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Probe Systems
use programmable motorized staging to position contacting pin s.
See Also: Probe Stations, Flying Probes
- TEAM SOLUTIONS, INC.
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DC-to-250MHz 1:10 Oscilloscope Probe Kit (HP-9250)
PRB-HP-9250
Up to 250MHz, Includes a handy storage pouch and includes an IC test-hook adapter for the probe., The BNC connector rotates to avoid cable tangle or kink., Cable length is 1.4 meters.
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Spectrometers
Instrument Systems Optische Messtechnik GmbH
Optical spectrometers analyze the spectral characteristics of light radiation. Adding optical probes and absolute calibration turns this type of measurement system into a spectroradiometer. Since software is used to calculate all radiometric, photometric and colorimetric quantities from spectral data, the quality and precision of the spectrometer is extremely important. This is why Instrument Systems is dedicating most of its research and development work to this field in order to be positioned at the leading edge of technology.
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Powerful In-Circuit Production Flash Programmer
CYCLONE FX
P&E Microcomputer Systems' Cyclone FX programmer is is a powerful in-circuit, stand-alone programmer that supports a wide range of ARM Cortex and NXP® processor families. It's a versatile tool that offers on-board storage of programming images, provides power to the target, supports manual or automated programming, and has an easy-to-use touchscreen interface. Programming may be launched by a single button press without a PC or automatically from a PC via the automated control SDK. The Cyclone may also be used as a debug probe during development.
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High-Temperature and High-PressurepH Electrodes
UltraDeg
Corr Instruments offers a full range of exceptionally high performance, high-temperature and/or high-pressure UltraDeg probes, including pH electrodes, reference electrodes, platinum conductivity probes, and ORP(redox) electrodes, for temperatures up to 650F (343C) and pressures up to 5100 psi (35 MPa). These probes are ideal tools for corrosion monitoring, thermodynamic or electrochemical studies in harsh environments such as steam generators, nuclear power reactors, geothermal systems, deep oil/gas wells, and super critical water systems. Many of these UltraDeg probes are built upon our innovative sealing compound, Queon, which is the only known material in the world for sealing electrical conductors in metal sealing glands or compression feedthroughs that are operable at temperatures between 400F (200C) and 650F (343C).
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Optical Voltage Probe
400-02
Srico’s optical voltage probe uses advanced, proprietary optical chip technology to achieve precise, interference-free measurement. Our sensor and optical fibers are made of dielectric materials. This facilitates a high degree of isolation between the voltage test point and the instrumentation system ⎯ at a safe distance of 100 meters and more. This system senses, measures, and transmits electrical data very accurately.
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Linear Testfixture (2 pcs. Cassette Included), UTT 105 x 170 mm (2pcs)
MG-05
FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (1000N) 650 units for each cassette• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 105 x 170 mm (wxd) each cassette• Outer dimensions: 550 x 400 x 50 x 140 mm (wxdxh1xh2)• Designed for 2 pieces changeable cassette
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Test Leads and Probes
Test leads and probes are an intergral part of a complete measurement system and extend the capabilities of your digital multimeter.
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Exchangeable Test Fixture
MA 2112/D/H/S-7/GR2270/71
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 12,13 kg
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DDR4 X16, 2-Wing, Small KOV, BGA Interposer For Logic Analyzers
W4636A
The W4636A DDR4 x16 – 2 wing BGA interposer for 96 ball DDR4 DRAM is designed for data rates up to and including 2.4 Gb/s. The W4636A probes all ADD/CMD/CNTRL and partial DQ/DQS, and it is designed for minimal KOV for space limited systems under test. The W4636A is the least expensive DDR4 BGA interposer for a logic analyzer.
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Hub of the System
Net-ESVR
The Enterprise Server NET-ESVR is a hub of the system. Its central role is to receive every 5 seconds the alarm status of each probe NET-XXX and to store the status and update system alarm matrix. It also provides communication with the multiple Clients NET-NMSC.
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Beam Probes
The CO2 Laser Beam Probes are hand-held plates designed to simplify the alignment of IR optical systems. They display the laser beam as a dark image on a fluorescent background using the same UV-excited, thermal-sensitive surfaces developed for Macken Instruments'' Thermal Image Plates.
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500Mz Spectrum Analyzer
SM-5005
Is used for the early test in the development of electrical products, troubleshooting of CATV/MATV system as well as the test and trouble diagnosis of cellular phone system. Combined with the near field probes of Mz530, it can detect the missing fields of radio frequency
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Vision Measurement
CMM Camera System
Aberlink’s camera system offers a non-contact facility on any Aberlink CMM. A innovative design of magnetic, kinematic joint allows the probe and camera to be swapped in just seconds. This means that components can be inspected using both touch trigger and vision inspection technology on the same machine.
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Flying Probe Tester
Pilot 4D M4
The Pilot 4D M4 is a full-performance, double-sided, flying probe test system with an extremely high level of flexibility, making it the ideal solution for those with a wide variety of testing needs, from prototypes to small/medium production volume, through the repair of field returns and reverse engineering. The vertical, compact architecture and the excellent board clamping system ensure that there is no oscillation of the board under test, which in turn greatly facilitates the precise positioning of the probes on the test points.
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Exchangeable Test Fixture
MA 2111/D/H/S-5
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 9,30 kg
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Probe System
Acculogic FLS 980 Dxi
Flying Probe systems do not require test fixtures, have few restrictions on board access and can test boards with a virtually unlimited number of networks. They also allow developers to complete test programs in a short time.The FLS980 Dxi guarantees superior probing precision and repeatability, even as component sizes and denser packaging technologies pose challenges to other test engineers.
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Mobile Optical 3D Measuring System for Online Photogrammetry
PONTOS Live
PONTOS Live is GOM’s tracking system for positioning components, as for a precise alignment on CNC machines or for the adjustment of fixtures. Combined with the GOM Touch Probe, PONTOS Live allows the inspection of areas that are optically difficult to access. Based on the triangulation principle, PONTOS Live analyzes components of different sizes – from a few millimeters up to several meters – point by point and regardless of the material.
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Proximity
Our revolutionary Digital Proximity System (DPS) eliminates the need for dozens of different drivers and transmitters by a single, field-configurable package that can be set to work with probes and cables from a variety of manufacturers. The DPS consists of a probe, an extension cable, and a driver or transmitter.
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Spectral Response SystemsQuantum Efficiency SystemsIPCE Measurement Systems
QE system provides electronics and software designed for fully automated measurement of external quantum efficiency of solar cells. All systems include probes and a fixed plate sample stage for samples up to 150 mm x 150 mm. The main system components include: custom designed software, measurement electronics, and computer system (Windows 8 operating system). The measurement involves focusing monochromatic light to a spot on the device under test, then accurately measuring the photon flux and current from the test cell. The system utilizes a dual beam configuration with lock-in detection, providing an absolute accuracy of ±3%. The QE system uses a grating monochrometer with silicon/InGaAs/Ge detectors. The system includes automatic order sorting filters and two light sources for monochromatic illumination (a Xenon- arc lamp and a halogen lamp). A single lock-in amplifier is used to measure both the reference detector and test device. The main system comes with all the hardware needed to measure quantum efficiency, a fixed plate sample stage and probes.
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Mid Bus Probes
MBP850
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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Optical Gaging Products
Quality Vision International Inc.
OGP® pioneered multisensor measurement with vision, touch probe and laser sensors. For over 75 years, OGP has consistently led with a succession of innovative systems and sensors to tackle the most difficult measurement challenges, especially as it pertains to the medical industry. Multisensor metrology is a preferred quality control technology for manufacturers to develop, maintain, and improve the quality of medical devices.
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Stimulus Induced Fault Testing
SIFT
SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
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UNIVERSAL NOID LIGHT
27800
Tests throttle body injectors, ported fuel injectors and sequential central port injectors, Adjustable probe fits all electronic fuel injection systems and swivels to fit various widths, Flashing light indicates normal pulses, no light indicates a problem.
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PCIe 4.0 Protocol Analyzer
Summit T48
Teledyne LeCroy’s Summit™ T48 joins the Summit™ T416 as the second protocol analyzer to be released in its family of tools supporting the PCIe 4.0 architecture. The new Summit™ T48 protocol analyzer based on the PCIe 4.0 specification supports up to 16GT/s and up to x8 lane width for protocol analysis. Companies that are interested in testing PCIe 4.0 based I/O cards such as Storage Controllers, Ethernet, Fibre Channel, Infiniband, and others will now be able to get all of the protocol analyzer debugging features they need, while being able to better manage their costs. SSD storage applications will also benefit from the integrated support for SSD bus protocols such as PCIe/ NVMe/ SMBus/ NVMe-MI/ TCG and others. When combined with Teledyne LeCroy’s Summit™ Z416 protocol exerciser, the Summit™ T48 will provide a deeper understanding of test results on a variety of test configurations. Teledyne LeCroy’s wide range of high speed interposers and probes provide full flexibility and connectivity to CEM and other form factor sockets on system boards as well as solder down and mid-bus probes.
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Changeable Cassette
230351/1 – CMK-02
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Renishaw Change Racks
Advanced Industrial Measurement Systems
The MRS modular rack system provides a platform for Renishaw probe and stylus changing racks. It consists of a rail (400 mm, 600 mm or 1000 mm long) that holds the probe or stylus changers, and interconnecting legs of selectable lengths that allow clearance for long styli and extension bars.
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SIP-90-6 Test System Interface Probe
SIP-90-6
Overall Length (mil): 656Overall Length (mm): 16.66Rec. Mounting Hole Size (mil): 57Rec. Mounting Hole Size (mm): 1.45Recommended Drill Size: 1,45 mm
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Diode Power probe
The COMM-connect 3026 Diode based temperature compensated probe is designed for use with the COMM-connect range of Power Monitors. The probe will handle from 50µW to 100mW . Used with external couplers and the our measurement system application from 1W to 1MW, a high dynamic range can be configured. The 3026 Diode based probe gives excellent stable results along with the COMM-connect Power Monitor variants. This gives our customers a number of applications to monitor and control the last part of your RF network installation from transmitters to the antenna.
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USB Protocol Verification System
Voyager M310e
The Voyager M310e is Teledyne LeCroy's flagship USB protocol verification system designed for USB 2.0, USB 3.2, Type-C, and USB Power Delivery. Offering the industry's highest fidelity probe design, flexible traffic generation, and a range of turnkey Compliance packages, the Voyager M310e is the most complete platform for cradle-to-grave USB design verification.
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Ultra-High Vacuum Scanning Kelvin Probe
Our Ultra-high Vacuum Scanning Kelvin Probes (UHVSKP2020 and UHVSKP5050) give the user full access to work function (Φ) and contact potential difference (CPD) measurements under vacuum with the ability to scan a sample area of 20 x 20mm or 50 x 50mm respectively. Each system comes with the UHV head unit, tip amplifier (located at the mounting port), digital control unit and host PC with dedicated software. The tip can be retracted 100mm from the sample and approaches normal to the sample. The associated digital electronic unit powers the head unit and provides an interface between the head unit and the data acquisition system. The system comes with a complete user manual, which includes an introduction to work function measurements and a detailed description of the system software, including examples. The work function resolution of the Ultra-High Vacuum Scanning Kelvin Probes is 1-3 meV.
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Reference Temperature Sensors
AMETEK Sensors, Test & Calibration
Our reference sensors can be used as your daily working-reference sensors in laboratory or field calibration applications. A large selection of types are available, including; straight, 90 degree angle, 4 mm or 1/4”. The superior design and specifications combined with a long history of reliability and low drift have made the STS probes the working-standard in many EN/IEC 17025 accredited laboratories worldwide. The DLC sensors are a part of our patented Dynamic Load Compensation system.
