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Device Under Test
a specific purpose component or module check; ex. substantial component of a PCB.
See Also: DUT, Unit Under Test, EUT
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High Flexibility VNA Cables
Our lines of high frequency VNA test cables display excellent electrical properties such as wonderful phase stability of +/- 6° at 50 GHz and +/- 8° at 67 GHz as well as VSWR of 1.3:1 at 50 GHz and 1.4:1 at 67 GHz. The 50 GHz assemblies are terminated with 2.4mm connectors while the 67 GHz versions utilize 1.85mm connectors. The braided stainless steel armoring surrounding the coax provides a rugged, but flexible cable with a flex life exceeding 100,000 cycles, making these test cables ideal for use in semiconductor probe testing, precise bench top testing as well as lab/production testing where the need for a highly flexible, yet durable cable solution is required. The VNA test cables are also equipped with rugged stainless steel connectors that provide up to 5,000 mating cycles when attached with proper care. Additionally, the flexibility of these cables makes it easier and safer to test a Device Under Test (DUT). A swept right angle 2.4mm and 1.855mm connector option allows these cables to fit in tight spaces and can reduce the length of cable required in many applications.
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2-Axis Rate and Position Tables
When a device under test needs to be stimulated with simultaneous movements around two axes, then a product from the ACUTRONIC two-axis motion simulator range is the right choice. Due to their independent motion simulation in two axes they are very versatile: they are used as Inertial Guidance Test Systems (IGTS), for HardWare-In-the-Loop (HWIL) testing, for the test of optronic pointing devices, and many more applications.
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Regenerative Power System, 500 V, 20 A, 5 kW, 400/480 VAC
RP7961A
The Keysight RP7961A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test. The regenerative capability enables the energy normally consumed to be returned to the grid cleanly, saving costs associated with energy consumption and cooling.
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Regenerative Power System, 160 V, ±125 A, 10 KW, 400/480 VAC
RP7946A
The Keysight RP7946A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test.
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NI-9228 , ±60 V, 1 kS/s/ch, 24-Bit, Simultaneous Input, 8-Channel C Series Voltage Input Module
783861-02
±60 V, 1 kS/s/ch, 24-Bit, Simultaneous Input, 8-Channel C Series Voltage Input Module - The NI‑9228 performs differential analog input. With channel-to-channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. The NI‑9228 is simultaneous sampling with two options for filtering: a low-latency filter or a 50/60 Hz rejection filter. The low-latency filter enables users to use this module in industrial or control applications while getting better external noise rejection.
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Test Port Adapter Set, 1.85 Mm To 1.85 Mm
85130H
The Keysight 85130H test port adapter protects the test set port from being directly connected to the device under test. This adapter has a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a 1.85 mm to 1.85 mm male adapter and a 1.85 mm to 1.85 mm female adapter. The frequency range for these adapters is dc to 67 GHz with a return loss of 23 dB or better.
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Dynamic Digital I/O With Per Channel Timing, Programmable Logic Levels And PMU PXI Card
GX5296
The GX5296 offers advanced dynamic digital I/O performance and capabilities in a single slot, 3U PXI format. The 32-channel, GX5296 features timing per pin, multiple time sets, data formatting, and an advanced sequencer – providing users with the capability to emulate and test complex digital busses for system, board or device test applications. Offering sub-nanosecond edge placement resolution per pin and a PMU per pin, the GX5296 has the ability to perform both DC and AC parametric testing. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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NI-9229, ±60 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Module
779785-01
±60 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Module - The NI‑9229 performs differential analog input. The NI‑9229 is an effective general-purpose analog module because of its resolution, sample rate, and input range. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. In addition to safety, isolation eliminates measurement errors caused by ground loops because the front end of the module is floating.
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Customized Test Fixtures
Test fixture is a device designed to mount a device under test (DUT), equipment under test (EUT) and unit under test (UUT) in place and allow it to be tested by being subjected to controlled electronic test signals and procedures.
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PXIe-4113, 2-Channel, 10 V, 6 A PXI Programmable Power Supply
782857-02
The PXIe‑4113 is a programmable DC power supply with isolated outputs. It helps simplify the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and component test—by eliminating the need to mix multiple instrumentation form factors in a given test rack. It also has standard output disconnect functionality that allows isolation from the device under test (DUT) when not in use, and remote sense to correct for losses in system wiring.
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PXIe-4140, 4-Channel Source Measure Unit
781742-01
The PXIe-4140 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4140 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
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Vector Impedance Analyser
TE3000
The TE3000 Vector Impedance Analyser is a portable desktop instrument designed for high accuracy impedance measurement. The probe style construction and small output signal make it ideal for "in circuit" impedance characterisation of small signal devices without the risk of damage to the device under test. The TE3000 comes factory calibrated to the tip of the probe with optional custom calibration. Turn it on, set the frequency, take a measurement, and display the results in any format.
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Scanner Probe
RFS set
The RFS set consits of three passive near field probes designed for the use in a measurement scanner during the development of E-field and magnetic field. They are designed for frequency ranges of 30 MHz to 3 GHz. The probe heads of the RFS set allow for close measurements needed to correctly localize interference sources on an electronic assembly. They document the whole image of the device under test`s near field. The scanner probes have a sheath current attenuation and are electrically shielded. They are connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance. The measuring signal can be increased with PA 203 or PA 303 preamplifier. On request RFS, LFS and XFS scanner probes can be produced.
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Large-size Hybrid Reverberation / Anechoic Chamber
F-Series
The F large-size hybrid Reverberation/Anechoic Chamber represents the most versatile OTA test system in the market today. With the same unique test features of their E Series RC counterparts, the F-Series can also test large form-factor devices under test (DUTs) like laptops, large TV sets, solar and trash compactors, drones, fridges or washing and vending machines, among others. With up to 16x16, 8DLCC and DUTs up to 2m and 500 kg including full-body phantoms in a turntable, the F Series also expands the frequency range down to cover 200 MHz up to 40 GHz frequency ranges and the test modes to include EMC, BS, small cell, eNodeB and Virtual Drive Testing over the air (VDT-OTA). In an again unheard-of feature, the F-Series is also reverse-convertible into an Anechoic chamber, allowing Far Field (FF) and Spherical Near Field (SNF) radiation patterns, efficiency and gain measurements and pre-5G testing of antennas and devices. Conversion from RC to AC or vice versa can be performed within half a day.
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Vibration Testing
Vibration testing includes kinetic energy transfer to the test specimen, often described as the Device Under Test or simply DUT. Typically specified in terms of displacement, velocity, acceleration or the corresponding power spectral density units as a function of frequency. The form of the vibration may be sinusoidal, random, or a combination.
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Automated Optical Inspection (AOI)
Automated optical inspection (AOI) is an automated visual inspection of printed circuit board (PCB) (or LCD, transistor) manufacture where a camera autonomously scans the device under test for both catastrophic failure (e.g. missing component) and quality defects (e.g. fillet size or shape or component skew). It is commonly used in the manufacturing process because it is a non-contact test method.
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Regenerative Power System 2000 V, ±30 A, 30 KW, 400/480 VAC
RP7983A
The RP7983A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test.
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NI-9229, ±60 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Module
780180-01
±60 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Module - The NI‑9229 performs differential analog input. The NI‑9229 is an effective general-purpose analog module because of its resolution, sample rate, and input range. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. In addition to safety, isolation eliminates measurement errors caused by ground loops because the front end of the module is floating.
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Automatic Calibration Module
ACM2520
ACM2520 is an automatic calibration module that can be used with all CMT Vector Network Analyzers operating in frequency range up to 20 GHz. It is a fully automatic USB-controlled and powered electronic calibration module. Minimizing the number of steps required by technicians reduces the risk of human error and expedites the calibration process. Automating the calibration routine also reduces wear and tear on the analyzer and RF cables. To perform full 2-port calibration, each end of the ACM need only be connected to the analyzer once, as opposed to 18 connections with a traditional calibration. The ACM also contains a factory characterized 20dB in-line attenuator which acts as a simulated device under test (DUT). The confidence check feature loads the factory stored DUT into memory so proper calibration can be verified.
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PXI-2549, 2.7 GHz, 50 Ω, Dual-Terminated SPDT PXI RF Relay Module
778572-49
2.7 GHz, 50 Ω, Dual-Terminated SPDT PXI RF Relay Module - The PXI‑2549 is a general-purpose single‑pole double‑throw (SPDT) switch module. You can use it to add flexibility to your switch network or to maintain uniform signal paths across multiple channels when building high‑channel‑count multiplexers. The PXI‑2549 termination resistors minimize reflections on open channels and protect your source or device under test from damage. The module also features excellent insertion loss, voltage standing wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use its onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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CAN MiniModules
Measurement points distributed throughout a device under test, whether in a vehicle or at a test bench place high demands on the measurement technology. Measurement modules must be compact, robust, reliable, and easy to use. CSM meets all these requirements with its long-term proven CAN MiniModule series.
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Electromechanical Transfer Switches up to 40 GHz
Fairview Microwave’s line of electromechanical relay transfer switches can be utilized for numerous applications to increase system level capabilities and can help simplify the overall design approach. With two input and two output ports, transfer switches can connect two different instruments with two devices under test. Additionally, they can be used as drop-out switches, for signal reversal or to bypass a component under test. These products are typically used in military communications and broadcast systems, SATCOM, test & measurement, instrumentation applications and are suitable for aircraft use.
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Keysight Dual 4x16 Armature Matrix for 34980A
34932A
The Keysight 34932A module for the 34980A Multifunction Switch/Measure Unit gives you the most flexible connection path between your device under test and your test equipment, allowing different instruments to be connected to multiple points on your device under test at the same time. Dual 4x16, 8x16, or 4x32 configurations 128 2-wire cross-points 300 V, 1 A switch; 2 A carry current Connections to the internal DMM Latching armature relays, with relay counter Expandable via four 2-wire analog buses
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PXI Single 18 Channel MUX, BNC Connectors
40-735-902-S3
The 40-735 data communications multiplexer is designed for switching the data lines of serial interfaces (RS232, USB). Careful attention to the design of the module ensures that the switching system minimizes its impact on the transmission distance of USB1.1 interfaces. The MUX is available in 36:1 or 18:1 formats and enables a single source of serial data to be switched to one of 36 or 18 devices under test. This allows the data source to load information to, or receive information from, the device under test. The 36:1 version can be software configured into two independent 18 way MUXs enabling two separate sources of serial data to be connected to separate banks of 18 devices. The module is ideal for performing bulk testing of any device that relies on a serial data communications port to load software or control the device operation. It can also be used for a variety of other applications where ever a 2-pole low power MUX is required.
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PXI-2515, 35-Channel, 0.25 A PXI Signal Insertion Switch Module
778572-15
35-Channel, 0.25 A PXI Signal Insertion Switch Module—The PXI‑2515 is a multiplexer switch module that enables connectivity by routing high-speed digital I/O (DIO) signals between a device under test (DUT) and an NI high-speed DIO device or a parametric measurement device. You can use modules such as PXI Source Measure Units (SMUs) and PXI Digital Multimeters (DMMs) with high-speed digital devices. With the PXI‑2515, you can perform parametric tests on digital pins without external connectivity or impedance mismatch challenges.
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PXIe-4141, 4-Channel, ±10 V, 100 mA, Precision PXI Source Measure Unit
781743-01
PXIe, 4-Channel, ±10 V, 100 mA, Precision PXI Source Measure Unit - The PXIe-4141 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4141 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4141 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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Test Fixture Kits
Our test fixture kits provide cost effective solutions to printed circuit board testing and other devices under test. Our modular kits are available in multiple sizes and configurations. They can easily be customized if our standard doesn’t meet your requirements. Removable side panels for ease of fabrication for I/O connections, switches or other hardware.
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Protection Test Set
CMC 850
The CMC 850 is a protection test set dedicated to IEC 61850. It focuses on the real-time communication methods GOOSE and Sampled Values to interface with the devices under test.
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Test Port Adapter Set, 2.4 Mm To 2.4 Mm
85130G
The Keysight 85130G test port adapter protects the test set port from connecting directly with the device under test. It has a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a NMD-2.4 mm (f) to NMD-2.4 mm (m) adapter and a NMD-2.4 mm (f) to PSC-2.4 mm (f) adapter. The frequency range for these adapters is dc to 50 GHz with a return loss of 23 dB or better.
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sbRIO-9229 , Non-Enclosed, ±60 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
780874-01
Non-Enclosed, ±60 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The sbRIO‑9229 performs differential analog input. The sbRIO‑9229 is an effective general-purpose analog module because of its resolution, sample rate, and input range. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. In addition to safety, isolation eliminates measurement errors caused by ground loops because the front end of the module is floating. Non-enclosed modules are designed for OEM applications.
