering probe station. - Hot chuck can be installed. Temp range: RT ~ 300°C - Hot and cool chuck from 0 °C ~ 300 °C can be provided. - Maximum 6pcs of manipulators can be installed on the base unit of probe station EPS500.

Product

Probe Systems

-

PacketMicro Inc.

PacketMicro Inc.

These flexible probe stations are designed for the ever-changing test configurations required in a engineering lab. Combined with durable probes or your own high-speed probes, PacketMicro probe stations are the most cost-effective probing solutions in the industry.

Product

Semi-Automatic LCD Probe Station/Laser Repair System

LCD 2424

-

Korima, Inc.

LCD 2424 - Korima, Inc.

The Model 2424 Semi-Automatic LCD Probe Station is designed especially for probing LCDs and other large substrates. Built on a steady and reliable anti-vibration table, the Model 2424 has powerfully built features that perform a number of specific tests required by all LCD/flat panel display manufacturers.