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Sound Quality Evaluation Pack
OS-2740
The OS-2740 is package software consists of the OS-2700 and plug-in options including sound quality evaluation software. This software quantify sound by using six parameters of psychoacoustic evaluation; loudness, sharpness, roughness, fluctuation strength, AI (Articulation Index), tonality as well as conventional physical quantities such as frequency analysis or octave analysis.
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Profilometer
MicroCam™
MicroCam™ fiber-based optical non-contact 3D profilometers deliver: High-Speed Non-Contact Surface and Cross-Sectional Inspection 3D Online Measurements, GD&T and Imaging Long Stroke Profilometry with Sub-Micron Resolution Thickness, Roughness and Vibration Measurements Fiber-based Probes which reach into Bores, Tubes, and Crevices
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Surface Roughness
Surface Roughness: these consist of a stylus attached to an arm which moves over the surface to record and measure the roughness over a specified distance, recording peak-to-valley average.
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Analytical Services
Atomic Force Microscopy (AFM) allows for sub nanometer resolution imaging of surface topography and is able to quantify surface roughness at the angstrom scale. Our team can give you highly accurate measurements such as surface topography, dopant distribution, magnetic domain features, and a wide variety of other sample properties to give you the information you need to do great work.Park can provide measurements in the following areas:● Topography (surface roughness, grain size, step height, etc.)● Mechanical Properties (stiffness, etc.)● Electrical properties (capacitance, conductivity, etc.)● Thermal properties ● Magnetic properties These properties can be measured in air or liquid, depending on your needs.
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Fluctuation Sound Analyzer
OS-2760
Fluctuation Sound Analyzer the OS-2760 is package software consists of the OS-2700 and plug-in options including fluctuation sound analyzer which is developed with new concept of sound quality evaluation parameter. This software makes clear sound features based on the two axes of frequency and fluctuating frequency by using new concept of [time fluctuation] as well as six parameters of physical quantities such as loudness, sharpness, roughness, fluctuation strength, AI (Articulation Index), tonality.
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Optical 3D Measuring Systems & Devices For Your Quality Assurance
As a manufacturer of optical industrial metrology, we offer a broad portfolio of optical 3D measuring systems & devices to support companies in various industries with precise quality assurance in production. Based on Focus Variation technology, our measuring systems not only enable surface roughness measurement, but also the detection of micro-geometries, shapes and structures.
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Rope Testers
The LMA Signal measures loss of metallic cross-sectional area (LMA) caused by corrosion, abrasion, etc. The LMA Signal is quantitative and can be calibrated. (Typically, a rope must be retired when the LMA exceeds 10%).The WRR Signal measures wire rope roughness (WRR). WRR is defined as the aggregate surface roughness of all wires in a rope. WRR is typically caused by and indicates internal and external corrosion pitting, broken wires and clusters of broken wires. The WRR signal is quantitative, and it is calibrated together with the LMA Signal.The LF Signal can indicate localized flaws (LF), for example, broken wires, corrosion pitting, etc. Because it is only qualitative - and cannot be calibrated - it is of limited value for assessing rope deterioration and for making rope retirement decisions.
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Powerful and Cost Effective Spectroscopic Ellipsometer
Smart SE
The Smart SE from HORIBA Scientific is a versatile spectroscopic ellipsometer for fast and accurate thin film measurements. It characterizes thin film thickness from a few Angstroms to 20µm, optical constants (n,k), and thin film structure properties (such as roughness, optical graded and anisotropic layers, etc).The spectral range from 450 to 1000nm is measured in a few seconds and ellipsometric data are analyzed using the DeltaPsi2 software platform. The software integrates two levels of software to fulfil both routine analysis with predefined recipes and advanced analysis with state-of-the art ellipsometric modelling.
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3D Measuring Laser Microscope
LEXT OLS5000
The OLS5000 laser confocal microscope precisely measures shape and surface roughness at the submicron level. Data acquisition that's four times faster than our previous model delivers a significant boost to productivity. Measure samples that are up to 210 mm tall. Capture the shape of any surface. Total magnification: 54x - 17,280x
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Sound Quality Evaluation Function for O-Solution
OS-0525
The sounds generated from the equipment are mainly measured by evaluation based on general analysis such as sound pressure level, FFT analysis and 1/3 Octave analysis. However, since those analysis don’t take into consideration the human hearing characteristics enough, sounds with even the same analysis result may give different impression.When a human listens to a sound, various sensations such as loudness, sharpness, and roughness occur.
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Roughness Measurement CMM Stylus
ZEISS ROTOS
ZEISS ROTOS offers optimum precision and maximum flexibility when performing roughness measurements thanks to its modular design and rotation in three axes: easy-to-change stylus arms further expand the range of possible applications.
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Optical Tactile Surface Finish
1000Z
The Adcole Model 1000-Z features both optical and tactile measuring heads to deliver high precision surface measurements of camshafts, crankshafts and turned parts. The non-contact interferometric probe greatly expands on the measurement capabilities from the diamond tipped contact probe of the standard Adcole 1000 gage, as the optical accessory can precisely measure surface finish of cam track groove sidewalls, cam track bottom grooves and more. Profilometers such as the 1000-Z quantify surface roughness and are relied on to maintain quality and identify potential problems in the manufacturing and coating process.
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Spectroscopic Ellipsometry
Spectroscopic ellipsometers measure film thickness and refractive index of single layers, and multi‑layer stacks. Related properties of bulk materials, isotropic and anisotropic materials, surface and interface roughness as well as gradients can be analysed.
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Spectroscopic Ellisopmeter for Simple Thin Film Measurement
Auto SE
The Auto SE is a new thin film measurement tool that allows full automatic analysis of thin film samples with simple push button operation.Sample analysis takes only a few seconds and provides a complete report that fully describes the thin film stack – including film thicknesses, optical constants, surface roughness, and film inhomogeneities.
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Dimensional Calibration
123 BLOCKS ANGLE BLOCKS BALL BAR BORE GAGE CALIPERS CHAMFER GAGES CMM'S COATING THICKNESS GAGES CYLINDER PLUGS DEPTH GAGES GAGE BLOCKS GO-NO-GO GAGES HARDNESS TESTERS HEIGHT GAGES INDICATORS LENGTH STANDARDS LEVELS MICROMETERS OPTICAL COMPARATORS PARALLELS PIN GAGES PROFILOMETERS RADIUS GAGES ROUGHNESS SPLINES THREAD RINGS THREAD PLUGS
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Optical Profiler
DRK8090
Shandong Drick Instruments Co., Ltd.
This instrument uses noncontact, optical phase shift interferometry method does not damage the surface when measuring graphics can be quickly measured by a variety of three dimensional surface morphology, and analyzed to calculate the measurement results. Suitable for measuring a variety of blocks, the surface roughness of optical components; scale, dial the groove depth; magnetic (optical) disk, the head surface texture measurements; structural morphology of coating thickness and coating trough structure at the boundary of the grating; silicon surface roughness measurement and the graph structure and so on.
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Line Scan Camera
Piranha4 Polarization
The Piranha4 Polarization™ camera is a breakthrough in the machine vision industry. This high-speed polarization camera features three native polarization states plus an unfiltered channel.The Piranha4 polarization camera extends detection capability in machine vision and is ideal for detecting stresses, surface roughness, film thickness, alloy composition, and 3D profiles.
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Contour And Surface Measuring Machines
The contour and surface measuring machines from ZEISS offer different, sometimes combinable sensors for roughness measurements, contour measurements or both. The contact-free linear drive makes these machines highly efficient and low-maintenance.
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Wafer Thickness Measurement System
MPT1000
Laser based Wafer Thickness and Roughness Measurement System designed by Chapman Instrument Inc., USA and OEM by Creden Mechatronic Sdn Bhd. A non-contact measurement system measures several parameters in a single system. (wafer & tape thickness, roughness, TTV, bump height, bow and warp measurements)
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Widefield Confocal Microscope
Smartproof 5
The versatile ZEISS Smartproof 5 widefield confocal microscope is your integrated system for surface analysis: fast, precise and repeatable. Put it to work on a wide range of industrial applications - such as roughness and topographical characterization - that come up every day in QA/QC departments, production environments and R&D labs. This high quality confocal system is driven by the powerful software ZEISS Efficient Navigation (ZEN) to bring you the added benefits of maximum user comfort and increased productivity.
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Stylus Profilometers
Tencor™
KLA Instruments™ Alpha-Step®, Tencor P- and HRP®-series stylus profilometers deliver high-precision, 2D and 3D surface metrology, measuring step height, surface roughness, bow and stress with industry-leading stability and reliability for your R&D and production requirements.
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Roughness Measurement
ZEISS ROTOS offers optimum precision and maximum flexibility when performing roughness measurements thanks to its modular design and rotation in three axes: easy-to-change stylus arms further expand the range of possible applications.
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Stylus Profilometry
Dektak®
Bruker's Dektak stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. Dektak surface profilers have been widely accepted as a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.
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Surface Roughness Gauges & Testers
Surface roughness gauges are used for measuring the surface roughness of a material. GAOTek’s surface roughness gauges are reliable, high quality, and affordable instruments that provide an accurate measurement. They are an efficient and quick means for inspection or testing. Our gauges are compact, easy to carry and portable, allowing the user to work in complex conditions, and are available for sale to the United States, Canada and globally.
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Roughness Testers
Roughness is an important parameter when trying to find out whether a surface is suitable for a certain purpose. Rough surfaces often wear out more quickly than smoother surfaces. Rougher surfaces are normally more vulnerable to corrosion and cracks, but they can also aid in adhesion. A roughness tester is used to quickly and accurately determine the surface texture or surface roughness of a material. A roughness tester shows the measured roughness depth (Rz) as well as the mean roughness value (Ra) in micrometers or microns (µm). Measuring the roughness of a surface involves applying a roughness filter. Different international standards and surface texture or surface finish specifications recommend the use of different roughness filters. For example, a Gaussian filter often is recommended in ISO standards.
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kSA BandiT PV
Harness the power of this patented technology to improve your process control. Measure and control uniformity, thickness, band gap, temperature, surface roughness and more.
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Surface Roughness Testers
Widely used in production site to measure surface roughness of various machinery-processed parts, calculate corresponding parameters according to selected measuring conditions and clearly display all measurement parameters.
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Substrate Thickness, Warp, and TTV Measurement
413 Series
Substrate Thickness, Warp, and TTV Measurement- with or without Tape- for Wafer Backgrind and Etch Thinning processes.Non-contact Echoprobe Technology.Thin film and surface roughness options.
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Surface Roughness Measuring Machines
Portable Surface Roughness Measurement instruments whose analysis function and operability are dramatically evolved
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Solar Radiation (Sunshine) Test
This test determines the effects of direct solar radiation on components and material. The heating effects of solar radiation differ from those of high air temperature in that the amount of heat absorbed depends on the roughness and color of the surface on which the radiation is incident and the angle of incidence to the sun. Variations in the intensity of solar radiation over the surface of the component, may cause components to expand or contract at different rates, which can lead to severe stresses and loss of structural integrity. In addition, degradation due to photo-chemical changes can occur such as fading of color, deterioration of natural and synthetic elastomers and polymers. The test items that are subjected to solar radiation testing are those that are exposed to solar radiation during its life cycle, in the open, in warm climates.
