Semiconductor
active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.
See Also: iJTAG
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Linear Positioning
KAOS OEM
A speedy, slim positioning stage for two-axis applicationsBased on cog-free linear motors, KAOS two-axis positioning stages combine a differential-motion carriage and a primary carriage on a single rail. This patented design results in a fast, compact stage well suited to semiconductor, electronics assembly and pick-and-place applications.
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TFProbe Wafer Measurement Tools
Angstrom Sun Technologies, Inc.
Angstrom Sun Technologies Inc offers optical measurement and inspection systems for semiconductor and related industries. Its core products include wafer measurement systems, spectroscopic ellipsometers, thin film reflectometers, and microspectrophotometers.
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Parametric Test Fixture
U2941A
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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Enterprise Software
In the race to digitize semiconductor manufacturing operations, Onto Innovation’s productivity software delivers the competitive advantage you need to capture market share. Our software connects information on a tool, within a factory, or across an entire global supply chain to capitalize on the potential of your biggest asset: your data.
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Automated Semiconductor Wafer Optical Inspection and Metrology
SITEview Software
Microtronic SITEview Software is designed from the end-user operator’s perspective and is easy to use, fully featured, and modular. Applications include visual wafer inspection, OCR sorting, wafer defect review, second optical inspection, image storage and retrieval, laser marking, microscope interface, and GEM/SECS II communication and seamlessly integrates with EAGLEview, MicroINSPECT and MicroSORT.
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Analysis
External appearance due to non-destructive semiconductor · X-ray fluoroscopic observation, SAT observation, electrical operation confirmation, ESD fracture analysis, plastic opening observation of Chip, search for abnormal portions by EMS / OBIRCH, package (PKG) analysis, Please do not hesitate to contact us anything related to semiconductor analysis, such as observation by polishing / parallel polishing (ball and bump observation etc.), peeling observation of defective part, analysis of foreign matter by EDX · FT - IR etc.
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ICP-OES Analyzer
SPECTRO ARCOS
SPECTRO Analytical Instruments GmbH
The SPECTRO ARCOS ICP-OES excels in industrial and academic applications for the most advanced elemental analysis of metals, chemicals, petrochemicals, and other materials.Its unique new MultiView plasma interface option provides truly uncompromising axial-view and radial-view plasma observation in a single instrument. The periscope-free MultiView mechanism lets an operator literally "turn" a radial-view instrument into an axial-view device, or vice-versa, in 90 seconds or less. Visit the MultiView Q&A section in the ARCOS Resource Center for answers to frequently asked questions. Plasma power enters a whole new era with the system's innovative generator. This unique, compact and extremely rugged component is based on laterally diffused metal oxide semiconductor (LDMOS) technology. It delivers the highest plasma power available today, enabling previously impossible feats of analysis at the highest plasma loads.
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IQ Mixers
The new MMIC IQ mixers from Fairview (also known as IQ modulators) utilize a highly reliable GaAs MESFET semiconductor process which integrates a pair of matched double balanced mixer cells, a 90-degree hybrid and a 0-degree splitter/combiner that produces exceptional amplitude and phase balance performance. This level of integration offers size and performance advantages in comparison to discrete module assemblies. With the addition of an external 90-degree IF hybrid module, these IQ mixers can be used as either a Single Sideband Up-converter Mixer or an Image Reject Down-converter Mixer. The benefit of image rejection and sideband suppression can reduce overall system cost and complexity by removing the need for pre-selection filtering. Typical applications include point-to-point and point-to-multipoint radio, VSAT, military radar, electronic warfare, satellite communications, test equipment, and sensors.
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Manual Semiconductor Metrology System
Front USB port enables easy storage of measurements and other data to flash drivesMTI Instruments’ Proprietary Capacitance Circuitry for Outstanding Accuracy and DependabilityNon-contact measurements76-300 mm diameter wafer rangeOptional wafer measurement ringsWafer stops for exact centeringEthernet interfaceFull remote control software (Windows compatible)Optional calibration wafers
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Amplifiers
Teledyne Lincoln Microwave design and manufacture RF amplifiers utilising the latest semiconductor technology. Our portfolio includes low noise amplifiers (LNA’s), power amplifiers and pre-amplifiers. These can incorporate linearization, filtering, phase and amplitude control functionality.
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Industrial Automation
Panasonic Industrial Devices Sales Company of America
Panasonic offers a diverse portfolio of products and over 40 years of design expertise to provide integrated solutions that fits into various automation markets such as Automotive, Semiconductor, Packaging and Bio Medical. Boasting a strong reputation for quality, an established organization of highly experienced professionals and technically advanced products, Panasonic strives to be your trusted partner.
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Packaging Manufacturing
KLA’s extensive portfolio of packaging solutions accelerates the manufacturing process for outsourced semiconductor assembly and test (OSAT) providers, device manufacturers and foundries for a wide range of packaging applications. Innovations in advanced packaging, such as 2.5D/3D IC integration using through silicon vias (TSVs), wafer-level chip scale packaging (WLCSP), fan-out wafer-level packaging (FOWLP) and heterogeneous integration as well as a wide range of IC substrates create new and evolving process requirements. KLA offers systems for packaging inspection, metrology, die sorting and data analytics focused on meeting quality standards and increasing yield before and after singulation. SPTS provides a broad range of etch and deposition process solutions for advanced packaging applications. Orbotech offers a portfolio of technologies that includes automated optical inspection (AOI), automated optical shaping (AOS), direct imaging (DI), UV laser drilling, inkjet/additive printing and software solutions to ensure manufacture of the highest quality of IC substrates.
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Semiconductor Curve Tracer
CS-5000 Series
*Max. Peak Voltage : 5,000V（HV mode）*Max. Peak Current : 1,500A（HC mode）*Equipped all models with LEAKAGE mode (Cursor resolution 1pA）*USB port for display hardcopy, waveform data (CSV format) and measurement setup SAVE/RECALL*LAN interface for Remote Control
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Panel-mount Type Conductivity Meter (Four-Wire Transmission, For Low-concentration)
HE-480C
HE-480C connects conductivity sensor (ESH /FS Series) and measures conductivity and temperature in the sample water. This is a highly functional model, with high-performance temperature compensation, and is applicable to a wide range of tasks, from managing pure water for use with semiconductors, to managing the quality of boiler water.
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Dimensional Metrology
Nova offers in-line optical integrated and stand-alone metrology platforms. The metrology product portfolio, combined with our modeling algorithm software, delivers unique measurement capabilities for the most advanced semiconductor technology nodes.
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Air-Cooled Universal Test Platform
Diamondx
Diamondx semiconductor test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost drivers IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.
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High Temperature Absolute Pressure Transducers
Our high temperature Baratron® capacitance manometers are controlled to temperatures of 150°C or higher for use use in demanding semiconductor manufacturing vacuum processes such as metal etching and nitride film chemical vapor deposition (CVD).
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DC Power Source Systems
Looking for a proven, precise DC power source? Advanced Energy offers standard DC and pulsed-DC power-delivery options. Thanks to vast feature sets and reliable performance, our DC power generators are used in nearly every manufacturing market — semiconductor, flat panel, glass, thin film, etc. And via our global, dedicated support staff, we make sure you get the right DC power product for your processes and applications.
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Power Supplies
Excelitas Technologies designs and manufactures high-performance, custom-tailored power supplies and systems for leading OEMs in diverse markets including: Medical, Dental, Semiconductor, Industrial Manufacutring, Defense, Aerospace and Safety and Security. Our broad product portfolio, which leverages the latest advances in power conversion technology, is based on field-proven designs.
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Metrology Solutions for Semiconductors
Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition.
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Camera Modules
e-con Systems Camera Modules come with parallel & MIPI interfaces. Our CMOS camera modules will be effective in any application or environment because of their versatility and wide range of options. Embedded camera module can be interfaced to processors like Tegra K1, i.MX6, DM3730, OMAP. Further to these HD camera modules, e-con offers evaluation boards with these camera modules interfaced to various development boards featuring these processors. We provide Omnivision Camera Module & Aptina Camera Module (ON Semiconductor) with CMOS Sensors.
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Amplifiers
We have designed and manufactured amplifiers using all major semiconductor materials, LDMOS, GaN, GaAs, and InP, to produce narrow, wideband, and pulse, receive and transmit amplifiers from 1 MHz to 220 GHz and power levels from mW to over 10 kW.
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STPOWER RF LDMOS Transistors
ST offers a broad portfolio of RF LDMOS (lateral double-diffused metal oxide semiconductor) transistors operating from a supply voltage of 7 to 50 V. They target applications in the 1 MHz to 4 GHz frequency range and feature high peak power up (>1 kW) and high ruggedness capability.
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Octal Digital Multi Channel Analyzer
V1782
The V1782 is the new CAEN Octal 32k digital MCA. Designed for high energy resolution semiconductor detector is perfectly suited for those application in which the number of input channels start becoming relevant such as when segmented HPGe, Clovers and silicon detectors are involved.The V1782 provides four steps of software selectable coarse gain and two possible jumper selectable dynamical ranges (0.2-0.4-0.8-1.6 Vpp and 1-2-4-8 Vpp).It is also compatible with Transitor reset preamplifier thanks to the jumper selectable 10 us AC coupling.
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High Purity Germanium (HPGe) Radiation Detectors
Semiconductor based photon radiation detectors have been evolving for over half a century, with ORTEC pioneering commercial availability for a majority of that time. Initial offerings were based around lithium-drifted germanium Ge(Li) and lithium-drifted silicon Si(Li). Ge(Li) was later replaced with more advanced, high purity germanium (HPGe) detectors. ORTEC provides a comprehensive suite of HPGe detector solutions covering an extensive range of energies and for a variety of applications.
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Global Design Platform
IC Manage Global Design Platform (GDP, GDP-XL) is the semiconductor industry’s most advanced, design & IP management system.
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UV Meters
OAI’s UV Measurement Instrumentation are the standard for Semiconductor Lithography, MEMS, Sensors, Microfluidics, UV Curing, 3-D Printing, Sterilization, Water Purification and Solar/PVC industries. For over 45 years our meters have earned a reputation for accuracy, repeatability and dependability. We offer full calibration and support services worldwide.
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Burn-In Test
Trio-Tech provides a comprehensive range of semiconductor testing services through its state-of-the-art laboratories in the Far East. The laboratories provides static and dynamic Burn-in /HTOL /SLT testing and other testing services. All of the company’s testing facilities are ISO9001, ISO14000, ISO17025 and DSCC certified ensuring that operating policies and procedures meet stringent international standards for consistency and reliability.
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WaferPro Express On-Wafer Measurement Program Software
WaferPro Express software performs automated wafer-level measurements of semiconductor devices such as transistors and circuit components. It provides turnkey drivers and test routines for a variety of instruments and wafer probers. Its new user interface makes it easy to setup and run complex wafer-level test plans, while powerful customization capabilities are enabled by the new Python programming environment.
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2MP Wide Temperature Range Industrial Grade HDR Camera
e-CAM20_CU0230_MOD
e-CAM20_CU0230_MOD is a 2MP high performance, HDR Camera Module with excellent low light performance. It is based on AR0230AT CMOS Image sensor from ON Semiconductor®. It has an ability to stream seamlessly at wide temperature range (-40 to 105°C) which is suitable for Automotive application. It has S-mount (M12) lens holder which allows customers to choose and use the lens according to their requirement. e-CAM20_CU0230_MOD has a dedicated, high-performance Image Signal Processor chip (ISP) that performs the entire Auto functions (Auto White Balance, Auto Exposure control).
