Semi-conductor
active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.
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Product
5.0 MP NVIDIA® Jetson Nano™ Camera
E-CAM50_CUNANO
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e-CAM50_CUNANO is a 5.0 MP 2-lane MIPI CSI-2 fixed focus color camera for NVIDIA® Jetson Nano™ developer Kit. This camera is based on 1/2.5" AR0521 CMOS Image sensor from ON Semiconductor® with built-in Image Signal Processor (ISP). This powerful ISP helps to brings out the best image quality from the sensor and making it ideal for next generation of AI devices.
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Product
Semiconductor
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PackageFunctionSMV(2.9mm*2.8mm)AND GateUSV(2.0mm*2.1mm)NAND GateFM8(5.0mm*4.5mm)NOR GateSM8(2.9mm*4.0mm)OR GateUS8(2.0mm*3.1mm)INVERTER
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Product
Rebuilt Testers
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Lorlin® manufacturers New and Rebuilt Discrete Component Semiconductor Test Systems for Transistors, Diodes, Zeners, Fets, IGBTs, SCRs, Triacs, Optos, Small Signal and Power Semiconductors. We measure, screen, test, analyze, characterize and sort the critical parameters of semiconductors devices including Leakage Current, Breakdown Voltage, Gain, Saturation Voltages, and offer a comprehensive test parameter library with an easy to use Windows based applications software. The systems us a Windows 10® 64-BIT Operating System with a USB 2.0 Interface. Engineering excellence, innovation, creativity and cutting edge technology has made Lorlin equipment well known for testing discrete components.
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Product
BHF Concentration Monitor
CS-137
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The CS-137 is a high-precision chemical solution concentration monitor designed to meet the strict demands of semiconductor wet-etching processes.
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Product
Semiconductor Optical Amplifier
SOA
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Amonics SOA is a polarization maintaining optical amplifier with high fiber-to-fiber gain. It is designed for transmitter applications to increase optical launch power to compensate for the loss of other optical devices. The benchtop version incorporates a user-friendly front panel housing a LCD monitor display, key switch, power control knob and optical connectors. RS232 computer interface is also equipped on the rear panel. 1MHz with 10ns pulse width intensity modulation is available. The OEM module version is an ideal building block for OEM system integration, especially in optical communication network and CATV applications. It requires only a single +5V power supply.
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Product
Semiconductor Test
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Smiths Interconnect’s test socket and probe card solutions utilize IDI contact technology to ensure superior quality and reliability in semiconductor test applications. Our best-in-class engineering, development and technical expertise ensure support of automated, system level and development test platforms.
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Product
Dimensional Metrology
Stand-Alone Metrology Family
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Nova’s stand-alone metrology platforms are utilized to characterize critical dimensions such as width, shape and profile with high precision and accuracy and are used in multiple areas of the fab such as photolithography, etch, CMP and deposition in the most advanced technology nodes, across all semiconductor leading customers.
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Product
Semiconductor Curve Tracer
CS-10000 Series
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This optional unit minimizes parameter variation on devices causedby heat. Pulse rise time can be configured for 1, 3, or 5ms; pulse duration from 1ms to 20ms; and pulse interval from 100ms to 2 seconds. This option is installed at the factory. Any changes desired after purchase will require return the unit back to IWATSUfactory.
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Product
Non-Contact Chemical Concentration Monitor
CS-900
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In order to fulfil the tight chemical concentration control required in semiconductor WET process, HORIBA realizes higher functionality to meet the needs by designing compact equipment while maintaining stable measurement and carrying out operator safety through its original sensor design.
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Product
On-Wafer Measurements
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Accurate DC/CV (and RF) statistical modeling of semiconductor devices requires collecting a significant amount of measured data from different wafers across several temperatures. Keysight Technologies recommends IC-CAP WaferPro as a turn-key DC/CV and RF automated characterization solution to help modeling and device engineers achieve more efficient on-wafer measurements across temperature. This new breakthrough solution is based on IC-CAP modeling software and efficiently controls DC/CV analyzers, network analyzers, probers, switching matrixes, and temperature chucks, as well as the powerful 407x and 408x Series of Keysight parametric testers.
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Product
3.4 MP Autofocus Low Light USB Camera Board With Liquid Lens
See3CAM_30
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See3CAM_30 is a 3.4MP UVC Compliant, low light, autofocus USB camera with liquid lens. It is a two-board solution with AR0330 CMOS image sensor from ON Semiconductor and USB 3.1 Gen1 type C interface board. See3CAM_30 is a colour camera with S-mount lens holder and does not require any special camera drivers to be installed in the host PC. See3CAM_30 is customizable and it is a Ready-to-Manufacture camera with all the necessary firmware built in and compatible with the USB Video Class (UVC). It consumes less power and doesn't heat up. There is no mechanical movement like in VCM motor for autofocus. Hence the life of the lens increases.
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Product
Semiconductor Testing
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Teradyne’s semiconductor test portfolio is transforming the way you test chipsets for automotive, industrial, communications, consumer, smartphones, and computer and electronic game applications. Semiconductor devices span a broad range of functionality, from very simple low-cost devices such as appliance microcontrollers, operational amplifiers or voltage regulators to complex digital signal processors and microprocessors as well as memory devices.
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Product
Two Phase AC Motor Drive
MS 2014
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Excellent High Speed Response. With help of semiconductor high end motion control algorithm and advanced common gain concept, a high speed response is achieved, therefore satisfying all motion control needs. Built-in Accuracy Improvement Features. Drive include features to improve total positioning accuracy of the mechanical system.
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Product
Programmable Parametic Tester
IST 878
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IST Information Scan Technology, Inc.
The IST 878 is a low cost test instrument that provides in-circuit or out-circuit testing for a wide range of discrete semiconductors
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Product
CD Measurement and Advanced Film Analysis
FilmTek CD
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Scientific Computing International
SCI’s leading-edge solution for fully-automated, high-throughput CD measurement and advanced film analysis for the 1x nm design node and beyond. Delivers real-time multi-layer stack characterization and CD measurement simultaneously, for both known and completely unknown structures. Patented multimodal measurement technology meets the challenging demands associated with the most complex semiconductor design features in development and production.
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Product
Flexible Test And Scan Solution For FFC Devices
Ismeca NY32W
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32-position turret test and scan platform for semiconductors on film-frame wafer media, providing the highest inspection yield for WLCSP and Bare Dies. Integrating innovative hardware and software technologies such as intelligent features that enable extended autonomous operation and productivity.
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Product
4K Multi-Camera System (TRICAM)
E-CAM130_TRICUTX2
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e-CAM130_TRICUTX2 (TRICamera) is a multiple camera solution for NVIDIA® Jetson TX2 developer kit that consists of three 13 MP 4-Lane MIPI CSI-2 camera board and an base board to interface with the J22 connector on the Jetson TX2. Each camera is based on the camera module e-CAM137_CUMI1335_MOD, 1/3.2" AR1335 color CMOS image sensor from ON Semiconductor® and integrated high performance Image Signal Processor (ISP).
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Product
Schottky Mixer and Detector Diodes
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Macom Technology Solutions Holdings Inc.
Schottky diodes are majority carrier diodes formed by plating a layer of metal on a layer of doped semiconductor, which forms a rectifying junction. The type of metal and the type of dopant in the semiconductor determines the diode’s barrier height, which is a measure of the amount of energy required to force the diode into forward conduction. MACOM produces Si Schottky diodes as well as GaAs Schottky diodes for use as signal detectors or in frequency mixers.
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Product
Semiconductor / FPD Inspection Microscope
MX61L
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Motorized Microscope for 300mm dia. Wafer/17 inch Glass Substrate use Reflected/Transmitted Illumination.
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Product
RF & Microwave Signal Generator
SMA100B
Microwave Signal Generator
The R&S®SMA100B RF and microwave signal generator delivers uncompromising maximum performance. It provides the purest output signals while maintaining the highest output power levels with the lowest harmonics, far outpacing the competition. As the world's leading signal generator, it can handle the most demanding module and system T&M tasks in the RF semiconductor, wireless communications, aerospace and defense industries.
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Product
Long Neck Combustible Gas Leak Detector
CD100A
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UEi Test & Measurement Instruments
The CD100A is the service persons tool designed to detect combustible gas leaks in residential and small commercial applications. Semiconductor sensor responds instantaneously to all combustible gases. The easily adjusted, steady tic rate provides a precise indication of the leak source. The CD100A can be used in tight quarters where others might not fit.
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Product
Transmission Line Pulse Testing
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Transmission Line Pulse testing, or TLP testing, is a method for semiconductor characterization of Electrostatic Discharge (ESD) protection structures. In the Transmission Line Pulse test, high current pulses are applied to the pin under test (PUT) at successively higher levels through a coaxial cable of specified length. The applied pulses are of a current amplitude and duration representative of the Human Body Model (HBM) event (or a Charged Device Model – CDM – event in the case of Very Fast TLP, or VF-TLP).
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Product
Scanning Magnetic Microscope
Circuit ScanTM 1000
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Operating circuits within a semiconductor generate external magnetic fields near the surface of the device. These magnetic fields, while weak in strength, contain information about the spatial variation of current density flowing within the circuit. Micro Magnetics has developed the CS1000 to make practical use of this information and provide engineers with valuable information about what is going on inside circuitry non-destructively.
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Product
1/2.5" 5.0 MP Low Noise USB Camera (Color)
See3CAM_CU55
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See3CAM_CU55 is a 5.0MP USB3.1 Gen1 UVC Color Camera with S-mount (also known as M12 board lens) lens holder. It is a two-board solution containing camera sensor board based on 1/2.5" AR0521 image sensor from ON Semiconductor and USB3.1 Gen 1 Interface board. The powerful on-board Image Signal Processor (ISP) brings out the best image quality of this 2.2micron pixel 5MP AR0521 CMOS image sensor making it ideal for next generation of high resolution surveillance, biomedical instruments and biometric authentication applications.
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Product
C-V Plotters
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Materials Development Corporation
MDC will tailor your CSM/Win Semiconductor Measurement System for your exact requirements. Choose the best capacitance meter, output device, and probe station for your needs. All CSM/Win C-V plotters feature the latest Dell Computers. The computer and capacitance meters are rackmounted in one compact enclosure. When ordered with a hot chuck or probe station, MDC can deliver a turnkey system of unparalleled performance.
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Product
3.4 MP Custom Lens Low Light Camera Module
e-CAM30_CUMI0330_MOD
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e-CAM30_CUMI0330_MOD is a high performance, small form factor, 3.4 MP pluggable Low Light Camera Module with S-Mount lens holder. It is based on AR0330 - a 3.4MP CMOS Image sensor from ON Semiconductor®. It has a dedicated, high-performance Image Signal Processor chip (ISP) on-board that performs the entire Auto functions (Auto White Balance, Auto Exposure control) in addition to complete image signal processing pipeline that provides best-in-class images, videos and the optional MJPEG compressions.
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Product
Semiconductor Automation
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Brooks' years of experience providing application-specific solutions backed by unparalleled technology leadership, industry expertise.
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Product
Calibration Services
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For over 25 years, OAI (Optical Associate Inc.), is the leader in NIST traceable calibration of instruments for measuring Ultra Violet (UV) light. Originally designed to meet the demanding needs of the semiconductor wafer fabrication industry, OAI developed the most repeatable NIST traceable calibration in the industry.
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Product
Turret Test And Scan Handlers
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Turret platforms for semiconductor test, inspection and packaging.
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Product
Trace Gas Monitor
GA-370
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For monitoring quality control of manufactured high-purity gases at air separation and semiconductor plantsGA-370 provides constant, ultrahigh-sensitivity and high-precision monitoring of trace impurities (CO, CO2 and CH4) for quality control at gas manufacturing facilities.
