Semi-conductor
active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.
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Product
Portable Voltage and Current Instruments
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Each model in our portable test equipment range is designed for accuracy and reliability, providing high performance and ease of use for applications. Products are used in various lab and field applications across industries such as research and development, semiconductor, and process control. For higher range electrical source and measure we have a series of bench multifunction calibrators and multimeters.
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Product
Wide Range TMAH Concentration Monitor
HE-960H-TM
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Accurately measures the concentration of TMAH (Tetra Methyl Ammonium Hydroxide), which is the main component of the photoresist developer solutions in semiconductor manufacturing. Wide measurement range : 0 - 10 %. Have the chemical resistant carbon sensor.
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Product
Laser Turbidity Meter
HU-200TB-EH
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HU-200TB-EH is a laser-type turbidity meter that can measure turbidity of membrane filtered water, etc. with a resolution of 0.0001 degrees. A high-sensitivity turbidty meter with a minimum resolution of 0.0001 degrees at a measurement range of 0.0000 to 2.0000 degrees, which uses a long-lasting semiconductor laser as the light source and employs a transmission 90-degree scattering light method.This is best suited for sensitive measurement of turbidity on surface water.
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Product
Programmable DC Power Supply
62000L Series
DC Power Supply
The Chroma 62000L Series Programmable DC power supplies have low noise linear performance and fast transient response. The units have many unique functions that are targeted for overall automated test system integration, automotive power electronics MCU/ECU, power semiconductors, wireless communications, etc. The 62000L Series is a high quality yet cost effective programmable DC Source, designed to meet the stringent requirements of the next generation of power electronics. The GPIB and USB control interfaces come standard with the 62000L Series, no additional purchase required. The 62000L Series can be easily remote controlled via either of these two interfaces. The 62000L weighs less than 2.5 kg, and its case measures 214.6W * 88.6H * 280D mm. Its light weight and compact size makes it easy to handle and stack safely.。
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Product
Custom Coatings
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MICROMATTER provides custom coating services (single or multi-layer) on customer supplied glass, metal and semiconductor substrates.
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Product
Thermo-hygrometer Handheld Temperature And Humidity Meter
HW100
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Shenzhen Chuangxin Instruments Co., Ltd.
HW100 temperature humidity meter is a portable temperature humidity test instrument., selecting high performance capacitor type polymer film humidity sensor and semiconductor type temperature sensor. It has features of volume small, weight light, easy carrying, multi-function, and high precision, etc., applies to various fields such as hot comfortable research, indoor air quality assessment, verification of HVAC system run situation in building, heating and refrigeration system overhaul, and detection of the air conditioning system during the production process and so on.
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Product
Ultra-minute Photoelectric Sensor
EX-Z
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Panasonic Industrial Devices Sales Company of America
At a thickness of 3mm, the EX-Z Series is one of the world's thinnest Photoelectric Sensors with a built-in amplifier which was achieved by utilizing a new Semiconductor packaging technology that does not use wire bonding. The compact design now makes it possible to install the sensors in narrow spaces that, in the past, could fit only a conventional fiber sensor head.
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Product
Compact Semiconductor Tester
QST4416-FC
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Qmax Test Technologies Pvt. Ltd.
The Qmax Model QST4416-FC is a compact small foot print, sophisticated automatic semiconductor tester. Its state-of-the-art hardware design which is freely configurable to user's application requirements and software features facilitates it to test linear & mixed signal IC components which covers a wide range of products like linear, Power management, Opto electronics, digital and mixed signal devices etc.
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Product
Semiconductor Optical Amplifiers
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A Semiconductor Optical Amplifier (SOA) is essentially a laser diode (LD) with no feedback from its input and output ports and hence is also referred to as a Traveling-Wave Amplifier (TWA). Semiconductor Optical Amplifiers (SOAs) have proven to be versatile and multifunctional devices that are key building blocks for optical networks.
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Product
Analytical Software for Microscopy
SPIP
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SPIP™ or Scanning Probe Image Processor - is an advanced software package for processing and analyzing microscopic images at nano- and microscale. It has been developed as a proprietary software by Image Metrology and is unique in the microscopy and microscale research market. With the high level of usable features, SPIP provides industrial and academic researchers with an advanced toolkit for working with microscope images, incl. extracting data from most microscopy file types, cleaning and enhancing data, analyzing measurements, visualizing and reporting analysis results. The software is used for research and innovation in a variety of industries such as pharmaceutical, cosmetics, semiconductors, hard disk manufacturing, polymer and aluminum manufacturing. Furthermore, SPIP is widely recognized as the standard microscope image analysis software for research and education at leading universities, and has been cited in more than 1200 scientific publications.
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Product
Mixed Signal Test Systems
MTS1000i
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The MTS-1000i is lowest cost platform available in the MTS series of ATE. It has a reduced platform size compared to the MTS-2010i & MTS-1020i, reduced power supplies, and 4 slots. It is mainly intended for single site testing. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
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Product
Probe Card
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Japan Electronic Materials Corp.
The probe card is a tool for testing semiconductors used at "Wafer Test" to check quality of IC or LSI in the first process of semiconductor manufacturing. The probe card is expendable.
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Product
Power Amplifiers
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RPG Medium Power Amplifiers are developed and manufactured by using most modern discrete components and thin film technologies, in order to cover the frequency range 50 to 130 GHz. With improved DC-supply and modern semiconductors these medium power amplifiers not only deliver high power output but also superior power added efficiency (PAE) and higher linearity. These medium power amplifiers are available as a standard product and on request as a customized manufactured product..
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Product
Stand Alone Wafer Sorter
MicroSORT
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The Microtronic MicroSORT semiconductor wafer sorter is designed to maximize throughput while minimizing wafer handling in a user-friendly operating environment. This stand-alone semiconductor wafer sorter enables sophisticated semiconductor wafer sorter routines for up to 4 wafer-cassette platforms. MicroSORT semiconductor wafer sorter reads OCR scribes from the top, bottom, or simultaneously, allowing for enhanced semiconductor wafer tracking and sorting. The MicroSORT semiconductor wafer sorter’s basic functions include the ability to move, compress, randomize, find, align, verify, and split semiconductor wafer lots. With our virtual tweezer mode, an operator can click on wafer icons to move wafers between cassettes, read semiconductor wafers, and swap wafer positions.
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Product
MOCVD Systems
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For growing high-quality compound semiconductor films, few techniques match the precision of Metal-Organic Chemical Vapor Deposition (MOCVD). They give engineers tight control over film composition and thickness, making them essential for optoelectronics and advanced power transistors.
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Product
PXI-2535, 544-Crosspoint, 1-Wire PXI Matrix Switch Module
778572-35
Matrix Switch Module
544-Crosspoint, 1-Wire PXI Matrix Switch Module—The PXI‑2535 is a high-density 4x136 PXI matrix switch module that is ideal for routing low-power DC signals in validation test systems of mass produced devices such as semiconductor chips and printed circuit boards (PCBs). Featuring field-effect transistor (FET) relays, the PXI‑2535 offers unlimited mechanical lifetime and switching speeds up to 50,000 crosspoints/s. It also features onboard relay counting for relay monitoring and deterministic operation with hardware triggers to improve test throughput.
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Product
PXIe-4163, 24-Channel, ±24 V, 50 mA PXI Source Measure Unit
784483-01
Analog Input Module
PXIe, 24-Channel, ±24 V, 50 mA PXI Source Measure Unit—The PXIe-4163 is a high-density source measure unit (SMU). It features 4-quadrant operation with a current resolution of 100 pA and the ability to sample up to 100 kS/s. The module also offers the ability to maximize stability and measurement accuracy with SourceAdapt, which allows you to custom-tune the transient response to match the characteristics of any load. The PXI-4163 is ideal for a broad range of mixed-signal integrated circuits (ICs) in semiconductor production test.
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Product
High Power Temperature Forcing System
MaxTC G4
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NEW G4– MaxTC is our premium Temperature Forcing System product, specifically designed for industry needs as a result of customer´s feedback from the Flex-TC. Its powerful cooling force (90W @ -40°C), rapid transition rates (75°C /min) and remote control capabilities will provide solutions to all semiconductor testing needs. MaxTC is compact, ultra quiet (55 d BA) and fits into any laboratory. A premium product at amazing value.
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Product
PhotoMASK Services
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For years APPLIED IMAGE has been serving customers who work with semiconductors, displays, PCB, MEMS, along with college professors, researchers, and students with Photomask making solutions tailored specifically to each customer’s needs. Working with a dedicated sales engineer means that you will have all of your questions answered.
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Product
300 Mm Semiconductor Processes
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With the Center Nanoelectronic Technologies (CNT), the Fraunhofer IPMS conducts applied research on 300 mm wafers for microchip producers, suppliers, equipment manufacturers and R&D partners. In the field of FEoL and BEoL we offer the following technology developments and services at Ultra Large Scale Integration level (ULSI):
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Product
Thermal Conductivity Analyzer
Model 2000B
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Teledyne Analytical Instruments
The Series 2000 represents a complete line of Thermal Conductivity Detector (TCD) based analyzers which can be applied in a wide range of applications and industries. By using field proven filament-based and semiconductor based TC detectors, Teledyne is able to continuously monitor hydrogen and a variety of other gases of interest in either binary or multi-component sample gas streams.
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Product
Elemental Analyzers for Carbon, Sulfur, Oxygen, Nitrogen and Hydrogen
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HORIBA Scientific provides inorganic elemental analyzers for a wide range of applications based on the inert gas fusion technique and high frequency heating combustion in oxygen stream.The EMIA Series for Carbon and Sulfur analysis and EMGA Series for oxygen, nitrogen and hydrogen analysis strongly rely on HORIBA’s experience as a pioneer in Non-Dispersive Infrared (NDIR) technology. Both EMIA and EMGA designs meet all requirements for the metallurgical industry. These instruments also help scientists working in other application fields such as semiconductor, battery materials, ceramics and more.
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Product
Capacitance Manometer
VG-200S
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Absolute pressure measurement is crucial for most of vacuum processes in various industries including Semiconductor, FPD, HDD, PV and Coating. A capacitance manometer determines the total pressure from the deformation of the diaphragm that occurs when a pressure difference is applied to both side of the diaphragm.
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Product
Automated Optical Inspection
AOI
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No complex assembly process is complete without the ability to inspect and characterize the many different components used. ficonTEC’s fully automated INSPECTIONLINE systems acquire high-resolution pictures of the surfaces of interest and performs optical inspection based on the user’s criteria. For example, facet inspection of laser diodes, QC for coatings, surface inspection, top/bottom/side-wall inspection of semiconductor chips, and die sorting are just some of the many inspection tasks performed routinely by ficonTEC’s suite of inspection tools. As for all of ficonTEC’s systems, a modular approach permits the inspection platform to equipped with additional features – automatic tray handling and various feeding philosophies, testing capabilities (e.g. LIV), top/bottom chip inspection, and in-situ labelling.
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Product
LOAD BOARD
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The semiconductor manufacturing process is divided into a front process (WAFER) and a post process (PACKAGE). The LOAD BOARD is an INTERFACE device for inspecting the function and performance of a package state IC, which is a post process, It is an INTERFACE key device for inspection. In particular, LOAD BOARD is widely used in non-memory semiconductor inspection equipment.
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Product
Automated Discrete Semiconductor Tester (ATE)
5000E
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Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
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5.0 MP NVIDIA® Jetson Xavier™ NX/NVIDIA® Jetson Nano™ Camera
E-CAM50_CUNX
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e-CAM50_CUNX is a 5.0 MP MIPI CSI-2 fixed focus color camera for NVIDIA® Jetson Xavier™ NX/NVIDIA® Jetson Nano™ developer Kit. This camera is based on 1/2.5" AR0521 CMOS Image sensor from ON Semiconductor® with built-in Image Signal Processor (ISP). This powerful ISP helps to brings out the best image quality from the sensor and making it ideal for next generation of AI devices.
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Product
High-Performance Strip Handler
MCT SH-5300
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SH-5300™ high-performance strip handler for testing advanced semiconductor packages, LEDs, MEMS sensors, and traditional ICs. It can handle a vast array of strip and laminate lead-frame sizes. Capable of tri-temp testing -55˚C to +160˚C and ambient testing to +160˚C.
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Vacuum Process And Chamber Environment Monitors
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Our process monitors are innovative in-situ process monitoring instruments that are fully integrated, application-specific packages, including component residual gas analyzers (RGAs), analytical equipment, and control software. Process mass spectrometers are used in varied applications, including; Semiconductor, Thin Film (CVD, Etch, PVD and degas), pharmaceutical lyophylization and bulk gas purity monitoring.
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Interface Solutions
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Cohu is the market leader in semiconductor test sockets and has 50+ years of semiconductor test expertise providing optimal test contactor and probe pin solutions for every type of application and challenge, using innovative and sophisticated R&D methods.We offer a full suite of test contactors that provide the electrical interface between the tester and the semiconductor device presented by the test handler; optimizes signal performance via an array of consumable probe pins.
