Si
atomic number 14 tetravalent metalloid chemical element.
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Product
Testing for Si Solar Cells Using High Performance CCD
EL Imaging Tester
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EL Testing for Si Solar Cells using High Performance CCD. The determination of luminescence (photo emissions) in solar cells is an important characterization tool. Typical solar cells often have defects which limit the efficiency or lifetime of a cell. Many of these defects are visualized with Luminescence Imaging. By using this technique, the manufacturing process can be optimized to produce better cells. Luminescence Imaging takes advantage of the radiative inter-band recombination of excited charge carriers in solar cells. The emitted photons can be captured with a sensitive CCD camera to obtain an image of the distribution of the radiative recombination in the cell. This distribution is determined by the local excitation level, allowing the detection of electrical losses, thus mapping the diffusion length of minority carriers as the emitted light is low intensity and in the near infra-red range, the CCD camera has a high sensitivity wavelength from 900 to 1100 nm with little thermal noise. This CCD camera provides excellent resolution of 1024 x 1024 pixels with a large 1μm pixel size, multi-megahertz readout speed, and robust USB 2.0 connectivity. The EL CCD Camera is the ultimate high-performance CCD camera for electroluminescence and photoluminescence imaging for Photovoltaic (PV) Cells and Modules. This camera combines low noise electronics and optimal sensitivity in NIR.
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Product
Si Detectors & Spectrometers
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Baltic Scientific Instruments, Ltd
X-ray spectrometers based on Si detectors with liquid nitrogen cooling, Peltier and electric machine cooling. The spectrometers are applied in the various systems for element analysis: X-ray fluorescent; electron probe; with alpha and beta excitation etc, as well as for the precision diffractometry in the devices of structural and phase analysis.
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Product
Resister
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Our ARFC type Film Flat Chip Resistor & ARFCN type Thin Film Chip Resistor Network are high precision Metal Film resistors produced with high purity. Alumina Substrate and Ni-Cr-Si Resistor Film based on high precision Etching Technology. The electrode Terminals are made with Spattering Film and Nickel-Solder Plating, and solderability is very good in all Flow, Reflow and Dipping type soldering for Hybrid IC, SMT, PCB etc. Our ARFC Metal Film Resistor & ARFCN type Thin Film Chip Resistor are being produced under the thorough quality control, and are being used widely in high precision and high reliability electronics circuit such as Measuring Instrument, Medical Instruments, Communication and other Industrial Instruments.
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Product
IV Tester System
PET-CC
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Application ■Mono crystalline silicon (Si) ■Multi crystalline silicon (mc-Si) ■Amorphous silicon (a-Si) ■Gallium arsenide (GaAs) ■Gallium indium arsenide (GaInAs)
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Product
Flow Calibration
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Trescal provides full Flow Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Flow Calibration services can be delivered at your site or at our lab. Accreditations for our flow calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
Electrical Calibration
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Trescal provides full Electrical Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Electrical Calibration services can be delivered at your site or at our lab. Accreditations for our electrical calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
Process EDXRF Spectrometer
NEX LS
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Applied Rigaku Technologies, Inc
Featuring advanced third generation EDXRF technology, the Rigaku NEX LS represents the next evolution of scanning multi-element process coatings analyzers for web or coil applications. To deliver superior analytical performance and reliability, the EDXRF measuring head assembly was derived from the established Rigaku NEX Series high-resolution benchtop instrumentation. With this proven technology, the Rigaku NEX LS delivers rapid, non-destructive, multi-element analyses — for coat weight, coating thickness and/or composition — for elements from aluminum (Al) through uranium (U). The measuring head is mounted on a rigid beam and is equipped with a linear traversing mechanism positioned over a roller so that the head-to-surface distance is constant. Common applications include silicone release coaters, converters, denesting Si for vacuum-formed plastics, RoHS compliance, conversion coatings, metalized plastic, top coatings on metal coil and fire retardants on fabric.
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Product
Spectrometer
VIS-NIR
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Wavelength range is 420 nm to 1100 nm with 4 nm resolutionHD Volume Phase Holographic GratingBack-thinned Si CCD with low noise electronicsExtreme low stray light and high transmissionShort acquisition time and high SNR spectraTEC cooling option availableBluetooth option availableFiber coupled or free spaceOEM Solution
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Product
Chemical Calibration
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Trescal provides full Chemical Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Chemical Calibration services can be delivered at your site or at our lab. Accreditations for our chemical calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
Medical Device Calibration
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Trescal provides full Medical Device Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Medical Device Calibration services can be delivered at your site or at our lab. Accreditations for our medical device calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
NRZ Analysis for Signal Integrity Studio, WavePulser 40iX High-Speed Interconnect Analyzer
WAVEPULSER-SI-STUDIO-NRZ
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Signal Integrity (SI) Studio uses SDA Expert (SDAX) serial data analysis software options to simplify NRZ or PAM serial data jitter, eye diagram, noise and crosstalk measurement and analysis setup.
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Product
Accelerometry Calibration
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Trescal provides full Accelerometry Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Accelerometry Calibration services can be delivered at your site or at our lab. Accreditations for our accelerometry calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
Scanning Slit Beam Profilers
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DataRay manufactures two types of scanning slit beam profilers: the patented BeamMap series, which offers real-time M², divergence, focus and alignment management, and the Beam’R series which provides affordable, compact, and precise beam profiling. All of our scanning slit beam profilers are available with Si, Ge, and InGaAs detectors, covering wavelengths from 190 nm to 2500 nm.
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Product
Magnetic Susceptibility Meter
SM-20
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The SM-20 magnetic susceptibility meter is very useful tool for a number of geological and geophysical applications where the unique sensitivity of 10-6 SI units together with its small, shirt-pocket size and low weight are appreciated.
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Product
Single Port Serial Interface
APCI-7300-3
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*PCI interface to the 32-bit data bus. *Asynchronous communication adapter, 1-port serial interface*1 socket for SI modules*Modular structure through SI modules*Configurable as: RS232, RS422, RS485, with or without isolation, or 20 mA Current Loop (active, passive) with isolation*Addressing through software
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Product
General Purpose Geiger Counter
Radalert® 100X
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The Radalert® 100X is a general purpose geiger counter that measures alpha, beta, gamma, and X-radiation. Features of the Radalert® 100X, include a three-second update and a Utility Menu that allows you to change the default settings for several operating parameters. Its digital liquid crystal display (LCD) shows the current radiation level in your choice of SI units (microsieverts per hour) from .000 to 1,100 and counts per minute (CPM) from 0 to 350,000 or counts per second (CPS) from 0 to 3,500. For users of conventional units mR/hr (milliroentgens per hour) from .000 to 110 and CPM are optional in the Utility Menu. This instrument also offers an accumulated total and timer function, up to 9,999,000 counts and 40 hours.
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Product
High Purity Germanium (HPGe) Radiation Detectors
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Semiconductor based photon radiation detectors have been evolving for over half a century, with ORTEC pioneering commercial availability for a majority of that time. Initial offerings were based around lithium-drifted germanium Ge(Li) and lithium-drifted silicon Si(Li). Ge(Li) was later replaced with more advanced, high purity germanium (HPGe) detectors. ORTEC provides a comprehensive suite of HPGe detector solutions covering an extensive range of energies and for a variety of applications.
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Product
RF Front-end
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The RF integrated passive device (RF IPD) uses a high-resistivity substrate to integrate quality factor components such as capacitors and indictors. Many functions like impedance matching networks, harmonic filters, couplers, baluns, and power combiners/splitters can be designed using IPD technology. ST's IPDs are manufactured using thick film and HiRes Si or glass wafer manufacturing technology and photolithography processing.
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Product
Pressure Calibration
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Trescal provides full Pressure Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Pressure Calibration services can be delivered at your site or at our lab. Accreditations for our pressure calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
4-Port Serial Interface, Modular, With/Without Optical Isolation, 3.3V
CPCI-7500
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*This Model has a 37-pin D-Sub male connector*RS232, RS422, RS485, 20 mA Current Loop*Modular structure through SI modules*With or without optical isolation*Mode configuration free for each port*128-byte FIFO-buffer, common interrupt*Transfer rate programmable up to 115,200 Baud*Option: up to 1 MBaud for RS485 and RS422*Automatic direction recognition for RS48*Mode: configurable RS232, RS422, RS485, 20 mA Current Loop (active, passive) with or without isolation (SI modules)*Transmission mode asynchronous, full, half duplex*Transfer rate: progr. up to 115.2 kBaud up to 1 MBaud on request*Protocol: 5, 6, 7 or 8-bit character 1, 1? or 2 stop bits*Parity: even, odd, none, mark or space*Interrupt lines: automatic through BIOS
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Product
GaN Power Amplifiers > 5W
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Macom Technology Solutions Holdings Inc.
MACOM GaN RF power amplifier solutions are designed with the latest GaN-on-SiC and GaN-on-Si technologies. Our MACOM PURE CARBIDE series of GaN-on-SiC power amplifiers offers high performance and reliability for the most demanding applications. Our expanding GaN portfolio is designed to address the challenging requirements of Aerospace & Defense, Industrial, Scientific and Medical applications and 5G wireless infrastructure. MACOM GaN products deliver output power levels ranging from 2 W to over 7 kW and exhibit best in class RF performance with respect to gain and efficiency. For sensitive Aerospace & Defense applications MACOM can offer a US only supply chain with AS9100D Certification.
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Product
RS422 Mode SI-module With Optical Isolation
MX422-G
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RS422 mode SI-module with optical isolation
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Product
Viscometry
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SI Analytics, a brand of Xylem, formerly SCHOTT® Geräte and SCHOTT® Instruments, is a world-renowned manufacturer of glass capillary viscometers and automatic viscometry meters.
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Product
RS485 Mode SI-module With Optical Isolation
MX485-G
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RS485 mode SI-module with optical isolation
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Product
FCB Probe Card
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The FCB Probe Card is the most mature technology of buckling beam probe card. It is aimed to achieve the semiconductor ship manufacture time-to-market (TTM) and cost of test (COT) demand. FCB is a proven solution for a variety of semiconductor production tests from early engineering pilot-runs to high volume manufacturing (HVM). FCB is ready for device requiring high signal integrity probing (SI) and/or power integrity probing (PI). Applications include cutting-edge SiPs/SoCs, WLP, graphic processors, micro processor, industrial microcontrollers, and more. FCB guarantees the world’s best overall cost-of-ownership (COO) for various DUT applications.
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Product
DVB / MPEG Stream Analyzer program
dvbsnoop
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dvbsnoop is a DVB / MPEG stream analyzer program, which enables you to watch (live) stream information in human readable form. Its purpose is to debug, dump or view digital stream information (e.g. digital television broadcasts) send via satellite, cable or terrestrial. Streams can be SI, PES or TS. Basically you can describe dvbsnoop as a "swiss army knife" analyzing program for DVB, MHP, DSM-CC or MPEG
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Product
Volume Calibration
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Trescal provides full Volume Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Volume Calibration services can be delivered at your site or at our lab. Accreditations for our volume calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
Seismometers
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SI value, the so called “velocity response spectrum”, is one of the standards to express an earthquake''s destructive power against structures. SW-74SI is an advanced model equipped with alarm output to 10-step and SI value output.
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Product
MPI PCB Probe Systems
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MPI Advanced Semiconductor Test
Every MPI manual probe systems can be configured with a variety of different holders for printed circuit boards (PCB’s) in order to provide in addition to on-wafer, versatile, convenient, and accurate Signal Integrity (SI) measurements with single-ended or differential RF probes. Measuring signals at the end of the channel for eye-patterns, deterministic jitter, distortion, TDR (Time Domain Reflectometry) impedance, cross-talk, coupling, and losses, or even S-parameters is easily accomplished.
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Product
Wafer Flatness Measurement System
FLA-200
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*Measures Thickness, TTV, Bow, Warp and site and global Flatness (ASTM compliance)*Measures all materials including Si, GaAs, Ge, InP, SiC*Full 500 micron thickness measurement range without re-*calibration2-D /3-D Mapping software
