Backplane Test
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Product
OpenVPX Backplanes
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Elma is a leading contributor to the DoD hardware convergence and tri-service commonality initiatives, providing CMOSS / SOSA-aligned technology, backplanes and modules pursuant to the stated goals of those initiatives. As the leader in VITA 46/65 OpenVPX backplane design and manufacturing, our cutting-edge signal integrity analysis informs the designs of our high-speed backplanes, handling critical data at speeds of 12 Gbps and reaching towards 25 Gbps.
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Product
Isolated Digital I/O 60VDC, 150mA
OTP2 module no.186
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The National Instruments PXI-6528, PCI-6528, and PXI-6529 Digital I/O Modules are isolated digital I/O interfaces for PCI and PXI. These modules can use inputs from NI 6528 and PXI 6529 devices to capture the status of sensors, actuators, and logic devices. NI 6528 devices have 24 SSR outputs for switching external devices with input currents up to 150 mA. The NI 6528 and PXI-6529 devices are suitable for a variety of applications, from automotive development and industrial factory automation to aerospace, laboratory research, and biomedical applications due to their high current handling capacity and isolation.
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Product
VXS Backplanes
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VXS (VME Switched Serial) represents an extension of the VME family according to VITA 41.0. This system is downward-compatible, so that assemblies with VME 96-pin connectors can still be used, while adopting the use of serial signals such as Gigabit Ethernet, PCI Express, Serial RapidI/O, and other fabrics.
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Product
Ethernet and Fibre Channel Test Platform
SierraNet M1288
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The SierraNet M1288 Ethernet and Fibre Channel test platform provides best in class analysis, jamming and generation for traffic capture and manipulation for testing application and link characteristics. SierraNet M1288 is the latest in the line of industry leading test and measurement tools from Teledyne LeCroy, designed for today’s high-speed storage and communications fabrics. SierraNet M1288 supports examination and modification of Ethernet and Fibre Channel links utilizing both Pulse Amplitude Modulation 4 (PAM4) and legacy Non-Return to Zero (NRZ) technologies.
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Product
14-slot ATX-supported PICMG 1.3 Bus Passive Backplane
FAB100
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The FAB100 features one CPU card slot, four ISA slots, four PCI-E x1 slots, one PCI-E x16 slot, and four 32bit/33MHz PCI slots. This PICMG 1.3 backplane also supports a built-in 24-pin ATX power connector. Furthermore, the FAB100 delivers outstanding system performance through high-bandwidth interfaces such as Serial ATA and USB 2.0 high speed peripheral (optional function). It is designed for all of PICMG 1.3 single board computers, and is a perfect fit for AXIOMTEK's SHB100 & SHB110, which are built around the PICMG 1.3 form factor. We also have various 4U-high enclosures, AX6156E, AX6156LE, AX6156LLE, AX6156LLES, AX61400, AX61491 and AX6145, to house the FAB100 and any customer's industrial integrations flexibly.
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Product
6TL24 Combinational Base Test Platform
H71002400
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The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
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Product
4-Module ICT System, I307x Series 6
E9903G
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Test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides those improvements built upon a proven technology foundation. With time-tested software, hardware, and programmability, the Series 6 are fully backward compatible with previous systems, and they make highly repeatable measurements.
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Product
Functional Test
UTS
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The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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Product
6-slot ATX-supported 2U Butterfly PICMG 1.3 Bus Passive Backplane
FAB210
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*Designed for PICMG 1.3 SBC*Compatible with AX61222TP/AX61220TP chassis*Supports one PICMG 1.3 CPU card slot, two PCI slots, two PCIe x1 slots, and one PCIe x16 slot
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Product
Functional Test System
TS-5040
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The Keysight TS-5040 Functional Test System is a cost effective, robust and reliable test system that gives you the lowest cost of ownership. In addition, the open architecture Test Exec SL gives you the flexibility to do just about anything you want.
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Product
3U CompactPCI® Subsystem with 8-slot Backplane and 1 + 1 CompactPCI® Redundant Power Modules
cPCIS-2632 Series
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- 3U CompactPCI® backplane with seven peripheral slots and one system slot- Temperature, voltage, and fan monitoring LEDs- Supports current sharing on +5 V, +3.3 V, and +12 V- 1 + 1 hot swappable 250 W + 250 W CompactPCI® power supplies- PICMG® 2.11 47-pin power interface- Hot-swappable cooling fans & filter
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Product
PCI Express Gen 3 Test Backplane
SKU-015-01-PCIe
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PCI Express Backplane was designed to support a variety of modern PCI Express board’s production testing and debugging. The backplane expands the Host computer into four x16 PCI Express slots via 10 ft. CAT7 data and 10-pin flat Power control cables. PCI Express Backplane and UUTs (unit under test – add-in PCI Express board) are powered by a standard ATX power supply connected to the backplane via 24 and 8 pin power connectors located on the backplane.
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Product
2 PICMG® CPU, 4 PCI™, 3 ISA Slots Backplane
HPCI-8S4
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- Supports AT, ATX power supplies- Slots: 2 PICMG® CPU, 4 PCI™, 3 ISA- Segment: 1- Dimensions: 264.2 mm x 218 mm
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Product
Lens Module Test Platform
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The Lens Module Test Platform is a flexible solution to deliver the quality that is expected from your brand for all types of lenses and cameras. The system can be configured to measure objective, eyepiece or camera lenses. As the platform can efficiently measure lenses as small as 2 mm3, it is perfect for the critically precise applications of life sciences, consumer electronics, automotive and other industries. With 25+ years of quality experience, the Lens Module Test Platform ensures that all products shipped to market work as intended.
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Product
Digital Backplane Interface Board
MSXB 033
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The Microstar Laboratories Digital Backplane Interface Board, part number MSXB 033, interfaces the Digital Backplane with a Data Acquisition Processor. The Digital Backplane Interface Board must be installed in the Digital Backplane to connect the backplane to a Data Acquisition Processor.
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Product
Test Solutions
AT/CX/CM Series
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The VeEX AT/CX/CM series are next generation test solutions designed for analog and digital cable TV networks supporting VoIP, WiFi, and Internet service. Analog and Digital SLM, ingress noise sweep, deep interleave support, and QAM constellation analysis are among many standard features. Enhanced optional features include QAM16/64/128 Upstream Generation (USG), Reverse Path QAM Analysis, and DOCSIS 2.0/DOCSIS 3.0 Cable Modem emulation. A high capacity LiIon battery pack provides extended autonomy for a full day use with only a single charge.
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Product
Shock Test
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Shock testing determines the ability of equipment to withstand the infrequent non-repetitive shocks encountered in handling, transportation, and service and to continue to function, where required. Also, shock tests verify that equipment will not detach from its mounting during these tests.
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Product
Test And Measurement
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Test and Measurement supplies test, measurement, and analysis equipment and software for product design optimisation, manufacturing control, and environmental monitoring systems. Markets are principally the aerospace, automotive, consumer electronics and oil and gas industries. For customers in the automotive and aerospace industries, our products and applications help them to design and test new products whilst reducing time to market. In consumer electronics, our equipment and software enable customers to refine the performance and accuracy of their products and to test them in the production process. In the environmental monitoring market, the desire for higher standards of community comfort is creating additional demand. In the oil and gas industries, our products and solutions optimise the recovery rates of oil and gas reservoirs and support the development of cost-efficient extraction processes in a safe manner that minimises the impact on the local environment. The operating companies in this segment are Brüel & Kjær Sound & Vibration, ESG Solutions, HBM and Millbrook.
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Product
Automatic Test
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Test Systems of varied sizes and complexity are a specialty of EJC Systems. From concept through development, fabrication, and customer integration, the EJC Systems team brings experience and expertise to ensure every customer receives exactly what was requested.
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Product
Leakage Test
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Leakage current and discharge current depend on the insulation of the device. The measurement simulates various fault situations that could occur during operation. The test determines whether the measured current is within the permissible limits and poses no danger to the user in case of a fault.
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Product
Test Engineering
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TestEdge engineers have an average of 17 years of engineering experience in test, packaging, and fixturing. This experience is across a wide spectrum of products, customers, and ATE platforms. We have experience in all of the following:Digital, analog, mixed-signal, RF Test programming servicesRemote test capability Semi-automatic test generation Automatic data collection and reduction High performance test fixturing Format independant vector translation High power testing with liquid cooling
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Product
EBIRST 78-pin D-type To 68-pin Male SCSI Adapter
93-006-401
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eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Test Probes
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Safety right angle insulated alligator test probe, safety right angle insulated alligator test probe with insulated jaws, test probe, minitest probe, micro test probe.
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Product
Electric Testing
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Our Capabilities*Dielectric Withstand*Hi-Potential Testing*Voltage Drop*Contact Resistance*Gate Leakage*Insulation Integrity*Dielectric Integrity
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Product
Munitions Testing
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E-Labs has an extensive background in the development and testing of Less Than Lethal (LTL) devices. We were the first to develop a measuring system to capture blunt force or impulse of a round in real time. The Ballistic Impulse Measuring System (BIMS) developed by E-Labs was used on USMC programs to evaluate LTL rounds and compare impulses on a one to one basis.
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Product
Test Compliance
MX CTS Series
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AMETEK Programmable Power, Inc.
A growing number of electronic products manufactured today have to meet international regulatory requirements for emissions and immunity. This is particularly true for products sold in the European community as well as a growing list of countries in the Far East. The California Instruments MXCTS System provides a cost-effective test solution aimed at verifying higher power product compliance to a number of AC and DC related harmonized test standards. The MXCTS system offers many of the same features and capabilities of the California Instruments CTS Series product line already in use at many EMC labs around the world.
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Product
Test Solution
Novus, Novus-M, & Novus-R 100/25GE Load Modules
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Keysight Network Applications and Security
Novus, Novus-M, and Novus-R are Ixia’s next-generation architecture and test solutions that satisfy the test needs of both high-density, multi-rate switch/router makers and the organizations implementing the network equipment. Supporting eight native QSFP28 100GE ports and up to 32-ports for 25GE per load module, Novus load modules enable interoperability and functional testing, as well as high-port count performance testing.
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Product
TEST SOCKET
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IC Package It is a device to install INTERFACE between TESTER and DEVICE during TEST to check electrical defects such as O / S (Open, Short) test, mounting test, BURN-IN TEST and RLC TEST, The device
