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Fineliner
The parallel tester Fineliner enables two-sided contact with fne structures. Withvisual detection of both substrate sides and corresponding adapter position correction≥ 300μm test points can be contacted. The rigid needle adapter with a pitch of ≥ 400μmalso allows a high contact density. This results in a large test depth on the substrate.The integrated DMC reader ensures a correct test result assignment. Multiple PCB canbe tested step by step through in the X-direction of the Fineliner, further eliminatingsubstrate tolerances in the X-direction, and enabling more cost-effective adapters andmeasurement techniques. A quick-release system with identifable replacement kitsensures safe and quick retooling.The measuring technology can be defned customer-specifcally. There are 2040 pyloninterface points per side.
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Data Acquisition Switch System
M300
No matter the product performance test in the R & D stage or the automatic test in the production process, for the application of multiple test points and multiple signal measurement, the M300 series data acquisition / switch system with modular structure combines the precise measurement function with the flexible signal connection function, and can provide a wealth of test measurement solutions.
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Gold Probes
4900 Series
The "GOLD PROBE" has been designed specifically for use with Tektronix, Hewlett Packard and other high performance oscilloscopes. This new slim design along with a host of versatile accessories, allows you to reach the most difficult test point in today's highly complex circuitry. The gold plated Probe Tips, Sprung Hook, Ground Lead, Alligator Tip and other critical interconnect points within the Gold Probe, provide excellent contacts for probing low level analog signals and high speed digital data. Unlike most "off shore" commodity probes, Probe Master guarantees quality and continuing domestic support for our "Made in America" Gold Probe.
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Compact Testers
Adaptronic wiring testers of the compact class are available as low voltage testers and also as high voltage testers, as KT version with display and keyboard and as NT version with the grafical user interface NT Control. With max. 5120 test points (NT 600) adaptronic wiring testers of the compact class are predestined for voluminous testing jobs and large products to be tested. Whether with adapter cables, test tables, test consoles or adapter consoles - the wiring testers of the compact class can also be used everywhere.
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Differential Probes (4-6 GHz)
Differential active probes are like two probes in one. Instead of measuring a test point in relation to a ground point (like single-ended active probes), differential probes measure the difference in voltage of a test point in relation to another test point. Dx10/Dx20/Dx00A-AT 4-6 GHz differential probes are a general purpose probing solution with high input dynamic range and offset.
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Tensile Strength Machine
UI-1100
Tensile Strength Machine, also known as Tensile Strength Tester, Universal Testing Machine (UTM), is used to do tensile, peel, shear, bend, and other tests of materials. Universal Testing Machine can do plenty tests like sole/upper bond test ISO 20344, velcro strength test (peel and shear strength) ISO 22776,zipper strength test ASTM D2061, rubber tensile test, 3 point bending test and etc.
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4x IDC to 192 Pin Quadrapaddle
YAV90Q04
The interface YAV90Q04 permits to connect two YAV90096 boards to one 192-Signal contacts Quadrapaddle module. As the Mini-D 50 connectors let 2 free pins (1 and 26), these pins are interconnected to a test point, with the possibility of be grounded. Cable P/N J6200540: Mini-D-50 to Mini-D-50 IDC connectors with 400 mm flat cable.
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Precision Flying Probe Platforms For Automated Test Applications
Flying Probe technology is used to automate the testing of printed circuit boards (PCB) that would otherwise have to be tested manually. Adding a Huntron Access Prober to your test procedure will significantly decrease test times therefore increasing productivity.Access Probers can accurately place a probe on test points with high accuracy achieved using micro-stepping motors and linear laser encoders. Probing the smallest surface mounted devices is possible. Huntron Access Probers can automate your unique test process using the standard probe or by adding a custom probe of your design. Huntron offers three Flying Probe system configurations based on PCB size and test head requirements.
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25 Pin Breakout Interface
VSI-Breakout-25
The VSI-Breakout-25 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.
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QT Enterprise Software
Procedures stored via QT Enterprise can be recalled via a barcoded scan to enable fast and accurate setup. In situations where multiple test points are involved, the software can interface with Vitrek’s 964i High Voltage Switching Systems, operating in conjunction with V7X & 95X Hipot Testers to further automate the process. For complex setups, QT Enterprise can display detailed instructions and images to the operator to ensure proper connections prior to testing.
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Wire Harness Tester
NX Pro
The Dynalab NX Pro Wire Harness Tester is a low-cost, feature-packed, stand-alone continuity tester with a maximum capability of 512 test points. The flexibility of the NX System allows each program to perform multiple tests, display custom messages or sounds, and analyze the results of a test or an input to "decide" which operation to perform next. The NX Pro Tester has 1.3Mb memory capacity for program storage and is compatible with Printers, Scanners, and all other Dynalab NX System accessories.
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1U Rack Adapter for Series HSF-1U, HSF-1UR
RA 19
The 1U high rack adapter will mount four of the low profile 50W, 100W and 150W (Series HSF-1UR or HSF-1U) power supplies. Each plug-in power supply is equipped with a power on/off, indicator LEDs and voltage test points. The RA 19-1U provides access to the DIP switches and rack keying without disassembling the rack. It also provides a redundant scheme with modules 1 and 3 being powered from one a-c input and modules 2 and 4 from a second a-c input. Module numbering is left to right facing the front panel.
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Benchtop Automated Functional Test
midUTS
Combining bench-top portability with powerful automated test functionality, the midUTS is an extremely versatile yet cost-effective solution for your electronics functional test needs. Comprised of high-performance commercial-off-the-shelf (COTS) instruments, along with Bloomy’s medium-density signal-routing PCBAs, a built-in or USB-connected PC, and a pair of high-integrity, production-grade cables connected to an adjacent benchtop fixture, the midUTS can be used in engineering for PCBA bring up, as well as scaled to manufacturing to perform high-volume PCBA and sub-assembly functional testing. It is also ideal for depot diagnostic test, debug, and repair of field returns. The two mass-interconnected cables connect the midUTS to as many as 320 test points on the unit under test (UUT), supporting an extreme wide variety of products using bed-of-nails as well as cable-connected UUT test fixtures. Most importantly, the midUTS helps you automate sequences of functional tests using NI TestStand and the Bloomy EFT Module for TestStand. This ideal balance between powerful features and affordable cost allow you to automate earlier in the product development lifecycle, substantially increasing product quality and minimizing time-to-market!
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Digital Communication Trainer
Digital Communication Trainer System to understand Techniques of Digital Modulation & Demodulation.Various functional block diagrams are provided on-board for Teaching/Training. These Trainer provides with various Test Points to visualize the signals on Oscilloscopes.
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Universal Cable/Harness Tester
LX-686
Shenzhen Lian Xin Technology Co., Ltd.
The system provides Chinese/English free switch operation interface,．·Up to 1500Vdc/1000Vac Test Voltage ,．·256 Max. Test Points , (Max of all series)．·500 Max Files Memory,support USB or PC unlimited expansion,．·Arc detection level 0-9 ,auto prompt．·Adopted high resolution colour 640*480 TFT LCD ,．·Providing Single-End ,Multi-segment ,Standard ,and Spot test of wire.．·Auto Scan and Auto Pin Search ,．·The system provides advanced instant open-circuit, short-circuit, continuity test,．·Intermittent Conductance Test,．·Intermittent Open/Short Test ,．·Full Programming Sequence Test ,．·Versatile I/O Ports for application ,．·Statistics and Print Function,．·Provide REMOTE interface, communicate with PLD auto test fixture,．·Provide personalized customization according to different requirements,
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2 Pole 12 X 4 Low Thermal Relay Matrix Module
DP-cPCI-4113
A matrix is the most versatile switch topology. It is made up of rows and columns that connect any input to any output. With matrix switching system, it is easy to connect a number of instruments or sources to various test points of the UUT. The benefit of matrix switching is simplified wiring with which the overall test system can easily and dramatically change the internal connection paths without any manual intervention.DP-cPCI-4113 offers switching matrix in a single slot 6U sized cPCI module with flexibility to configure for 48 cross-points or 72 cross-points on factory selectable basis.
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Touch Screen 1550nm Single Mode Mini OTDR
TR1500S
Shenzhen Sharingtek Communication Co., LTD
The TR1500S mini OTDR is compact and easy to carry. It adopts a 3.5 inches high-definition touch screen, supports multi-touch and smooth operation, integrates OTDR, event map, optical power meter, light source, visual fault locator and flashlight in one unit, to meet various test needs in different occasions. The OTDR function adopts 1550nm wavelength and is built in high-efficiency wavelength isolator. It can perform optical live test on 1490 and 1577nm optical links, which supports up to about ±10dB optical live test. Its maximum measurement range is 80km.The TR1500S is used to measure optical fiber’s length, loss, connection quality and other parameters. It can easily test the breaking point, bend and loss point of the optical fiber links. It is suitable for maintenance personnel to have optical line maintenance and emergency repair testing.
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Bead Target Probes
A methodology for placing test points directly on a PCB's copper traces, or top metal, thus forming a “Bead Probe”.
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Cable and Harness Tester
CHT
The Cable and Harness Tester (CHT) provides multiple testing capabilities for up to 300 connector/harness test points. Test capabilities include DC Insulation Resistance (IR), DC and AC Dielectric Withstanding Voltage (DWV), and 2-Wire and 4-Wire Continuity.
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3-Axis Motion Simulators
When a device under test needs to be stimulated with simultaneous movements around three axes, then a product from the ACUTRONIC three-axis motion simulator range is the right choice. Independent motion simulation in three axes makes them very versatile: they are used as Inertial Guidance Test Systems (IGTS), for HardWare-In-the-Loop (HWIL) testing, for the test of optronic pointing devices, and many more applications.
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Functional Test Fixtures
Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
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Test adapter LRP-LR (Type D, 4 mm)
MA-LPL02D
Hachmann Innovative Elektronik
Our test adapter MA-LPL02D connects LR measuring devices to standardized LRP string parts and capacitive test points. An insulating tube with great dielectric strength shields the user from static energized test points without automatic earthing.
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Flashpoint
The MINIFLASH is a uniquely designed flash point tester for the determination of flashpoints of liquids and solids, using the GRABNER INSTRUMENTS flash point detection method of measuring the instantaneous pressure increase inside the continuously closed chamber due to a hot flame. The MINIFLASH flashpoint analyzer series is a new approach to flash point testing. It revolutionizes traditional methods, when it comes to safety, sample volume, speed and instrument size.
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SM / Expansion Unit
A testing procedure designed to thoroughly test the electrical characteristics of a wire or cable, may require additional test points to connect the end points of all conductive paths. The changing and alteration of Test Adapter Cables (TACs) would become obsolete when having access to one or several expansion units. Increased testing efficiency alleviates the long, drawn out down times of the disabled aircraft while improving product readiness. Additional time can be spent on troubleshooting and problem identification and will not require the user to unhook and connect TACs to different matrices. Adding additional expansion units will save the user time, money, and effort.
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Plugbord
3682
VECTOR Electronics and Technology, Inc.
44 Gold plated edge contacts (22 each side)on 0.156"(3.96mm) centers.Interleaved buses pattern on wiring side only solder- coated for user convenience. Bus outline silkscreened on component side to facilitatecomponent placement. Mounts DIPs with 0.3”, 0.4” & 0.9” lead spacing. Unclad test point area at top of board Row and column legends provided
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Mag Lead w/Alligator Clips
138
*54" Test Lead Set *Mag Lead features a magnetic disconnect. *You can "stick" to any metallic ground or test point. *Time saving product - can substitute for alligator clips at metallic test points. *Now, when you need alligator clips, you've got them! *Fits almost all DMM's and hand held scopes. *Get the Mag Lead, it stays put and won't fall off!
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Hand Insertion Tools
Zierick Manufacturing Corporation
Ideal for low volume, short run and prototype PCB assembly applications, Zierick’s hand tools offer a simple and reliable method for inserting press fit and splay mounted terminals. The hand tool can be easily installed on any type of press machine for increased flexibility and faster insertion. With the addition of a lower tool die, terminals can then be splayed and locked into place to improve reliability and prevent part removal and rotation. Zierick hand tools are available for PCB-mounted quick-disconnect terminals, quick-disconnect receptacles, post receptacles, test points and IDC terminals. Simple and reliable method for inserting press-fit and splay mounted terminals. Single tool can handle multiple terminal insertion applications. Tools can be installed on almost any type of manual or pneumatic press. Please click here for a PDF user manual for Zierick's hand tools.
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Flying Probe Tester Substrate
Substrates with structures down to 10µm and several hundred thousand test points per panel require specific solutions forscanningcapacitance measurementhigh accuracy and temperature Management
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Design for Test Service
Design For Test (DFT) is a technique used to implement certain testability features into a product. Testing House can provide an analysis of the CAD data for testability of your circuit board. Access to a board can be very difficult as boards get smaller and designs get more densely populated. We can work with your design engineer to improve testability and maintain an effective in-circuit test. When access to the board is limited and boundary scan devices are present, we can provide the customer a list of key nodes that will require access in order to provide a very effective test. Our analysis will provide a list of all the accessible test points and an explanation for any nodes declared inaccessible.
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Boundary-Scan Interactive Analyzer & Toolkit
ScanExpress JTAG Debugger
Test probe access is a luxury—modern electronic system design techniques such as blind and buried vias or ball-grid-array (BGA) devices guarantee limited signal access. Test points quickly reduce precious board real-estate and can even degrade performance. ScanExpress JTAG Debugger overcomes these limitations to provide the control and visibility necessary to quickly debug and test hardware, using a simple JTAG port to interface with IEEE-1149.1 compliant devices.Whether debugging prototype hardware, enhancing production tests with boundary-scan control, or diagnosing a faulty board in the field, ScanExpress Debugger’s easy-to-use and versatile interface helps engineers test and debug systems faster and more efficiently.
