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Device Under Test
a specific purpose component or module check; ex. substantial component of a PCB.
See Also: DUT, Unit Under Test, EUT
- Pickering Interfaces Inc.
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PXI Instrumentation Modules For Automated Test Systems
PXI-based test systems often require a variety of general-purpose instrumentation such as digital I/O, waveform generators, voltage & current sources and DUT power supplies.
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PXI Automotive Switch Simulator Modules
Pickering's Switch Simulator Modules are designed for automotive test applications. These modules simulate the operation of automotive switches where dirty contacts or leaking current can be expected from switch contamination. They allow automotive I/O devices to be tested for correct operation under adverse conditions.
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Digital Multimeter
M3500A
USBTMC stands for USB Test & Measurement Class. Any USB device conforms to USBTMC without the limitations of operation systems and environment can work under VISA assistance, and communicate with a computer.In other words, the control procedures via VISA to USBTMC device and via VISA to GPIB device are the same.
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Regenerative Power System, 80 V, ±125 A, 5 KW, 200/208 VAC
RP7932A
The Keysight RP7932A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test.
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PXI 8/16-Channel Isolated D/A Converter
M9185A
The M9185A is a fully independent, isolated D/A converter that is capable of supplying high voltage levels in parallel of up to eight or sixteen channels. Each channel is able to output up to 16V as stimulus signals to Device Under Tests (DUTs).
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Functional Test Fixtures
Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
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Modulation Distortion For E5081A Up To 20 GHz
S960704B
The Keysight S960704B modulation distortion software application enables fast and accurate active device modulation distortion characterization under modulated signal conditions up to 20 GHz. The wide dynamic range and vector error correction of the ENA-X yield an extremely low residual EVM of the test setup, delivering a complete picture of your device’s signal distortion performance without test system interference. S960704B software measures EVM, NPR, ACPR, and decomposes linear and nonlinear signals by spectrally correlating input and output spectrum without needing to demodulate. Integration with the ENA-X measurement flexibility enables quick modulated signal distortion measurements along with traditional VNA tests.
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BACnet Quick Test (BQT)
BQT is an easy-to-use all-purpose BACnet device discovery, analysis and testing tool for Windows. BQT runs under Windows 7/8/10, Server 2008/2012 and XP, and provides a simple set of client features tailored to the needs of end-users, installers and product developers who just want to run some quick tests.
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TMS Test Management Software
LX TMS
To diagnose and analyze electronic components and devices, various tests are required in development, production and service. Equipped with all the necessary standard functions, the test sequencer developed by LXinstuments meets all criteria for a successful and smooth test process. The test item ( DUT ) is examined under various operating conditions for its properties, function and usability. Typical areas of application can be found where the usual complexity of test sequences has to be processed. The test sequencer is therefore suitable for small and medium-sized systems where special functions of other sequencers are not required. The free, cross-platform, open source developer platform .NET serves as a starting point. The integrated WPF (Windows Presentation Foundation) framework ensures a user-friendly program interface.
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Cables
Adapter Cables connect your Spectrum card or instrument with your device under test, your sensor, your transmitter or receiver, your external machine, your prototype equipment or simply with a probe for measuring. To fulfill a lot of different requirements Spectrum is offering adapter cables between different types of connections and with different length. These adapter cables are manufactured for Spectrum following Spectrum's specification.
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PXIe-2748, 3 GHz, 16x1 PXI RF Multiplexer Switch Module
780587-48
PXIe, 3 GHz, 16x1 PXI RF Multiplexer Switch Module—The PXIe‑2748 is a PXI RF multiplexer switch module that is ideal for switching RF signals up to 3 GHz in production test applications. The high channel count of the PXIe‑2748 makes it well-suited for test systems that require switching a large number of RF signals, such as switching several devices under test to a single channel on the RF analyzer. It also features onboard relay counting for relay monitoring.
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Digital I/O with Per Channel Programmable Logic Levels and PMU PXI Card
GX5295
The GX5295 offers outstanding digital test capabilities and channel density in a compact 3U PXI form factor. Offering both performance digital and analog test capabilities, the GX5295 provides a cost-effective, tester per pin architecture - making this card the ideal choice for high throughput, mixed-signal component test applications. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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DC Automated Accelerated Reliability Test Station (AARTS)
DC-HTOL
The DC Automated Accelerated Reliability Test Station (AARTS) systems are designed to maximize channel density. The first systems developed by Accel-RF (ARF) were intended for RF and DC stimulus to the Device Under Test (DUT). However, there are some applications in which RF stimulus is not required.
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Programmable RF Multi-Port Test
A programmable multi-port switch between your RF device under test and a Vector Network Analyzer significantly speeds up testing.
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2kV, 400 MHz High Voltage Differential Probe
HVD3220
The HVD3000A series of high voltage differential probes cover the fullest range of applications, from 120/240 V switch-mode power supplies through 600 V class and 5 kV electrical apparatus. The table below provides a list of recommended probe models based on specific device under test applications.
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RFFE Protocol Analyzer and Exerciser
PGY-RFFE-EX-PD
Prodigy Technovations Pvt. Ltd.
RFFE Protocol Analyzer (PGY-RFFE-EX-PD) is the Protocol Analyzer with multiple features to capture and debug communication between host and design under test. The RF Front-end control interface (RFFE) Serial bus interface is emerging as a chosen for controlling RF frond end devices. There are variety of front end devices such as Power Amplifiers (PA), Low-Nose Amplifiers (LNA), filters, switches, power management modules, antenna tuners. It is widely used in mobile devices.
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NI-9239 , ±10 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
782402-01
±10 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The NI‑9239 performs differential analog input. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. In addition to safety, isolation eliminates measurement errors caused by ground loops because the front end of the module is floating. Designed for both speed and accuracy, the NI‑9239 is an effective general-purpose analog module because of its resolution, sample rate, and input range.
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LCR Meters
PeakTech Prüf- und Messtechnik GmbH
A type of electronic test equipment used to measure the inductance (L), capacitance (C), and resistance (R) of an electronic component.[1] In the simpler versions of this instrument the impedance was measured internally and converted for display to the corresponding capacitance or inductance value. Readings should be reasonably accurate if the capacitor or inductor device under test does not have a significant resistive component of impedance. More advanced designs measure true inductance or capacitance, as well as the equivalent series resistance of capacitors and the Q factor of inductive components.
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4 Channel 1.0 ~ 17.0 Gb/s Pulse Pattern Generator and Error Detector
CA9806
The UC INSTRUEMNTS CA9806 is a high performance, flexible four channel Pulse Pattern Generator and Error Detector that can operate from 1.0 to 17.0 Gb/s (consult factory for higher or lower operation speeds). It is also a standalone Bit Error Rate test solution that incorporates an internal full rate clock synthesizer. Its small size allows it to be placed close to the device under test, it can also be placed further away using the TX driver pre and post emphasis controls features to compensate for cable and interconnect losses. It also has a non destructive, integrated eye outline capture feature along with a quick eye height and width measurement capability. Build‐in 8.5 ~ 15 Gb/s eye diagram testing function.
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Error Detector Remote Head 32 and 17 Gb/s
N4952A
The N4952A is an affordable and compact error detector remote head available in 4 to 17 Gb/s and 5 to 32 Gb/s configurations. Compatible with the N4960A Serial BERT controller, it is the perfect solution to test up to 32 Gb/s per channel for 100 Gigabit Ethernet applications and other high-data rate devices. The N4952A error detector supports PRBS or user patterns and operates up to 32 Gb/s in a single band with no gaps or missing data rates. The remote head allows the test equipment to be located very close to the device under test, eliminating the need for long cables that degrade signal quality.
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Electromechanical Transfer Switches up to 40 GHz
Fairview Microwave’s line of electromechanical relay transfer switches can be utilized for numerous applications to increase system level capabilities and can help simplify the overall design approach. With two input and two output ports, transfer switches can connect two different instruments with two devices under test. Additionally, they can be used as drop-out switches, for signal reversal or to bypass a component under test. These products are typically used in military communications and broadcast systems, SATCOM, test & measurement, instrumentation applications and are suitable for aircraft use.
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Automated Discrete Semiconductor Tester (ATE)
5000E
Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
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NI-9239, ±10 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
779593-01
±10 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The NI‑9239 performs differential analog input. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. In addition to safety, isolation eliminates measurement errors caused by ground loops because the front end of the module is floating. Designed for both speed and accuracy, the NI‑9239 is an effective general-purpose analog module because of its resolution, sample rate, and input range.
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SART Tester
The International Marine Organization states that all GMDSS equipment (including SARTs) should be periodically maintained and verified to meet all the performance requirements. In case of test failure, ships may be detained in a port under SOLAS regulation IV/15.8.The 9GHz Search and rescue radar transponder (radar-SART) is indispensable safety device and it must be checked regularly or annually during radio inspection.The purpose of an annual testing is to determine that SART is operational as defined in appropriate performance standards for Survival Craft Radar Transponders for use in Search and Rescue Operations, IMO Resolution A.802 (19).
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Spectral Response SystemsQuantum Efficiency SystemsIPCE Measurement Systems
QE system provides electronics and software designed for fully automated measurement of external quantum efficiency of solar cells. All systems include probes and a fixed plate sample stage for samples up to 150 mm x 150 mm. The main system components include: custom designed software, measurement electronics, and computer system (Windows 8 operating system). The measurement involves focusing monochromatic light to a spot on the device under test, then accurately measuring the photon flux and current from the test cell. The system utilizes a dual beam configuration with lock-in detection, providing an absolute accuracy of ±3%. The QE system uses a grating monochrometer with silicon/InGaAs/Ge detectors. The system includes automatic order sorting filters and two light sources for monochromatic illumination (a Xenon- arc lamp and a halogen lamp). A single lock-in amplifier is used to measure both the reference detector and test device. The main system comes with all the hardware needed to measure quantum efficiency, a fixed plate sample stage and probes.
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2kV, 120 MHz High Voltage Differential Probe with Auto Zero Disconnect
HVD3206A
The HVD3000A series of high voltage differential probes cover the fullest range of applications, from 120/240 V switch-mode power supplies through 600 V class and 5 kV electrical apparatus. The table below provides a list of recommended probe models based on specific device under test applications.
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Wireless Fiber Inspection Probe - WIS 300
Shanghai Fibretool Technology Co.,Ltd.
WIS 300 wireless fiber inspection scope is a WIFI/USB dual-use portable digital fiber inspector. With automated PASS/FAIL and fast images focus functionality, and easy pairing to Android™ and Apple© iOS devices, It can quickly check various patch cords and transceivers, display the fiber end face in PC/laptop/ OTDR/Smartphone etc..digital devices with the USB cable or WiFi connection. Under WiFi mode, it can automatically get the image checked and analyzed. Test results can do the pass/fail judges with IEC/IPC criteria. Fiber images and results can be saved on PC and mobile devices in jpg/pdf/excel format for file records. It’s super light and handy to take anywhere anytime for field tests, operation inspections, and lab research.
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Multimedia Test Video Generator/Analyzer
882EA-DP
The Teledyne LeCroy quantumdata 882EA-DP test instrument with both a DisplayPort 1.1 transmitter and receiver (analyzer) option is packed with features for video and audio testing of DisplayPort monitors and sources at pixel rates up to 268 MHz. The 882EA-DP test instrument provides two (2) additional DisplayPort ports for passive monitoring of the link layer through the optional Aux Channel Analyzer (ACA) application. The ACA option enables you to monitor link training transactions either between the instruments Tx port or its Rx port with the DisplayPort device under test. The 882EA-DP instrument can optionally be equipped with industry approved compliance tests for Link Layer, EDID and HDCP 1.2.
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NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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External Frontend
FE50DTR
The R&S®FE50DTR external frontend can extend the frequency range up to 50 GHz for Rohde&Schwarz signal and spectrum analyzers as well as signal generators. The R&S®FE50DTR enables signal up and downconversion directly at the device under test (DUT), lowering cable losses, increasing sensitivity and delivering more power at the antenna in an OTA environment. With a dual connector system, testing of active components is an easy task.
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PXI Battery Simulator Module
41-751-001
The 41-751 is a low power battery simulator module that can be used to simulate the power supplies of cellular phones and other portable battery devices. It features fully floating output terminals than can deliver voltages up to 6 Volts. The fast responding remote sense connections allow the module to regulate the supply voltage at the device under test.
