Near-Field
1) EMF closest to the antenna. 2) Near-field optics.
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Product
Scanning Near Field Optical Microscope
SNOM
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SNOM microscopes employ SPMs precision of piezoelectric raster-scanning together with sharp probes to obtain light optical images at rather better than the usual wavelength-limited resolution. The possibility to go beyond the Abbe diffraction limit has been achieved with the Near-field light optical microscopes (SNOM or NSOM).
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Product
Near Field Micro Probe Sets
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The near field probe is designed for a high-resolution measurement of electrical near fields.
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Product
Deluxe Near-field Detection Receiver
ANDRE™ Deluxe
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The ANDRE is a handheld broadband receiver that detects known, unknown, illegal, disruptive, or interfering transmissions. The ANDRE locates nearby RF, infrared, visible light, carrier current, and other types of transmitters. Quickly and discretely identify threats using the ANDRE Deluxe’s wide range of accessories specifically designed to receive transmissions from 10 kHz up to 12 GHz.
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Product
2D Near-Field Analysis of VCSEL Arrays
VTC 4000
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Instrument Systems Optische Messtechnik GmbH
The VTC 4000 near-field camera from Instrument Systems was specially developed for the ultrafast, precise 2D analysis of VCSEL arrays. It enables polarization-controlled characterization of all relevant parameters simultaneously for the single emitters of the array.
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Near Field Micro Probes ICR HH H Field
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The measuring coil is horizontally located in the probe head. The near field micro probes are operated with a positioning system (Langer Scanner).
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Near-Field Probes 100 kHz up to 50 MHz
LF1 set
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The LF1 near-field probe set consists of 4 shielded near-field probes used during the development process for emission measurement of longwave, medium wave, and shortwave frequencies on electronic devices. The probe heads of the LF1 set are designed for incremental detection of sources of electromagnetic interference on assemblies. First, the electromagnetic interference of the assembly is detected by the LF-R 400 probe from up to 10 cm. Then probes with higher resolution like the LF-B 3, LF-U 5 and LF-U 2.5 are used to more precisely detect any source of interference. The probe heads are designed for taking measurements at single pins and larger components. Near-field probes are small and handy. They have a current attenuating sheath and, therefore, are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probes do not have an internal terminating resistance of 50 Ω.
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Product
Near Field Moving Detector Goniophotometer
LSG-1900B
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LSG-1900B Goniophotometer is near field Type C automatic goniophotometric instrument for luminous intensity distribution measurement. The LSG-1900B uses a constant temperature detector. It is for industrial laboratory photometric data measurements of small luminaires, such as down light, bulb light, etc.
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Product
Near Field Probes 30 MHz up to 3 GHz
RF1 set
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The RF1 near field probe set consists of 4 passive near field probes for making measurements in the development phase of E-field and magnetic field in the ranges of 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF1 set allow for measurements close to the electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors in order to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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Product
Near-Field Scanning Optical Microscope Platform
MoScan-F
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MoScan-F is a device that enables you to get the best up-to-date available spatial optical resolution using the near field scanning optical microscope (NSOM) principle
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Product
EMC Near Field Probes
TBPS01
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The TBPS01 EMC near field probes H20, H10, H5 and E5 are magnetic field (H) and electric field (E) probes for radiated emissions EMC pre-compliance measurements. The probes are used in the near field of sources of electromagnetic radiation.
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Near Field Probes
MFA Family
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The micro probes allow detailed measurements of high-frequency magnetic fields in the layout, at the smallest SMD components(0603-0201) and at IC pins of printed circuit boards.
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Product
Near Field Microprobe E-field 7 MHz to 3 GHz
ICR E150
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The near field microprobe is used to measure electric fields at extremely high resolution and sensitivity. The optimal distance to the object being measured is < 1 mm. Due to its small probe head dimension, the probe has to be moved by a manual or automatic positioning system, e.g. Langer-Scanner.
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Product
GO-NR1000 Near-Field Goniophotometer
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Hangzhou Everfine Photo-E-Info Co., LTD
Suitable for LED light source, LED chip, module and other small light source, the principal function includes: spatial light intensity distribution curve, spatial color distribution curve, iso-lux curve, total luminous flux, effective luminous flux, spatial luminance curve, etc.The test data can be saved as IESNA (*.ies), CIBSE (*.cib), EULUMDAT (*.ldt), CIE (*.cie), CEN (*.cen) and other formats, which can be directly used as the input data of international general lighting design software. Spatial luminance data can be imported into near-field lighting generation software to generate light data that can be imported into third parties (TracePro and LightTools).
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Near Field Probes 30 MHz up to 3 GHz
RF2 set
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The RF2 near field probe set consists of 4 passive near field probes for measurements in the development phase of the magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF2 set allow the step by step localization of interference sources of the RF magnetic field on assemblies. From greater distances the electromagnetic interference can be detected by RF-R 400-1 and RF-R 50-1 probes. The RF-B 3-2 and RF-U 5-2 probes with their higher resolution can more precisely detect the interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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Product
Near Field Probes
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Anteral has extensive background in the design of Near Field Probes (open ended waveguides probes). Our Near Field Probes are currently being used in several laboratories around the world including the ESA's anechoic chamber. Anteral designs Near Field Probes from 10 GHz to 750 GHz covering the sectors requirements. Moreover, our Near Field Probes have a sharped design minimize reflections.
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Product
Near-field Chambers
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Most antenna measurements need to be carried out in the far field; that is, the test antenna should be illuminated by a plane wave. Typically this is carried out by providing sufficient separation between the source and the AUT so the spherical wave approaches a plane-wave character.
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Product
Near Field Micro Probe ICR HV H Field
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The measurement coil is located vertically in the probe head. The near field probes are run with a positioning system (Langer Scanner).
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Product
Near Field Probes
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A typical emi emission test is performed using broadband EMC antennas such as biconical, log periodics, Combilogs and horns. These antennas usually placed at 1, 3 or 10 meter distance as required by the test specification. These is considered far field measurements and the emission limits are given for the specific distance by the specification. During EMI compliance measurements, the emissions levels from products are compared with these limits. If the product exceeds these limits it is considered failing. These tests are typically conducted in a open area test site IOATS) or inside an anechoic chamber.
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Product
Near Field Probes
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Used for accompanying measurements of high-frequency, electric and magnetic RF fields on assemblies and devices.
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Product
GO-R5000 Full-Field Speed Goniophotometer
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Hangzhou Everfine Photo-E-Info Co., LTD
The GO-R5000 integrates more powerful functions such as near field, middle field and far field distribution goniophotometer, which can be used for spatial luminous intensity distribution and total luminous flux test of indoor lighting lamps, floodlights, street lamps, etc. Equipped with imaging luminance meter and spectroradiometer, it can measure the spatial luminance distribution and spatial spectral color distribution of the light source.
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Product
Interference & Compatibility Evaluation System
ICEy
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Schmid & Partner Engineering AG
ICEy is the most advanced reactive near-field E/H-field scanning system for the analysis of EM interference and compatibility (EMI/EMC) in highly integrated electronics. ICEy is the only system that provides accurate EM measurements traceable to international calibration standards and also allows independent interlaboratory comparability of EMI/EMC measurement results.
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Product
Combination Board Tester
ATE QT2256-640 PXI
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Qmax Test Technologies Pvt. Ltd.
Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or micro controller based boards. ATE QT2256-640 PXI system is designed as a combination board tester capable of testing highly complex and PCBs employing various techniques on a single platform. It can be easily upgraded to 640 digital channels and with programmable UUT power supplies, IEEE or PXI external instrumentation, Bus cycle signature system, ICE and integrated Boundary scan Test AC/DC parametric testing. The ATE is interfaced to an external host PC using a PCI express interface card allowing a maximum data transfer rate. Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or microcontroller based boards.
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Product
Scanner Probe
RFS set
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The RFS set consits of three passive near field probes designed for the use in a measurement scanner during the development of E-field and magnetic field. They are designed for frequency ranges of 30 MHz to 3 GHz. The probe heads of the RFS set allow for close measurements needed to correctly localize interference sources on an electronic assembly.
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Product
RGO-2000P Robotic Goniophotometer For Plant Lighting
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Hangzhou Everfine Photo-E-Info Co., LTD
RGO-2000P proposed a solution based on the plant lighting requirement to measure and evaluate the spatial light distribution performance of plant lighting based on the limitations of far-field measurement and ILMD near field distribution goniophotometer.
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Near Field Probes 30 MHz up to 6 GHz
XF1 set
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The XF1 set of near field probes consists of 4 passive near field probes and one passive E field probe for making measurements in the development phase of the magnetic and electric fields in ranges from 30 MHz to 6 GHz. Due to their integrated impendance matching, the probes are less sensitive in the lower frequency range than the RF type probes. The probe heads of the XF1 set allow for the step by step identification of interference sources of the magnetic field on an electronic assembly. At first, for example the XF-R 400-1 detects the fields which the assembly emits in total. Next, using higher resolution probes the interference sources can be more precisely detected. The E field probe is used for the detection of electric interfering fields near the assemblies. With trained use of the near field probes, field orientation and field distribution can be detected. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
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Product
Passive Magnetic Antennas, TX-Loop Antennas
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A passive loop antenna which is matched to a resonance frequency of 13.56 MHz with 370 kHz bandwidth (-3dB)The purpose of the antenna is to produce defined magnetic fields at 13.56 MHz efficiently, i.e. to test near field communication devices (NFC) or RFID equipment.
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Light Engines
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Delivering the highest brightness and optical power available, our light engines provide optimized output solutions for a range of applications such as light guide and fiber optic coupling, fluorescence excitation, and unrivaled uniform near and far field illumination.
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Antennas
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Our broad portfolio of antennas includes products designed for cellular, broadcast, navigation, RFID, IoT, DAS, mmWave, and more. Our antennas are available in standard and custom designs and engineered for use in cars, heavy-transport vehicles including rail, and a wide variety of personal electronics, including mobile device and wearable technology. Our antennas offer high-quality transmission for a wide variety of frequencies including, but not limited to Bluetooth, WLAN, and ZigBee. We manufacture our antennas in facilities worldwide, which include testing capabilities in near and far field patterns, scattering parameters, SAR, vibration, humidity, temperature shock, salt fog, throughput, and acoustic. We also manufacture antenna assemblies.
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Product
Near-field Goniophotometer
RiGO801
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TechnoTeam Bildverarbeitung GmbH
Correct determination of the luminous intensity distributions (lid) of lamps and luminaires far within their photometric near-field range. Capture of ray data.
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Fiber optic active antennas / field probes
EFS-105
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The EFS-105 is the first in a family of fiber-optic active antennas & E-field probes. The field distortion caused by the probe head is nearly zero due to the exceptionally small probe head and the all-optical signal transmission and power supply. This gives an invaluable advantage for near field measurements and measurements close to metallic parts.
