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Si
atomic number 14 tetravalent metalloid chemical element.
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High Purity Germanium (HPGe) Radiation Detectors
Semiconductor based photon radiation detectors have been evolving for over half a century, with ORTEC pioneering commercial availability for a majority of that time. Initial offerings were based around lithium-drifted germanium Ge(Li) and lithium-drifted silicon Si(Li). Ge(Li) was later replaced with more advanced, high purity germanium (HPGe) detectors. ORTEC provides a comprehensive suite of HPGe detector solutions covering an extensive range of energies and for a variety of applications.
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Accelerometry Calibration
Trescal provides full Accelerometry Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Accelerometry Calibration services can be delivered at your site or at our lab. Accreditations for our accelerometry calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Flow Calibration
Trescal provides full Flow Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Flow Calibration services can be delivered at your site or at our lab. Accreditations for our flow calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Single Port Serial Interface
APCI-7300-3
*PCI interface to the 32-bit data bus. *Asynchronous communication adapter, 1-port serial interface*1 socket for SI modules*Modular structure through SI modules*Configurable as: RS232, RS422, RS485, with or without isolation, or 20 mA Current Loop (active, passive) with isolation*Addressing through software
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NRZ Analysis for Signal Integrity Studio, WavePulser 40iX High-Speed Interconnect Analyzer
WAVEPULSER-SI-STUDIO-NRZ
Signal Integrity (SI) Studio uses SDA Expert (SDAX) serial data analysis software options to simplify NRZ or PAM serial data jitter, eye diagram, noise and crosstalk measurement and analysis setup.
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Schottky Mixer and Detector Diodes
Macom Technology Solutions Holdings Inc.
Schottky diodes are majority carrier diodes formed by plating a layer of metal on a layer of doped semiconductor, which forms a rectifying junction. The type of metal and the type of dopant in the semiconductor determines the diode’s barrier height, which is a measure of the amount of energy required to force the diode into forward conduction. MACOM produces Si Schottky diodes as well as GaAs Schottky diodes for use as signal detectors or in frequency mixers.
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FCB Probe Card
The FCB Probe Card is the most mature technology of buckling beam probe card. It is aimed to achieve the semiconductor ship manufacture time-to-market (TTM) and cost of test (COT) demand. FCB is a proven solution for a variety of semiconductor production tests from early engineering pilot-runs to high volume manufacturing (HVM). FCB is ready for device requiring high signal integrity probing (SI) and/or power integrity probing (PI). Applications include cutting-edge SiPs/SoCs, WLP, graphic processors, micro processor, industrial microcontrollers, and more. FCB guarantees the world’s best overall cost-of-ownership (COO) for various DUT applications.
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1.3 Million Pixel CMOS Image Sensor
Sapphire 1.3M
This 1.3 million pixel Sapphire CMOS image sensor, designed on Teledyne e2v’s proprietary Eye-On-Si CMOS imaging technology, is ideal for diverse applications where superior performance is required. The innovative pixel design offers excellent performance in low-light conditions with both electronic rolling shutter and electronic global shutter, with a high-readout speed of 60 fps in full resolution. Novel industrial machine vision application features such as multi ROI and histogram output are embedded on-chip. Very low power consumption enables this device to be used in battery powered applications.
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General Purpose Radiation Survey Meter/Geiger Counter
Rad 100™
The RAD 100™ is a general purpose radiation survey meter/geiger counter that detects and measures alpha, beta, gamma, and X-radiation. It is intended for personal safety and educational purposes. Like the popular Radalert® 100X, the RAD 100™ features a 3-second update on its digital liquid crystal display (LCD). The LCD shows the current radiation level in your choice of microSieverts per hour (SI units) or mR/hr for gamma radiation measurements. For mixed sources (alpha, beta, gamma) the CPM mode is recommended. This instrument also offers an accumulated total and timer function, up to 9,999,000 counts and 40 hours. A red LED blinks and a beeper chirps with each count (the chirp can be muted). This is a professional instrument that is also easy to learn to use and to operate, and carries the industry leading Medcom warranty (2 years overall limited to 1 year on the GM sensor). Many instruments designed by the Medcom team are still working perfectly after 30 years of use, so this instrument should provide a lifetime of useful information.
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Avalanche Photodiodes
Excelitas offers Avalanche Photodiodes (APDs) on both Silicon (Si) and InGaAs materials. Si APDs cover the spectral range of 400 nm to 1100 nm and the InGaAs APDs cover 950 nm to 1550 nm. An Avalanche Photodiode (APD) provides higher sensitivity than a standard photodiode and is for extreme low-level light (LLL) detection and photon counting.
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16-element Si photodiode array
S12362-321
The S12362/S12363 series is a back-illuminated type 16-element photodiode array specifi cally designed for non-destructive X-ray inspection. These are modified versions of our previous products (S11212 series: 1.575 mm pitch). The pitch has been changed to 2.5 mm. The back-illuminated photodiode array is also simple to handle and easily couples to scintillators without having to worry about wire damage because there are no bonding wires and photosensitive areas on the back side.
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1600x1200 Pixel Sapphire CMOS Image Sensor
Sapphire 2M
This 1,600 x 1,200 pixel Sapphire CMOS image sensor, designed on Teledyne e2v’s proprietary Eye-On-Si CMOS imaging technology, is ideal for diverse applications where superior performance is required. The innovative pixel design offers excellent performance in low-light conditions with both electronic rolling shutter and electronic global shutter, with a high-readout speed of 50/60 fps in full resolution. Novel industrial machine vision application features such as multi ROI, histogram outputs and 3D range gating are embedded on-chip.
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IV Tester System
PET-CC
Application ■Mono crystalline silicon (Si) ■Multi crystalline silicon (mc-Si) ■Amorphous silicon (a-Si) ■Gallium arsenide (GaAs) ■Gallium indium arsenide (GaInAs)
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GaN Power Amplifiers > 5W
Macom Technology Solutions Holdings Inc.
MACOM GaN RF power amplifier solutions are designed with the latest GaN-on-SiC and GaN-on-Si technologies. Our MACOM PURE CARBIDE series of GaN-on-SiC power amplifiers offers high performance and reliability for the most demanding applications. Our expanding GaN portfolio is designed to address the challenging requirements of Aerospace & Defense, Industrial, Scientific and Medical applications and 5G wireless infrastructure. MACOM GaN products deliver output power levels ranging from 2 W to over 7 kW and exhibit best in class RF performance with respect to gain and efficiency. For sensitive Aerospace & Defense applications MACOM can offer a US only supply chain with AS9100D Certification.
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Scanning Slit Beam Profilers
DataRay manufactures two types of scanning slit beam profilers: the patented BeamMap series, which offers real-time M², divergence, focus and alignment management, and the Beam’R series which provides affordable, compact, and precise beam profiling. All of our scanning slit beam profilers are available with Si, Ge, and InGaAs detectors, covering wavelengths from 190 nm to 2500 nm.
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Wafer Flatness Measurement System
FLA-200
*Measures Thickness, TTV, Bow, Warp and site and global Flatness (ASTM compliance)*Measures all materials including Si, GaAs, Ge, InP, SiC*Full 500 micron thickness measurement range without re-*calibration2-D /3-D Mapping software
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Lux Meters
Lux meter is used for measuring illuminances in work places.The lux is the SI unit of illuminance and luminous emittance. It is used in photometry as a measure of the apparent intensity of light hitting or passing through a surface.
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Testing for Si Solar Cells Using High Performance CCD
EL Imaging Tester
EL Testing for Si Solar Cells using High Performance CCD. The determination of luminescence (photo emissions) in solar cells is an important characterization tool. Typical solar cells often have defects which limit the efficiency or lifetime of a cell. Many of these defects are visualized with Luminescence Imaging. By using this technique, the manufacturing process can be optimized to produce better cells. Luminescence Imaging takes advantage of the radiative inter-band recombination of excited charge carriers in solar cells. The emitted photons can be captured with a sensitive CCD camera to obtain an image of the distribution of the radiative recombination in the cell. This distribution is determined by the local excitation level, allowing the detection of electrical losses, thus mapping the diffusion length of minority carriers as the emitted light is low intensity and in the near infra-red range, the CCD camera has a high sensitivity wavelength from 900 to 1100 nm with little thermal noise. This CCD camera provides excellent resolution of 1024 x 1024 pixels with a large 1μm pixel size, multi-megahertz readout speed, and robust USB 2.0 connectivity. The EL CCD Camera is the ultimate high-performance CCD camera for electroluminescence and photoluminescence imaging for Photovoltaic (PV) Cells and Modules. This camera combines low noise electronics and optimal sensitivity in NIR.
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Pressure Calibration
Trescal provides full Pressure Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Pressure Calibration services can be delivered at your site or at our lab. Accreditations for our pressure calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Temperature Calibration
Trescal provides full Temperature Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Temperature Calibration services can be delivered at your site or at our lab. Accreditations for our temperature calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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KV CAPS
1000 V
Macom Technology Solutions Holdings Inc.
The MACOM KV CAPS™ Si high voltage capacitors feature very high working voltage ratings, very low loss and excellent stability by virtue of their novel internal construction and very high-quality dielectric layers. These capacitors are available in surface mount (SMT) plastic packages or in hermetic ceramic packages.
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Medical Device Calibration
Trescal provides full Medical Device Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Medical Device Calibration services can be delivered at your site or at our lab. Accreditations for our medical device calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Volume Calibration
Trescal provides full Volume Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Volume Calibration services can be delivered at your site or at our lab. Accreditations for our volume calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Si Detectors & Spectrometers
Baltic Scientific Instruments, Ltd
X-ray spectrometers based on Si detectors with liquid nitrogen cooling, Peltier and electric machine cooling. The spectrometers are applied in the various systems for element analysis: X-ray fluorescent; electron probe; with alpha and beta excitation etc, as well as for the precision diffractometry in the devices of structural and phase analysis.
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AAA Solar simulator
SS50AAA-PLC
Application ■Mono crystalline silicon (Si) ■Multi crystalline silicon (mc-Si) ■Amorphous silicon (a-Si) ■Gallium arsenide (GaAs) ■Gallium indium arsenide (GaInAs) ■Gallium aluminum arsenide (GaAlAs) ■Gallium indium phosphite (GaInP)
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RF Front-end
The RF integrated passive device (RF IPD) uses a high-resistivity substrate to integrate quality factor components such as capacitors and indictors. Many functions like impedance matching networks, harmonic filters, couplers, baluns, and power combiners/splitters can be designed using IPD technology. ST's IPDs are manufactured using thick film and HiRes Si or glass wafer manufacturing technology and photolithography processing.
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Electrical Calibration
Trescal provides full Electrical Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Electrical Calibration services can be delivered at your site or at our lab. Accreditations for our electrical calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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KV CAPS
500 V
Macom Technology Solutions Holdings Inc.
The MACOM KV CAPSTM Si high voltage capacitors feature very high working voltage ratings, very low loss and excellent stability by virtue of their novel internal construction and very high-quality dielectric layers. These capacitors are available as unpackaged chips. The chips have gold bonding surfaces on both terminals to enable excellent bonding and minimum contact resistance.
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Acoustic Calibration
Trescal provides full Acoustic Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Acoustic Calibration services can be delivered at your site or at our lab. Accreditations for our acoustic calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Magnetic Calibration
Trescal provides full Magnetic Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Magnetic Calibration services can be delivered at your site or at our lab. Accreditations for our magnetic calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.