Electric Vehicle Test Systems
See Also: EV Test Systems, Electric Vehicle
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Product
Cable Sheath Testing and Fault Location System
Shirla
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Cable fault location with the BAUR shirla. Shirla the fault location system is used for cable and cable sheath testing as well as for pre-location and pinpointing of cable faults. The pre-location based on the measuring bridge principle according to Murray and Glaser that is designed especially for power cables, also enables pre-location for control and lighting cables. Null balance and evaluation take place automatically.* Cable and cable sheath testing up to 10 kVC* Resistance measurement* Cable and cable sheath fault pre-location with precision measuring bridge* Adjustable cable sections that can be defined with length, conductor cross-section and material respectively and can be considered in the distance calculation
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Product
Tire Rolling Resistance Test System
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This system measures the rolling resistance of each tire accurately. In addition to the simultaneous measurement of tire loss resistance and rolling resistance coefficient for each drive by mode operation (JC08, WLTC), coasting test, constant acceleration/deceleration test and transient mode test are able to be performed. Furthermore, measurement of driving noise/ vibration of the tire, effect of the tire loss due to the temperature change can be verified by adding options.Conforming the JIS D 4234: 2009 and ISO 28580: 2009.
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Product
C-Mic Auto Test System
BK9010B
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Based on the BK3010V2 C-Mic Tester, the BK9010B is our fastest C-mic test system. Fully automatic, the BK9010B loads the mics in place and after testing, it sorts passing microphones into 8 quality classes, and failing microphones according to the reason they failed. Each mic is put into its appropriate bin. As testing progresses, you can view the data graphically in real time or save it to be viewed or analyzed later.
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Product
Benchtop Electric Blast Drying Oven
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Guangdong Test EQ Equipment co., Ltd.
- Precision & Uniformity: Multi-zone airflow design ensures ±2% temperature uniformity (per ASTM E1459). Auto-reversing fan eliminates hot/cold spots.- Rapid Drying: Turbo blast mode reduces drying time by 50% vs. conventional ovens (ideal for ceramics, polymers, and PCB coatings).- Durability: SUS304 stainless steel chamber, fiberglass insulation, and powder-coated exterior for corrosion resistance.- Smart Connectivity: IoT-enabled remote monitoring via mobile app (iOS/Android), compliance with FDA 21 CFR Part 11 for audit trails.- Energy Efficiency: ECO mode reduces power consumption by 30% during idle (ENERGY STAR® 2025 certified).
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Product
Electrolytic Capacitor Test & Scanning System
DU-9001
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Delta United Instrument Co., Ltd.
The 10 capacitor - LCC/DZ/R in order to automatically scan test improve the test reliability and test efficiencyEach test channel can be opened / short circuit return to zero with high precision.Wide range scan box can be used to test 3mm~35mm 10 capacitorsSuitable for high voltage capacitance test, 450V330uF 10 capacitors can be smooth test
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Product
SMD Array Type LCR Test Fixture
16034H
Test Fixture
The 16034H is designed for impedance evaluations of array-type SMD.The minimum SMD size that this fixture is adapted to evaluate is 1.6(L)x0.8(W)[mm]. Since the tip of the measurement electrodes are very thin and the device holder is extremely flat, the device can be shifted and the measurement electrodes can contact each of the elements of the array-type component.
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Product
Profiling Systems
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ICK profiling systems measure, detect, classify, count, and check vehicles in 3D. They determine the number of axles on heavy goods trucks for vehicle classification and measure vehicle dimensions to rectify loading errors. The systems recognize overheated vehicles approaching tunnels and other entrances and activate diversions. They also monitor external train contours. If a limit value is exceeded, the system triggers an alarm. All this contributes to safety on roads and railroads.
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Product
30/50 GHz Quad Electrical Channel DCA-M
N1094B
Oscilloscope
The N1094 DCA-M builds on that legacy by using the high-performance elements of 86100 and electrical channel hardware of N104X plug-in modules. Electrical channels are available with 30 GHz and 50 GHz bandwidths.
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Product
Sensortech Systems
IMPS-4400
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The Instant Moisture Profiling System (IMPS) is a non-contact RF moisture profiling system, typically used in board manufacturing plants, built in a customizable multi-sensor arrayed framework.
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Product
CHEK 3-in-1 Electrical Tester
GT 3100GAM
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Cable test monitors line continuity, shows completed circuits. Lamp test indicates the lamp and fixture continuity. Circuit tester checks if power is available, if polarity is correct, if wiring is correct.
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Product
UV systems / UV systems / UV devices
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The LightGuide pureUV is a UV radiator part, which prevents direct radiation to the substrate as far as possible.
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Product
High Power & Voltage Pack Testing System
FTF
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Drive simulations with standard Electric Vehicle tests: FUDS, SFUDS, GSFUDS, DST and ECE-15LDrive Cycle TestingIntegration with motor test benchesCycle testing of EV/HEV Battery Packs
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Product
RF/Microwave ATE Systems
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Over two decades ago, In-Phase Technologies founded our company for the purpose of designing and producing reliable high quality RF and microwave Automated Test Equipment (ATE). We continue that tradition today, providing the best, world-class automated test equipment. Our system designs bring together the right combination of Commercial Off the Shelf (COTS) test equipment, custom designed and built Interface Test Adapters (ITAs), lightning fast and accurate measurement software, and the optimum user interface to make all of this technology easy to use.
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Product
Test Systems
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This measurement system is the state-of-the-art acoustical analyser from Norsonic. Using the experiences and accumulated know-how from the previous generations of analysers, Norsonic is offering a multi-channel system with focus on user friendliness, high efficiency, and accurate reporting. The system has been designed for field testing as well as demanding accredited lab measurements.
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Product
Electroluminescence Test Systems
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The products of the SolarModule EL-inline family are integrated into a module production line, before lamination, after lamination or at the end directly after the performance measurement. High-resolution cameras provide excellent image quality and allow the automatic detection of relevant defects. A manual evaluation of images is no longer necessary, which means that considerable costs can be saved. Communication to upstream and downstream processes is flexible and can be adapted to all common interfaces.
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Product
Multifunction Meter for Electrical Installations
AMPI-530
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Measurement of short-circuit loop ; Testing of differential, general and selective protections for differential current ; Measurement of insulation resistance ; Up to 10GΩ ; Voltages: 50 V, 100 V, 250 V, 500 V, 1000 V ; Measurement of earth resistance ; Bi-directional continuity test on PE cables, phase sequence ; Measurement and recording of voltage, frequency, alternating current, cosϕ, power, harmonics and THD
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Product
COMPUTERIZED AUTOMATIC RELAY TEST SYSTEM
CVRT-S16
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CVRT-S8 & S16 are ideal for automatic testing of ELECTRO MECHANICAL AND READ RELAYS (only DC relays) both for static and dynamic characteristics. This system scans at one stroke, all the parameters of the relay as per definition of test procedure. The test sequence can be pre-programmed and stored in the disk. You can select the tests as per your requirement. Can include or exclude the test and you can have several options to match your test definitions. Semi skilled person can be engaged for actual testing, as he need not make any settings and need not interpret the readings. The system conducts the tests and gives PASS / FAIL indication on overall test results. If a printer is connected, each test result will be printed.Test Parameters : -> Coil Resistance.-> PickUp/Pull In /Operating Voltage or Current Linear Ramp Method or Step Method.-> Measure Pickup Contact Gap FBB-LBB V or mA-> DropAway/Drop Out/Release Voltage or Current Linear Ramp Method or Step Method.-> DropAway Contact Gap FFB-LFB V or mA-> % Release Dropaway/Pickup-> Contact Resistance of all contacts both Front and Back contacts.-> Operating Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while Operating @ above-> Release Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while release @ above-> Difference of Operate Time - Release Time.-> Bridging Test or Non Overlap Test.-> Transfer or Traverse Times while Operate and release.-> Operate Time @2nd Set Voltage or Current.-> Release Time @2nd Set Voltage or Current.-> Power Consumption @ Rated Voltage.-> Coil Current @ Rated Voltage at Room Temperature.-> Coil Resistance Corrected to 20deg C.-> Timing Waveform Graph for all active Contacts.
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Product
Flash Programming for Functional Test Systems
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Flash programming stations allow you to offload flash programming from functional test systems, increasing test throughput while improving capital utilization. Circuit Check flash programmer fixtures support multiple programmer types and multiple I/O configurations.
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Product
CDM Test System
1100-CDM series
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Tokyo Electronics Trading Co., Ltd.
Model 1100-CDM is the latest model developed as a successor to the conventional CDM-550, and supports testing methods (Field-Induced CDM) that conform to international standards. In addition, a camera and a high-accuracy robot can apply CDM stress to a precise position.
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Product
Fanless Embedded System With 7th/6th Gen Intel® Core™, Pentium® And Celeron® Processor For Railway And Vehicle PC
UST500-517-FL
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The UST500-517-FL is powered by the LGA1151 socket 7th/6th generation Intel® Core™ and Pentium® processors up to 65W with the Intel® Q170 chipset. The integrated 16 PoE ports are available in RJ-45 or M12 connectors for IP cameras. It provides a full scope of power protection that includes intelligent vehicle power management technology for ACC on/off delay, shutdown delay, and over/under voltage protection. Enhanced by its robust structure and system design, the UST500-517-FL is able to operate under a wide temperature range from -40°C to +70°C and vibration endurance up to 3 Grms. This transportation embedded box is in compliance with ISO 7637-2 and EN 50155 for mobile surveillance applications. There are 16 Gigabit LAN ports which support 802.3at/af Power over Ethernet with a total power budget of 200W. Its DVI-D, HDMI and VGA interfaces support three surveillance monitors. Furthermore, its external accessible SIM card slot enables users to easily change SIM card for different telecommunication service. With wireless LAN modules, this user-friendly transportation embedded system can real-time transmits the video to the control center. The two built-in or four swappable SATA hard drives are used for mass storage of video files.
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Product
Radar Systems
HLS GSR Series
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Welcome to the future of Radar Systems: the Gets Systems HLS GSR Series.Our state-of-the-art, high-performance FMCW X-band RADAR systems redefine the possibilities of detection and classification. Whether it’s People, Vehicles, UAVs, Airborne, or Seaborne targets, our HLS GSR Series empowers you with unparalleled capabilities for the most demanding security and defense applications.
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Product
System
SYS-28
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This 28" box coater has a separately ventable top chamber, to allow for faster parts changes and increased productivity. It also is equipped with our FTC-620 flip controller. The flip and rotation motors can be seen on the top. This system uses a Varian tri-scroll pump and a bottom mounted 16" APD cryopump.
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Product
Launch Vehicle Avionics
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L3 Cincinnati Electronics (L3 CE) began contributing to launch vehicle success in 1953. L3 CE products include an extensive family of command/receiver, command/receiver/decoders, S-Band transmitters, video and other operational products. L3 CE has been on all major U.S. launches.
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Product
Acoustic System
Constellation
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In acoustics, one size does not fit all. Constellation offers an elegantly simple way for venues to transform architectural acoustics with a finger tap, affording a level of sonic flexibility never before possible.
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Product
Pump Test System
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This automated test system evaluates a wide range of performance metrics for a cooling pump assembly. The LabVIEW based system programs the DUT then initiates a series of tests to check:Serial communication verificationMotor voltage & currentImpeller speed and flowAir and water temperaturesLeak and level sensor functions
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Product
Pressure Decay Test Systems
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Pressure decay leak testing technology has become a mainstay in the arena of high volume production testing. Pressure decay testing methods offer the world's manufacturers a cost-effective and easily applicable solution to the leak testing challenges they encounter on a given day. Fundamentally, pressure decay testing is a straightforward measurement technique; Cincinnati Test Systems (CTS) pioneers new and innovative ways to integrate our technology into custom turnkey systems that exceed the industry standards for reliability and repeatability. CTS' 30+ years of experience goes way beyond the pressure test unit by offering our customers comprehensive, custom turnkey solutions to the most challenging leak testing problems.
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Product
Automatic Transformer Test System
TH2840AX
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Changzhou Tonghui Electronic Co., Ltd.
■ The test speed is as high as 1000 times/s (>10kHz), without relay action time ■ Test level up to 20Vrms ■ The bias voltage is built-in ±40V/±100mA/2A ■ Up to 288 test pins (only TH2840NX) ■ Industry-friendly user experience: Linux bottom layer, built-in help file
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Product
System Amplifier
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Solid state Broadband Amplifiers are designed for optimum operation for IED Jammer Applications which is featured as below. We can rack mount any of our existing amplifiers or systems or custom design the amplifier and enclosure. Each Rack Mounted Amplifiers are built around a large bonded fit heat-sink rated for high temperature ambient operation.
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Product
Mixed Signal Test Systems
MTS2010i
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The MTS-2010i are a cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process.





























