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Test Software
programs, procedures or rules and associated documentation pertaining to the operation of a computerized test set.
See Also: Test Software Development, Software Testing
- Pickering Interfaces Inc.
product
PXI Single 36 Channel MUX, SMB Connectors
40-735-912-S4
The 40-735 data communications multiplexer is designed for switching the data lines of serial interfaces (RS232, USB). Careful attention to the design of the module ensures that the switching system minimizes its impact on the transmission distance of USB1.1 interfaces. The MUX is available in 36:1 or 18:1 formats and enables a single source of serial data to be switched to one of 36 or 18 devices under test. This allows the data source to load information to, or receive information from, the device under test. This 36:1 version can be software configured into two independent 18 way MUXs enabling two separate sources of serial data to be connected to separate banks of 18 devices. The module is ideal for performing bulk testing of any device that relies on a serial data communications port to load software or control the device operation. It can also be used for a variety of other applications where ever a 2-pole low power MUX is required.
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Benchtop Communication Test System
ATS3000A
The ATS3000A is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23 instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000A also includes the sophisticated IF and baseband I/Q Digital Signal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easy-touse graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets areavailable for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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Scienlab Charging Discover Test Software
SL1093A
The Scienlab Charging Discover test software controls the Scienlab Charging Discovery System (CDS). With this up-to-date, user-friendly software, you can operate the system, visualize measured values, record test sequences, and generate reports for trusted insights.
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Portable Interface Unit
1553-USB-PIU
The 1553-USB-PIU is a Portable Interface Unit providing full MIL-STD-1553 test, simulation and bus analysis capability in a compact self-contained unit, to connect via a USB interface to suitable host systems. The unit provides support for all 1553A, 1553B, McAir and STANAG 3838 variants in a self contained battery operated unit, and is supplied with a matching power supply and battery charger unit for desk-top use. The 1553-USB-PIU supports concurrent Bus Controller (BC) and up to 31 Remote Terminals (RT) with Bus Monitor (BM). An additional stand-alone Chronological Bus Monitor (CBM) facility is also provided, with comprehensive multi-level triggering capability. Full error injection capability is provided in BC and RT modes, with full error detection in BC, RT, BM and CBM modes. The unit provides a variable amplitude dual redundant 1553 interface. 2 Mbytes of dual ported RAM are provided. The unit is supplied with "C" Driver library, together with a Windows GUI, providing a user friendly software tool for all 1553 set-ups, data management and storage.
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DC Parametric Test System with Curve Trace
DC3
The wafer has been fully tested, cut and packaged. Today's IC manufacturers are finding tremendous cost savings in performing just fast DC tests on these packaged parts rather than running the full wafer tests all over again. Until now this required either an expensive full-power IC tester, or a "rack-n-stack" collection of instruments. Enter the HILEVEL DC3 Co-Optive Parametric Tester. No more instruments, no switching matrix, no tricky software. The DC3 combines a high-precision DC-PMU and internal DUT supplies to test up to 2,048 pins, all in a single chassis with Multi-Site capability up to 64 sites. And every DC3 includes our Classic Curve Trace feature, allowing easy curve tracing on every pin.
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At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
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Compliance Test Software Measurement Server License
D9010AGGC
The D9010AGGC compliance test software license provides the capability to offload the measurements from the compliance test software running on an oscilloscope to one or multiple virtual machines or measurement servers. This allows you to perform continuous data acquisition and computation of tests result in parallel, reducing the overall test time.
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QAM DVB Analyzer
Wuhan Sunma Technology Co., Ltd.
QAM Analyzer designed for both installation and maintenance of HFC system. Measure and display main parameters in DVB testing (channel power, MER, BER, Constellation Diagram), signal level on any frequency, amplitude of the carriers singly in the whole system range, and etc. The Analog, QAM and FM channel can be set and tested efficiently; it also supports HUM measurement, C/N measurement, voltmeter function, spectrum analysis and data logging. Also it is easy for user to obtain a report of test data via PC or printer through toolbox software.
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High-Performance Intelligent Pod for Corelis Boundary-Scan Controllers
ScanTAP 4 & 8
Boundary-scan has proven itself time and again to be a truly versatile interface for structural test, embedded functional test, built-in self-test (BIST), software debug, and in-system programming. Supporting such diverse applications requires equipment with high-performance specifications and extended features.Corelis ScanTAP pods are designed for use with PCI-1149.1/Turbo and PCIe-1149.1 high-speed JTAG controllers. Featuring 4 & 8 independent Test Access Ports (TAPs), up to 80 MHz clock rates, and advanced TAP capabilities such as analog voltage measurement, the ScanTAP family of intelligent pods is the ideal JTAG interface for high-performance environments.
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TesT Software
61850
Simulate, monitor and test IEDs on your digital substation network with Doble's 61850 TesT Software.Use with Doble's F6150sv and Protection Suite software to apply sampled values (SV) and generic substation event (GSE) simulations to functionally test, receive status messages and get more data from substation devices.
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OPC Server
An OPC sever (OLE for Process Control) provides IO and more devices to communicate with a wide range of HMI/SCADA software packages residing on a host. Advantech''s OPC server for ADAM and modbus devices features OPC DA (data access) and AE(alarm and events) client for the rapid testing.
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Configurable Simulation Of ECU Diagnostics.
TestCUBE2
Softing Automotive Electronics GmbH
The ECU simulation TestCUBE2 is the counterpart for all cases of application in which an ECU is not yet (e.g. preparation of workshop tests) or no longer (e.g. tester regression test) available. TestCUBE2 is a configurable hardware and software solution for simulating ECU diagnostics with real bus communication. With just one device, you can simulate several ECUs or even an entire vehicle at the same time.
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Generators
Classical Shock
Software Classical shock is used for testing specimen resistance to shock impact. As the Software Classical shock is activated, at the output of shaker control system ZET 017-U there is formed a signal with pre-set parameters. Types of signals generated:
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PSG Vector Signal Generator, 100 kHz to 44 GHz
E8267D
Test advanced receivers with realistic wideband radar, EW and Satcom waveforms with metrology-grade performance and versatile capabilitiesSimulate complex electromagnetic environments with up to 4 GHz of bandwidthReduce the time you spend creating complex signals with Signal Studio software: pulse building, noise power ratio (NPR), multi-tone signals, wireless & moreMaster your most complex signal requirements with the industry's best SSB phase noise: 143 dBc/Hz at 1 GHz (10 kHz offset)
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Relay & Protection Testing
Weshine Electric Manufacturing Co., Ltd
Given the diverse functional requirements of the grid’s protection system, testing capabilities require a new level of sophisticated test hardware and software with which to analyse the entire protection system’s (or individual protection component’s) operation in "real life" situations. It is further necessary that these expanding testing capabilities be met with a similar improvement in the simplification of a test instrument’s user interface and software control.
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Nand Flash Tester
NplusT
NplusT was created in December 2002 by Tams Kerekes' 20-years experience in the field of electrical semiconductors and reliability testing.The company started with the sales representation of semiconductor equipment and consumable suppliers. In the meantime, qualified engineering services, linked to the represented products, were provided in Europe.In 2003 NplusT started to market "RIFLE", the non-volatile memory engineering tester, and related services. In a few years, this product has become a reference platform for many memory makers.In 2005 Liliom Laboratories, a Hungarian software development company, merged into NplusT. Thanks to this operation, the company became leader in the test data collection and processing segment.From 2008 a dominant portion of NplusTs turn-over derived from licensing software products. Today almost every European along with several Far East semicon companies license our software products and make use of qualified engineering services.From 2011, NplusT provides turn-key solutions for device testing and characterization, including hardware, software and support.
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Test & Programming Software
ScanExpress
The ScanExpress Family of boundary-scan software offers a fully integrated development environment that includes boundary-scan and at-speed functional test program generation, test program execution with advanced pin level diagnostics, interactive boundary-scan debugging, and in-System Programming (ISP) of devices such as Flash memory, serial EEPROMs, CPLDd, and FPGAs.
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EBIRST 200-pin LFH Verification Fixture
93-002-101
The 93-002-101 200-pin LFH Verification Fixture is an accessory for the eBIRST range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces switching solutions.. The tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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CloudShell Pro
Quali’s Cloud Sandbox Software allows you to create and publish sandboxes that are replicas of infrastructure and application configurations and use them for development, testing, demos, training and support. CloudShell works by letting you model, orchestrate, and deploy on-prem, cloud, and hybrid environments so that all teams in the DevOps lifecycle have consistent access to production ready environments.
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EV And Pack/Module Tester
Discover the Series 8500, an innovative and fully automated test system engineered to evaluate the performance of Electric Vehicle (EV) components, Energy Storage batteries, Modules, and Packs in real-world conditions. This high-specification system not only delivers accurate results but also allows the energy produced during discharge to be returned to the electrical grid.Using Maccor’s standard fully featured battery test software, the Series 8500 can perform virtually any type of battery test including FUDS, SFUDS, DST etc. for electric vehicle batteries and standard cycling tests for energy storage devices.
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TMS Test Management Software
LX TMS
To diagnose and analyze electronic components and devices, various tests are required in development, production and service. Equipped with all the necessary standard functions, the test sequencer developed by LXinstuments meets all criteria for a successful and smooth test process. The test item ( DUT ) is examined under various operating conditions for its properties, function and usability. Typical areas of application can be found where the usual complexity of test sequences has to be processed. The test sequencer is therefore suitable for small and medium-sized systems where special functions of other sequencers are not required. The free, cross-platform, open source developer platform .NET serves as a starting point. The integrated WPF (Windows Presentation Foundation) framework ensures a user-friendly program interface.
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Image Sensor Test System
IP750
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Compact Tablet Hardness Tester
HC 7
The new member of our Lab.line product family: the HC 7 hardness tester for manual use in the laboratory.Equipped with a touch display and the new database-driven touch software, the HC 7 impresses with its exceptional user-friendliness. The new software can be operated intuitively and is equipped with all important functions for quick operation.Start your quick, direct and product testing with just a few clicks directly via the touch display and set up to 50 products. Reports can be printed externally via USB or LAN interface. It is also possible to connect DYMO* and EPSON* roll printers (*special models only).
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Boundary Scan Products
Acculogic offers a powerful suite of PC-based hardware and software tools specially designed for testing of electronic devices, boards and systems using the IEEE1149.1 and IEEE1149.6 standards. Acculogic’s comprehensive line of Boundary Scan Test tools can be effectively used in the entire product life cycle, starting with design verification and validation and continuing into pilot production and manufacturing. Use of these tools in field service and repair depots can help further to reduce test cost and cycle time.
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Digital Leeb Hardness Tester
TIME®5310
Beijing TIME High Technology Ltd.
TIME5310 is an advanced digital Leeb hardness tester developed with advanced micro electronic technology. It is loaded with all the features for metal hardness testing, such as probe auto recognition, large memory, USB output, removable printer, software, etc. The improved display makes it is much easier to read the values. TIME5310 digital hardness meter is a must have for testing in the field or in the lab. By the way, there are newly designed probes for this hardness meter now.
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Modulation Distortion For E5081A Up To 20 GHz
S960704B
The Keysight S960704B modulation distortion software application enables fast and accurate active device modulation distortion characterization under modulated signal conditions up to 20 GHz. The wide dynamic range and vector error correction of the ENA-X yield an extremely low residual EVM of the test setup, delivering a complete picture of your device’s signal distortion performance without test system interference. S960704B software measures EVM, NPR, ACPR, and decomposes linear and nonlinear signals by spectrally correlating input and output spectrum without needing to demodulate. Integration with the ENA-X measurement flexibility enables quick modulated signal distortion measurements along with traditional VNA tests.
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Vector Network Analyzer (VNA) Simulator – Advanced
S94051B
S94051B puts Keysight’s industry-leading network analyzer software portfolio into your computer. Dive deeper into data captured on an instrument with support for time domain, spectrum analysis, gain compression, and all the other software applications you use on your instrument. You can also develop and troubleshoot test programs on your computer before deploying them to the instrument. S94051B is a superset of S94050B and contains the S-parameter functionality.
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Test Management Software
Test case management and QA is about Coordination and Visibility. PractiTest allows you to Manage all the Requirements, Tests, Issues and Reporting in one simple software testing solution. Get all the information you need in one integrated test case management software solution. Real value from all the information. A Test Case Management tool to help you manage your work and your team.
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Application Software
Radiant's application software packages are used in conjunction with ProMetric® Imaging Colorimeters and Photometers to provide complete solutions for accomplishing specialized testing and calibration tasks in R&D, production lines, or in the field.
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Photovoltaic Array Simulator, 15 kW, 1500 VDC
N8900APV Series
The PV simulators are autoranging, programmable DC power sources that simulate the output characteristics of a photovoltaic array under different environmental conditions (temperature, irradiance, age, cell technology, etc.) enabling you to quickly and comprehensively test inverter MPPT algorithms and inverter efficiency. The DG8900 SAS control software creates and downloads solar I-V curves to a single output solution. For multiple outputs choose the DG9000 SAS control software which can be used with up to 12 N8900APV sources.
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PCIe-6341, PCI Express, 16 AI (16-Bit, 500 kS/s), 2 AO (900 kS/s), 24 DIO Multifunction I/O Device
781046-01
PCI Express, 16 AI (16-Bit, 500 kS/s), 2 AO (900 kS/s), 24 DIO Multifunction I/O Device - The PCIe‑6341 offers analog I/O, digital I/O, and four 32-bit counters/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality leveraging the high-throughput PCI Express bus and multicore-optimized driver and application software. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PCIe‑6341 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
