Filter Results By:
Products
Applications
Manufacturers
RF Probes
Coaxial Probes are said to offer repeatable performance up to 3 GHz in custom or standard configurations.
See Also: Test Probes
- Pickering Interfaces Inc.
product
PXI/PXIe RF Matrix, 32x4, 300 MHz, 50 Ω, SMB
42-724-022
The 40-724-022 (PXI) and 42-724-022 (PXIe) are 32x4 RF matrix modules suitable for switching frequencies up to 300 MHz. Having a 50 Ω characteristic impedance and front panel SMB connectors, these modules provide a simple and scalable bidirectional matrix for RF and are intended for the easy construction of high performance switching systems.
-
product
RealProbe RF Probes
Unmatched performance In-Circuit RF Probes covering up to 18GHz. These are must tools for any in-circuit RF and Microwave testing and troubleshooting.
-
product
RF Radio - Frequency Probes
*3 to 6 Ghz *PCB MCX SMB SMC *SMA U. FL MS / MM Fakra *Exchangeable inner plunger
-
product
Enhanced Probe Station
EB Series
Comprehensive prober for DC and RF. The EB series contains features to step-up your usability to acquire the accurate data you need from your devices. It has a built in probe card slot.
-
product
Mini Probe Station
C-2
The smallest probe station which still preserves the key functions and precision that are fundamental to all probing. This size is still capable of DC and RF measurements, making it the most versatile in its size.
-
product
Broadband Isotropic Field Strength Probes
PI-01, PI-01E, PI-03, PI-05
Modern design probes meeting the requirements of most EMC and RF safety standards for RF safety, industrial, military and radar communication applications: 0.2-1000 V/m, 10 KHz-40 GHz.
-
product
Test Contactor/WLCSP Probe Head
ACE
ACE™ test sockets offer optimal RF performance for fine pitch FBGA, QFN and wafer-level packages for Power Amplifiers, RF switches and mobile communications. Supporting pitches down to 0.4 mm, ACE features an innovative design that provides superior performance, improved yields and power efficiency.ACE probe heads deliver exceptional electrical performance, both DC and RF. Manufactured from HyperCore™ base material, a proprietary material of Cohu’s Everett Charles Technologies, ACE probes have the electrical properties of BeCu with the non-oxidizing properties of a precious metal. The short signal path, sharp tips, and large contact area between plungers provide high current conductance and reliable contact with less force.
-
product
Fiber optic thermometer systems
TS Series
Micronor now offers a complete range of fiber optic temperature sensors, probes and interfaces for temperature measurement in challenging environments. TS series fiber optic temperature probes offer immunity to RF and microwave radiation along with wide temperature range, intrinsic safety and non-invasive use. The fiber optic temperature probes can operate over -200°C to +300°C (-328°F to +572°C), and withstand harsh and corrosive environments. Typical fiber optic temperature monitoring applications include:
-
product
Near Field Probes 30 MHz - 6 GHz
XF Family
The XF family consists of 4 passive magnetic field probes and 3 passive E field probes designed for measuring magnetic and E-fields in ranges from 30 MHz to 6 GHz during the development phase. Due to their integrated impendance matching the probes are less sensitive in the lower frequency range than the RF type probes.
-
product
Probe Cards
U-Probe for Multi-die Test of Memory IC. Vertical-Probe Needle Type Probe card suitable for multi-die test of devices with peripheral pads. ertical-Probe Spring Type. Probe card suitable for area array pad test. 64DUTs Multi-Die. Probe Card for RF devices. Fine Pitch.
-
product
Eddy Current Probes and Drivers
Proximity sensors work on the eddy current principle. A proximity system consists of an eddy current probe, extension cable and driver. A high-frequency RF signal is generated by the driver, sent through the extension and probe cables and radiated from the probe tip. The tip consists of a precision wound copper coil inside a chemical and temperature resistant PEEK case.
-
product
Active Differential Probe, 100 kHz to 7 GHz
U1818A
The Keysight U1818A 100 kHz to 7 GHz active differential probe makes it easy to perform high frequency in-circuit measurements using network, spectrum and signal source analyzers. With flat frequency response, low noise floor, and direct power from instrument connection, the U1818A allows measurements to be made while taking full advantage of Keysight's RF analyzers dynamic range.
-
product
Probe Cards
Ceramic Blades
SV TCL offers a variety of ceramic blades and blade probe cards. We have patented ceramic microstrip blade probes available in low leakage and low capacitance for optimal signal transference, while SV TCL's blade cards are ideal for parametric and RF testing.
-
product
LISN & Voltage Probes
All commercial LISNs include an artificial hand connection and a transient limiter. This adds a 30dB insertion loss. A 30dB pre-amplifier is included which can be connected in the RF output feed to return the insertion loss to 0dB. The Voltage Probe requirement is covered by our PLIP (Power LIne Interference Probe). This fully meets the requirements of CISPR16, but has additional features:*Fully galvanic isolation between input and output (>1kV), for the safety of operator and analyser!*Shrouded safety clips for attachment to the line to be measured.*Filtered frequency response matched to Band A and B.*Current limiting on the output.*Visual indication of high voltage input.
-
product
RF Coaxial Probes & Probe Positioner
Fairview Microwave’s line of coaxial RF probes and RF PCB probe positioner are ideal for use with chip evaluations, signal integrity measurements, coplanar waveguide, substrate characterization, gigabit SERDES and test fixture applications. The RF coaxial probes provide return loss better than 10 dB and a maximum operating frequency of 20 GHz. The probes have a 3.5mm female interface, a pitch of 800 or 1500 micron and they can be cable-mounted. They feature gold-plated contacts and can be used by hand, with or without a probe positioner. Compliant coaxial GSG (or GS) pogo pins allow for a broad range of probing angles. The RF PCB probe positioner can hold coaxial probes, has articulated joints and delivers multi-axis positioner control. This positioner also boasts a magnetic mounting plate with on-off positioner switch.
-
product
Test Contactor/Probe Head
Hydra
Engineered for excellence and efficiency, Hydra™ spring probe series offers precision, reliability, and standardized semiconductor test interface.Designed to be best-in-class at a competitive price point, Hydra is optimized to maximize your operational efficiency. Hydra is built to withstand demanding high-volume manufacturing test environments with its robust and durable design.With a common test-height, Hydra offers the ability to mix and match power, RF, and Kelvin probes within the same test socket. In addition, Hydra streamlines inventory management with fewer probe part numbers to manage and shorter lead times.
-
product
Bulk Current Monitoring Probe
MP-50
The Current Monitoring probes may be used whenever RF current measurements are required. Current measurements are made by placing a current carrying conductor within the “sensing” window of the probe and measuring the probe’s output voltage with an RF detector. Calibration of the probe permits the conversion of the voltages measured to current. Current measurements can be made over the frequency range shown in the transfer impedance curve furnished with each probe. There is virtually no loading of the circuit and the technique permits normal operation of the device under test during measurements. The MP-50 can be used for the procedure for clamp injection when the common- mode impedance requirements cannot be met given in chapter 7.4 of IEC/EN 61000-4-6 „Immunity to conducted disturbances, induced by radio frequency fields”. The MP-50 can also be used as current monitor for BCI testing as per ISO11452-4, RTCA/DO-160 section 20, MIL-STD-461 and various automotive standards.
-
product
MOD MONITOR
TYPE HFX-1
The Type HFX-1 Modulation Monitor is an ancillary piece of equipment, which is used with narrow bandwidth, or older oscilloscopes to allow viewing of RF signals and particularly modulated signals as high as 55MHz. The equipment contains an RF signal source and a broadband mixing circuit which converts the high frequency signal to an intermediate frequency within the oscilloscope’s range. The frequency control dial is simply adjusted until the RF signal is viewed on the scope. BNC connectors are mounted on the rear panel to allow interconnect to the scope and RF probe. This product was previously called "oscilloscope frequency extender" and may be used to view other high frequency signals on older or narrow band scopes.
-
product
Near Field Probes 30 MHz up to 3 GHz
RF6 set
The RF6 near field probe set consists of 2 passive magnetic field probes and 2 passive E field probes for measurements in the development phase of the E-field and magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF6 set allow a step by step localization of interference sources of the RF magnetic field and RF-E-field on an assembly. From a larger distance the electromagnetic interference is detected by RF-R 50-1 for the magnetic field and by RF-E 02 for the E-field. The RF-B 3-2 and RF-E 10 probes with their higher resolution can more presicely detect the interference sources of the magnetic field and the E-field. Field orientation and field distribution on an electronic assembly can be detected by special guidiance of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
-
product
RF High Frequency Probes
*Low impedance*High bandwidth up to 20 GHz*Repeatable measurements*Coaxial design*Interchangeable center conductor
-
product
4-Channel Broadcast Monitor
The COMM-connect Entry Level Broadcast Power Monitor type 3025 can control two external RF Measuring heads. The high dynamic range with external couplers and RF measuring heads cover from 1W to 1MW. Equipped with the RMS Probes the Power conversion algorithms handles multi carrier, multi mode signals. With the 3026 Diode base probe the power readout gives good repeatable results. The power readout is auto scaled and VSWR will be calculated between the two probes. The COMM-connect Entry Level Power Monitor gives a number of application to monitor and control the last part of your RF network installation from transmitters to the antenna.
-
product
Diode Power probe
The COMM-connect 3026 Diode based temperature compensated probe is designed for use with the COMM-connect range of Power Monitors. The probe will handle from 50µW to 100mW . Used with external couplers and the our measurement system application from 1W to 1MW, a high dynamic range can be configured. The 3026 Diode based probe gives excellent stable results along with the COMM-connect Power Monitor variants. This gives our customers a number of applications to monitor and control the last part of your RF network installation from transmitters to the antenna.
-
product
Standard 3.06 (86.70) - 4.00 (113.40) RF Probe For SMA Connectors
CSP-30ES-013
Nominal Impedance (Ohms): 50Current Capacity (Amps) @ 20° C: 1.00Bandwidth @ -1dB (GHz): 35.00Return Loss @ -20dB (GHz): 22.00Test Center (mil): 328Test Center (mm): 8.33Recommended Travel (mil): 100Recommended Travel (mm): 2.54Full Travel (mil): 200Full Travel (mm): 5.08Overall Length (mil): 1,033Overall Length (mm): 26.24Rec. Mounting Hole Size (mil): 297Rec. Mounting Hole Size (mm): 7.54
-
product
Frequency Shaped Isotropic Electric Probes
PI-SH-FCC, PI-SH-ICNIRP
An isotropic electric field probe with shaped frequency response meeting the ICNIRP or FCC RF safety standards for occupational and general public exposure limits (see the specified frequency ranges below). Meter readings are shown in % of the STD – standard reference level, eliminating the need to know the source frequency. Probe output is proportional to RF power density in the whole specified power range, producing the correct RF power measurements in single and multi-signal environments, typically present at multiple antenna sites.
-
product
RF Voltmeter
9240
The 9240 series is the latest addition to Boonton’s popular 9200 series of RF voltmeters. It combines accuracy, smart probes, and operator features that have never before been available in its price range. It is simple to use on the bench, and comprehensive enough to integrate into an ATE system.
-
product
6TL36 Plus In-line Test Handler w/Bypass
EA923
- Test handler 6TL36 Plus.- Dual line (bypass)- 1096 x 1875 x 1851mm [WxDxH]- Expandable to form a group with several 6TL36 modules (adapt line to production volumes).- ICT, FCT with RF, ISP or Combined test (ICT+FCT)- Servocontrolled DUT stop (stopper-less system)- Exchange time 3,2s- Max. PCB dimension 600x450mm- 19” rack space for instruments integration: 28UH- Receiver 25 slots in probe plate + 4 slots in push plate- Automatic Conveyor width adjustment- Optional Return Conveyor- High dynamics conveyors (1500 mm/s)- 90mm Top-30mm Bottom Component clearance- SMEMA and Hermes standard- CE
-
product
Semi-Rigid Test Probes Up to 6 GHz
Fairview Microwave’s semi-rigid test probe assemblies come in multiple cable diameters to help when attaching the unterminated end of the probe to a circuit board trace. There are two versions including straight-cut probe ends for those that would like to customize the dimensions of the center conductor and dielectric dimensions, as well as pre-stripped probe ends that are ready for immediate use. By soldering the outer conductor to the signal ground and the exposed center conductor to the trace carrying the signal of interest, simple sampling measurements can be made without having to create a separate subassembly circuit board or add a connector to the circuit layout which can take up valuable real estate. Fairview provides 3 diameters of semi-rigid coax and 3 different lengths from 3 inches to 12 inches to fit a variety of trace widths and applications. All test probes are 100% RF tested to ensure the cable assemblies operate to 6 GHz and also to make sure that the SMA connector interface meets the 1.35:1 VSWR specification prior to shipping. To protect the small diameter coax from damage, each part is shipped in a clear protective tube that can also be used for storing the probes for future use.
-
product
High-Frequency Probe, 300 kHz to 3 GHz
85024A
85024A high-frequency probe makes it easy to perform in-circuit measurements. An input capacitance of only 0.7 pF shunted by 1 megohm of resistance permits high frequency probing without adversely loading the circuit under test. Excellent frequency response and unity gain guarantee high accuracy in swept measurements with this probe. High probe sensitivity and low distortion levels allow measurements to be made while taking advantage of the full dynamic range of RF analyzers.
-
product
Complete Probe Station
BD Series
Best for DC and RF probing, the platen lift is designed for smooth raise and contact of your probes simultaneously to your device. It is ideal for probing multiple spots on your device, or through multiple devices.
-
product
RF Capacitance Level Switches
ABB's RF Capacitance level switches feature one-step external calibration, immunity to material build-up, and a wide selection of probes for even the most challenging applications from low dielectric bulk solids to sticky slurries.
-
product
Near Field Probes 30 MHz up to 6 GHz
XF1 set
The XF1 set of near field probes consists of 4 passive near field probes and one passive E field probe for making measurements in the development phase of the magnetic and electric fields in ranges from 30 MHz to 6 GHz. Due to their integrated impendance matching, the probes are less sensitive in the lower frequency range than the RF type probes. The probe heads of the XF1 set allow for the step by step identification of interference sources of the magnetic field on an electronic assembly. At first, for example the XF-R 400-1 detects the fields which the assembly emits in total. Next, using higher resolution probes the interference sources can be more precisely detected. The E field probe is used for the detection of electric interfering fields near the assemblies. With trained use of the near field probes, field orientation and field distribution can be detected. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
