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Ball Pressure Test Device
ZBP-T
Made up by the related item according to IEC60695, IEC884-1, GB/T5169.21-2006, GB4706.1-2005, GB2099.1-2008, etc. • R = 2.5mm Pressure: 20N • Base with thermocouple hole • Material: 304 stainless steel
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Modular Test System
IMU-MGS
Modular test system with colour touch screen and intuitive software. An integrated help with graphics guide the user through fast and efficient setup and operation. The system is used for CE mark testing in the European Union.
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Meter Testing System
ASTel
Three-phase Meter Test Equipment of ASTeL 3.2x.x series system is a fully automatic system enabling simultaneous, multi-position calibration and legalization of electric energy meters. The automatics include power sources, reference standards, stand controllers, photoelectric scanning heads, separating transformers, and other elements of the system. All these elements are controlled through a Windows based executive program.
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C-Mic Testing System
BK3010
The BaKo BK3010 is our main C-Mic tester. It's small enough to carry under your arm and with a test time of under 0.5 seconds, it tests as fast as you can connect a microphone. Setting up the specifications is so easy and intuitive, we based the BK3012 D-Mic Tester on it. It is also the model for our BK9010B Fully Automatic C-mic Tester.
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Cable Harness Test System
Data Patterns has built high reliability Cable Harness Test Systems for large installations. These are primarily used in launch vehicle aircraft and missile level cable harness test validation. Installations with upto 20,000 lines test capability at a single location have been supplied by Data Patterns. Portable version capable handling of as small as 384 points have also been addressed.
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Programmable Parametric Tester For Discrete Semiconductors
IST-8800
IST Information Scan Technology, Inc.
The IST-8800 is a fully programmable, low cost tester that provides parameter measurements or parametric GO/NO GO test for transistors, diodes, MOS-FETs, Regulators, Triacs, Zeners, SCRs, and J-FETs. These devices can be tested up to 5 amps or 1200 volts with a measurement range down to the nano amp range. Only four universal test fixtures are required which can test the device across a wide range of packages.
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HV AC Voltage Test Systems
Fivestar HV Testing Equipment Co., Ltd.
FSHV offers three different types of AC voltage test systems, the conventional type is AC test transformer design, mainly for testing objects of medium & low capacitance products, particularly for tests requiring stable voltage even if the load changes under voltage (corona, wet & pollution tests) or when the load is inductive (like inductive voltage transformers). Another is AC resonant test systems, according to series resonance circuit XL=XC (2πfL=1/2πfC), by setting F frequency of power supply or L inductance of reactor, generate a pure sinusoidal waveform of the test voltage, and the required input power is only 1/Q. Variable frequency type operates in a frequency range from 20Hz to 300Hz, ideal for field commissioning test of power cables and GIS/GIL. Variable inductance type outputs continuous AC voltage of power frequency (50/60Hz), mainly for factory testing of high and ultra-high voltage cables, power transformers, GIS, etc.
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Pump Test System
This automated test system evaluates a wide range of performance metrics for a cooling pump assembly. The LabVIEW based system programs the DUT then initiates a series of tests to check:Serial communication verificationMotor voltage & currentImpeller speed and flowAir and water temperaturesLeak and level sensor functions
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Ultra-Wideband (UWB) Test System
IQgig-UWB
The IQgig-UWB is ideal for both R&D characterization, high-volume production, and certification. Making it the perfect platform to enable a cost-effective, seamless transition from the lab to the manufacturing floor.
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Discrete C-Size Switch Cards
Compatible for use on VXI platforms, these switch products were formerly sold under the Racal Instruments brand name.
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Low Voltage Test System
CKT T1
The CKT T1 is a compact size solid-state test system featuring 128 test points.
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Standalone with Drop-In Test Systems
800 Series ATE
The Circuit Check 800 Series ATE provides the versatility of utilizing the economical drop-in fixturing present in the 600 Series or an integrated dedicated fixture, while simultaneously providing the increased test equipment capacity of the 1000 Series. This combination produces a cost effective full turnkey test solution.
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Test System
LB302
Computer Gesteuerte Systeme GmbH
The LB302 test system is the most used midsize range version of the LB-300 series. It is designed for development as well as for production. The ‘device under test’ (DUT) is connected with a G12 receiver (Virginia Panel Company), which has a high number of possible contacting and a low transition resistance.
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(100kN) Fatigue Testing Systems
8801
The 8801 servohydraulic testing system meets the challenging demands of a varied range of both dynamic and static testing requirements. The 8801 provides complete testing solutions to satisfy the needs of advanced materials and component testing, and is ideally suited for high- and low-cycle fatigue testing, thermomechanical fatigue testing, and fracture mechanics. The higher capacity of up to 100 kN, a larger working space, a high stiffness, and the precision of alignment all make the 8801 an exceptionally versatile and reliable testing system.
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Immunity Testing Systems
CIS Series
The CIS series test systems are configured to perform conducted immunity testing according to IEC 61000-4-6. The system includes an ACS series power amplifier, coupling/decoupling Network (CDN), directional coupler, 150Ω to 50Ω adapters, power attenuators, cables and [optional] CSAT software. These systems, when properly configured, are capable of testing your products to all levels given in IEC 61000-4-6 up to 230 MHz. You can choose from three systems. Follow the links below for detailed information, including a comprehensive datasheet listing system specs.
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Backend Test For Packaging Devices
Power MOSFETs need a lot of different tests. We understand backend test, and have over 80% of our installations used in this application, operational 24hrs every day delivering fully tested and QA approved products at throughput rates up to 20kuph. Backend test, for power devices in particular, has a diverse, but well-established list of technical demands to detect both failures and failure mechanisms.
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Automatic Hysteresis Graph Test System
DX-4DMT
X-4DMT automatic hysteresigraph system accords with the standard permanent magnet test system, GB3217-92, used to measure the major and minor hysteresis loops, demagnetization curves, recoil hysteresis loops and initial magnetization curves in different temperature of ferrite, AlNiCo, SmCo, NdFeB and quenched material, and gives the magnetic parameter, Br, Hcb, Hcj, (BH)max, Hk and so on, and could meet different requirements on test function, precision, power capability, reliability, efficiency, price, local environment from laboratory to enterprise's production line.
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Meter Test Systems
We offer a huge variety of products for meter testing. From the smallest device with the size of a single-phase meter up to customized semi-automatic systems with more than 40 test positions.
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Rad-Hard Discretes
ST's portfolio of rad-hard discrete products for Space applications includes:
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High Voltage Isolation Test Systems
HT 9460 and 9464
Accurate and non-destructive production testing of ac Isolation Voltage and Partial Discharge. With over 450 systems installed worldwide the 946X series of test systems are the standard and system of choice used by the majority of semiconductor manufacturers that produce optically isolated devices.
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GSP-2B Test System Interface Probe
GSP-2B
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 125Full Travel (mm): 3.18Recommended Travel (mil): 125Recommended Travel (mm): 3.18Overall Length (mil): 845Overall Length (mm): 21.46
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Phase Noise Test System
N5511A
The Keysight N5511A phase noise test system (PNTS) lets you measure at the limits of physics with readings down to kT (-177 dBm/Hz). The N5511A PNTS is a replacement for the gold-standard Keysight E5500 phase noise measurement system and is designed to meet the needs of phase noise power users.
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Production Test System
G3 Hybrid
The G3 Hybrid is a state of the art system for fast Production test throughput in DC test applications. The system combines the most versatile offerings of features in a single system, at the lowest cost. For devices requiring DC and Continuity test capability only, G3H is a very flexible cost-effective Production Test solution. This approach provides a DC test system with the capability to add logic resources (AC/SCAN) as well as analog resources for Mixed Signal. The HILEVEL G3H embraces low cost while supporting SCAN, giving you the ability to toggle every node in your chip.
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Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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Backplane Test System
402HV
Our model 402HV is the result of 25 years of high voltage / high pin count test systems experience. We produced our first high voltage system back in 1985. It was programmable up to 600 volts / 600 Mohms and had over 49,000 test points. It could test a 5k point board in less that 15 seconds. Since then we have built hundreds of high voltage test systems, with our highest voltage system capable of testing up to 2000 Volts DC / 1500 Volts AC. (One of our 600 volt systems, built in 1986 is still in operation testing boards for a defense contractor.)
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Tracker for Testing CPV Module Systems
The tracking precision of our biaxial tracker is better than ±1° on each axis, with an option for ±0.1° precision. This makes the tracker ideal for testing concentrating PV modules. The software runs all required tests for angle-dependent testing of PV modules according to IEC 62108.
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Thermal and Mechanical Testing System
3500 System
The Gleeble 3500 is a fully integrated digital closed loop control thermal and mechanical testing system. Easy-to-use Windows based computer software, combined with an array of powerful processors, provides an extremely user-friendly interface to create, run and analyze data.
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Manual Flying Probe Test Systems
They provide flexible measurement technologies like Kelvin and high voltage tests in combination with low tooling costs. atg Luther & Maelzer offers a wide range of different systems starting from standard systems with 8 heads up to oversized systems with 24 test heads.
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Dynamic and Fatigue Testing Systems
Instron offers an extensive range of fully-integrated dynamic and fatigue testing systems from 1000 N up to 5000 kN. Incorporating servohydraulic, servo-electric and linear motor technologies, these test instruments cover a broad range of fatigue, dynamic, and static testing applications. These applications include high-cycle fatigue, low-cycle fatigue, thermo-mechanical fatigue, fracture mechanics, crack propagation and growth studies, fracture toughness, bi-axial, axial-torsional, multi-axial, high strain rate, quasi-static, creep, stress-relaxation, and other types of dynamic and static tests.
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Measurement Devices
In addition to the critical role data loggers play in a data-acquisition system, there are other types of measurement devices. Some measurement devices are used to increase the number of terminals that data loggers can use, which enables them to measure more sensors or control more external devices.
