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VLF test system
BAUR PHG 80 portable
BAUR Prüf- und Messtechnik GmbH
Portable, high performance test generator with VLF truesinus technology. The BAUR PHG 70/80 portable VLF test systems are used for cable and cable sheath testing of medium-voltage cables of up to 50 kV and electrical equipment.* 3 voltage shapes in one device: VLF truesinus, VLF square wave and DC voltage* For medium-voltage cables of up to 50 kV operating voltage* Cable testing, fault conditioning, cable sheath testing
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High-Voltage Test and Diagnostics Device
Viola
BAUR Prüf- und Messtechnik GmbH
Cable testing and diagnostics with the BAUR viola. The portable and powerful viola high-voltage testing and diagnostics device is used for cable and cable sheath testing of medium-voltage cables up to 35 kV and electrical equipment. Another function is insulation testing on electrical equipment.* High performance and compact* Precise and non-destructive determination of the cable condition* Easy and quick test setup* Automatic testing and diagnostic sequences
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Wireless Device Testing
D.L.S. Electronic Systems, Inc
WI the testing and certification of your Wireless Device will be accomplished with precision and efficiency.
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Automated Aerospace and Defense Test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Test And Simulation Devices
BreakingPoint
Control global threat intelligence at Internet-scale to create massive-scale, high fidelity simulation and testing conditions for battle-testing infrastructures, devices, applications, and people.
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High Voltage Test System
CKT-1180
The CKT 1180 is a High-Voltage Test System with up to 3500 VDC and 2800 VAC RMS leakage test capabilities.Originally designed for High-Speed Rail, the CKT 1180’s focus is to test assemblies that require extremely high reliability and work at elevated voltages.
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Mixed Signal Test Systems
MTS1020i
The MTS-1020i is a cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
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METES - Meter Test Systems
Dramatic advances in the field of measurement technology and the use of state-of-the-art micro-electronics have led to the development of a new generation of electricity meters which are far more accurate than their predecessors of just a few years ago. As well as measuring the exact amount of energy used, a high level of integration enables electronic meters to perform a number of additional functions. As a result, these meters are also more sensitive to network irregularities. This means that regular testing is the only way to ensure that a meter functions correctly, both during final factory tests and during the entire life span of a meter.
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Polarity & Burn in Test Systems
Our polarity and burn-in test systems are available for components such as multilayer, disc type or hollow ceramics.
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Fiber-Optic Devices
Understanding that fiber-optic devices are key devices for building global information networks, Renesas has applied its advanced R&D, design, development, and quality management expertise to creating a diverse portfolio of products for a wide range of fiber-optic communications applications.
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Photonics Wafer Probing Test System
58635
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Collaboration Devices
VIA family of True-Collaboration™ solutions: VIA Collage for more complex meeting spaces and VIA Connect PRO for huddle spaces and small to mid-sized meeting rooms.
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MMIs for Test and System Integration
Laying out a custom PCB is too time consuming and costly for most rush projects. Pulse Research Lab has developed Mini Modular Instruments ™ to provide cost effective solutions to the most common engineering challenges.
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Flying Prober Test System
QTOUCH1404C
Qmax Test Technologies Pvt. Ltd.
The Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built high resolution Vision Camera for easy monitoring of probe needle contact. The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision.
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Macro-Vickers Hardness Testing System
LV Series
LECO's LV Series Macro-Vickers Hardness Testing Systems offer an affordable testing system suitable for larger, heavier samples used in welding and other demanding applications. Models include analog and digital, with options to upgrade to automatic configurations.
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Flying Prober Test System
QTOUCH2204C
Qmax Test Technologies Pvt. Ltd.
The Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built Vision Camera for easy monitoring of probe needle contact.The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision. It also comes with in-built image processing unit with minimum 5 Mega pixel Camera ,tele-centric lens with image processing software, illuminated with LED bar light with controls.
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Automated Shock Test Systems
AutoShock-II Test System
The AutoShock-II is a fully automated series of shock test systems used to measure and identify product fragility levels and evaluate protective packaging. With the simulation of real world shock pulses and impact energy levels, manufacturers can systematically test and optimize product design and packaging. L.A.B. Equipment, Inc.''s fully automated computer controlled shock and data analysis test systems are the critical path in accomplishing this optimization.
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Electrodynamic Vibration Test Systems
DC-series
Depending on the reference PSD or other operating conditions such as the specimen, one part of the controlled response may deviate from the reference PSD
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Microtester Test Systems
With the micro probes and the fine-pitch adapters used on them, you are able to contact the finest test structures. E-tests, functional tests, IC tests or high-current tests are made to be affordable, efficient and with a short cycle time. With the integration of HF adapters we also enable the double-sided testing of HF substrates up to high frequency ranges.
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Automatic Transformer Test System
TH2829CX
Changzhou Tonghui Electronic Co., Ltd.
Number of Test PIN: 20 ■ Frequency: 20Hz-1MHz, Resolution: 0.5mHz ■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms) ■ Test Speed: max. 13ms ■ 7-inch TFT LCD display with a resolution of 800×RGB×480
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Handover Test Systems
Family of handover test systems designed for handset-to-network handover testing. Internal step attenuators allow the RF signal between the network access points and the handsets to be dynamically faded up/down. The Ethernet/Serial models run our latest generation 3.x.x firmware that features easy to use ASCII formatted commands.
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Light-Transmitting/-Receiving Devices for Optical Communication Systems
Sumitomo Electric Industries, Ltd.
Various light-transmitting/-receiving devices support the foundation of optical communication systems. The portfolio includes semiconductor lasers and photodiodes for optical transceiver modules and board level design, as well as wavelength-tunable lasers and optical receivers for optical coherent communication devices in the backbone systems.
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32-CH Discrete Output Module
HSL-DO32-M-N/HSL-DO32-M-P
Slave ID consumption: 2 consecutive from odd"N" type for NPN sinking type outputSwitch capacity: Single channel 500 mA; all channels 60 mA at 24VDCPhoto couple isolation voltage: 2500 VrmsResponse time: ON→OFF: 180µs, OFF→ON :1.2µsLED indicator: Power, Link and Output statusPower supply: +10V to +30 VDCOperating temperature: 0 to 60°C
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Integration of Inline Test Systems
The test system and adapter can also be integrated in inline test systems. Additional communication can take place via interfaces (e.g. RS232, DLL). We have already created numerous integrations for different manufacturers.
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In-System Test Programming System
WriteNow
Based on proprietary WriteNow! Technology, the WriteNow! Series of In-System Programmers is a breakthrough in the programming industry. The programmers support a large number of devices from various manufacturers and have a compact size for easy ATE/fixture integration. They work standalone or connected to a host PC, and are provided with easy-to-use software utilities.
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Wireless Devices
Schweitzer Engineering Laboratories, Inc.
Wireless devices use radio signals to communicate and pass data over the air, eliminating the need for traditional cabling.
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Primary Injection Test Systems
Primary current injection testing is utilised in high current/high voltage scenarios found at large electrical installations such as substations. A large current (between 100A and 20,000A depending on system specifications and test requirements) is injected directly on the primary side of the electrical system such as a circuit breaker. The objective of the test is to identify how the system operates under various levels of current load.
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Battery Cell Test System
PEC is the worldwide leader in cell, module and pack test equipment for advanced batteries and energy storage systems. Our test equipment combines very high control and measurement accuracy with an excellent dynamic behavior. This results in very precise, near real time simulations of demanding applications in electro-mobility, renewable energy, aerospace and defense. PEC also supplies test systems for primary batteries and consumer applications.
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EV Battery Test System
Shenzhen Sinexcel RE Equipment CO., Ltd
5V cell equipment adopts Sinexcel innovative circuit design + high-speed DSP complex algorithm, the detection process supports multi-gear switching; The equipment integrates voltage, temperature, pressure and other auxiliary channels, 20ms high-speed working condition simulation and other practical innovative functions to meet all aspects of battery electrical performance testing.
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Device Thermal Test Systems
Thermal Engineering Associates, Inc.
Thermal test system combines the test and measurement capability of dedicated instruments with the ease of operation and data collecting capability offered by graphical-user-interface-driven software operating on an integrated computer.Diodes (PN, Schottky, LED, varactor, PIN), Stacked Diodes (Hi-V Rectifiers & LEDs), Laser Diodes, Transistors (Bipolar, MOSFET, IGBT) & Diodes, Integrated Circuits (Application & Thermal Test Die).
