Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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PXI 2.5W Programmable Resistor Module, 4-Channel, 1Ω to 239Ω
40-251-113
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The 40-251-113 is a programmable resistor module with 4 channels which can be set between 1Ω and 239Ω with 1Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
In-Circuit Test System
TestStation LX
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TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.
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Product
Midirack - 120 x 60 x 80 cm
OTP2-Modul-Nr002
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The rack serves as the basic framework for your individually designed test system. Various OTP² modules can be installed in the 120 x 60 x 80 cm rack in order to meet the most varied of test requirements.The modular architecture of the OTP (Open Test Platform) is based on a flexible instrumentation matrix, LXI-based sources and measuring devices, combined with a high-quality transfer interface for connecting the test adapters. The systems can easily be expanded with customer- and application-specific functions. We use standardization to build cost-effective systems that still fit your requirements exactly.
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Product
Waveguide Harmonic Mixers (smart mixer), 60 to 90 GHz
M1970E
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The Keysight M1970E 60 to 90 GHz waveguide harmonic mixer is an un-preselected mixer that will extend the operating frequency range of the N9030A PXA, N9020A MXA,and N9010A EXA signal analyzers up to 90 GHz. Smart features are embedded to help you to greatly simplify your overall test setup and improve the DANL and TOI of your test system. Go smart with harmonic mixing for your millimeter-wave applications.
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Electronics Functional Test
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Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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Product
8-Channel 4-Quadrant Source Measurement Unit (SMU)
PXIe-9908
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The PXIe-9908 is a high-density SMU module designed for automated testing and mini/micro LED wafer probing applications. It supports precision sourcing and measurement up to ±100V and 100mA, with scalable configurations. With compatibility across major operating systems and programming languages, it delivers fast, accurate, and reliable testing performance tailored for automated test systems and next-generation display technologies.
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Miniature Vibration Test System
G-2 Series
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The G-2 Series Miniature Vibration Test System, though compact & handy, consists of a sweep oscillator, sine controller, power amplifier and vibration generator, thus suited to a variety of applications; calibration of sensors, standardized vibration tests for small parts, school teaching materials and modal analysis. The G-2002 is handy, with all the composed units being incorporated in a portable case.
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Flying Probe Testers
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Flying probe test systems require no test fixturing, have few restrictions on board access, and can test boards with virtually unlimited number of nets. These systems also allow developers to complete test programs in a short time.
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Product
PXI 2.5W Programmable Resistor Module, 4-Channel, 1.5Ω to 6.97kΩ
40-251-024
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The 40-251-024 is a programmable resistor module with 4 channels which can be set between 1.5Ω and 6.97kΩ with 2Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Test Systems & Sub-systems Development and Integration
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Research, development and the production of electronic test equipment, systems and subsystems for the industrial, scientific, and defense markets.
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PXI 10W Programmable Resistor Module, 1-Channel, 1.5Ω to 1.81kΩ
40-253-022
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The 40-253-022 is a programmable resistor module with 1 channel which can be set between 1.5Ω and 1.81kΩ with 0.5Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PXI High Density Precision Resistor Module, 3-Channel, 3.5Ω to 773kΩ
40-298-143
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The 40-298-143 is a high density programmable resistor module with 3 channels which can be set between 3.5Ω and 773kΩ with 1Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Electromagnetic anechoic box/Shield box/Anechoic chamber
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The necessity of a wireless system test has risen by the spread of recent wireless telecommunication equipment as shown in cellular phone, wireless LAN, RF-ID tag and ETC (Electronic Toll Collection system). It is necessary for a wireless test to be performed in anechoic environment in which an external noise is intercepted and a radio wave does not reflect internally. An anechoic chamber (room version of a shield box) is proper facilities but needs a wide space and a huge cost. Especially, the equipment under wireless system test on the production line can not radiate any signal radio wave outside before approval. The shield box satisfies these conditions.
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General Purpose Functional Test Systems
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Keysight Technologies’ TS-5000 Family of Electronics Functional Test Systems offers a wealth of choices in general purpose instruments, power supplies, switch loading and DIO capabilities in a multiple rack heights, seamlessly connected with open architecture software Test Exec SL, all immaculately assembled and thoroughly tested so you don’t have to.
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Test Workflow Standard
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Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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COMPUTERIZED LCRTZ TEST SYSTEM (Automatic Transformer Test System)
CVCT-S20
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Ideal for fast and fool proof testing of COILS AND SMALL TRANSFORMERS like SMPS transformers, Telecom transformers (HYBRID, POT CORE, RM-CORE), Pulse transformers etc. The systems scans at one stroke, all the windings of a transformer and tests as per definition of test procedure. The test procedure can be pre-programmed and stored under User friendly menu driven software . Any semi-skilled and unskilled person can be engaged for actual testing purpose. Can Select test frequency, pin number, parameters, test conditions, limits for each test. Test any pin to any other pin any defined parameter.Test Parameters :-> Inductance-> Capacitance-> AC Resistance, -> DC Resistance, -> Impedance, -> Leakage Inductance,-> Transformation Ratio & Winding PolaritySPECIFICATIONS :Measurement Frequencies : 50 Hz, 100 Hz, 500 Hz, 800 Hz; 1 KHz, 2 KHz, 5 KHz, 10 KHz. Measurement Voltage: 0.1 V – 1.0 V RMS adjustable under program control.
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Fire Control System
MS 1120
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PCI Based BTA is used to test FCC System Processor (8086) & Analog Boards. This system consists of a PC-AT, Digital Input / Output (DIO) Board and Analog Input / Output (AIO) Board to provide the necessary input/output signals to/from the board to be tested.
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MXI Computerized Tomography (CT) Option
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The Nordson TEST & INSPECTION µCT inspection option provides Computerized Tomography (CT) functionality to compliment the 2D X-ray investigations on Nordson TEST & INSPECTION X-ray inspection systems. It uses the superior, sub-micron feature recognition 2D x-ray images, that Nordson TEST & INSPECTION X-ray systems always provide, to produce the best CT models for 3D sample analysis, virtual micro-sectioning and internal dimensional measurements. It reduces the number of time-consuming micro-section analyses needed and / or assists in identifying where micro-section preparation and investigation must concentrate. Available with a system order or as retro-fit to suit application and workflow needs.
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PXI/PXIe MEMS RF Multiplexer, Quad 4-Channel, 4GHz, 50Ω, MCX
42-878-242
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The module is based on the latest micro-electromechanical system (MEMS) switching technology and has low insertion loss and VSWR. In addition, MEMS devices have a long operational life of >3 billion operations and benefit from an operating time of <20 μs allowing greater test system throughput. The multiplexers have excellent and repeatable RF characteristics beyond 4 GHz with each path having a nominally equal insertion loss.
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Product
SystemSolutions
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Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your yourdevice, not on your test system.
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Electrodynamic Shock Test System
FS SERIES
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The system can test the sensor and ECU for an airbag and also reproduce the shock by assuming an automotive collision and full-scale crash. The system can be incorporated into the production line for total inspection. It can maintain the operating quality of the airbag to make a contribution to lifesaving against a traffic accident.
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PXI Precision Resistor Module 6-Channel, 3 to 2.97M
40-297-051
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A simple solution for applications requiring accurate simulation of resistive sensors. The series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Backplane Test System
402HV
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Our model 402HV is the result of 25 years of high voltage / high pin count test systems experience. We produced our first high voltage system back in 1985. It was programmable up to 600 volts / 600 Mohms and had over 49,000 test points. It could test a 5k point board in less that 15 seconds. Since then we have built hundreds of high voltage test systems, with our highest voltage system capable of testing up to 2000 Volts DC / 1500 Volts AC. (One of our 600 volt systems, built in 1986 is still in operation testing boards for a defense contractor.)
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Exchangeable Test Fixture
MA 2112/D/H/S-7
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 11,30 kg
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Radio Frequency, Communications, & Navigation Test Systems
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Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
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Product
PCI Precision Resistor Card 4-Channel, 1.5Ω To 3.55kΩ
50-297-123
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The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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370MHz To 6GHz Radiation Measurement System
RMS-0460
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The MegiQ Radiation Measurement System (RMS) is a compact test system that performs 3-axis radiation pattern measurement in non-anechoic spaces.
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PCI Precision Resistor Card 9-Channel, 1.5Ω To 6.97kΩ
50-297-024
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The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
PXI-2546, 2.7 GHz, 50 Ω, Dual 4x1 PXI RF Multiplexer Switch Module
778572-46
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2.7 GHz, 50 Ω, Dual 4x1 PXI RF Multiplexer Switch Module—The PXI‑2546 is an RF signal multiplexer switch module. The multibank architecture of the PXI‑2546 makes it ideal for test systems that require parallel operations such as RF stimulus-response testing. The module also provides excellent insertion loss, voltage standing wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use the onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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Shielding Effectiveness/ Conductivity Test
EM-2107A | 30 MHz – 1.5 GHz
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The EM-2107A is a standard test fixture for evaluation of the electromagnetic shielding effectiveness of planar material. The fixture is an enlarged section of coaxial transmission line and complies fully with the requirements of ASTM test method D4935-1. The measured data relates to the shielding effectiveness due to a plane wave (far field EM wave) from which near field values for magnetic and electric fields may be inferred. The EM-2107A is provided with a reference standard test specimen, a dynamic range specimen. Dynamic range of greater than 80dB is achievable, although the cables and other test system components usually establishes the limiting factors.
