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Mapping
See Also: Wafer Mapping, Survey
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Network Management
PLANET Universal Network Management System is designed to monitor all kinds of deployed network devices, such as managed switches, media converters, routers, smart APs, VoIP phones, IP cameras, etc., compliant with the SNMP Protocol, ONVIF Protocol and PLANET Smart Discovery utility. It thus enables the administrator to centrally manage a network of up to 1024 nodes from a central office, greatly boosting network and power management efficiency. The NMS solution includes the software, hardware and Touch LCD controller series to attend to different applications. They all feature dashboard, topology and map viewing to make network management efficient and effective.
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Dispersive X-ray Fluorescence Spectrometer
SPECTRO MIDEX
SPECTRO Analytical Instruments GmbH
The SPECTRO MIDEX is known to be an all-round talent for the fast, non-destructive analysis of small spots and the rapid mapping of large surfaces (up 233x160 mm, 9.2x6.3’’) in research and development as well is in compliance screening applications as many elemental analysis tasks in industry, research and the sciences require a non-destructive measuring system that is extremely sensitive and offers a small measuring spot.
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Spectroscopic Reflectometer
– Antireflective coating (ARC) on textured (poly-) crystalline silicon solar cellMeasurement– Thickness, Reflectivity, n&kWavelength– 420 – 950 nm (1.3-3.0 eV) : expandableAccuracy (thickness measurement on specular sample)– 104.5 nm for 104.8 nm SiO₂on c-Si* Accuracy can be dependent on the quality of filmThickness range– 10 nm ~ 20 mm (depend on sample)Data acquisition time– < 1 sBeam spot size– ~ 50 mmFocusing of beam– Manual (optional auto-focus)Sample stage– Manual X-Y stage (specify sample size and travel distance)(optional automatic X-Y stage for mapping)
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Color and Monochrome Camera
DP74
The DP74 color camera for fluorescence not only advances the speed and ease with which you can obtain detailed, accurate images but also introduces for the first time the concept of Intelligent Imaging. With Intelligent Imaging, the camera analyzes the live image and automatically applies its technology to reduce processing time and produce quality images of even dim and challenging samples. Furthermore the camera can follow your stage movements to create in real-time a panoramic image with mapped zoom-outs, a great time saver for documenting your sample. The DP74’s wide field of view and unsurpassed live speed provide an on-screen experience closely matching the traditional ocular view, thanks to its expertly calibrated colors. Maximize your investment return on a shared laboratory instrument with the camera’s top resolution of 20.7 megapixels and the capability to work with brightfield and fluorescent samples alike. These features are compatible with any microscope, whether manual or motorized, making the DP74 a perfect solution for a smarter and faster imaging workflow.
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Pressure Mapping
GRIP™ SYSTEM FOR R&D
Tactile pressure sensing system that quantifies forces applied by the human hand while grasping objects.
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Satellite Terminal Geolocation System
Satellite Terminal Geolocation System is designed to identify and locate sources of satellite transmission such as satellite gateway, VSAT Hub and VSAT terminals etc. The system is useful to the intelligence and defense agencies to identify the sources of satellite transmission of their adversaries and locate the terminals on digital map.
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Vine-Shoot Diagnostics
FA-WOOD™
FORCE-A offers a service for vine-shoot mapping. This spatial heterogeneity analysis is a support tool for crop management (pruning, fertilization, grass management) for the practice of a sustainable viticulture.
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Testing for Si Solar Cells Using High Performance CCD
EL Imaging Tester
EL Testing for Si Solar Cells using High Performance CCD. The determination of luminescence (photo emissions) in solar cells is an important characterization tool. Typical solar cells often have defects which limit the efficiency or lifetime of a cell. Many of these defects are visualized with Luminescence Imaging. By using this technique, the manufacturing process can be optimized to produce better cells. Luminescence Imaging takes advantage of the radiative inter-band recombination of excited charge carriers in solar cells. The emitted photons can be captured with a sensitive CCD camera to obtain an image of the distribution of the radiative recombination in the cell. This distribution is determined by the local excitation level, allowing the detection of electrical losses, thus mapping the diffusion length of minority carriers as the emitted light is low intensity and in the near infra-red range, the CCD camera has a high sensitivity wavelength from 900 to 1100 nm with little thermal noise. This CCD camera provides excellent resolution of 1024 x 1024 pixels with a large 1μm pixel size, multi-megahertz readout speed, and robust USB 2.0 connectivity. The EL CCD Camera is the ultimate high-performance CCD camera for electroluminescence and photoluminescence imaging for Photovoltaic (PV) Cells and Modules. This camera combines low noise electronics and optimal sensitivity in NIR.
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Real-time Chemical Imaging System
AZtecLive & Ultim Max
AZtecLive is a revolutionary new approach to EDS analysis that enables a radical change in the way users perform sample investigation in the SEM. It combines a live electron image with live X-ray chemical imaging to give an intuitive new way of interacting with your samples. 100 mm2 and 170 mm2 sensor areas. Quantitative analysis at 400,000 cps. EDS mapping at >1,000,000 cps.
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First Article Inspection Services
API’s, on-site, first article measurement services provide inspection data on parts and assemblies with direct comparison against CAD models or drawings. Generated 3D measurement data from our portable metrology equipment and 3D scanners offers a comprehensive analysis of the physical part under measurement. Inspection reports can include 3D color maps or generated 3D models for detailed computer analysis.
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TestTools for Lab & Field
Analyzer designed to be used on the field to generate maps including measurements of the field quality of service, enabling identification of reception issues and efficient troubleshooting.
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NED-LMD Near-Eye Display Measurement Systems
NED-LMD WG Series
Gamma Scientific is introducing the NED-LMD Waveguide Tester as the world’s first specialized near-eye display measurement system that mimics human visual perception for fast, accurate and repeatable characterization of next generation optical waveguide-based Augmented/Mixed Reality displays and display components (light engine, waveguide, etc.). This comprehensive offering features a ‘robotic eye’ to help device manufacturers predict how the human eye would perceive their AR/MR displays, quantifying end user experience mapping the entire display field of view.
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Rotating Machinery Analysis
The Rotate software package is part of the m+p Analyzer Software for noise & vibration measurements and analysis. It provides a wide range of data acquisition and analysis tools for capturing and understanding noise and vibration induced in rotating and reciprocating machines by their motion. Fixed and variable speed machines are accommodated as are both structural vibration and condition monitoring diagnostics. Multiple tacho inputs can be processed for accurate speed tracking during analysis. Spectral mapping, order tracking, time history and orbit data analysis are all available.
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Intelligent Double Sized H009 Interface Module for Excalibur 8000 Family of Carrier Boards
M8KH009
The M8KH009 is an intelligent, double-sized, H009 interface module for the multimode, multiprotocol, EXC-8000 family of carrier boards. The M8KH009 provides a complete solution for developing and testing H009 interfaces and performing system simulation of the H009 bus, according to the standard H009 protocol. Each module of the M8KH009 contains 32K x 16 dualport RAM for Data Blocks, control registers, and Look-up tables. In addition, the module contains another 32K x 16 dual-port RAM for a Concurrent Monitor. All data blocks and control registers are memory mapped, and may be accessed in real-time. Each of the independent, dual-redundant M8KH009 modules may be programmed to operate in one of three modes of operation: Central Control Complex (CCC) mode with Concurrent Peripheral Unit operation (1–16 PUs), Peripheral Unit mode (Multiple – up to 16 PUs) and Bus Monitor mode. In addition, the module can simultaneously operate as an independent Internal Concurrent Monitor in CCC, Multiple PU or CCC/Concurrent PU modes.
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Turnkey NDT Corrosion Inspection Services
Robot-enabled ultrasonic inspection that produces thickness grid maps to identify areas where corrosion and other damage mechanisms have caused wall-thinning.
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Pressure Mapping
HIGH SPEED I-SCAN® SYSTEM
Tactile pressure and force measurement system capable of measuring
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Atomic Force Microscopy
Bruker’s industry-leading AFM microscopes provide the highest levels of performance, flexibility and productivity, and incorporate the very latest advances in atomic force microscopy techniques. Applications range from materials science to biology, from semiconductors to data storage devices, from polymers to optics with measurement of nanoscale topography, nano-mechanical, nano-electrical and nanoscale chemical mapping.
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Semi-automatic 150mm Probe Station
CM460
CM460 Semi-automatic 150mm probe station step & repeat, point & shoot, color mapping, and complete software control.
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SAM Auto Line
PVA TePla Analytical Systems GmbH
The fully automated acoustic microscopes from the SAM Auto Line enable simple detection of cavities, voids, bubbles, inclusions, and delamination and are ideally suitable for wafer inspection, bond checking, and MEMS inspection. An automatic defect-review software package performs a fully automated evaluation of the entire wafer. The results can be issued as klarf files and VEGA MAP. A GEM/SECS connection is also possible.
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Fixture Building Software
FixGenius
Tests show that FixGenius’ rule-based probe-mapping algorithms reduce pin deflection by up to 25% compared with traditional fixturing packages. FixGenius comes with a powerful Fixture Editor that allows the user to change the probe mapping. If a solution is mathematically possible, FixGenius’ algorithms will find it, and pick the one with least deflection. If the job simply cannot be done with one single fixture, FixGenius will fully automatically split the test into multiple fixtures or into fixture and flying probe test sets, with guaranteed test integrity.
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Hyperspectral Image Processing Software for THz Imaging Data
ImageLab
ImageLab is a one-of-a-kind image processing tool developed by our partner EPINA for the analysis of data from various spectroscopic imaging techniques such as THz, optical, UV/VIS, IR, Raman, or mass spectrometry. Based on multivariate statistical methods it enables the user to analyze and classify acquired hyperspectral images, to merge them with maps of physical properties and to overlay them with conventional high-resolution color photos. Visualization of the image data and highlighting of analytical information round up the software package to an indispensable instrument for in-depth analysis of spectroscopic image data. ImageLab is now part of Menlo Systems’ imaging extension TERA Image. Ask us for possibilities to upgrade your THz imaging system with our unique software tool!
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Power Solutions for the More Electric Aircraft
The aerospace industry is experiencing a revolution with the wide-scale development of Electric Vertical Take-Off & Landing (eVTOL) and the More Electric Aircraft (MEA). These aerial vehicles, many of them unmanned (UAV), will serve a variety of service-related functions: Search and Rescue (SAR), Medivac, delivery and lift operations, aerial mapping, and of course, human transport. Astronics leads the industry with the next generation of aircraft power electronics serving this new and exciting market as an extension of our best-in-class CorePower® product line.
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Photoluminescence Mapping System
VS6845A
Industrial Vision Technology Pte Ltd.
With its unique optical design technology, the System detects and classifies defects that affect yield and uses advanced photoluminescence (PL) technology to enable real-time monitoring of MOCVD production processes.
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High Voltage Isolator for Logic Analyzers
LX-08
The LX-08 series of high voltage logic analyzer adapters provides a safe isolated method of measuring high voltage control signals with a low voltage logic analyzer. All inbound signals are optically isolated and attenuated to a safe level for the delicate inputs typically found on logic analyzers. The inputs on the LX-08 are capable of withstanding voltages up to +/- 300V AC/DC, higher voltage configurations are available upon request. Rather than probing with multiple neon screwdrivers, the LX-08 can provide simultaneous viewing of up to 8 circuits in the STANDALONE mode via the indicator array. Need to catch a transient event or map out a timing sequence? Just add a logic analyzer to the outputs of the LX-08 and turn it into a high voltage logic analyzer. High voltage signals that were hazardous for a logic analyzer can now be measured safely. Typical outputs of a high speed PLC sequencer can be precisely timed and measured from both sides of the control relay. With the built in user selectable AC filter circuit, an AC signal can be measured as DC events or AC cycles.
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Azure Maps
Create location-aware web and mobile applications using simple and secure geospatial services, APIs, and SDKs in Azure. Deliver seamless experiences based on geospatial data with built-in location intelligence from world-class mobility technology partners.
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3D Software
Geomagic Wrap
Geomagic Wrap 2017 delivers a new and improved 3D scan-to-model workflow. From expanded file format support to manipulating texture maps for bringing your printed parts to life, the 3D scan data toolbox of Geomagic Wrap provides a wealth of possibilities.
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Multi-Function Cable Tester
T012-001-K
The T012-001-K Multi-Function Cable Tester is an essential tool for cable installers or anyone working in telecom or LAN environments. It allows you to track cable, find a short or breakage in non-powered wires, and perform wire mapping on RJ45 cables, detecting shorts and open wires.
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X-ray Fluorescence, XRF Analysis Services
Two XRF systems are available, a wavelength dispersive system (WDXRF) and an energy dispersive system (EDXRF). The difference is the manner in which the x-rays are detected. WDXRF instruments have very good energy resolution which leads to fewer spectral overlaps and improved background intensities. EDXRF instruments have higher signal throughput which can shorten analysis times. The higher signal throughput also makes EDXRF systems suitable for small spot or mapping analysis.
