Semi-conductor
active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.
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Product
High Temperature Digital Mass Flow Controller
SEC-8000 F/D/E Series
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The SEC-8000F/D/E series can operate in high temperature environments, from 15 ℃ to 120 ℃, for a variety of tasks including semiconductor and compound semiconductor processing.
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Product
64-Axis PCIe EtherCAT MainDevice Motion Controller
PCIe-8338
Motion Controller
ADLINK PCIe-8338 is a hardware-based EtherCAT motion controller able to support up to 64 synchronized axes and over 10,000 points simultaneously. The PCIe-8338 features dedicated isolated emergency stop input (EMG), and configurable isolated high-speed digital input as not only generic sensor input but also pulsar input, with up to 1MHz input frequency. Optimum jitter control is provided in minimal cycles of 250µs to optimize synchronous I/O performance for vertical automation applications in semiconductor, electronic manufacturing, and others. The PCIe-8338 provides an out-of-shell application-ready (APS) function library to generate multi-dimensional, highly synchronized, time-deterministic event-triggered motion & I/O control. A wide range of compatible 3rd party SubDevice are easily designed with ADLINK's APS function library. ADLINK's MotionCreatorPro 2 utility is fully compliant with the Microsoft Windows environment, that allows complete EtherCAT motion and I/O configuration and function evaluation as well as compiling program download functions.
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Product
5.0 MP Camera For Rockchip RK3399
E-CAM50_CU96
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e-CAM50_CU96 is a 5MP Fixed focus MIPI camera for 96Boards compliant Rock960 developer kit featuring Rockchip RK3399 processor. This 4-lane MIPI Camera for Rock960 board is based on our popular low-light camera module, e-CAM55_CUMI0521_MOD which has 1/2.5" AR0521 CMOS Image sensor from ON Semiconductor® and a built-in Image Signal Processor (ISP). It has S-mount (M12) lens holder which allows customers to choose and use the lens according to their requirement.
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Product
AMIDA ATI 600 Tester
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AMIDA ATI 600 Tester is a dedicated test system for semiconductor components (MOSFET, BJT, DIODE, ... etc.), which can accurately and quickly measure product parameters through form filling and editable program control. In practical applications, AMIDA ATI 600 Tester is the best choice for users, whether it is CP or FT mass production testing, or research projects of component characteristics.
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Product
Semiconductor Test Hardware Solutions
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A critical element of every semiconductor test solution is the interface between the device and ATE. The hardware team at Test Spectrum has produced thousands of successful test interface solutions for some of the most challenging semiconductor products on all major ATE platforms. Our in-house team of PCB design experts has an added advantage of direct access to our senior test engineering staff.
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Product
ESD Testing & Latch-Up Testing Services
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EAG is an industry leader in ESD testing (Electrostatic Discharge) and Latch up testing. Our highly experienced engineering team use their industry leading knowledge and years or real world experience of the latest semiconductor technologies, circuit design, and device physics to optimize our customer's ESD and latch-up results. Human Body Model (HBM) and Machine Model (MM), Charged Device Model (CDM), Latch-up, Transmission Line Pulse (TLP).
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Product
Caibration Equipment For Lab Use
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In the field of high-power semiconductor testing, PONOVO has launched a smart test platform with high-speed high-frequency, high-voltage, high-current power sources, combined with high-speed, high-precision high-voltage, high-current analog acquisition technology and high-speed digital processing control system. The platform can complete the testing of dynamic parameter parameters, static parameters, thermal parameters and mechanical parameters, and power life parameter of various types of high-power semiconductor devices, modules, and chips, which could meet different testing requirements. It is the universal testing platform for automated testing for different application purpose, such as the research and development testing, engineering acceptance test, factory acceptance test, etc.
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Product
1.3 MP Custom Lens NIR Camera Module (Monochrome)
e-CAM10_CU0130_MOD
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The e-CAM10_CU0130_MOD is a 1.3 MP NIR Camera module (Monochrome) based on the Aptina / ON Semiconductor AR0130CS CMOS image sensor with S-mount lens holder attached to it. The AR0130 is a 1/3” Optical Form factor, Electronic Rolling Shutter CMOS sensor with enhanced sensitivity in the Near Infrared region and superior low light performance. The e-CAM10_CU0130_MOD is designed to connect with any Application Processor that has parallel digital video interface. The standard S-Mount lens holder can accommodate a wide range of lenses based on the customer choice. e-CAM10_CU0130_MOD’s S-Mount holder can also house a fisheye lens or a zoom lens to meet their application requirements.
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Product
3.4 MP Autofocus (Liquid Lens) Low Light Camera Module
e-CAM31_MI0330_MOD
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e-CAM31_MI0330_MOD is a high performance, small form factor, 3.4 MP Autofocus Low Light Camera Module with Liquid Lens. It is based on AR0330 CMOS Image sensor from ON Semiconductor®. This Autofocus Liquid Lens Camera Module has slave mode for precise frame-rate control and for synchronizing two sensors. e-CAM31_MI0330_MOD – Liquid lens camera module has superior low light performance. It supports Full HD @ 60fps for maximum video performance. It also has a support for external mechanical shutter and an on-chip phase-locked loop (PLL) oscillator. The dedicated ISP performs the entire Auto functions like auto white balance, auto exposure control in addition to complete image signal processing pipeline.
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Product
Test Contactor/Probe Head
Hydra
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Engineered for excellence and efficiency, Hydra™ spring probe series offers precision, reliability, and standardized semiconductor test interface.Designed to be best-in-class at a competitive price point, Hydra is optimized to maximize your operational efficiency. Hydra is built to withstand demanding high-volume manufacturing test environments with its robust and durable design.With a common test-height, Hydra offers the ability to mix and match power, RF, and Kelvin probes within the same test socket. In addition, Hydra streamlines inventory management with fewer probe part numbers to manage and shorter lead times.
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Product
LED
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Scientific Computing International
A light-emitting diode (LED) is a semiconductor device that emits light when current flows through it.
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Product
EpiStride SiC CVD System
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Veeco’s latest technology for the compound semiconductor market enables high-performance chemical vapor deposition of Silicon Carbide for both 6 and 8-inch wafer production. The platform enables a return to production in under 5 hours after routine cleaning maintenance. The EpiStride system’s high uptimes, short cycle times and overall stable performance lead to the lowest cost of ownership per wafer compared to competitive systems.
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Product
Test Management Software
ActivATE™
test
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Product
RF Bias Burn-In System
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These systems deliver an unbeatable combination of advantages over a wide range of RF frequencies and power levels. The Automated Multi-Channel RF-Biased Burn-In Test System is a turnkey system that incorporates all of the capability needed for accelerated aging and parametric testing of RF semiconductor devices. Its powerful software elegantly supports data acquisition, storage, and presentation. Accel RF’s customers choose system features to meet their technical needs and capital budget. In addition to cost savings, use of Accel-RF’s solutions accelerate product time-to-market, saving many months of product development.
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Product
Optical Metrology
YieldStar
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Our YieldStar optical metrology solutions for the semiconductor industry can quickly and accurately measure the quality of patterns on a wafer.
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Product
Customized Ellipsometers
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~0.1 nm thickness difference can be seen by IE-1000.Thickness distribution of thin film can be imaged.Thickness and optical images of semiconductor device, display, and bio samples.IE-1000 can show the images which can not be seen by conventional microscope.Defect of semiconductor and display can be seen directly.Easy and fast operation.
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Product
Power Semiconductor Device
IGBT/SIC
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Hitachi High Voltage IGBTs have been corresponding to a wide range of applications such as railway applications and various power conveters, leading companies for domestic and overseas adopt them, since they were adopted as a railway application in 1992. Will continue to contribute to the developing energy society by pursuing more easy-to-use, high-performance and high -quality products with leading-edge research and development.
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Product
Impact Series Power Discrete Semiconductor Tester
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The Impact Series Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.
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Product
Multifunction Instrument for Education and Training
LabXplorer
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LabXplorer turns your desktop, laptop, tablet or smart phone into a powerful, multifunction test and measurement instrument for a wide range of applications. Instruments, whatever you need, are at your fingertips. LabXplorer provides multimeter, oscilloscope, spectrum analyzer, logic analyzer, programmable analog and digital signal generator, impedance analyzer and also measures characteristics of passive electronic components and semiconductor devices.
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Product
Noise Suppression Products / EMI Suppression Filters / TVS Diodes (ESD Protection Devices)
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Murata noise suppression products include compact EMI suppression filters that efficiently eliminate noise, L Cancel Transformers (LCTs) that greatly suppress noise in high-frequency bands by reducing the ESL generated inside capacitors and in boards, and TVS Diodes that guard semiconductor devices against electrostatic discharge from external sources. Murata supplies products that support a variety of approaches to suppressing noise.
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Product
The Lorlin© Impact Series
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Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results.
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Product
PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope
780319-02
Oscilloscope
1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
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Product
Enterprise Yield Management Solution
dataConductor
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dataConductor is an interactive enterprise yield management solution for the semiconductor industry. With dataConductor, semiconductor manufacturers can collect data from diverse, global manufacturing systems and combine them into a single warehouse to manage yields during data characterization, yield ramp and volume production.The dataConductor platform is a comprehensive enterprise yield management system built upon our high-performance dC Warehouse. dataConductor features an optimized Oracle database, standard and custom data parsers, and a full suite of analysis capabilities that can be tailored to your particular environment.
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Product
Fast Response Gas Detector
Leaksurveyor
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Teledyne Gas & Flame Detection
The GMI Leaksurveyor combines quality, ruggedness and advanced Technology in a user friendly, portable gas detector. The integral fast response and high sensitivity semiconductor sensor enables leakage surveys to be performed and distribution leaks to be quickly found.
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Product
PXI Switched Guard Reed Relay Module, 13x SPST
40-121-002
Reed Relay
The 40-121-002 provides 13x SPST switches in a single slot PXI module and designed to provide an isolation resistance in excess of 1013Ω. It has been designed to ensure high isolation resistance through the use of switched guards, making it ideal for low level measurements and semiconductor test.
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Product
Low Noise Amplifiers
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RPG Low Noise Amplifiers are developed and manufactured using the most modern discrete components and thin film technologies, in order to cover the frequency range 50 to 350 GHz. With improved DC-supply and modern semiconductors these amplifiers not only deliver low noise performance but also broad operating bandwidth and gain flatness. These low-noise amplifiers are available as a standard product and on request as customized manufactured product.
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Product
X-Ray Inspection System
MXI Quadra 5
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Quadra™ 5 is the X-ray inspection system of choice for sub micron applications such as PCB and semiconductor package inspection, counterfeit component screening and finished goods quality control.
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Product
Semiconductors
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Multiphysics Analysis Solutions for Chips and 3D IC Systems. Ansys cloud-native solutions provide unparalleled capacity to speed up completion times for even the largest finFET integrated circuits (IC) and 3D/2.5D multi-die systems. These powerful multiphysics analysis and verification tools reduce power consumption, improve performance and reliability, and lower project risk with foundry-certified golden signoff verification.
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Product
Streak Camera
OptoScope S3C-1
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The S3C-1 is a streak camera based on a semiconductor sensor. Like tube-based streak cameras, the S3C-1 captures changes in light along a line and records the change over time. To record the intensity values, they are sampled and stored with up to 2 GSamples/sec. The line is 65 µm wide and consists of 200 elements along its 5 mm length. Each element consists of a sensitive photodiode with a downstream amplifier.A new and special camera feature is continuous recording. This makes it possible to take recordings of events for which precise information about the time of their occurrence only becomes available after they have taken place. This "post-triggering" simplifies or allows certain applications.
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Product
Nand Flash Tester
NplusT
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NplusT was created in December 2002 by Tams Kerekes' 20-years experience in the field of electrical semiconductors and reliability testing.The company started with the sales representation of semiconductor equipment and consumable suppliers. In the meantime, qualified engineering services, linked to the represented products, were provided in Europe.In 2003 NplusT started to market "RIFLE", the non-volatile memory engineering tester, and related services. In a few years, this product has become a reference platform for many memory makers.In 2005 Liliom Laboratories, a Hungarian software development company, merged into NplusT. Thanks to this operation, the company became leader in the test data collection and processing segment.From 2008 a dominant portion of NplusTs turn-over derived from licensing software products. Today almost every European along with several Far East semicon companies license our software products and make use of qualified engineering services.From 2011, NplusT provides turn-key solutions for device testing and characterization, including hardware, software and support.
