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Profile Projectors
Measure the profile of small flat objects or camparison check.
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VisionGauge Digital Optical Comparators / Digital Profile Projectors
500 Series
The VisionGauge Digital Optical Comparator is The Fastest, Easiest, Most Accurate Way to Compare a Part to a CAD File. Our VisionGauge Digital Optical Comparators: Produce a very high contrast image with very sharp edge profiles so that there is no problem viewing it in full daylight Are much more accurate, more powerful, much faster, include CAD Auto Pass/Fail and CAD Auto-Align, works directly with CAD data so there no mylars or templates are needed, etc.
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Profile Projectors and Vision Systems
Aberlink's revolutionary measurement software provides you with a powerful, yet easy-to-use user interface. This means you can use the Aberlink 2D software on your profile projector or vision system within 15 minutes of being shown the inspection routines for the first time. You will substantially increase the measurement capability of your profile projector and part inspection through-put.
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Horizontal Profile Projector
Sinowon Innovation Metrology Manufacture Ltd.
◆ The lifting system adopts cross roller rail and precision screw drive, which makes lifting drive more comfortable and stable;◆ Coating process reflector, clearer image and great dustproof;◆ Adjustable contour and surface illumination, to meet with difference workpiece demand;◆ Imported high light and long using life LED illumination ,to ensure precision measurement demand;◆ High resolution optical system with clear image and magnification error is less than 0.08%;◆ Powerful Bi-axial fan cooling system，highly increase using life;◆ Powerful and colorful DRO DP400，realized fast and accurate 2D Measurement;◆ Built-in Mini-printer, can print and save data;◆ With standard 10X objective, optional 5X,20X，50X，100X objective，rotary table, foot switch ,clamp, etc.
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Toolmakers Microscope
Sinowon Innovation Metrology Manufacture Ltd.
It is widely used in mechanical, meter, electronic and light industry; university, Institute and metrology department. The measuring profile projector can detect the contour dimension and surface shape of variety complex workpiece, such as templates, punching pieces, cams, threads, gears, molding milling cutters.
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Profile Projector
Wide range of Microscopes and accessories for industry, research, Quality Assurance etc. Microscopes: Biological Binocular Stereo Comperators Gemologycal etc Accessories : Light Sources Cameras Stands for Microscopes.
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Profile Projector
Baty SM300
300mm screen vertical light path projector with multi-function readout unit and printer. Robust design with full geometric measuring functionality ideal for the shop floor. Features • Top quality profile projector highly versatile and easy to operate • Large travel range 150mm x 50mm (6”x 2”) as standard • Linear scale stage with 0.001mm resolution.
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Projectors
Innovations in Optics' projectors achieve spatially uniform illumination fields by combining our patented COB LED technology and efficient, non-imaging, homogenizing optics with precision re-imaging lens systems.
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CTDs: Profiling
Profiling CTDs make continuous measurements as they travel through water. When lowered over the side of a ship or integrated with an autonomous vehicle, they map a vertical column of water's characteristics. Compared to moored CTDs, profiling CTDs account for dynamic errors introduced by moving through water and sample rapidly to generate a high-resolution dataset over a short period of time. Sea-Bird Scientific profiling CTDs are:*Designed to perform under unique dynamic conditions found on moving platforms.*Pumped and ducted for constant flow to match temperature and conductivity response.*Plumbed so measurements are made on the same sample of water with a predictable delay and predictable flow effects.*Built with a rugged design for shipboard and autonomous deployments.
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Multi-Surface Profiler
Tropel® FlatMaster® MSP
The Tropel® FlatMaster® MSP (Multi-Surface Profiler) is a frequency stepping interferometer that provides fast and accurate metrology for semiconductor wafers up to 300mm in diameter. In seconds up to 3 million data points are collected with sub-micron accuracy enabling total thickness and flatness characterization over the entire surface.
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Multi-Parameter Profiler
fastCTDplus Rhodamine
An evolution of the miniCTD, the fastCTDplus multi-parameter profiler is designed to deliver the highest quality CTD and Rhodamine observations at fast drop rates.
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Projector Measurement Products
Xinye Optoelectronic Engineering Co.,Ltd.
Projector Measurement Products by Xinye Optoelectronic Engineering Co.,Ltd.
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Thermal Profiler
V-M.O.L.E.®
The V-M.O.L.E. is a full-featured compact thermal profiler that belies its sophistication in an easy-to-use 3-channel Mini-thermocouple configuration. Ideal for VERIFICATION of PCB profile performance, 3 channels give you Hot, Cold and Sensitive component data for verifying the correct oven settings.
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Profiling Belt Radiometer
ILT400
International Light Technologies
The IL400 Profiling Belt Radiometer continues with the all-in-one exposure, intensity, and profiling capability first introduced in the IL393. New solid-state detector and ultra-stable amplifier technology along with rechargability combine to give lower noise, greater speed, and higher accuracy at a price below any precision belt radiometer sold today.
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Multi-Parameter Profiler
fastCTDplus Phycocyanin
An evolution of the miniCTD, the fastCTDplus multi-parameter profiler is designed to deliver the highest quality CTD and Phycocyanin observations at fast drop rates. A conductivity cell designed for optimum flow-through, a fast-response thermistor temperature sensor and 0.01% pressure sensor together with a Fluorometer sensor, all synchronously sampling at up to 32Hz to deliver the highest quality profiles in a lightweight and robust package.
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Wind Profilers
Bristol Industrial & Research Associates Ltd
Biral provides Sodar systems for the 3-dimensional measurement of wind speed and direction in a vertical column extending hundreds of metres above the sensor. Sodar systems are used in applications such as wind energy site assessment, wind shear detection at airports, plume modelling and basic research.
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IR/Visible Target Projectors
Santa Barbara Infrared’s reflective infrared and visible target projectors are turnkey test systems for electro-optical (E-O) testing of FLIRs and other infrared (IR) and visible imaging systems. The standard target projectors are assembled from SBIR’s STC Series Collimators, Infinity Blackbodies, Infinity VSX Integrating Spheres and 300 Series Target Wheels.
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Refractive Index Profiler
S14
The S14 Refractive Index Profiler complements optical fiber preform analysis measurements by providing highly accurate and precise characterization of the refractive index profile of drawn single-mode, multimode, and specialty fibers using the RNF (Refracted Near Field) technique. The S14 index profile data produces fiber geometry information directly. Manufacturers can also use S14 data for the prediction of fiber transmission parameters such as mode field diameter, cut-off wavelength, and chromatic dispersion.
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Surface Profile Gages
PosiTector® SPG
Surface Profile Gages for Blasted Steel, Textured Coatings and Concrete Profile. Digital depth micrometer measures and records peak to valley surface profile heights.
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Profiling Software
In today's world of advanced, high quality, lead-free electronics, thermal profiling is central to successful solder process control. It can, however, be a bewildering task: many software packages are difficult to understand and use, and their output requires a degree of interpretation that assumes long experience in profiling.
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Pulse-Coherent Acoustic Doppler Profiler
PC-ADP
The PC-ADP (Pulse-Coherent Acoustic Doppler Profiler) is an ADP optimized for high-resolution, 3-axis (3D), short-range, boundary layer studies.
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Surface Profile
Surface profile: The degree of profile on the surface affects a coating’s overall performance and determines aspects such as adhesion, coverage and overall volume of coatings used. If the profile is too large the amount of coating required increases, otherwise there is a danger that the peaks remain uncoated - allowing rust spots to occur. If the profile is too small there may be an insufficient key for adequate adhesion.
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Backplane Profiling & Inspection System
603d
A major problem in the backplane industry is detecting bent connector pin defects. The most difficult being when the pin bends underneath the shroud rather than going into the hole. Many times this defect cannot be detected electrically as the connector pin is touching the conductive annular ring of the hole, allowing electrical test to pass. Unfortunately, it is an intermittent connection and will fail later on as there is not an actual mechanical connection.
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Profile Style (BRIK) LDT
AMETEK Sensors, Test & Calibration
The Profile Style LDT - BRIK - housing provides a convenient mounting option. The streamlined aluminum extrusion houses the sensing element and electronics. The magnet moves over the sensing element that determines the position and converts it to a readable output.
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Scanning Slit Beam Profiling
NanoScan
Measure your beam as never before with the NanoScan™ beam profiler. The advantage of scanning slit beam profiling is sub-micron precision for measuring beam position and size. Scan head configurations include Silicon, Germanium, and Pyroelectric versions for a wide range of wavelengths and laser power levels. The NanoScan software is available in two versions: Standard and Professional, and includes an extensive set of ISO quantitative measurements, an M2 Wizard, and the ability to measure laser power.
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Wave Profiler
The Wave Profiler allows the user to measure non-directional wave parameters continuously for long periods of time with high temporal and spatial resolution in deeper water from the safety of an underwater mooring. The instrument is particularly useful for clients who need to measure long-period waves (such as rogue waves or infra-gravity waves), waves in wash and in wakes, and non-linear waves.
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Surface Profile
Surface profile: The degree of profile on the surface affects a coating’s overall performance and determines aspects such as adhesion, coverage and overall volume of coatings used. If the profile is too large the amount of coating required increases, otherwise there is a danger that the peaks remain uncoated - allowing rust spots to occur. If the profile is too small there may be an insufficient key for adequate adhesion.
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UV-NIR Beam Profiler
CinCam
CINOGY Technologies CinCam is optimized to provide excellent sensitivity from the UV to NIR spectral range involving CCD/CMOS/InGaAs technologies. Thanks to its high resolution and its small pixel size, the CinCam ensures the highest accuracy in laser beam analysis of cw and pulsed laser systems. The plug and play design facilitates easy and flexible adaption to standard optical components.
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ElcoMaster Oven Profiling Software
*Oven Logger set up & programming*Paint/Powder parameter library*Product probe maps*Fully customisable inspection templates*Selectable probe/channel traces*Statistical analysis by probe/channel*Max, Min, standard deviation, coefficient of variation*Temperature profile, cure progress, histogram & individual cure value graphs against product*Time at temperature, time of peak difference*Time above maximum absolute & minimum cross link temperatures*Fully customisable inspection reports*Combined reports - coating thickness, gloss, adhesion, profile, climate, surface cleanliness*Report generator wizard & PDF generator*Email or export data*Import photo’s, data sheets, critical data, inspection notes, etc & include on inspection reports*Cloud computing - allows for cross site collaboration, including internal text messaging tool*Overlay temperature profiles, review and compare multiple oven profiles over time*Use additional data loggers for multiple channels or run overlays
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Optical Profiler
DRK8090
Shandong Drick Instruments Co., Ltd.
This instrument uses noncontact, optical phase shift interferometry method does not damage the surface when measuring graphics can be quickly measured by a variety of three dimensional surface morphology, and analyzed to calculate the measurement results. Suitable for measuring a variety of blocks, the surface roughness of optical components; scale, dial the groove depth; magnetic (optical) disk, the head surface texture measurements; structural morphology of coating thickness and coating trough structure at the boundary of the grating; silicon surface roughness measurement and the graph structure and so on.
