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ECM Noise Under RF Test System
BK8020
The BaKo Type BK8020 ECM Noise Under RF Test System tests microphones under RF noise, using a ‘Direct Injection Test’ in the frequency range of 5MHz~2.5GHz with an amplitude modulated (AM) disturbance signal of 1kHz. You run the system using the controlling PC, which allows automatic configuration and which runs the test sequence automatically. When you finish testing, you can print data as an MS Excel report or save it for comparison and analysis.
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RF Device Tester
RF ITS
Sterner's automated test management system, combined with integrated RF technology modules, provides full functionality, including: Apply power to the device under test (DUT). Read and write blocks of data to set up and validate product EEPROM using a hard-wired communications interface. Scan transmitting devices or traveller barcodes and write the information to the DUT (the "sign-up process"). Inject an RF signal of known frequency and power level to test receiver sensitivity.
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Serial Device Servers
Advantech''s serial device servers, Modbus gateways, and USB Device Server are easy to install and configure, support wired and wireless networking and provide various operation modes to satisfy rigorous industrial automation needs.
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Rail Traction Inverter Test System
The rail inverter test system uses a pulse test methodology to verify proper operation of the IGBT switching elements in a subway car motor control. The system is designed to verify proper commutation of the switching elements. A large capacitor bank allows testing at DC voltages up to 1kV and peak currents of up to 3kA into reactive loads.The system also integrates self test capabilities and safe-to-turn-on (STTO) diagnostics to ensure no gross faults are present prior to the application of high voltages. Further the system includes dielectric withstand (hi-pot) test capability to ensure electrical safety.
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PXI System for LRU Test
ARINC 629
PXI System for LRU Test Support. The system shown here was developed in support of Boeing 777 LRU Production Test.
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SSD Test System
The Neosem’s SSD test system combines advanced SSDtest hardware, software and environmental chamber into a single platform and supports all popular storage interfaces including PCIe, SAS & SATA and fast emerging protocols such as NVMe and AHCI.
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Flash Storage Device
Axiomtek provides various industrial-grade flash storage device for customers to simplify and shorten the system design time.
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3U OpenVPX Multichannel Discrete I/O Board
68DT1
The 68DT1 is a 3U OpenVPX™ board featuring up to 96-Channels of Standard Functionality (SF) DT1 module-type or Enhanced Functionality (EF) DT4 module-type Discrete I/O functions [foptioned, factory configurable].48-Channels are dedicated as input (voltage or contact sensing with programmable, pull-up/pull-down current sources). An additional 24 or 48-Channels are programmable for either input or output (current source, sink, or push-pull) switching up to 500 mA per channel from an applied 3 – 60 V external VCC source (or sink to ISO-GND). The 68DT1 can sense broken input connections and whether an input is shorted to +VCC or to ground. Additional features of the DT4 EF are listed below. The 68DT1 offers unparalleled programming flexibility, a wide range of operating characteristics, and a unique design that eliminates the need for pull-up resistors or mechanical jumpers.
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LED Power Driver Test System
Chroma C8000
Chroma Systems Solutions, Inc.
The Chroma 8491 ATS is equipped with optimized standard test items for LED driver testing (lighting & TV backlight). The user is only required to define the test conditions and specifications for the standard test items to perform the test.
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CDM Test System
1100-CDM series
Tokyo Electronics Trading Co., Ltd.
Model 1100-CDM is the latest model developed as a successor to the conventional CDM-550, and supports testing methods (Field-Induced CDM) that conform to international standards. In addition, a camera and a high-accuracy robot can apply CDM stress to a precise position.
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Stationary Meter Test Systems AC
Today Meter Test Technology is much more than only testing accuracy and functionality of a conventional electricity meters. With implementation of SmartMeters a complex test and data management system is required. – It’s a good thing to have experts by your side.
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Automated Test Systems
Chroma Systems Solutions, Inc.
From power conversion to battery to electrical safety, our test systems will maximize your time, improve your validation process, and increase your throughput.
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Camera Test System
FS 8681 / SR
FS8681/SR is software for evaluating images* and making pass/fail judgments in camera mass production inspections. It consists of the "Editor FS8681" application that sets the inspection content and the "Sequence Runner FS8681SR" application that executes the set inspection.
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Device Testing
S-TEST Lab
SPEKTRA Schwingungstechnik und Akustik GmbH Dresden
S-TEST Lab solutions have been tailored for system level testing in development and lab environments. The core component is the S-TEST desk system. It combines a compact design with the full test interface, that enables the developer to react flexible on changing requirements already in early project phases and to also verify product performance parameters.
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Optical 3D Measuring Systems & Devices For Your Quality Assurance
As a manufacturer of optical industrial metrology, we offer a broad portfolio of optical 3D measuring systems & devices to support companies in various industries with precise quality assurance in production. Based on Focus Variation technology, our measuring systems not only enable surface roughness measurement, but also the detection of micro-geometries, shapes and structures.
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Phase Noise Test System
PN9000 System
Noise eXtended Technologies S.A.S.
The PN9000 is a simple and fast Automatic Phase Noise Test System covering a very wide frequency range. Its modular architecture allows optimum configuration, multiple measurement techniques and future growth in a NIST tested instrument.
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Six-Cell Diffusion Testing System
Phoenix DB-6
The Phoenix DB-6 (six-cell diffusion block) provides an ideal platform compliant with 21 CFR Part 11 for release-rate testing of six vertical diffusion cells at once using manual sampling methods. Controlled by an advanced computerized display, the DB-6 provides uniform and precise heating and stirring of six cells. The compact footprint of the DB-6 economizes on lab bench space.
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Universal Testing Systems (Up to 600 kN)
5980 Series
Instron 5980 Series floor model testing systems are universal, static testing systems that perform tensile and compression testing; and also perform shear, flexure, peel, tear, cyclic, and bend tests. The 5900 Series are engineered for precision, built for durability, and offer the flexibility for changing requirements. They are designed with standard and optional features that increase testing efficiency and improve the testing experience for the operator. 5980 Series floor models are robust, heavy-duty frames commonly used for testing high-strength metals and alloys, advanced composites, aerospace and automotive structures, bolts, fasteners, and plate steels. Frames are available in load capacities of 400 and 600 kN.
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Conformance Test Systems
With an established market leadership position in GCF and PTCRB approvals for LTE-Advanced and all leading-edge technologies, Anritsu continues expanding its number of test case validations in GCF and PTCRB for Protocol, RF and RRM conformance testing. With increasing complexity of wireless technologies, Anritsu Conformance Test systems provide easy-to-use control software to maximize testing efficiency.
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Passive Tapping Device
DSL Phantom™
DSL Phantom™ is a unique passive tapping device for Lawful Interception (LI) of ADSL lines. The device records and stores broadband digital information, offering unique advantages to Law Enforcement Authorities (LEAs) looking to capture data between the target and the service provider premises.
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COMPUTERIZED AUTOMATIC RELAY TEST SYSTEM
CVRT-S16
CVRT-S8 & S16 are ideal for automatic testing of ELECTRO MECHANICAL AND READ RELAYS (only DC relays) both for static and dynamic characteristics. This system scans at one stroke, all the parameters of the relay as per definition of test procedure. The test sequence can be pre-programmed and stored in the disk. You can select the tests as per your requirement. Can include or exclude the test and you can have several options to match your test definitions. Semi skilled person can be engaged for actual testing, as he need not make any settings and need not interpret the readings. The system conducts the tests and gives PASS / FAIL indication on overall test results. If a printer is connected, each test result will be printed.Test Parameters : -> Coil Resistance.-> PickUp/Pull In /Operating Voltage or Current Linear Ramp Method or Step Method.-> Measure Pickup Contact Gap FBB-LBB V or mA-> DropAway/Drop Out/Release Voltage or Current Linear Ramp Method or Step Method.-> DropAway Contact Gap FFB-LFB V or mA-> % Release Dropaway/Pickup-> Contact Resistance of all contacts both Front and Back contacts.-> Operating Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while Operating @ above-> Release Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while release @ above-> Difference of Operate Time - Release Time.-> Bridging Test or Non Overlap Test.-> Transfer or Traverse Times while Operate and release.-> Operate Time @2nd Set Voltage or Current.-> Release Time @2nd Set Voltage or Current.-> Power Consumption @ Rated Voltage.-> Coil Current @ Rated Voltage at Room Temperature.-> Coil Resistance Corrected to 20deg C.-> Timing Waveform Graph for all active Contacts.
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Memory Test System
T5801
Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
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Cable Sheath Testing and Fault Location System
Shirla
BAUR Prüf- und Messtechnik GmbH
Cable fault location with the BAUR shirla. Shirla the fault location system is used for cable and cable sheath testing as well as for pre-location and pinpointing of cable faults. The pre-location based on the measuring bridge principle according to Murray and Glaser that is designed especially for power cables, also enables pre-location for control and lighting cables. Null balance and evaluation take place automatically.* Cable and cable sheath testing up to 10 kVC* Resistance measurement* Cable and cable sheath fault pre-location with precision measuring bridge* Adjustable cable sections that can be defined with length, conductor cross-section and material respectively and can be considered in the distance calculation
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Cogging Test System
CTS
Magtrol’s Cogging Test System is a stand-alone test system designed to control and measure Detent Torque, Cogging Torque and Friction Torque. The test System includes a precision geared motor, a TS Series Torque Sensor integrating a 5 000 pulses encoder. CTS 100 to CTS 102 have a built-in security clutches to avoid system overload by mishandling when not in use. The geared motor drives the MUT (Motor Under Test) at a low speed from 1 to 10 rpm (respectively 8 rpm for CTS 103 and CTS 104), while acquiring its cogging torque related to angle position.
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AC Hysteresis Graph Test System
DX-2012SA
Under continuous frequency of 1 kHz to 500 kHz, automatic measurement of magnetic hysteresis loop of the soft magnetic materials such as silicon steel, precision alloy, non-crystal and ferrite, accurate measurement on the dynamic magnetic characteristic parameters such as amplitude permeability µa, loss angle d, loss iron Pc, remanence Br and coercivity Hc.
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Stand-alone I-V Test Systems
OAI offers a complete line of high performance I -V Testers. I -V Testers and I -V Rider software may be ordered as a stand -alone system or integrated into any OAI Solar Simulator. Three standard ranges of I -V Testers are available; ≤1A, 1 -5A, 5 -10A, and 20A. Higher current testers are available as custom options. An OAI Application Engineer will work with you to insure that the I -V Tester and I -V Rider software you choose is optimized for your specific application.
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Portable System for High-Boltage Solid Dielectrics Testing
HVTS-70/50
Portable system HVTS-70/50 is designed for carrying out high-voltage withstand testing of cable insulation and other solid dielectrics with DC (rectified) voltage up to 70 kV and AC voltage up to 50 kV RMS at industrial frequency (f = 50 Hz).
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Test Tables / System Solutions
WEETECH, as a manufacturer of test equipment, offers its customers also a "Ready To Use" test system solution. It consists of the test table, the customer-specific adaptation as well as the test device, and is very quickly ready for use at the customer's site. According to the customer's requirements, the set-up is designed as a system with permanently installed adaptations for the production of constant cable harnesses in large quantities or with interchangeable adapters for the flexible production of different cable harnesses. Depending on the application, a larger table version or a smaller desk version is available. Various interfaces are available for integrating these solutions into a complete production automation system.
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BAW Devices
Teledyne’s Bulk Acoustic Wave (BAW) Product Line has been producing BAW delay devices since the early 1960’s. Over the years, Teledyne Microwave Solutions (TMS) has constantly improved BAW technology and is currently the world’s only supplier of microwave bulk acoustic wave delay devices. Markets for BAW devices include instrumentation and radar altimeters and are available in connectorized, pin and surface mount configurations.
