Near-Field
1) EMF closest to the antenna. 2) Near-field optics.
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Near-field Chambers
Most antenna measurements need to be carried out in the far field; that is, the test antenna should be illuminated by a plane wave. Typically this is carried out by providing sufficient separation between the source and the AUT so the spherical wave approaches a plane-wave character.
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Scanning Near Field Optical Microscope
SNOM
SNOM microscopes employ SPMs precision of piezoelectric raster-scanning together with sharp probes to obtain light optical images at rather better than the usual wavelength-limited resolution. The possibility to go beyond the Abbe diffraction limit has been achieved with the Near-field light optical microscopes (SNOM or NSOM).
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Near-Field Detection Module for Imaging
Reflection
Reflective AFM-tip illuminationDetection optimized for high-performance near-field imagingEnables optical amplitude and phase resolved near field measurementsNear-field spectroscopy possible via sequential imaging (Requires tunable illumination unit)Patented background-free detection technologySuited for visible & infrared wavelength range (0.5 20 m)Version for infrared & THz wavelength range (5 300 m) availableSupported AFM scan-speed: up to 20 m/s @ highest spatial resolution
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Near-Field Probes 100 kHz up to 50 MHz
LF1 set
The LF1 near-field probe set consists of 4 shielded near-field probes used during the development process for emission measurement of longwave, medium wave, and shortwave frequencies on electronic devices. The probe heads of the LF1 set are designed for incremental detection of sources of electromagnetic interference on assemblies. First, the electromagnetic interference of the assembly is detected by the LF-R 400 probe from up to 10 cm. Then probes with higher resolution like the LF-B 3, LF-U 5 and LF-U 2.5 are used to more precisely detect any source of interference. The probe heads are designed for taking measurements at single pins and larger components. Near-field probes are small and handy. They have a current attenuating sheath and, therefore, are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probes do not have an internal terminating resistance of 50 Ω.
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Near Field Micro Probes ICR HH H Field
The measuring coil is horizontally located in the probe head. The near field micro probes are operated with a positioning system (Langer Scanner).
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Near-Field Scanning Optical Microscope Platform
MoScan-F
MoScan-F is a device that enables you to get the best up-to-date available spatial optical resolution using the near field scanning optical microscope (NSOM) principle
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Near Field Strength Monitor / Bug Detector
NFSM-2000
Locate and Identify Hidden Radio Transmitters with an all Digital Display, earphone and accompanied tool for finding hidden RF Wireless Cameras.
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Near Field Probes
A typical emi emission test is performed using broadband EMC antennas such as biconical, log periodics, Combilogs and horns. These antennas usually placed at 1, 3 or 10 meter distance as required by the test specification. These is considered far field measurements and the emission limits are given for the specific distance by the specification. During EMI compliance measurements, the emissions levels from products are compared with these limits. If the product exceeds these limits it is considered failing. These tests are typically conducted in a open area test site IOATS) or inside an anechoic chamber.
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Near Field Microprobe E-field 7 MHz to 3 GHz
ICR E150
The near field microprobe is used to measure electric fields at extremely high resolution and sensitivity. The optimal distance to the object being measured is < 1 mm. Due to its small probe head dimension, the probe has to be moved by a manual or automatic positioning system, e.g. Langer-Scanner.
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Near Field Probes 30 MHz - 6 GHz
XF Family
The XF family consists of 4 passive magnetic field probes and 3 passive E field probes designed for measuring magnetic and E-fields in ranges from 30 MHz to 6 GHz during the development phase. Due to their integrated impendance matching the probes are less sensitive in the lower frequency range than the RF type probes.
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Cylinder type, Near field Antenna Measurement System
anm02
As it combines the vertical direction of the probe antenna with the turn of the object antenna, and performs the near field measurement in the shape of a cylinder. The result will be converted to far field. Feature The pattern behind the antenna can be measured by a cylinder scanning. Fast measurement.For example ) Vertical direction 256 point and Rotatory direction 180 point : 30 minutes.
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RF Near Field Scanner
The TEM Consulting near field scanner is a high precisions positioner that supports the precise movement of field probes. Using our scanning positioner field maps of planes and volumes can be developed to assist engineers in antenna design, analyzing and solving EMC problems and mapping signal intensity.
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Near Field Probes
Used for accompanying measurements of high-frequency, electric and magnetic RF fields on assemblies and devices.
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Near Field Probes 30 MHz up to 3 GHz
RF6 set
The RF6 near field probe set consists of 2 passive magnetic field probes and 2 passive E field probes for measurements in the development phase of the E-field and magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF6 set allow a step by step localization of interference sources of the RF magnetic field and RF-E-field on an assembly. From a larger distance the electromagnetic interference is detected by RF-R 50-1 for the magnetic field and by RF-E 02 for the E-field. The RF-B 3-2 and RF-E 10 probes with their higher resolution can more presicely detect the interference sources of the magnetic field and the E-field. Field orientation and field distribution on an electronic assembly can be detected by special guidiance of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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Versatile AFM Optical Coupling
TRIOS
The TRIOS platform is an advanced research instrument that provides the entry path for researchers in materials science, biology, spectroscopy and photonics. TRIOS is the most versatile optical coupling platform providing three ports for optical spectroscopy measurements with top-down, side (oblique) and inverted accesses to the AFM tip and sample.If you work with opaque and/or transparent samples, either in air or in liquid looking at nanoscale structures and near-field optical properties investigation, the TRIOS platform is the right solution for you. It perfectly combines upright optical, inverted optical, and atomic force microscopies, and unleash all the power of both techniques providing instrument adjustment and measurement automation, high resolution and integration flexibility. Such performance is only available from HORIBA.
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Near Field Probes 1GHz - 10 GHz
SX set
The SX1 set consists of 3 passive near field probes for making measurements in the development phase of E-field and magnetic field with a high clock frequency in the range from 1 GHz to 10 GHz. The probe heads of the set SX allow for measurements close to electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors, to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through trained use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
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Plane Wave Converter
PWC200
The R&S®PWC200 Plane Wave Converter is a bidirectional array of 156 wideband Vivaldi antennas placed in the radiating near field of the device under test (DUT). The phased antenna array can form planar waves inside a specified quiet zone within the radiating near field of the 5G massive MIMO base station for realtime radiated power and transceiver measurements (EVM, ACLR, SEM, etc.).
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EMC Near Field Probes
TBPS01
The TBPS01 EMC near field probes H20, H10, H5 and E5 are magnetic field (H) and electric field (E) probes for radiated emissions EMC pre-compliance measurements. The probes are used in the near field of sources of electromagnetic radiation.
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Imaging Goniometers
Radiant Vision Systems fully-automated goniometric systems are combined with a ProMetric® Imaging Colorimeter or Photometer and specialized software to capture a precise, comprehensive model of a light source’s near-field output.
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Scanning Magnetic Microscope
Circuit ScanTM 1000
Operating circuits within a semiconductor generate external magnetic fields near the surface of the device. These magnetic fields, while weak in strength, contain information about the spatial variation of current density flowing within the circuit. Micro Magnetics has developed the CS1000 to make practical use of this information and provide engineers with valuable information about what is going on inside circuitry non-destructively.
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Near Field Micro Probe Sets
The near field probe is designed for a high-resolution measurement of electrical near fields.
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NI-5782, 100 MHz Bandwidth Transceiver Adapter Module for FlexRIO
782705-02
The NI‑5782 is ideal for applications that require the acquisition and generation of IF or baseband signals with in-line, real-time processing. You can analyze acquired signals in the PXI FPGA Module for FlexRIO to perform measurements and generate response signals. Application areas include RF modulation and demodulation, channel emulation, bit error rate testing (BERT), signal intelligence, radio frequency identification (RFID) and near-field communication (NFC) test, real-time spectrum analysis, and software defined radio (SDR).
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Near Field Probes
MFA Family
The micro probes allow detailed measurements of high-frequency magnetic fields in the layout, at the smallest SMD components(0603-0201) and at IC pins of printed circuit boards.
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Near Field Micro Probe ICR HV H Field
The measurement coil is located vertically in the probe head. The near field probes are run with a positioning system (Langer Scanner).
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USB Magnetometer
MultiDimension Technology Co.,Ltd.
A three-axis digital magnetometer that is intended for the measurement of magnetic fields near the probe tip at frequencies less than 250 Hz.
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Near-Field Detection Module for Spectroscopy
nanoFTIR
Reflective AFM-tip illuminationDetection optimized for high-performance near-field spectroscopyPatented background-free detection technologyBased on optimized Fourier-Transform spectrometerUp to 3 spectra per secondStandard spectral resolution: 6.4/cmUpgrade to 3 cm-1 spectral resolution availableSuited for visible & infrared detection (0.5 20 m)Exchangeable beam-splitter mount includedNEW: Suited for IR synchrotron sources
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Near Field Probe Set
RF100
The RF100 probe set consists of a passive E field probe and H field probe, BNC adaptor and carry case. The output is via a BNC socket. These are general purpose probes which are ideal for use in conjunction with an EMC measuring system. They are sensitive to sources in close proximity, but are insensitive to background signals. This makes them ideal for the identification of emission frequencies in noisy environments... thus making measurements easier and quicker. The proximity requirement also enables sources to be located and the exit route identified.
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Interference & Compatibility Evaluation System
ICEy
Schmid & Partner Engineering AG
ICEy is the most advanced reactive near-field E/H-field scanning system for the analysis of EM interference and compatibility (EMI/EMC) in highly integrated electronics. ICEy is the only system that provides accurate EM measurements traceable to international calibration standards and also allows independent interlaboratory comparability of EMI/EMC measurement results.
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Passive Magnetic Antennas, TX-Loop Antennas
A passive loop antenna which is matched to a resonance frequency of 13.56 MHz with 370 kHz bandwidth (-3dB)The purpose of the antenna is to produce defined magnetic fields at 13.56 MHz efficiently, i.e. to test near field communication devices (NFC) or RFID equipment.
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Near-field Scanning Optical Microscope
NSOM
Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nanomanufacturing.Conventional microscopes have fundamentally limited resolution due to diffraction, but there is no such restriction for near-field interactions, that is why near-field microscopy is becoming one of the most important techniques for nano-science.
