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Elemental
of the periodic table.
- Applied Rigaku Technologies, Inc
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Low cost EDXRF Elemental Analyzer
NEX QC+ QuantEZ
Applied Rigaku Technologies, Inc
As a premium low-cost benchtop EDXRF elemental analyzer, the Rigaku NEX QC+ QuantEZ delivers wide elemental coverage with easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids, and slurries. The 50 kV X-ray tube and Peltier cooled silicon drift detector (SDD) deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability, along with multiple automated X-ray tube filters, provides a wide range of XRF applications’ versatility and low limits-of-detection (LOD).
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LIBS Analyzer
LIBS is a type of optical emission spectroscopy used to measure elemental concentrations in a material.
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Neutron Activation Analysis
Neutron Activation Analysis (NAA) is one of the most sensitive analytical techniques used for multi-element analysis available today. The NAA procedure is capable of providing both quantitative and qualitative results for individual elements, with sensitivities that can be superior to those possible by any other analytical technique. Elemental Analysis Incorporated (EAI), as an innovator in the development and application of radio-nuclear chemistry analytical techniques, now offers its clients the ability to analyze some 75 individual elements (including certain organic elements) by NAA at trace and ultra-trace concentrations. Moreover, by developing scientific liaisons with selected nuclear reactor sites in North America, EAI is able to offer customers the expertise and capabilities of the premier scientists and research facilities available today. Combined with EAI’s tradition of excellence in customer service and technical assistance, EAI is uniquely positioned to assist clients with timely, cost-effective, and reliable trace element analysis for almost every conceivable field of industry or scientific research.
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Small Spot Advanced EDXRF Spectrometer
NEX DE VS
Applied Rigaku Technologies, Inc
Specially designed and engineered for heavy industrial use, whether on the plant floor or in remote field environments, the superior analytical power, flexibility, and ease-of-use of the NEX DE VS adds to its broad appeal for an ever-expanding range of applications, including exploration, research, RoHS inspection, and education, as well as industrial and production monitoring applications. Whether the need is basic quality control (QC) or its more sophisticated variants — such as analytical quality control (AQC), quality assurance (QA) or statistical process control like Six Sigma — the NEX DE VS is the reliable choice for routine elemental analysis.
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CS/ONH Analyzers
Elemental analysis of CS and ONH in inorganic materials | Based on the know-how of many decades Bruker offers innovative solutions for rapid and precise elemental analysis of carbon, sulfur, oxygen, nitrogen and hydrogen.
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Energy Dispersive X-ray Spectroscopy
EDS
Materials Evaluation and Engineering
EDS is an elemental chemical microanalysis technique performed in conjunction with each of the SEMs at MEE. Features or phases as small as about 1 micron can be analyzed.
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Scanning Electron Microscopy (SEM Analysis)
Rocky Mountain Laboratories, Inc.
Scanning Electron Microscopy (SEM Analysis) can produce images of almost any sample at magnifications of 15-300,000X. The SEM has tremendous depth of field allowing for imaging that cannot be accomplished using optical microscopy. Conductive and nonconductive samples can be imaged. When operated in the backscatter (BSE) detection mode, differences in material composition can be observed. Elemental analysis can be performed on any feature observed with an integrated Energy Dispersive Spectroscopy (EDS) detector.
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X-ray Fluorescence Spectroscopy (XRF) Services
Work we''ve done: Coating identification, Measuring lead levels in paint and solder, Elemental comparison of two metal ingots, Restriction of Hazardous Substance (RoHS) testing.
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Plasma Profiling TOFMS
PP-TOFMS
Plasma Profiling TOFMS addresses the needs of materials scientists across a wide range of application areas. PP-TOFMS provides fast elemental depth distribution of any inorganic material. The speed and ease of use of PP-TOFMS permit to reduce optimization time of growth processes as many research scientists strive to reduce the time from discovery to applications of new materials.The simultaneous full coverage of TOFMS available for each point of depth permits the detection of non suspected contamination. This is key for failure analysis and optimization of thin film processes that tend to no longer be based on ultra-high grade methods (i.e. ink jet printing…).
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Carbon / Sulfer Analyzer
ELEMENTRAC CS‑i
The elemental analyzer ELEMENTRAC CS-i measures the carbon and sulfur concentration in predominantly inorganic samples through combustion in an induction furnace and the subsequent analysis of the gaseous combustion products carbon dioxide and sulfur dioxide.
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X-ray Fluorescence
XRF analysis – one of the best analytical techniques to perform elemental analysis in all kinds of samples, no matter if liquids, solids or loose powders must be analyzed.
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X-ray Fluorescence Spectrometers
Is a non-destructive analytical technique used to determine the elemental composition of materials.
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Energy Dispersive X-ray Fluorescence Spectrometer
Pharmaceutical Elemental Impurities Analysis System
Control of Elemental Impurities in Pharmaceuticals In the pharmaceutical industry, the analysis of elemental impurities is necessary to ensure the safety of pharmaceuticals. In December 2014, the "Guideline for Elemental Impurities" (Q3D) was issued by the International Council for Harmonisation of Technical Requirements for Pharmaceuticals for Human Use (ICH), consisting of representatives from Europe, the U.S. and Japan. In Japan, the "Guideline for Elemental Impurities in Drug Products" (PFSB/ELD Notification 0930 #4 from the Ministry of Health, Labour and Welfare) was issued, and will be applied to new drug products submitted for approval after April 1 2017. For 24 elements categorized in Class 1 to Class 3, residual quantities in pharmaceutical drug products must be controlled within permissible limits. Although ICP-AES and ICP-MS are used for precise analysis of elemental impurities, X-ray fluorescence spectrometers can be used as an alternative analysis method. This is because they can quantitatively and qualitatively analyze a variety of elements nondestructively, and without chemical pretreatment, unlike ICP-AES and ICP-MS systems. The X-ray fluorescence spectrometry has been adopted as a general method of analysis in the U.S Pharmacopeia and the European Pharmacopoeia. (USP<735>, Ph.Eur.2.2.37)
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Online Slurry Elemental Analyzer
SlurryView
Lyncis Online Slurry Analyzer is providing continues elemental analysis of slurry without a need for a complex and high maintenance sampling system. The analyzer is installed above a slurry flow surface and can deliver an accurate chemical analysis of production feed, concentrate product or tailings. All elements including light once can be measured simultaneously without manual sampling and sample preparation.
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Handheld XRF Analyzer
Vanta Element
The Vanta Element XRF analyzer series provides elemental analysis for fast alloy grade identification and sorting at an affordable price. The series is available in two cost-effective models
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Multi-Element Standards
These multi-element standards consist of multi-layer thin film coatings, one on top of the other, upto a maximum of 6 elemental coatings. It is generally recommended to have coating thicknesses < 20 µg/cm2, so as to cause negligible notable matrix effects, in particular absorption of X-rays emitted in lower deposits by those covering them.
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A to Z Testing
Elemental Analysis has the ability to analyze, and to test for all of the substances listed below, and many more. If you do not see the substance you need analyzed or tested for, please give us a call! We can test almost ANYTHING!
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Surface Analysis and Materials Characterization Services
The Materials Characterization division of Evans Analytical Group is the leading global provider of surface analysis and materials characterization services. Our international network delivers world-class analytical services directly to you. EAG''s expertise in surface analysis, composition and contamination measurement, trace elemental analysis and microscopy can help you and your company meet your goals, no matter what high technology industry you work in.
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Handheld XRF Analyzer
ProSpector II
ElvaX ProSpector is a powerful handheld analyzer employing the latest developments in XRF analysis. Due to the advanced electronics and state-of-the-art mathematical algorithms ProSpector provides ultimate quality of measurement within a couple of seconds. It is an intuitive and user friendly instrument for highly accurate elemental analysis in a variety of applications.
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Imaging X-Ray Photoelectron Spectrometer
Kratos AXIS Nova
X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a mature and widely used surface analysis technique for materials characterisation. XPS provides quantitative elemental and chemical state information from the upper most 10 nm of material. The The AXIS Nova photoelectron spectrometer can collect X-ray photoelectron spectra and images from any material that is stable under the ultra-high vacuum conditions required for the technique.
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Soil Analysis
We offer a full spectrum of analytical technologies, and sample clean up and moisture extraction reagents, designed to provide reliable, accurate, and precise results that make compliance easier and help you reduce regulatory risks. Organic Elemental Analysis, Trace Elemental Analysis, X-Ray Fluorescence (XRF) Spectrometry, Automated Discrete Photometry, Gas Chromatography Mass Spectrometry (GC-MS), Accelerated Solvent Extraction (ASE).
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Elemental Analyzer
CHANGSHA KAIYUAN INSTRUMENTS CO., LTD.
Elemental Analyzer is used to determine carbon, hydrogen, nitrogen content in solid and liquid material, such as coal, coke, oil, petroleum, biomass, fertilizer, plastic, food, hydrocarbons and plant tissue, leaves and tobacco, which is widely applied in power plants, coal mines, metallurgy, chemical industry, commercial inspection, scientific research, food industry, education etc.
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Ultra-Low Frequency Raman Spectrometer Down to 10 cm-1
Modular TeraHertz Raman Spectrometer
HORIBA’s modular terahertz modular Raman spectrometer extends the spectral range of a measurement to < 10 cm-1. Consisting of an Ondax SureBlock™ module fiber coupled to HORIBA’s iHR320 imaging spectrometer, this custom system provides an affordable option for macro-Raman measurements close to the laser line. Below are Stokes and anti-Stokes spectra of elemental sulfur recorded with this system.
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Chemical Analysis
Chemical analysis involves determining the elemental constituents of a material. This information can then be used to determine if the material matches a required specification. At Keighley Laboratories analysis of a wide range of products covering many material types is undertaken although these are mainly metal or metal related products.
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X-ray Fluorescence Spectrometer
X-ray fluorescence spectrometer that provides quick, easy elemental analysis using touch screen operation. It is equipped with functions for conventional qualitative and quantitative analysis (FP method, calibration curve method), as well as screening for RoHS elements. With a variety of both hardware and software options available, it is customizable to cover a wide range of analysis needs.
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XRF Analysis
Elemental analysis (Be-U) from sub-ppm to 100% in solids, powders or liquids, X-ray Fluorescence.
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Hydrogen Analyzer
EMGA-921
EMGA-921 Hydrogen analyzer: It's a "New flagship model” for H analyzer and user friendly product.This is an hydrogen elemental analyzer with high accuracy and repeatability suiting to cutting-edge technology's R&D as well as quality control in the market of steel, new materials, catalyst and so on. This is a new generation model optimized to fit to user's requests.
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Thin-film deposition
Plasma Source
SPECS Surface Nano Analysis GmbH
Thin-film deposition covers any technique for depositing material onto a bulk or thin film substrate. Elemental alloy or compound films are produced by non-reactive or reactive (co-)deposition. Often functionalization or tailoring of device interfaces by predeposition or deposition assisting surface treatment with atoms or ions is necessary.
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AdvintRIO™ Reconfigurable I/O
SNAKEHEAD
The Snakehead platform employs aNI CompactRIO (cRIO) system consisting of an embedded controller, chassis, and NI C Series I/O modules.Snakehead systems are not dependent on a separate host computer. They offer both Ethernet, and Wi-Fi connectivity to powerful real-time controller with a user-upgradable backplane that includes a high performance field-programmable gate array (FPGA). Snakehead provides stand-alone embedded execution for deterministic LabVIEW Real-Time applications. These units are designed for ruggedness, reliability, and low power consumption. The heart of Snakehead systems is the reconfigurable I/O (RIO) FPGA core. The RIO core has an individual connection to each I/O module and is programmed using easy to use elemental I/O functions to read or write signal information from each module
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Spectroscopic Analyzer / Test
Optokey's products offer complete sample characterization solutions and yield situationally sensitive spectrum data and detailed insight into the elemental and molecular composition of the sample. These systems and proprietary software can be precisely tailored to customer's requirements to sense a wide range of analytes, including organics, heavy metals, and biomolecules (DNA, peptides, lipids, etc.) and other materials.
