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The Nanoworkbench
In light microscopy it is natural to use toolsets like tweezers, knives, probes and several different measurement tools. Without this many present-day products and methods would not exist. The operators of SEM/FIB-Systems generally work without toolsets, although the wavelength limit of light is no physical boundary. It can be imagined how technology would be pushed when a SEM/FIB Workbench reaches the same degree of practicability and utilization as toolsets for light microscopes. The Nanoworkbench is the first system substituting the eye-hand coordination effectively with nm precision in a SEM/FIB-system. The Nanoworkbench features a set of applications including TEM lamella preparation, nano probing, nano cutting, nano cleaning, force distance measurement, particle sorting and material preparation. Every application supports automated processes so almost no user interaction is needed. Even complex processes can be done within seconds and even by untrained users. Applications can be combined to create new and more complex processes. Expanding the SEM/FIB to a material processing system and a nano-analytical workbench by utilizing the Klocke Nanoworkbench enables new applications in research and production of material research, live sciences, tribology, environmental & forensic research and semiconductor technology.
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Particle Size Analyzers
Particle systems can be complex, but measuring them doesn’t have to be! Anton Paar offers two different technologies to characterize particles from the nanometer to the millimeter range. The Litesizer series employs light-scattering technology to determine not only particle size, but also zeta potential, transmittance, molecular mass, and the refractive index of nano- and microparticles in liquid dispersions. The PSA series uses laser diffraction technology to measure the size of particles in both liquid dispersions and dry powders in the micro and millimeter range. Side by side they open up a wide range of possibilities for comprehensive particle characterization.
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Nano Particle Size Analyzer
SALD-7500nano
Delivering 10 times the sensitivity of previous models, this innovative analyzer is capable of continuously measuring changes in particle size and particle size distribution at one-second intervals, within a range spanning 7 nm to 800 μm. In addition, unique options that accommodate the measurement of even high-concentration samples (up to 20 wt%) and trace quantity samples (down to 15 μL) are available. Due to its leading-edge measurement capabilities, the analyzer will likely be used for many applications in new areas, including nanotechnology, the life sciences, and fine bubbles (microscopic bubbles).
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Submicron Particle Imaging
FlowCam Nano
Yokogawa Fluid Imaging Technologies, Inc.
FlowCam Nano is the next-generation dynamic image analysis instrument for submicron particle imaging and sizing in real-time. FlowCam Nano extends subvisible particle analysis to detect objects between 300 nanometers and 2 micrometers - the smallest visible with light microscopy.
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Alpha Particle Counting System
UltraLo-1800
The UltraLo-1800 is a best-in-class alpha particle counting system. Our patented design reduces background rates by 50x compared to conventional systems.
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Nano Family
The Nano Family is a set of boards with a tiny footprint, packed with features. It ranges from the inexpensive, basic Nano Every, to the more feature-packed Nano 33 BLE Sense / Nano RP2040 Connect that has Bluetooth® / Wi-Fi radio modules. These boards also have a set of embedded sensors, such as temperature/humidity, pressure, gesture, microphone and more. They can also be programmed with MicroPython and supports Machine Learning.
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Nano Spotter For MALDI-TOF MS
AccuSpot
Bringing LC to MALDI Technology LC/MS/MS is often regarded as the technique of choice in identifying components from complex mixtures; however, it is not without its limitations. An alternative approach is to consider LC/MALDI.
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Reticle/Mask Particle Remover
RP-1
The RP-1 automatically removes particles from the reticle/mask by air (or N2) and vacuum suction. Routinely removing the particles before the lithography process extends the replacement cycle of the pellicle and cleaning cycle of the mask, thereby contributing to a reduction in running costs.
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Particle Deposition Systems
Sets the standards for wafer inspection and metrology equipment. This advanced tool is vital for increasing the yield of future leading-edge devices, while meeting the measurement needs of today.
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Particle Size Analyzers
NanoBrook Series
Brookhaven Instruments Corporation
Rapid and accurate protein & nanoparticle size distributionsMultimodal & unimodal size distribution softwareISO 13321 and ISO 22412 compliant resultsRange: < 0.3 nm to 10 mThree measurement angles: 15, 90, and 173Ideal for fast, routine sizing applications in research or quality controlHigh power 35 mW diode laserDynamic light scattering at 173 and 90Temperature control, -5 C to 110 CCompact bench top unit, USB connectionMolecular weight determination (relative and absolute through Debye plot)
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Nano Interface Unit
NIU2A
NAI’s NIU2A contains an integrated power supply, two function module slots and an optional ARM® Cortex®-A9 processor. This small, low-power unit is ideally suited for rugged military, industrial, and commercial applications. It delivers off-the-shelf solutions that accelerate deployment of SWaP-optimized systems — in less time, with NO NRE.
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Magnetic Particle Liquid Checker
S-2A / S-2B
Magnetic particle liquid checker S-2 series is a test bar which can directly check the quality of magnetic particle liquid immediately. Magnetic particle liquid checker S-2A type has a sensor at the head of straight test bar.
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Handheld Emission Particle Counter
HEPaC
Naneos Particle Solutions gmbh
*Simple measurement of particle number concentrations*Portable and battery-operated*Emission measurements without dilution (sensor heated)*Concentration range up to 5'000'000 particles/cm3*No operating fluids or dryers necessary*Automatic creation of an official measurement report on a tablet*METAS-certified according to ordinance SR 941.242
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Process Particle Size Analyzers
Insitec Range
Insitec systems deliver the online continuous particle size analysis needed for efficient, cost-effective monitoring and control of industrial processes. Suitable for the widest variety of process streams from dry powders to hot sticky slurries, sprays and emulsions, whether milligrams of material or hundreds of tonnes per hour. Insitec systems measure particles in the size range 0.1 micron to 2.5 mm.
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Particle Deposition Systems
MSP’s 2300G3 Particle Deposition System sets the standards for wafer inspection and metrology equipment. This advanced tool is vital for increasing the yield of future leading-edge devices, while meeting the measurement needs of today.
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Reticle / Mask Particle Detection System
PR-PD2HR
In semiconductor plants, where high performance and demanding functionality are required, the HORIBA PD Series'' high operating rate and long-term dependability have earned it a solid reputation. Inheriting a transfer system that has proven to provide stable, high performance and superior throughput over long operating periods, the PR-PD2HR now offers the most sensitive detection in the series with exclusive signal processing that can detect particles as small as 0.35 m.
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Particle Analysis for Liquids
With our partner Pamas we have developed the microscopic image analysis system PAMAS FastPatch 2 GO for automatic membrane filter analysis.
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Particle Solutions
Brookhaven Instruments Corporation
ultimodal Size Distribution which has been refined to give a more accurate graphical image of the particles being measuredHealth Mode post-measurement analysis for DLS, ELS, and PALSStatistical Process Control seamlessly integratedParticle Solutions 3.2, a robust suite of software that integrates five measuring technologies in one package: DLS, ELS, PALS, ASEC and Rhe.
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Non-Destructive Particle Monitoring
PARTi
PARTi provides a complete solution for non-destructive surface particle monitoring of consumables, parts and cleanroom apparel.
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Portable Particle Counters
Engineered for you, they provide real-time cleanroom particle counting in an easy-to-use, reliable instrument that's ready for measurement.
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Particle Counters
PaMas Partikelmess- und analysesysteme gmbH
an instrument that detects and counts physical particles; either ionising or non-ionising.
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Laser Diffraction Particle Size Analyzer
SALD-2300
The new standard in the SALD series. While maintaining continuity and compatibility with respect to the data of the SALD2000/2100/2200, which were popular, widely distributed models, this instrument is equipped with many new functions useful for evaluating changes (dispersion, aggregation, dissolution) in particle size distribution relative to the concentration or time. It supports a particle concentration range from 0.1 ppm to 20% and can perform a series of measurements of 200 data points at 1 second minimum intervals.
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Handheld Particle Counters
Models 3888 And 3889
Kanomax’s innovative Handheld Particle Counters (Models 3888 & 3889) set the standard of instrumentation in cleanroom / operating room monitoring and verification, filter testing, IAQ investigation, data center cleaning and many more highly specialized and highly sensitive applications. These beautifully engineered devices boast some of the most highly advanced technology in the industry. A combination of accuracy and practicality, these devices count airborne particles with high quality performance.
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Particle Analyzers
Teilch Particle Analyzers have proven significant advantages when compared to competitors’ solutions. Innovations in light source, flow control, analog and digital signal processing, components integration and software allow Teilch to provide a state of the art system for precision particle analysis.
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Magnetic Particle Flaw Inspection System
This model can perform every kinds of magnetic particle flaw inspection in our unit. circular magnetization longitudial magnetization continuous magnetization, residual magnetization threading bar magnetization current induction magnetization, AC magnetization AC demagnetization DC magnetization, DC demagnetization.
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Dynamic Particle Image Analysis System
iSpect DIA-10
Shimadzu's iSpect DIA-10 Dynamic Image Analyzer combines particle size and image analysis technology to offer complete particle characterization. It can perform particle imaging, size analysis, and foreign object detection, and obtain size distributions and number concentration, in as little as two minutes.
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Particle Sizing
REPRODUCIBLE ANALYSIS OF PARTICLE SIZE AND SHAPEStatic Light Scattering – perfect for particle sizing from 0.01 to 2100 µm!The Laser Particle Sizer ANALYSETTE 22 NanoTec is used worldwide in production and quality control, in research and development for the precise measurement of particle sizes.Dynamic Image Analysis – particle shape and size analysis in a wide measuring range 20 µm - 20 mm!The Particle Sizer ANALYSETTE 28 ImageSizer is ideal for particle shape and size analysis of powders and bulk solids as well as emulsions and suspensions.
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Laser Particle Size Analyzer
Easysizer20
Zhengzhou Nanbei Instrument Equipment Co. Ltd
sysizer20 is the latest product of OMEC in Year 2006 and is highly automated, all the process can be done automatically after setting up initial parameters. Multiple sample feeding systems are available to meet your requirements. Applications：Measure the particle size distribution of powder or latex Principle：Use the principle of laser light scattering to determine particle size distribution.
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Fast Particle Sizer Spectrometers
To measure rapidly-evolving aerosols (such as engine or 3D printer emissions), you need a particle sizer that can keep up. TSI has several fast particle sizer spectrometers that are designed for such situations. Whether your application requires 1 Hz (or faster) size distributions, a soot-specific data inversion, or sample dilution, TSI has a fast sizing solution.
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