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Product
Fabric Drape Tester
TF118
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TESTEX Testing Equipment Systems Ltd.
Fabric Drape Tester, to measure and calculate the co-efficiency of drape of fabrics using image processing technology. It can be used to test the drape property of all kinds of fabrics
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Product
10 Gigabit Ethernet AdvancedTCA® Fabric Interface Switch Blade
aTCA-3430
Switch Blade
The aTCA-3430 is a high performance 10G Fabric switch blade for AdvancedTCAR platforms. This product is ideal for bandwidth intensive telecom applications such as wireless access controllers, DPI/security network, IPTV, IP multimedia subsystems, RNC/BSC, broadband access/bearer networks, data centers, and LTE/4G network applications. The aTCA-3430 provides 10GbE hub-to-node connectivity and integrated switch silicon that supports load balancing, priority queues, packet classification, and flow control to enable strict bandwidth management for implemented applications.
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Product
DIN75200 Interior Fabric Horizontal Burning Test Equipment
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Shenzhen Chuangxin Instruments Co., Ltd.
DIN75200 Interior Fabric Horizontal Burning Test Equipment
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Product
Fabric Tactile Tester
DRK549A
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Shandong Drick Instruments Co., Ltd.
Fabric feel style is not only one of the important evaluation indexes of textile comfort, but also an important factor affecting textile sales. Therefore, textile feel style measurement instrument has always been the research direction of textile science and technology.
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Product
Switch Fabric Modules
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Switched fabrics provide the interprocess communication backbone for OpenVPX systems - and these modules enable you to achieve the maximum benefit.
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Product
9U Blade Server for 12 Blades with Dual Fabric Switch Slots
cPCIS-3300BLS
Blade Server
- PICMG® 2.16 Packet Switching Backplane architecture- Dual PICMG® 2.16 fabric slots for high availability- 21 slots, including 12 node slots, two fabric slots, three redundant 6U CompactPCI® power modules and one CMM slot- Hot swappable 800 W + 400 W redundant CompactPCI® power supply with universal AC input
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Product
PCI to Star Fabric Module
51-921-001
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This module resides in the Slot 1 position of a PXI chassis and interfaces to the backplane of the PXI chassis. When located in a generic peripheral slot, it can be used to drive two extension PXI chassis.
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Product
Fabric Pneumatic Bursting Tester
TF142C
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TESTEX Testing Equipment Systems Ltd.
Fabric Pneumatic Bursting Tester, to determine the bursting pressure of fabrics uses pneumatic test method, including knits, woven fabric, non-woven fabric, laminated fabric and other craft-made fabric.A test specimen is clamped over an expansive diaphragm by a circular clamping ring, increasing compressed air pressure is applied to the underside of the diaphragm, causing distension of the fabric until the test specimen bursts, the bursting strength and distension are determined.
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Product
40 Gigabit Ethernet AdvancedTCA® Fabric Interface Switch Blade
aTCA-3710
Switch Blade
The aTCA-3710 is a high performance, high bandwidth, 40G Fabric switch blade for AdvancedTCA® platforms. This product is ideal for bandwidth intensive telecom applications such as wireless access controller, DPI/security network, IPTV, IP multimedia subsystem, RNC/BSC, broadband access/bearer network, data center, and LTE/4G network applications. The aTCA-3710 provides 40GbE hub-to-node connectivity and integrated switch silicon that supports load balancing, priority queues, packet classification, and flow control to enable strict bandwidth management for implemented applications.
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Product
Fiber Manufacturing
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From preform fabrication to final quality control, our fiber test instruments are designed to provide a complete end-to-end solution for all of your testing needs. Our technology is so widely used that virtually all fibers produced globally encounter multiple PK instruments before leaving the factory.
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Product
Software Module with a Virtual Gage for Real-Time Inspection and Assembly
Verisurf Build
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Verisurf BUILD is the industry-leading tool for real-time model-based inspection, tool fabrication, and computer-aided assembly.Inspect position and profile, set details and fabricate tools, jigs, and fixtures faster and at lower cost than any other process or software.Evolved and perfected from a large installed base at today’s modern aerospace, automotive, and industrial tooling manufacturers.
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Product
D-Coupon Generator
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Conductor Analysis Technologies, Inc
This coupon generator is based on the D-Coupon of IPC 2221B Appendix A. It is advised that you familiarize yourself with the coupon specifications before using the generator. It is also recommended that the drill, etch and soldermask fabrication compensations be applied uniformly to both the coupons and product board after the coupons have been designed.
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Product
Plano Optical Substrate Fabrication
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Keysight has the technology and expertise to fulfill all your requirements for precision plano substrates up to 300mm:
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Product
Shrinkage Template Scale
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TESTEX Testing Equipment Systems Ltd.
Shrinkage Template Scale, suitable for all shrink testing standards. Shrinkage Template Scale complies with AATCC 135/150/160/179, BS EN 3759, ISO 3759, etc. Welcome to contact us if you have any problems about fabric shrinkage test method.
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Product
Bursting Strength Tester
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TESTEX Testing Equipment Systems Ltd.
Bursting Strength Tester is used to test the strength of bursting for fabric. When you do bursting test, mullen burst tester is a wise machine for you.
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Product
30μm Transparent Quartz Interdigitated Electrode (IDE)
TIQ1
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30 μm transparent interdigitated electrode (IDE) fabricated on a high-quality quartz substrate for MEMS sensors, gas sensing, bioelectrochemical research, photoelectric detection, and electrochemical applications. Customizable electrode materials, dimensions, and layouts are available for laboratory and OEM projects.
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Product
Semiconductor
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Engineered ceramics are used in the semiconductor industry because of their excellent material properties. Ultra-pure ceramics are often used in the whole cycle of semiconductor manufacturing including Semiconductor Wafer & Wafer Processing, Semiconductor Fabrication (Front End), and Semiconductor Packaging (Back End).
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Product
In-House Testing
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Aerodyn’s state of the art test facility features vast capabilities for new product development and testing to meet our customers’ needs. By coupling our extensive design, fabrication, and instrumentation capabilities, along with our LabVIEW certified engineers, Aerodyn offer the utmost support to allow for very quick test setups and delivery of results.
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Product
8-Channel 250 MHz A/D with DDC, Kintex UltraScale FPGA - XMC
Model 71131
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- Jade Xilinx Kintex UltraScale FPGA Products and Navigator Design Suite Software Video- Jade Xilinx Kintex UltraScale FPGA Family Brochure- Complete radar and software radio interface solution- Powerful Xilinx Kintex UltraScale FPGAs- Eight 250 MHz 16-bit A/Ds- Eight multiband DDCs (digital downconverters)- 5 GB of DDR4 SDRAM- Sample clock synchronization to an external system reference- LVPECL clock/sync bus for multimodule synchronization- PCI Express (Gen. 1, 2 & 3) interface up to x8- VITA 42.0 XMC compatible with switched fabric interfaces- Optional LVDS and gigabit serial connections to the FPGA for custom I/O- Ruggedized and conduction cooled versions available
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Product
Ultrasound Transducers
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Utilizing optical and semiconductor fabrication techniques, Imaginant manufactures the PureView PrecisionTM line of RoHS-compliant delay-line ultrasound transducers with center frequencies ranging from 50 MHz to 250 MHz (higher and lower transducer frequencies are also available). Imaginant's precision-manufacturing process produces transducers that exhibit high reliability and high uniformity from device to device. This manufacturing consistency enables uniform test system performance to be attained across multiple systems. Imaginant transducers are available in focused and flat-face models that can be produced with minimal-damping for applications requiring maximal sensitivity or with maximal-damping and high-bandwidth for applications requiring the highest-degree of temporal precision.
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Product
4-Channel 200 MHz A/D with DDC, Kintex UltraScale FPGA - XMC
Model 71861
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- Jade Xilinx Kintex UltraScale FPGA Products and Navigator Design Suite Software Video- Jade Xilinx Kintex UltraScale FPGA Family Brochure- Complete radar and software radio interface solution- Supports Xilinx Kintex UltraScale FPGAs- Four 200 MHz 16-bit A/Ds- Four multiband DDCs (digital downconverters)- 5 GB of DDR4 SDRAM- Sample clock synchronization to an external system reference- LVPECL clock/sync bus for multimodule synchronization- PCI Express (Gen. 1, 2 & 3) interface up to x8- VITA 42.0 XMC compatible with switched fabric interfaces- Optional LVDS and gigabit serial connections to the FPGA for custom I/O- Ruggedized and conduction-cooled versions available- Synchronize up to eight modules with Model 7893 System Synchronization and Distribution Amplifier - PCIe
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Product
Process EDXRF Spectrometer
NEX LS
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Applied Rigaku Technologies, Inc
Featuring advanced third generation EDXRF technology, the Rigaku NEX LS represents the next evolution of scanning multi-element process coatings analyzers for web or coil applications. To deliver superior analytical performance and reliability, the EDXRF measuring head assembly was derived from the established Rigaku NEX Series high-resolution benchtop instrumentation. With this proven technology, the Rigaku NEX LS delivers rapid, non-destructive, multi-element analyses — for coat weight, coating thickness and/or composition — for elements from aluminum (Al) through uranium (U). The measuring head is mounted on a rigid beam and is equipped with a linear traversing mechanism positioned over a roller so that the head-to-surface distance is constant. Common applications include silicone release coaters, converters, denesting Si for vacuum-formed plastics, RoHS compliance, conversion coatings, metalized plastic, top coatings on metal coil and fire retardants on fabric.
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Product
Impedance Measurement
CITS880s
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Finer geometries and thinner copper can present a challenge for fabricators measuring impedance on leading edge PCBs. The CITS880s answers that challenge with the introduction of Launch Point Extrapolation (LPE). LPE extrapolates the TDR response back to a point close to the start of the transmission line effectively allowing to users more accurately to measure the instantaneous or incident impedance of the line.
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Product
Crease Recovery Tester
TF110
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TESTEX Testing Equipment Systems Ltd.
Crease Recovery Tester, to determining recovery properties of fabrics by creasing in a loading device for a predetermined time using a weight suitable for the test method specified (BS/ISO/AATCC), After transferring the specimen to the clamp of the tester, the specimen is allowed to recover and the angle of recovery recorded. Fabric Crease Tester complies with ISO 2313, AATCC 66, BS EN 22313， etc.
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Product
Textile Tensile Testing Machine
TF002
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TESTEX Testing Equipment Systems Ltd.
Textile Tensile Testing Machine, to determine the physical and mechanical performance of tension, tearing, compression, bursting, rapture, flexibility, shear and peel and seam slippage. Especially designed to test a wide range of yarn, fabric, leather, with a huge assortment of specimen grips and software available, it can also be used for strength test of rubber, plastic, metal, wire, paper, packaging, and other materials
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Product
FTB Ecosystem
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Imagine test tools that actually help you deliver services with speed and quality. Imagine if you could institutionalize operational efficiencies, eliminate silos and make every component of your deployment, turn-up and monitoring part of one tightly woven fabric.
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Product
Yarn Count Tester
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TESTEX Testing Equipment Systems Ltd.
Yarn Count Testing Machine, automatically calculates count systems used for sliver, roving and yarn, and can also be used for fabric yield. Yarn Count Tester consists of an accurate electronic balance with a capacity of 400g or 200g x 0.001g and built-in calculating program. Please contact us if you want to know more about yarn count test method.
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Product
RF Power Transistors
Silicon Bipolar
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Macom Technology Solutions Holdings Inc.
At MACOM we offer a broad range of silicon bipolar transistor products designed for applications ranging from DC to 3.5 GHz. Our silicon bipolar transistors are ideal for civil avionics, communications, networks, radar, and industrial, scientific, and medical applications. Our all-gold metallization fabrication processes ensure high performance and long term reliability for ground and space applications.
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Product
65 lane, 17 port, PCI Express
PEX 9765
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Broadcom has extended the reach of PCIe for use as a fabric for data center and cloud computing through its ExpressFabric initiative and platform of hardware and software. ExpressFabric can eliminate expensive bridging devices within the rack, such as adapter cards that translate native PCIe to Ethernet and back to PCIe. Yet ExpressFabric works seamlessly with other standards used within the rack and in rack-to-rack connectivity.
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Product
3rd Gen MicroTCA Carrier Hub (MCH), Double Module, 40/10GbE/PCIe/FPGA/SRIO
UTC006
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The VadaTech UTC006 is a double module, MTCA.4 format, MCH with front-panel fabric expansion and RTM support (PCIe optiononly). Fabric options include PCIe Gen3, 10/40GbE, Xilinx Virtex-7 FPGA, Cross Bar Switch (CBS), and SRIO.
